JP2005101581A - 半導体装置 - Google Patents

半導体装置 Download PDF

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Publication number
JP2005101581A
JP2005101581A JP2004247664A JP2004247664A JP2005101581A JP 2005101581 A JP2005101581 A JP 2005101581A JP 2004247664 A JP2004247664 A JP 2004247664A JP 2004247664 A JP2004247664 A JP 2004247664A JP 2005101581 A JP2005101581 A JP 2005101581A
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JP
Japan
Prior art keywords
region
semiconductor device
trench
element formation
insulating film
Prior art date
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JP2004247664A
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English (en)
Japanese (ja)
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JP2005101581A5 (https=
Inventor
Yoshio Sugi
祥夫 杉
Naoto Fujishima
直人 藤島
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
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Fuji Electric Holdings Ltd
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Publication date
Application filed by Fuji Electric Holdings Ltd filed Critical Fuji Electric Holdings Ltd
Priority to JP2004247664A priority Critical patent/JP2005101581A/ja
Publication of JP2005101581A publication Critical patent/JP2005101581A/ja
Publication of JP2005101581A5 publication Critical patent/JP2005101581A5/ja
Withdrawn legal-status Critical Current

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  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Thin Film Transistor (AREA)
JP2004247664A 2003-08-29 2004-08-27 半導体装置 Withdrawn JP2005101581A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2004247664A JP2005101581A (ja) 2003-08-29 2004-08-27 半導体装置

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2003209751 2003-08-29
JP2004247664A JP2005101581A (ja) 2003-08-29 2004-08-27 半導体装置

Publications (2)

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JP2005101581A true JP2005101581A (ja) 2005-04-14
JP2005101581A5 JP2005101581A5 (https=) 2007-08-30

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ID=34466743

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JP2004247664A Withdrawn JP2005101581A (ja) 2003-08-29 2004-08-27 半導体装置

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JP (1) JP2005101581A (https=)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2019054106A (ja) * 2017-09-14 2019-04-04 株式会社東芝 半導体装置
JP2019519116A (ja) * 2016-06-21 2019-07-04 無錫華潤上華科技有限公司Csmc Technologies Fab2 Co., Ltd. 横型絶縁ゲートバイポーラトランジスタ及びその製造方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03194974A (ja) * 1989-12-22 1991-08-26 Fuji Electric Co Ltd Mos型半導体装置
JPH07254609A (ja) * 1994-03-15 1995-10-03 Toshiba Corp 半導体装置
JP2001127287A (ja) * 1999-10-27 2001-05-11 Toshiba Corp 絶縁ゲート型半導体装置
JP2002280549A (ja) * 2001-03-21 2002-09-27 Fuji Electric Co Ltd 半導体装置および半導体装置の製造方法
JP2002353447A (ja) * 2001-05-30 2002-12-06 Fuji Electric Co Ltd 半導体装置

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03194974A (ja) * 1989-12-22 1991-08-26 Fuji Electric Co Ltd Mos型半導体装置
JPH07254609A (ja) * 1994-03-15 1995-10-03 Toshiba Corp 半導体装置
JP2001127287A (ja) * 1999-10-27 2001-05-11 Toshiba Corp 絶縁ゲート型半導体装置
JP2002280549A (ja) * 2001-03-21 2002-09-27 Fuji Electric Co Ltd 半導体装置および半導体装置の製造方法
JP2002353447A (ja) * 2001-05-30 2002-12-06 Fuji Electric Co Ltd 半導体装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2019519116A (ja) * 2016-06-21 2019-07-04 無錫華潤上華科技有限公司Csmc Technologies Fab2 Co., Ltd. 横型絶縁ゲートバイポーラトランジスタ及びその製造方法
US10770572B2 (en) 2016-06-21 2020-09-08 Csmc Technologies Fab2 Co., Ltd. Lateral insulated-gate bipolar transistor and manufacturing method therefor
JP2019054106A (ja) * 2017-09-14 2019-04-04 株式会社東芝 半導体装置

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