JP2005241641A - コンピュータ断層撮影装置の散乱及びビームハードニング補正 - Google Patents
コンピュータ断層撮影装置の散乱及びビームハードニング補正 Download PDFInfo
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- 239000000463 material Substances 0.000 abstract description 8
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- 238000002083 X-ray spectrum Methods 0.000 abstract description 4
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Abstract
【解決手段】 散乱を補正する方法は、複数の投影データ(10)から対象物の3D画像(12)のボクセル化表示(14)を得る段階を含む。対象物の単独散乱プロファイルが対象物の3D画像(12)のボクセル化表示を用いて計算される。対象物の全体散乱プロファイルが単独散乱プロファイル(13)及び調整係数を用いて求められ、全体散乱プロファイルを用いて投影データ(10)を補正して散乱補正投影データ(18)を得る。
ビームハードニング補正方法は、X線スペクトル、対象物材料、及び検出器スペクトル応答についての減弱データをシミュレートする段階を含む。減弱データに関数が当てはめられて減弱曲線を得る。
【選択図】 図2
Description
12 3D画像
14 ボクセル化表示
Claims (10)
- 複数の投影データ(10)から対象物(20)の3D画像(12)のボクセル化表示(14)を取得する段階と、
前記対象物(20)の3D画像(12)のボクセル化表示(14)を用いて前記対象物(20)の単独散乱プロファイルを計算する段階と、
前記単独散乱プロファイル及び調整係数を用いて前記対象物(20)の全体散乱プロファイルを求める段階と、
前記全体散乱プロファイルを用いて前記投影データ(10)を補正し、散乱補正投影データ(18)を取得する段階と、
を含む散乱補正方法。 - 前記散乱補正投影データ(18)を再構成して散乱補正3D画像(16)を取得する段階を更に含む請求項1に記載の方法。
- 前記投影データ(10)が生CT画像データを含む請求項1に記載の方法。
- 前記投影データ(10)が複数の投影生コンピュータ断層撮影(CT)データ(10)を含む請求項3に記載の方法。
- 前記対象物の全体散乱プロファイルを求める前記段階が、前記単独散乱プロファイルを調整係数と乗算する段階を含む請求項3に記載の方法。
- 前記対象物の全体散乱プロファイルを求める前記段階が、前記単独散乱プロファイル及び多散乱プロファイルの合計として前記全体散乱プロファイルを表す段階を更に含み、前記多散乱プロファイルが前記単独散乱プロファイルと調整係数との乗算により得られることを特徴とする請求項5に記載の方法。
- 前記投影データ(10)の補正が、該投影データ(10)から前記全体散乱プロファイルを差し引いて前記散乱補正投影データ(18)を取得する段階を含む請求項3に記載の方法。
- 前記対象物(20)の3D画像(12)のボクセル化表示(14)を取得する前記段階が、複数のボクセル(22)を結合して個別の大きなボクセル(24)を形成する段階を更に含む請求項3に記載の方法。
- 前記対象物(20)の3D画像(12)のボクセル化表示(14)が複数のボクセル(22、26、28)を含み、前記対象物の3D画像のボクセル化表示を取得する前記段階が更に、
前記3D画像(12)の閾値を求める段階と、
前記ボクセル(22、26、28)の各々のCT値を前記閾値と比較する段階と、
前記比較に基づいて前記複数のボクセル(26、28)を除去して前記対象物(20)のボクセル化表示(14)を単純化する段階と、
を含む請求項3に記載の方法。 - 前記対象物の散乱補正3D画像(16)を分析する段階と、
前記分析に基づいて調整係数を改良する段階と、
前記単独散乱プロファイル及び前記調整係数を用いて前記対象物の全体散乱プロファイルを再計算する段階と、
前記全体散乱プロファイルを用いて前記投影データ(10)を補正し前記散乱補正投影データ(18)を取得する段階と、
を更に含み、
前記分析、改良、再計算、及び補正段階が、満足できる散乱補正画像が得られるまで繰り返される請求項3に記載の方法。
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US10/784,099 | 2004-02-23 | ||
US10/784,099 US7065234B2 (en) | 2004-02-23 | 2004-02-23 | Scatter and beam hardening correction in computed tomography applications |
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JP2014083234A (ja) * | 2012-10-24 | 2014-05-12 | Shimadzu Corp | 散乱線補正方法、画像処理装置および断層撮影装置 |
JP2017113526A (ja) * | 2015-10-09 | 2017-06-29 | コミサリア ア レネルジ アトミク エ オウ エネルジ アルタナティヴ | スペクトルを修正するための方法 |
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FR2897255B1 (fr) | 2006-02-10 | 2008-03-14 | Commissariat Energie Atomique | Procede d'estimation du rayonnement diffuse en tomographie par rayons x |
US8000435B2 (en) * | 2006-06-22 | 2011-08-16 | Koninklijke Philips Electronics N.V. | Method and system for error compensation |
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US7336760B2 (en) * | 2006-07-28 | 2008-02-26 | Varian Medical Systems Technologies, Inc. | Methods, systems, and computer-program products to estimate scattered radiation in cone-beam computerized tomographic images and the like |
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DE102007020065A1 (de) * | 2007-04-27 | 2008-10-30 | Siemens Ag | Verfahren für die Erstellung von Massenbelegungsbildern anhand von in unterschiedlichen Energiebereichen aufgenommenen Schwächungsbildern |
EP2009592B1 (de) | 2007-06-25 | 2013-03-06 | EMPA Eidgenössische Materialprüfungs- und Forschungsanstalt | Verfahren zur Streukorrektur von röntgentomografischen Daten |
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WO2009141767A1 (en) | 2008-05-21 | 2009-11-26 | Koninklijke Philips Electronics N.V. | Method and apparatus for scatter correction |
CN102160085B (zh) | 2008-09-16 | 2013-11-20 | 皇家飞利浦电子股份有限公司 | 成像装置 |
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JP2017113526A (ja) * | 2015-10-09 | 2017-06-29 | コミサリア ア レネルジ アトミク エ オウ エネルジ アルタナティヴ | スペクトルを修正するための方法 |
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US7065234B2 (en) | 2006-06-20 |
US20050185753A1 (en) | 2005-08-25 |
EP1566771A1 (en) | 2005-08-24 |
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