JP2006017613A - Interference image measuring instrument - Google Patents

Interference image measuring instrument Download PDF

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JP2006017613A
JP2006017613A JP2004196674A JP2004196674A JP2006017613A JP 2006017613 A JP2006017613 A JP 2006017613A JP 2004196674 A JP2004196674 A JP 2004196674A JP 2004196674 A JP2004196674 A JP 2004196674A JP 2006017613 A JP2006017613 A JP 2006017613A
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image
interference
light
region
light intensity
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Yutaka Kuriyama
豊 栗山
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Mitutoyo Corp
Mitsutoyo Kiko Co Ltd
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Mitutoyo Corp
Mitsutoyo Kiko Co Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To provide an interference image measuring instrument capable of extracting phase information at a satisfactory S/N ratio, even when portions different in light intensities exist within the same view field, in measurement of an interference fringe. <P>SOLUTION: In this interference image measuring instrument 10 provided with an image detecting means 12 for detecting interference light to image an interference fringe image, and for acquiring the phase information based on the imaged interference fringe image, the one interference fringe image regulated to conform a range of a light intensity amplitude in each area with a signal level range of the image detecting means 12 is acquired from the interference lights having the light intensity amplitudes different in every of the areas within the same view field, by regulating luminous energy incident into the image detecting means 12, based on light intensity amplitude information in every of areas of the detecting interference lights, and based on spatial arrangement information of the areas, or by regulating the signal level range of the image detecting means 12 to image the interference fringe image. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

本発明は、光波干渉測定等に用いられる干渉画像測定装置、特にその干渉画像の取得機構に関する。   The present invention relates to an interference image measurement apparatus used for optical wave interference measurement and the like, and more particularly to an interference image acquisition mechanism thereof.

光の干渉を利用して被測定物の長さ、形状などの測定を行う光波干渉測定では、CCDカメラなどの画像検出器を用いて干渉縞を撮像し、得られた干渉画像から測定に必要な位相情報を得る。例えば、特許文献1に記載されるような非密着光波干渉測定では、被測定物(GB:ブロックゲージ)の長さを算出するために必要となる位相情報は、被測定物の端面の領域における干渉縞と、その周囲の領域の干渉縞から得られる。つまり、図1に示すように、位相情報は干渉画像上で同一視野内にある複数地点から取り出す必要がある。具体的には、片側端面における周囲領域とGB領域における位相差情報Φを、周囲領域上の2点AおよびAにおける位相情報ΦAとΦAと、GB領域中心点Bでの位相情報ΦBから、
Φ=(ΦA+ΦA)/2−ΦB
と算出する。
特開2003−194523号公報
In light wave interferometry, which measures the length and shape of an object to be measured using light interference, an interference detector is used to image an interference fringe using an image detector such as a CCD camera, and measurement is necessary from the obtained interference image. Accurate phase information is obtained. For example, in non-contact optical interference measurement as described in Patent Document 1, the phase information necessary for calculating the length of the object to be measured (GB: block gauge) is obtained in the region of the end face of the object to be measured. It is obtained from the interference fringes and the interference fringes in the surrounding area. That is, as shown in FIG. 1, it is necessary to extract phase information from a plurality of points in the same field of view on the interference image. Specifically, the phase difference information Φ in the peripheral region and the GB region on one end face, the phase information ΦA 1 and ΦA 2 at two points A 1 and A 2 on the peripheral region, and the phase information at the GB region center point B From ΦB,
Φ = (ΦA 1 + ΦA 2 ) / 2−ΦB
And calculate.
JP 2003-194523 A

ここで問題となるのが周囲領域とGB領域における干渉縞の光強度振幅幅がそれぞれ異なる場合である。つまり、周囲領域では通過光と参照光による干渉信号が得られるのに対し、GB領域ではGB端面からの反射光と参照光による干渉信号になる。これを光強度について考えると、図2に示すように、GB面の反射率をx%の場合、GB領域で得られる信号の振幅は周囲領域のx%となる。
ところで信号を高分解能で取得するためには、光強度振幅の最大最小値が画像検出器の階調の範囲内に納まり、かつ無駄なく使いきる事が有効である。しかし、鋼のGB面がほぼ100%の反射率であるのに対し、ジルコニアセラミックスのGBでは十数%、ガラスに至っては5%程度と、材質によって反射率は大きく異なり、低反射率の面においては光強度が極端に低下する危険性がある。つまり、図3に示すように、鋼のGB領域での光強度振幅A鋼GBと周囲領域の光強度振幅A周囲はほぼ等しくなるのに対して、反射率の低いセラミクスのGB領域の光強度振幅AセラGBは周囲領域の光強度振幅A周囲よりも小さくなってしまう。
Here, a problem arises when the light intensity amplitude widths of the interference fringes in the surrounding region and the GB region are different from each other. That is, an interference signal due to the passing light and the reference light is obtained in the surrounding area, whereas an interference signal due to the reflected light from the GB end surface and the reference light is obtained in the GB area. Considering the light intensity, as shown in FIG. 2, when the reflectance of the GB surface is x%, the amplitude of the signal obtained in the GB region is x% of the surrounding region.
By the way, in order to acquire a signal with high resolution, it is effective that the maximum and minimum values of the light intensity amplitude fall within the gradation range of the image detector and can be used without waste. However, the steel GB surface has a reflectivity of almost 100%, while the zirconia ceramic GB has a reflectivity of about 10% and the glass reaches about 5%. There is a risk that the light intensity will be extremely reduced. That is, as shown in FIG. 3, the light intensity amplitude A in the steel GB region is substantially equal to the periphery of the light intensity amplitude A in the surrounding region, whereas the light intensity in the GB region of the ceramics with low reflectance is low. The amplitude A Sera GB is smaller than the light intensity amplitude A surrounding area .

上述のように同一視野内に極端に反射率が異なる部分が混在する場合、光強度振幅が大きい部分にカメラの階調範囲を合わせる必要があるため、強度振幅が小さい部分では分解能が下がることが考えられる。したがって、図4に示すように、光強度振幅が小さい領域では光強度振幅がカメラの性能に起因するノイズや、レンズなどの光学系で発生するノイズに強く影響を受け、結果的に高精度な測定を阻害する要因となる。つまり、同一画像内に光強度振幅が著しく異なる領域が混在する場合には画像検出器の階調を十分に使い切ることが不可能であり、結果的に位相信号のS/N比が悪化する危険性がある。
本発明は上記課題に鑑みなされたものであり、その目的は、干渉縞の測定に際し、光強度の異なる箇所が同一視野内に混在している場合においても、S/N比よく位相情報を抽出することができる干渉画像測定装置を提供することにある。
As described above, when parts with extremely different reflectances are mixed in the same field of view, it is necessary to match the gradation range of the camera to a part with a large light intensity amplitude, so the resolution may be lowered at a part with a small intensity amplitude. Conceivable. Therefore, as shown in FIG. 4, in a region where the light intensity amplitude is small, the light intensity amplitude is strongly affected by noise caused by the performance of the camera and noise generated in an optical system such as a lens, resulting in high accuracy. It becomes a factor that hinders measurement. In other words, if there are regions with significantly different light intensity amplitudes in the same image, it is impossible to fully use the gradation of the image detector, resulting in a risk that the S / N ratio of the phase signal deteriorates. There is sex.
The present invention has been made in view of the above problems, and its purpose is to extract phase information with a high S / N ratio even when locations with different light intensities coexist in the same field of view when measuring interference fringes. It is an object of the present invention to provide an interference image measurement apparatus capable of performing the above.

上記目的を達成するために本発明の干渉画像測定装置は、干渉光を検出して干渉縞画像を撮像する画像検出手段を備え、撮像した干渉縞画像に基づいて位相情報を取得する干渉画像測定装置であって、検出する干渉光の領域毎の光強度振幅情報と、該領域の空間的な配置情報とに基き、前記画像検出手段に入射する光量を調整、もしくは前記画像検出手段の信号レベル範囲を調整して干渉縞画像を撮像することによって、同一視野内の領域ごとに異なる光強度振幅を有する干渉光から、各領域での光強度振幅の範囲を画像検出手段の信号レベル範囲と適合するように調整された一つの干渉縞画像を取得することを特徴とする。   In order to achieve the above object, an interference image measurement apparatus according to the present invention includes an image detection unit that detects interference light and captures an interference fringe image, and obtains phase information based on the captured interference fringe image. An apparatus that adjusts the amount of light incident on the image detection unit based on light intensity amplitude information for each region of interference light to be detected and spatial arrangement information on the region, or a signal level of the image detection unit By adjusting the range and picking up the interference fringe image, the light intensity amplitude range in each region is matched with the signal level range of the image detection means from the interference light having different light intensity amplitude for each region in the same field of view. One interference fringe image adjusted so as to be acquired is obtained.

上記の干渉画像測定装置において、領域毎の光強度振幅の情報に基づいて前記画像検出手段の検出信号レベルを設定する検出レベル設定手段と、複数の干渉画像から一部分を抽出し、それらを合成して一つの干渉縞画像とする画像処理手段と、を備え、前記検出レベル設定手段により、画像検出手段の階調範囲を各領域での光強度振幅の範囲に適合するように変更して複数の干渉縞画像を撮像し、前記画像処理手段により、各領域毎に階調範囲が適切に設定された前記複数の干渉縞画像を合成して一つの干渉縞画像を取得することが好適である。   In the interference image measuring apparatus, the detection level setting means for setting the detection signal level of the image detection means based on the information of the light intensity amplitude for each region, and a part is extracted from the plurality of interference images and synthesized. Image processing means for making one interference fringe image, and the detection level setting means changes the gradation range of the image detection means to match the range of the light intensity amplitude in each region, and It is preferable that an interference fringe image is captured, and the image processing unit obtains one interference fringe image by synthesizing the plurality of interference fringe images in which gradation ranges are appropriately set for each region.

上記の干渉画像測定装置において、領域毎の光強度振幅の情報を基に、画像検出手段へ入射する入射光量を調節する入射光量調節手段と、領域毎に適切な検出レベルで撮像された複数の干渉縞画像から一部分を抽出し、それらを合成して一つの干渉縞画像とする画像処理手段と、を備え、前記入射光量調節手段によって所定領域からの入射光量を調整することで、該領域の光強度振幅を画像検出器の階調範囲に適合するように調整し、前記画像処理手段により、各領域毎に階調範囲が適切に設定された前記複数の干渉縞画像を合成して一つの干渉縞画像を取得することが好適である。   In the above interference image measuring device, based on the information on the light intensity amplitude for each region, an incident light amount adjusting unit that adjusts the incident light amount incident on the image detecting unit, and a plurality of images captured at an appropriate detection level for each region Image processing means for extracting a part from the interference fringe image and combining them into a single interference fringe image, and adjusting the incident light quantity from the predetermined area by the incident light quantity adjusting means, The light intensity amplitude is adjusted to match the gradation range of the image detector, and the plurality of interference fringe images in which the gradation range is appropriately set for each region are synthesized by the image processing means. It is preferable to acquire two interference fringe images.

上記の干渉画像測定装置において、測定干渉光を複数の光束に分割する光分割手段を備え、前記画像検出手段は、前記光分割手段によって分割された各光束を検出する複数の画像検出器を含み、前記複数の画像検出器により特定の光強度振幅を持つ領域毎に、光強度振幅に対して適切に調整された複数組の干渉画像を提供することが好適である。
上記の干渉画像測定装置において、特定の領域の光を選択的に減衰する減衰領域選択手段を備え、前記減衰領域選択手段を光路中に挿入することで前記特定領域内の光強度振幅を調整して、同一視野内の各領域の干渉光の光強度振幅を略同一にすることが好適である。
The interference image measuring apparatus includes a light dividing unit that divides measurement interference light into a plurality of light beams, and the image detection unit includes a plurality of image detectors that detect the light beams divided by the light dividing unit. It is preferable to provide a plurality of sets of interference images appropriately adjusted with respect to the light intensity amplitude for each region having a specific light intensity amplitude by the plurality of image detectors.
The interference image measuring apparatus includes an attenuation region selection unit that selectively attenuates light in a specific region, and adjusts the light intensity amplitude in the specific region by inserting the attenuation region selection unit into the optical path. Thus, it is preferable that the light intensity amplitude of the interference light in each region within the same field of view is substantially the same.

また、本発明の干渉画像測定装置は、干渉光を検出して干渉縞画像を撮像する画像検出手段を備え、撮像した干渉縞画像に基づいて位相情報を取得する干渉画像測定装置であって、前記画像検出手段は、検出する干渉光の領域毎の光強度振幅情報と、該領域の空間的な配置情報とに基き、受光面のピクセル毎または領域毎に、ゲインおよび/または露光時間が設定可能に構成されたことを特徴とする。   The interference image measurement device of the present invention is an interference image measurement device that includes image detection means for detecting interference light and capturing an interference fringe image, and acquires phase information based on the captured interference fringe image, The image detecting means sets the gain and / or exposure time for each pixel or each region of the light receiving surface based on the light intensity amplitude information for each region of the interference light to be detected and the spatial arrangement information of the region. It is configured to be possible.

本発明によれば、検出する干渉光の領域毎の光強度振幅情報と、該領域の空間的な配置情報とに基づき、前記画像検出手段に入射する光量を調整、もしくは前記画像検出手段の検出信号レベルを調整して干渉縞画像を撮像することによって、同一視野内の領域ごとに異なる光強度振幅を有する干渉光から、各領域での光強度振幅の範囲を画像検出手段の階調範囲と適合するように調整された一つの干渉縞画像を取得することとしたため、光強度の異なる箇所が同一視野内に混在している場合においても、S/N比よく位相情報を抽出することができる。   According to the present invention, the amount of light incident on the image detection unit is adjusted based on the light intensity amplitude information for each region of the interference light to be detected and the spatial arrangement information of the region, or the detection of the image detection unit. By picking up the interference fringe image by adjusting the signal level, the range of the light intensity amplitude in each region from the interference light having different light intensity amplitude for each region in the same field of view is defined as the gradation range of the image detection means. Since one interference fringe image adjusted to fit is acquired, phase information can be extracted with a high S / N ratio even when locations with different light intensities are mixed in the same field of view. .

以下に図面を参照して、本発明の好適な実施形態について説明する。また、以下の実施形態においては、各領域の光強度振幅と、それを検出器の階調範囲に適合させるための情報は事前に取得済みであり既知とする。
実施形態1
図5は本発明の第1の実施形態にかかる干渉画像測定装置の概略構成図である。図5の実施形態の干渉画像測定装置10は、干渉光を検出して干渉縞画像を取得するための画像検出手段(画像検出器12)と、該画像検出器12の検出信号レベルを設定する検出レベル設定手段14と、複数の干渉画像から一部分を抽出し、それらを合成して一つの干渉縞画像とする画像処理手段16と、を備える。検出レベル設定手段14により画像検出器12の階調範囲を、干渉縞画像の所定の領域の光強度振幅の範囲に略等しくなるよう調整し、干渉画像を撮像する。つまり、その領域において画像検出器の階調範囲を無駄なく使いきれるよう、画像検出器の階調範囲とその領域の光強度振幅の範囲が適合するように調整する。さらに、調整する領域を変更して干渉画像を撮像し、複数の干渉縞画像を取得し、こうして得られた複数の干渉画像から、画像処理手段16によって調整された領域を切り貼りして一つの干渉画像が作成される。
Hereinafter, preferred embodiments of the present invention will be described with reference to the drawings. In the following embodiments, the light intensity amplitude of each region and information for adapting it to the gradation range of the detector have been acquired in advance and are known.
Embodiment 1
FIG. 5 is a schematic configuration diagram of the interference image measuring apparatus according to the first embodiment of the present invention. The interference image measurement apparatus 10 of the embodiment of FIG. 5 sets image detection means (image detector 12) for acquiring interference fringe images by detecting interference light, and a detection signal level of the image detector 12. Detection level setting means 14 and image processing means 16 for extracting a part from a plurality of interference images and combining them into one interference fringe image are provided. The detection level setting means 14 adjusts the gradation range of the image detector 12 so as to be approximately equal to the light intensity amplitude range of a predetermined region of the interference fringe image, and captures an interference image. In other words, adjustment is made so that the gradation range of the image detector and the range of the light intensity amplitude of the region are matched so that the gradation range of the image detector can be used without waste in that region. Further, an interference image is picked up by changing the region to be adjusted, a plurality of interference fringe images are acquired, and the region adjusted by the image processing means 16 is cut and pasted from the plurality of interference images obtained in this way to obtain one interference. An image is created.

画像検出器12は、CCDカメラ等の画像検出器で構成される。本実施形態では画像検出器12はコンピュータ18等に接続され、該コンピュータ18は検出器の設定、取得データの記録などを行う。画像検出器12で所得した干渉縞画像情報は、コンピュータ18の記憶手段20に記憶される。画像処理手段16は、記憶手段20に記憶された干渉縞画像に対して画像処理を行うものである。
検出レベル設定手段14は、画像検出器12の検出レベルの設定を行うためのものである。検出レベルの調整は検出器のゲインを切り替える、シャッター速度(露光時間、すなわち光の蓄積時間)を切り替える等の方法で行えばよい。
以上が本実施形態の概略構成であり、以下にその作用を説明する。ここでは、特許文献1に記載された非密着光波干渉測定による寸法測定を想定して説明を行う。
The image detector 12 includes an image detector such as a CCD camera. In this embodiment, the image detector 12 is connected to a computer 18 or the like, and the computer 18 performs setting of the detector, recording of acquired data, and the like. The interference fringe image information obtained by the image detector 12 is stored in the storage means 20 of the computer 18. The image processing unit 16 performs image processing on the interference fringe image stored in the storage unit 20.
The detection level setting means 14 is for setting the detection level of the image detector 12. The detection level may be adjusted by a method such as switching the gain of the detector or switching the shutter speed (exposure time, that is, the light accumulation time).
The above is the schematic configuration of the present embodiment, and the operation thereof will be described below. Here, the description will be given assuming dimension measurement by non-contact optical interference measurement described in Patent Document 1.

本実施形態では、同一視野(撮像領域全体)内の画像を複数の領域に分け(ただし、一つの領域内では光強度振幅が略一定になるように分ける)、各領域ごとに干渉画像の取得を行う。つまり、非密着光波干渉測定の例でいうと、GB領域の干渉縞画像の取得と、周囲領域での干渉縞画像の取得をそれぞれ別個に行う。そして、検出レベル設定手段14によって画像検出器12の階調範囲を各領域での光強度振幅の範囲に適合するように設定し、複数の干渉縞画像をそれぞれ撮像する。すると、図6の(a)に示したような周囲領域において階調が適切に調整された干渉縞画像と、図6の(b)に示したようなブロックゲージ領域において階調が適切に調整された干渉縞画像とが得られ、コンピュータ12の記憶部20に記憶される。   In this embodiment, an image in the same field of view (entire imaging area) is divided into a plurality of areas (however, the intensity of light intensity is divided within one area so as to be substantially constant), and an interference image is acquired for each area. I do. That is, in the example of non-contact light wave interference measurement, acquisition of the interference fringe image in the GB region and acquisition of the interference fringe image in the surrounding region are performed separately. Then, the gradation range of the image detector 12 is set by the detection level setting means 14 so as to match the range of the light intensity amplitude in each region, and a plurality of interference fringe images are respectively captured. Then, the interference fringe image in which the gradation is appropriately adjusted in the surrounding area as shown in FIG. 6A and the gradation in the block gauge area as shown in FIG. 6B are appropriately adjusted. The interference fringe image thus obtained is obtained and stored in the storage unit 20 of the computer 12.

画像処理手段16では、周囲領域において階調が適切に設定された画像(図6の(a))から周囲領域部分の画像を切り出す(図6の(c))。同様にGB領域において階調が適切に設定された画像(図6の(b))からGB領域部分の画像を切り出す(図6の(d))。こうして得られた2つの画像(図6の(c),(d))を組み合わせて一つの干渉縞画像を合成する(図6の(e))。
このようにして得られた干渉縞画像を用いれば、画像内の全ての領域で階調が適切に調整されたものが得られるため、S/N比のよい測定が可能となる。つまり、周囲領域とGB領域それぞれの領域のみでカメラの階調を使い切るように調整された干渉画像を別個に取得し、それらを領域毎に組み合わせることで従来技術の問題点を解決したのである。
The image processing means 16 cuts out the image of the surrounding area from the image (FIG. 6A) in which the gradation is appropriately set in the surrounding area (FIG. 6C). Similarly, an image of the GB area is cut out from an image (FIG. 6B) in which the gradation is appropriately set in the GB area (FIG. 6D). The two images ((c) and (d) in FIG. 6) obtained in this way are combined to synthesize one interference fringe image ((e) in FIG. 6).
If the interference fringe image obtained in this way is used, an image in which the gradation is appropriately adjusted in all the regions in the image can be obtained, so that measurement with a good S / N ratio is possible. That is, the problem of the prior art is solved by separately acquiring interference images adjusted so that the gradation of the camera is used up only in each of the surrounding area and the GB area, and combining them for each area.

図7は、画像検出器のゲイン切り替えによる階調の調整の説明図である。ここでは、ブロックゲージの端面の領域での光強度振幅AGBが周囲領域の光強度振幅A周囲よりも小さい場合を仮定している。図7(a)は、画像検出器の階調範囲を周囲領域の光強度振幅A周囲に合わせた場合を示している。また図7(b)は、図7(a)のときよりも検出器のゲインを大きくとり、ブロックゲージ端面の領域における光強度振幅AGBの検出信号が、検出器の階調範囲に適合するようにしている。図7(b)の場合では、周囲領域での光強度振幅A周囲は、検出器の階調範囲を超えてしまうため飽和しているが、ブロックゲージ端面の領域では検出器の階調範囲は適切に設定されている。 FIG. 7 is an explanatory diagram of gradation adjustment by switching the gain of the image detector. Here, it is assumed that the light intensity amplitude A GB in the region of the end face of the block gauge is smaller than the surroundings of the light intensity amplitude A in the surrounding region. FIG. 7A shows a case where the gradation range of the image detector is matched with the periphery of the light intensity amplitude A in the surrounding area . In FIG. 7B, the gain of the detector is made larger than that in FIG. 7A, and the detection signal of the light intensity amplitude A GB in the area of the block gauge end face is adapted to the gradation range of the detector. I am doing so. In the case of FIG. 7B, the periphery of the light intensity amplitude A in the surrounding area is saturated because it exceeds the gradation range of the detector, but in the area of the block gauge end face, the gradation range of the detector is It is set properly.

図8は検出器のシャッター速度を変えて調整する方法の説明図である。図8(a)は、画像検出器の階調範囲を周囲領域の光強度振幅A周囲に合わせた場合を示している。図8(b)は、検出器のシャッター速度を遅く(露光時間を長く)し、GB領域からの干渉光の検出光強度振幅AGBが検出器の階調範囲に適合するようにしている。図8(b)の場合では、周囲領域での光強度振幅A周囲は、検出器の階調範囲を超えてしまうため飽和しているが、ブロックゲージ端面の領域では検出器の階調範囲は適切に設定されている。
また、位相シフト法によって光波干渉測定を行う場合、異なる位相シフト量の画像を複数撮像する必要があるが、画像取得の順序には特に制限はない。つまり、図9(a)に示すように、一回の位相シフト中の各ステップにおいて複数画像を取得しても、図9(b)に示すように組毎に位相シフトを複数回実施してもよく、またこれらの組み合わせでもよい。
FIG. 8 is an explanatory diagram of a method of adjusting by changing the shutter speed of the detector. FIG. 8A shows a case where the gradation range of the image detector is matched with the periphery of the light intensity amplitude A in the surrounding area . In FIG. 8B, the shutter speed of the detector is slow (exposure time is long), and the detected light intensity amplitude A GB of the interference light from the GB region is adapted to the gradation range of the detector. In the case of FIG. 8B, the periphery of the light intensity amplitude A in the surrounding area is saturated because it exceeds the gradation range of the detector, but in the area of the block gauge end face, the gradation range of the detector is It is set properly.
Further, when performing light wave interference measurement by the phase shift method, it is necessary to capture a plurality of images having different phase shift amounts, but there is no particular limitation on the order of image acquisition. That is, as shown in FIG. 9A, even if a plurality of images are acquired at each step during one phase shift, the phase shift is performed a plurality of times for each group as shown in FIG. 9B. Or a combination thereof.

実施形態2
第1の実施形態では、光強度に合わせ、検出器を調整したが、逆に入射する光強度自身を調整してもよい。次にこの場合を説明する。
図10は本発明の第2の実施形態にかかる干渉画像測定装置の概略構成図である。図10の干渉画像測定装置110は、画像検出手段(画像検出器112)と、領域毎の光強度振幅の情報を基に、画像検出手段へ入射する入射光量を調節する入射光量調節手段114と、画像検出手段(画像検出器112)と、複数の干渉画像から一部分を抽出し、それらを合成して一つの干渉縞画像とする画像処理手段116と、を備える。
Embodiment 2
In the first embodiment, the detector is adjusted in accordance with the light intensity. However, the incident light intensity itself may be adjusted. Next, this case will be described.
FIG. 10 is a schematic configuration diagram of an interference image measuring apparatus according to the second embodiment of the present invention. The interference image measurement apparatus 110 in FIG. 10 includes an image detection unit (image detector 112), an incident light amount adjustment unit 114 that adjusts an incident light amount incident on the image detection unit based on information on the light intensity amplitude for each region, and , Image detecting means (image detector 112), and image processing means 116 for extracting a part from a plurality of interference images and combining them into one interference fringe image.

ここで、入射光量調節手段114は光減衰板などで構成され、画像検出器112に入射する光量自体を調整する。つまり、光路中に挿入する光減衰板を変更することで透過する光量を調整できる。ただし、光減衰板の設置位置は、特に限定されない。
そして、第1の実施形態と同様に、干渉画像内の各領域の光強度振幅に合わせ、その光量が画像検出器112の階調範囲に適合するよう調整し、複数の干渉画像を撮像する。複数の干渉画像は、それぞれの異なった領域内でのみ適切に階調範囲が調整されている。これら複数の干渉縞画像から、画像処理手段116は、図6で説明したのと同様に、階調範囲が適切に調整された領域を切り貼りして一つの干渉画像を作成する。
Here, the incident light amount adjusting means 114 is constituted by a light attenuating plate or the like, and adjusts the light amount itself incident on the image detector 112. That is, the amount of transmitted light can be adjusted by changing the light attenuating plate inserted in the optical path. However, the installation position of the light attenuation plate is not particularly limited.
Then, similarly to the first embodiment, the light intensity amplitude of each region in the interference image is adjusted so that the amount of light matches the gradation range of the image detector 112, and a plurality of interference images are captured. The plurality of interference images are appropriately adjusted in gradation range only in different areas. From the plurality of interference fringe images, the image processing means 116 cuts and pastes a region in which the gradation range is appropriately adjusted, as described with reference to FIG. 6, and creates one interference image.

実施形態3
次に複数検出器を使用する場合を説明する。干渉後の光をそれぞれ必要な領域数に分割し、あらかじめ特性が分かった、または特性の揃った検出器で領域毎に検出することで、従来技術の問題点を解決することが可能である。
図11は本発明の第3の実施形態にかかる干渉画像測定装置の概略構成図である。図11の干渉画像測定装置210は、干渉光を複数の光束に分割する光分割手段222と、該光分割手段222によって分割された各光束を検出する複数の画像検出器212a,bと、画像処理手段216とを備える。光分割手段222は、ビームスプリッタなどの素子で構成されている。また、図11では2光束に分割した例を示したが、分割する領域の数に応じて変更すればよい。
Embodiment 3
Next, a case where a plurality of detectors are used will be described. It is possible to solve the problems of the prior art by dividing the light after interference into the required number of areas and detecting each area with a detector whose characteristics are known in advance or whose characteristics are uniform.
FIG. 11 is a schematic configuration diagram of an interference image measuring apparatus according to the third embodiment of the present invention. The interference image measuring apparatus 210 in FIG. 11 includes a light dividing unit 222 that divides interference light into a plurality of light beams, a plurality of image detectors 212a and 212b that detect each light beam divided by the light dividing unit 222, and an image. And processing means 216. The light dividing means 222 is composed of an element such as a beam splitter. Moreover, although the example divided | segmented into 2 light beams was shown in FIG. 11, what is necessary is just to change according to the number of the area | regions to divide | segment.

画像検出器212a,bの階調範囲は、それぞれの各領域の光強度振幅に適合するように設定されている。例えば、画像検出器212aの階調範囲はGB領域の光強度振幅に、画像検出器212bの階調範囲は周囲領域の光強度振幅に適合するよう調整する。また、この調整は第1の実施形態のように、検出器自体を調整してもよいし、第2の実施形態のように入射光量自体を調整してもよい。
それぞれの画像検出器212a,bで検出された干渉縞画像の情報は、コンピュータ218に送られ、記憶部220に記憶される。そして、第1の実施形態と同様に、画像処理手段216によって、複数の干渉縞画像から、各領域での階調範囲が適切に設定された一つの干渉縞画像を得る。このように複数の検出器を用いた構成とすることで、短時間で画像の取得を行うことができる。
The gradation ranges of the image detectors 212a and 212b are set so as to match the light intensity amplitude of each region. For example, the gradation range of the image detector 212a is adjusted to match the light intensity amplitude of the GB region, and the gradation range of the image detector 212b is adjusted to match the light intensity amplitude of the surrounding region. Further, this adjustment may be performed by adjusting the detector itself as in the first embodiment, or by adjusting the amount of incident light itself as in the second embodiment.
Information on the interference fringe images detected by the respective image detectors 212 a and 212 b is sent to the computer 218 and stored in the storage unit 220. Then, as in the first embodiment, the image processing unit 216 obtains one interference fringe image in which the gradation range in each region is appropriately set from the plurality of interference fringe images. Thus, by using a configuration using a plurality of detectors, an image can be acquired in a short time.

上記の実施形態においては、異なる階調範囲に調整された複数の画像を用いて、階調範囲が適切に調整された干渉画像を得る場合を示したが、次にあげる実施形態4、5では一回の撮像で、同一視野内の全ての領域の階調範囲を適切に設定することができる。
実施形態4
図12は本発明の第4の実施形態にかかる干渉画像測定装置の概略構成図である。図12の干渉画像測定装置310は、画像検出器312と、特定の領域の光を選択的に減衰する減衰領域選択手段314とを備えている。
減衰領域選択手段314は、減衰させたい領域の形状に合わせて製作された光減衰板などで構成される。この減衰領域選択手段314を必要に応じて光路中に挿入することで特定領域内の光強度振幅を調整し、同一視野内の各領域の干渉光の光強度振幅を略同一にする。例えば、非密着光波干渉測定を例に説明すると、図13に示されるように、GB領域の部分に穴を設けた減衰板を光路中に挿入し、周囲領域光を減衰させGB領域からの光とほぼ同等の強度振幅としている。すると、画像検出器312の階調範囲をGB領域の光強度振幅に適合させることによって、自動的に周囲領域の光強度振幅とも適合する。その結果、一つの干渉縞画像を撮像するのみで、各領域での階調範囲が適切に設定された干渉縞画像を得ることができる。
In the above embodiment, a case has been described in which an interference image in which the gradation range is appropriately adjusted is obtained using a plurality of images adjusted in different gradation ranges. The gradation range of all the areas in the same visual field can be appropriately set by one imaging.
Embodiment 4
FIG. 12 is a schematic configuration diagram of an interference image measuring apparatus according to the fourth embodiment of the present invention. The interference image measurement apparatus 310 of FIG. 12 includes an image detector 312 and attenuation region selection means 314 that selectively attenuates light in a specific region.
The attenuation region selection means 314 is composed of an optical attenuation plate manufactured according to the shape of the region to be attenuated. The attenuation region selection means 314 is inserted into the optical path as necessary to adjust the light intensity amplitude in the specific region, so that the light intensity amplitude of the interference light in each region in the same field of view is substantially the same. For example, the non-contact light wave interference measurement will be described as an example. As shown in FIG. 13, an attenuation plate having a hole in the GB region is inserted into the optical path to attenuate the surrounding region light and to reduce the light from the GB region. The intensity amplitude is almost the same. Then, by adjusting the gradation range of the image detector 312 to the light intensity amplitude of the GB region, the light intensity amplitude of the surrounding region is automatically adapted. As a result, it is possible to obtain an interference fringe image in which the gradation range in each region is appropriately set only by capturing one interference fringe image.

実施形態5
図14は本発明の第5の実施形態にかかる干渉画像測定装置の概略構成図である。図14の干渉画像測定装置410では、画像検出器412として、露光時間や信号読み出し時のゲインの設定が、受光面のピクセル毎(もしくは、所定の範囲ごと)に変更可能であるものを使用する。例えば、CMOS方式のものを用いればよい。
本実施形態の画像検出器412では、検出する干渉光の領域毎の光強度振幅情報と、該領域の空間的な配置情報とに基き、受光面のピクセル毎(もしくは領域毎)に露光時間、および/またはゲインの設定を行う。その結果、一回の画像の撮像で各領域での階調範囲が適切に設定された干渉縞画像を得ることができ、位相情報をS/N比よく抽出することができる。
以上説明したように、本発明の干渉画像測定装置によれば、光強度の異なる箇所が同一視野内に混在している場合においても、それぞれの箇所が適切な階調範囲に調整された干渉画像を得ることができるため、S/N比よく位相情報を抽出することができる。
Embodiment 5
FIG. 14 is a schematic configuration diagram of an interference image measuring apparatus according to the fifth embodiment of the present invention. In the interference image measurement apparatus 410 in FIG. 14, an image detector 412 that can change the exposure time and the gain setting at the time of signal readout for each pixel (or for each predetermined range) on the light receiving surface is used. . For example, a CMOS method may be used.
In the image detector 412 of the present embodiment, based on the light intensity amplitude information for each area of the interference light to be detected and the spatial arrangement information of the area, the exposure time for each pixel (or each area) of the light receiving surface, And / or set gain. As a result, an interference fringe image in which the gradation range in each region is appropriately set can be obtained by capturing an image once, and phase information can be extracted with a high S / N ratio.
As described above, according to the interference image measuring apparatus of the present invention, even when locations with different light intensities are mixed in the same field of view, the interference images in which each location is adjusted to an appropriate gradation range. Therefore, phase information can be extracted with a high S / N ratio.

干渉画像内領域と位相情報の取得地点の説明図。Explanatory drawing of the acquisition point of the area | region in an interference image, and phase information. 反射率と干渉縞の光強度振幅の関係についての説明図。Explanatory drawing about the relationship between a reflectance and the light intensity amplitude of an interference fringe. 反射率による光強度振幅の違いについての説明図。Explanatory drawing about the difference in the light intensity amplitude by a reflectance. 光強度と検出器階調の関係の説明図。Explanatory drawing of the relationship between light intensity and a detector gradation. 本発明の第1の実施形態にかかる干渉画像測定装置の概略構成図。1 is a schematic configuration diagram of an interference image measuring apparatus according to a first embodiment of the present invention. 本実施形態の装置における画像処理の説明図。Explanatory drawing of the image process in the apparatus of this embodiment. 検出器で使用する階調の調整の説明図。Explanatory drawing of adjustment of the gradation used with a detector. 検出器で観測される光強度の調整の説明図。Explanatory drawing of adjustment of the light intensity observed with a detector. 位相シフト法で測定する場合の画像取得順序の説明図。Explanatory drawing of the image acquisition order in the case of measuring by a phase shift method. 本発明の第2の実施形態にかかる干渉画像測定装置の概略構成図。The schematic block diagram of the interference image measuring device concerning the 2nd Embodiment of this invention. 本発明の第3の実施形態にかかる干渉画像測定装置の概略構成図。The schematic block diagram of the interference image measuring device concerning the 3rd Embodiment of this invention. 本発明の第4の実施形態にかかる干渉画像測定装置の概略構成図。The schematic block diagram of the interference image measuring device concerning the 4th Embodiment of this invention. 第4の実施形態の干渉画像測定装置の説明図。Explanatory drawing of the interference image measuring device of 4th Embodiment. 本発明の第5の実施形態にかかる干渉画像測定装置の概略構成図。The schematic block diagram of the interference image measuring device concerning the 5th Embodiment of this invention.

符号の説明Explanation of symbols

10 干渉画像測定装置
12 画像検出器
14 画像処理手段
16 検出レベル設定手段
DESCRIPTION OF SYMBOLS 10 Interference image measuring device 12 Image detector 14 Image processing means 16 Detection level setting means

Claims (6)

干渉光を検出して干渉縞画像を撮像する画像検出手段を備え、撮像した干渉縞画像に基づいて位相情報を取得する干渉画像測定装置であって、
検出する干渉光の領域毎の光強度振幅情報と、該領域の空間的な配置情報とに基き、前記画像検出手段に入射する光量を調整、もしくは前記画像検出手段の信号レベル範囲を調整して干渉縞画像を撮像することによって、
同一視野内の領域ごとに異なる光強度振幅を有する干渉光から、各領域での光強度振幅の範囲を画像検出手段の信号レベル範囲と適合するように調整された一つの干渉縞画像を取得することを特徴とする干渉画像測定装置。
An interference image measurement device that includes an image detection unit that detects interference light and captures an interference fringe image, and obtains phase information based on the captured interference fringe image,
Based on the light intensity amplitude information for each area of the interference light to be detected and the spatial arrangement information of the area, the amount of light incident on the image detection means is adjusted, or the signal level range of the image detection means is adjusted. By capturing the interference fringe image
One interference fringe image adjusted so that the range of the light intensity amplitude in each region matches the signal level range of the image detection means is acquired from the interference light having different light intensity amplitude for each region in the same field of view. An interference image measuring apparatus characterized by that.
請求項1に記載の干渉画像測定装置において、
領域毎の光強度振幅の情報に基づいて前記画像検出手段の検出信号レベルを設定する検出レベル設定手段と、
複数の干渉画像から一部分を抽出し、それらを合成して一つの干渉縞画像とする画像処理手段と、を備え、
前記検出レベル設定手段により、画像検出手段の階調範囲を各領域での光強度振幅の範囲に適合するように変更して複数の干渉縞画像を撮像し、前記画像処理手段により、各領域毎に階調範囲が適切に設定された前記複数の干渉縞画像を合成して一つの干渉縞画像を取得することを特徴とする干渉画像測定装置。
The interference image measurement apparatus according to claim 1,
Detection level setting means for setting a detection signal level of the image detection means based on information of light intensity amplitude for each region;
Image processing means for extracting a part from a plurality of interference images and combining them into one interference fringe image,
The detection level setting means changes the gradation range of the image detection means so as to match the range of the light intensity amplitude in each area, and captures a plurality of interference fringe images. An interference image measurement apparatus characterized in that a plurality of interference fringe images having a gradation range appropriately set are combined to obtain one interference fringe image.
請求項1に記載の干渉画像測定装置において、
領域毎の光強度振幅の情報を基に、画像検出手段へ入射する入射光量を調節する入射光量調節手段と、
領域毎に適切な検出レベルで撮像された複数の干渉縞画像から一部分を抽出し、それらを合成して一つの干渉縞画像とする画像処理手段と、
を備え、
前記入射光量調節手段によって所定領域からの入射光量を調整することで、該領域の光強度振幅を画像検出器の階調範囲に適合するように調整し、前記画像処理手段により、各領域毎に階調範囲が適切に設定された前記複数の干渉縞画像を合成して一つの干渉縞画像を取得することを特徴とする干渉画像測定装置。
The interference image measurement apparatus according to claim 1,
Based on the information of the light intensity amplitude for each region, the incident light amount adjusting means for adjusting the incident light amount incident on the image detecting means,
Image processing means for extracting a part from a plurality of interference fringe images captured at an appropriate detection level for each region and combining them into one interference fringe image;
With
By adjusting the amount of incident light from a predetermined region by the amount of incident light adjusting means, the light intensity amplitude of the region is adjusted so as to match the gradation range of the image detector, and by the image processing means, An interference image measurement apparatus characterized in that a plurality of interference fringe images having a gradation range appropriately set are combined to obtain one interference fringe image.
請求項2または3のいずれかに記載の干渉画像測定装置において、
測定干渉光を複数の光束に分割する光分割手段を備え、
前記画像検出手段は、前記光分割手段によって分割された各光束を検出する複数の画像検出器を含み、
前記複数の画像検出器により特定の光強度振幅を持つ領域毎に、光強度振幅に対して適切に調整された複数組の干渉画像を提供することを特徴とする画像測定装値。
In the interference image measuring device according to claim 2 or 3,
Comprising a light splitting means for splitting the measurement interference light into a plurality of light fluxes;
The image detecting means includes a plurality of image detectors for detecting each light beam divided by the light dividing means,
An image measurement apparatus for providing a plurality of sets of interference images appropriately adjusted with respect to light intensity amplitude for each region having a specific light intensity amplitude by the plurality of image detectors.
請求項1に記載の干渉画像測定装置において、
特定の領域の光を選択的に減衰する減衰領域選択手段を備え、前記減衰領域選択手段を光路中に挿入することで前記特定領域内の光強度振幅を調整して、同一視野内の各領域の干渉光の光強度振幅を略同一にすることを特徴とする干渉画像測定装置。
The interference image measurement apparatus according to claim 1,
Attenuating area selecting means for selectively attenuating light in a specific area, and adjusting the light intensity amplitude in the specific area by inserting the attenuating area selecting means in the optical path, thereby each area in the same field of view. An interference image measuring apparatus characterized in that the light intensity amplitudes of the interference light beams are substantially the same.
干渉光を検出して干渉縞画像を撮像する画像検出手段を備え、撮像した干渉縞画像に基づいて位相情報を取得する干渉画像測定装置であって、
前記画像検出手段は、検出する干渉光の領域毎の光強度振幅情報と、該領域の空間的な配置情報とに基き、受光面のピクセル毎または領域毎に、ゲインおよび/または露光時間が設定可能に構成されたことを特徴とする干渉画像測定装置。
An interference image measurement device that includes an image detection unit that detects interference light and captures an interference fringe image, and obtains phase information based on the captured interference fringe image,
The image detecting means sets the gain and / or exposure time for each pixel or each region of the light receiving surface based on the light intensity amplitude information for each region of the interference light to be detected and the spatial arrangement information of the region. An interference image measurement apparatus characterized by being configured.
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Cited By (5)

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JP2008281391A (en) * 2007-05-09 2008-11-20 Pulstec Industrial Co Ltd Apparatus and method for measuring three-dimensional shape
JP2009222399A (en) * 2008-03-13 2009-10-01 Nikon Corp Image gain adjusting device and method, and three-dimensional shape measuring instrument
US9060117B2 (en) 2011-12-23 2015-06-16 Mitutoyo Corporation Points from focus operations using multiple light settings in a machine vision system
JP2016164557A (en) * 2015-02-27 2016-09-08 株式会社東京精密 Surface shape measurement device and surface shape measurement method
CN112179505A (en) * 2020-09-23 2021-01-05 中国科学院光电技术研究所 Image processing device and method based on wedge-shaped flat plate shearing interferometer

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008281391A (en) * 2007-05-09 2008-11-20 Pulstec Industrial Co Ltd Apparatus and method for measuring three-dimensional shape
JP2009222399A (en) * 2008-03-13 2009-10-01 Nikon Corp Image gain adjusting device and method, and three-dimensional shape measuring instrument
US9060117B2 (en) 2011-12-23 2015-06-16 Mitutoyo Corporation Points from focus operations using multiple light settings in a machine vision system
JP2016164557A (en) * 2015-02-27 2016-09-08 株式会社東京精密 Surface shape measurement device and surface shape measurement method
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