JP2005049247A - Floodlight using white light source, and three-dimensional shape measuring device using it - Google Patents

Floodlight using white light source, and three-dimensional shape measuring device using it Download PDF

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Publication number
JP2005049247A
JP2005049247A JP2003282282A JP2003282282A JP2005049247A JP 2005049247 A JP2005049247 A JP 2005049247A JP 2003282282 A JP2003282282 A JP 2003282282A JP 2003282282 A JP2003282282 A JP 2003282282A JP 2005049247 A JP2005049247 A JP 2005049247A
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Japan
Prior art keywords
light source
measured
white light
dimensional shape
image data
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Pending
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JP2003282282A
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Japanese (ja)
Inventor
Masatoshi Noguchi
雅敏 野口
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Graphtec Corp
グラフテック株式会社
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Priority to JP2003282282A priority Critical patent/JP2005049247A/en
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Abstract

When a white light source is used as a light source of a projector, the inefficiency of wastefully consuming most of the light flux of the light source and the problem of significantly increasing the manufacturing cost of the projector itself are solved.
A plurality of white light sources are arranged in a first direction, and a plurality of openings provided corresponding to the plurality of white light sources are alternately arranged in a second direction orthogonal to the first direction. And a mask portion provided so that openings adjacent to each other overlap in a minute region in the second direction, and a white light source is selected as a white light source on one side and a white light source on the other side in the second direction By controlling the light emission automatically, the light source control unit causes the white light source on one side to emit light and the cutting line formed on the surface of the object to be measured is imaged by the imaging means, and then the white light source on the other side is A cutting line formed on the surface of the object to be measured is imaged by the imaging means, and the obtained image data is processed to measure the three-dimensional shape of the object to be measured.
[Selection] Figure 1

Description

  The present invention relates to an apparatus for irradiating an object to be measured with sheet light and measuring its three-dimensional shape.

As a means for measuring the three-dimensional shape of an object to be measured, a non-contact type three-dimensional shape measuring apparatus using a light cutting method has been conventionally used.
JP 05-026638 A Japanese Patent No. 2582215

FIG. 7 is a diagram showing a basic configuration of a three-dimensional shape measuring apparatus using this type of light cutting method. In the figure, 1 is a projector that generates slit light and irradiates the object to be measured, and 3 is an object 2 to be measured. A CCD camera 4 as an image pickup means for picking up an image of a cutting line formed on the surface 4 is a turntable on which the object 2 to be measured is placed and rotated. The projector 1 is positioned so that the slit light to be irradiated coincides with the rotation axis of the turntable 4.
In the three-dimensional shape measuring apparatus using this light cutting method, the position and angle of the projector 1 and the CCD camera 3 as the imaging means are predetermined with respect to the reference line with respect to the center line of the turntable 4, that is, the rotation axis. The optical cutting plane formed by the slit light from the projector 1 irradiated on the surface of the object 2 to be measured, that is, the cutting line, is imaged by the CCD camera 3 and captured. The coordinate value of each point on the cutting line with respect to the reference line (that is, the rotation axis of the turntable 4), that is, the slit light, is obtained using the cutting line data and the preset values such as the installation angle of the CCD camera 3 held in advance. The actual cross-sectional shape of the object to be measured 2 being irradiated is calculated.
By calculating the cross-sectional shape each time the unit angle turntable 4 is rotated, the shape of the entire surface of the measurement object 2 is three-dimensionally digitized.

  In the three-dimensional shape measuring apparatus using this light cutting method, it is desirable that the reflected light of the cutting line is thin and bright, and this can improve the measurement accuracy. Therefore, in order to realize this, a projector is shown in FIG. As shown, a laser light source 5 having a laser light emitting diode, and a lens 61 provided for focus adjustment so that the laser light emitted from the laser light source is condensed on a reference line, that is, the rotation axis of the turntable 4; The optical system is composed of a cylindrical lens 62 that diffuses the laser light transmitted through the lens 61 in the direction of the reference line to form slit light.

  In the three-dimensional shape measuring apparatus using a laser light emitting diode as a light source for the projector, since the light emitted from the laser diode has almost a single wavelength, the surface of the object to be measured is, for example, near 600 nm (red). When the color is a green to blue region (red complementary color region), the slit light is absorbed by the object to be measured, and the reflected light intensity is lowered, so that the cutting line cannot be measured in the worst case. The problem that occurred.

  In order to solve this problem, as shown in FIG. 9, a white light source is used as a light source, slit light is generated by passing through a slit, and this is applied to an object to be measured. In this case, the distance between the slits 1 is narrowed in order to obtain a thin cutting line, so that the amount of light passing through the slit is remarkably reduced, and in order to obtain the desired reflected light, the light emission amount of the light source is increased. As a result, the manufacturing cost of the device itself increases, and new troubles such as the need to take measures against heat generation of the projector occur.

  The problem to be solved is that when a white light source is used as the light source of the projector, the inefficiency of wasting most of the light flux of the light source and the production cost of the projector itself are significantly increased. It is.

  In the present invention, a plurality of white light sources are arranged in a first direction, and a plurality of openings provided corresponding to the plurality of white light sources are alternately arranged in a second direction orthogonal to the first direction. A mask portion provided so that openings adjacent to each other overlap in a minute region in the second direction, and a first light for condensing light from a light source irradiated through the mask portion in the vicinity of the object to be measured The projector includes a lens and a second lens unit for diffusing the light transmitted through the first lens in the first direction, and a plurality of projectors corresponding to openings arranged alternately in the second direction. The white light source is selectively controlled to emit light with the white light source on one side and the white light source on the other side in the second direction, so that the white light source on the one side is caused to emit light by the light source control unit. Imaging the irradiation area formed on the surface of the object to be measured by imaging means Subsequently, the irradiation area formed on the surface of the object to be measured is emitted by emitting the white light source on the other side by the imaging means, and each obtained image data is processed and processed on the object to be measured. The main feature is that image data equivalent to irradiation with slit light can be obtained.

  The present invention can use a relatively inexpensive light-emitting element such as a white LED, is less affected by the surface color of the object to be measured, and efficiently combines the image processing without reducing the luminous flux. There is an effect that a thin cutting line can be obtained.

Hereinafter, a projector using the white light source of the present invention and a three-dimensional shape measuring apparatus using the same will be described with reference to the drawings.
FIG. 1 is a diagram showing a configuration of a projector according to the present invention and a three-dimensional shape measuring apparatus using the same, and components equivalent to those of the above-described conventional apparatus are denoted by the same reference numerals.
Also in the three-dimensional shape measuring apparatus of the present invention, as in the above-described conventional apparatus, a white light projector for the reference line with reference to the center line of the turntable 4 on which the object 2 to be measured 2 is placed, that is, the rotation axis. 1 and the position and angle of the CCD camera 3 that is an image pickup means are held as predetermined default values, respectively, and are formed by a sheet-like light beam from the projector 1 irradiated on the surface of the object 2 to be measured. The irradiated area is picked up by the CCD camera 3, and the reference line (that is, the rotation axis of the turntable 4) is used by using the picked up irradiation area and the preset values such as the installation angle of the CCD camera 3 held in advance. The coordinate value of each point on the cutting line with respect to, that is, the actual cross-sectional shape of the object 2 to be measured that is detected when the slit light is irradiated, is calculated. Position by calculating the cross-sectional shape to each rotation angle turntable 4 is configured to three-dimensionally quantify the overall shape surface to the object 2 to be measured.

FIG. 2 is a diagram showing a configuration of a projector using the white light source of the present invention. In the figure, 11 is a white LED as a white light source arranged in the first direction, and 12 is a white LED 11 described later. A mask having a corresponding opening, 13 is a first lens made of a plano-convex lens that condenses near the surface of the measurement object 2 to be irradiated with light from the white LED 11, and 14 is transmitted through the first lens 13. This is a second lens composed of a cylindrical lens that diffuses light in a first direction coinciding with the central axis of the turntable 4 to make this a sheet-like light beam.
FIG. 3 is a diagram showing the mask 12 as viewed from the optical axis direction of the white LED 11 that is a light source, and a mask opening 121 provided corresponding to the plurality of white LEDs 11 arranged in the first direction includes A plurality are arranged in one direction. The plurality of openings 121 are alternately arranged in a second direction orthogonal to the first direction as shown in the figure, and the mask openings adjacent to each other are minute in the second direction. It is provided so as to overlap each other.
In the present embodiment, among the plurality of white LEDs 11 corresponding to the openings alternately arranged in the second direction, the white light source of one side in the second direction, that is, the odd-numbered LEDs 1 and LED3 in the drawing. And the other side, that is, the white light sources of even-numbered LEDs 2 and LEDs 4 in the drawing, are provided so as to selectively control light emission by a control unit (not shown).

Next, the slit light irradiation operation by the projector of the present embodiment will be described.
The irradiation area when one side of the second direction, that is, the odd-numbered LEDs 1 and 3 in the figure is turned on, and then the other side in the second direction, that is, the even-numbered LEDs 2 and 4 in the figure, is lit. As shown in FIG. 4A, the light beam that has passed through the vicinity of the mask edge portion passes through the first lens 13 and the second lens 14, and then on the line along the mask edge on the irradiation surface, the mask opening portion. They overlap with a width determined by the overlap width 211 and the lens magnification. Here, the irradiation distribution of each region in the direction perpendicular to the virtual cutting line is as shown in FIGS. 4B and 4C. These illuminations are sequentially applied to the object 2, and the reflected light is imaged by the CCD camera 3.
When these two images are scanned over the entire screen of the object 2 to be measured and the absolute value of the luminance difference quantified with respect to the corresponding pixel is calculated, as shown in FIG. Image data forming the offset low luminance region is obtained. Next, when the sum of the two images is taken in the same manner, as shown in FIG. 5B, the overlapping area is added to obtain image data forming a high luminance area. Further, by subtracting the former (FIG. 5A) from the image data of the latter (FIG. 5B), image data as shown in FIG. 5C is obtained, and only the overlapping region of the two irradiation regions is obtained. Remains at high brightness, and this is the image data of the cutting line to be obtained.
By performing the irradiation of the sheet-like light beam and the processing of the image data every time the turntable 4 is rotated by a unit angle, the surface shape of the measurement object 4 is three-dimensionally digitized.
According to the present invention, a cutting line obtained by irradiating an object to be measured with slit light by obtaining image data of imaged data in the vicinity of the mask edge of each mask opening, that is, overlapping irradiation areas. Image data equivalent to the data can be obtained.

  FIG. 6 is a diagram showing the configuration of the second embodiment of the projector using the white light source of the present invention. The difference from the first embodiment is that the cylindrical lens 14 as the second lens is the first lens. This is a point in which a plurality are arranged in the direction. In the case of the present embodiment, by arranging a plurality of second lenses that diffuse light from the light source in the first direction in the first direction, the diffused sheet-like luminous flux has brightness in the first direction. There is an effect that it becomes uniform.

  In the projector of the present invention, since a white light source is used as the light source, it is possible to perform texture detection on the surface of the measurement object 4 in addition to the above-described surface shape measurement of the measurement object 4. That is, not only the coordinate data on the cutting line of the object 4 to be measured but also the brightness or color at each coordinate point is detected by the CCD camera 3 as an image pickup means, and thereby the entire surface of the object 4 to be measured is detected. By detecting, the texture on the surface can be detected simultaneously with the shape measurement of the measurement object 4.

It is a figure which shows the structure of the three-dimensional shape measuring apparatus of this invention. It is a figure which shows the structure of the projector using the white light source of this invention. It is a figure which shows the mask part of the light projector of this invention. It is a figure explaining the sheet-like light beam irradiation operation | movement by the projector of this invention. It is a figure explaining the sheet-like light beam irradiation operation | movement by the projector of this invention. It is a figure which shows the structure of 2nd Example of the projector of this invention. It is a figure which shows the basic composition of the three-dimensional shape measuring apparatus by this kind of light cutting method. It is a figure which shows the structure of the conventional projector. It is a figure which shows the structure of the conventional projector.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 Light projector 2 Object to be measured 3 CCD camera 4 Turntable 5 Laser light source 6 Optical system

Claims (4)

  1. A light source in which a plurality of white light sources are arranged in the first direction;
    A plurality of openings provided in correspondence with the plurality of white light sources are alternately arranged in a second direction orthogonal to the first direction, and openings adjacent to each other are minute regions in the second direction. A mask portion provided to overlap,
    A first lens that collects light from a light source irradiated through the mask portion in the vicinity of the measurement object, and a sheet that diffuses light transmitted through the first lens in the first direction. A lens part comprising a second lens part as light;
    A projector using a white light source.
  2. A plurality of white light sources arranged in a first direction and a plurality of openings provided corresponding to the plurality of white light sources alternate in a second direction orthogonal to the first direction. And a mask portion provided so that openings adjacent to each other overlap in a minute region in the second direction, and light from a light source irradiated through the mask portion is collected near the object to be measured A projector comprising: a first lens to be formed; and a lens unit including a second lens unit that diffuses light transmitted through the first lens in the first direction to form sheet light;
    An irradiation area formed on the surface of the object to be measured is irradiated by slit light to the object to be measured from the projector, and the three-dimensional shape of the object to be measured is measured based on the obtained image data. In the three-dimensional shape measuring device,
    The plurality of white light sources corresponding to the openings alternately arranged in the second direction are selectively controlled to emit light on one side and on the other side in the second direction. Having a light source control unit,
    When measuring the three-dimensional shape of the object to be measured, the light source controller emits the white light source on the one side and images the irradiation area formed on the surface of the object to be measured by the imaging means, and then The irradiation area formed on the surface of the object to be measured is emitted by the white light source on the other side, and the three-dimensional shape of the object to be measured is measured by calculating each obtained image data. A three-dimensional shape measuring apparatus.
  3.   First image data obtained by causing the white light source on the one side to emit light by the light source control unit and imaging an irradiation area formed on the surface of the object to be measured by the imaging means, and the white light source on the other side First, the difference between the first image data and the second image data is calculated using the second image data obtained by imaging the irradiation area formed on the surface of the object to be measured by the imaging means. Next, the sum of the first image data and the second image data is calculated, and the calculated difference data is subtracted from the calculated sum data, thereby obtaining the three-dimensional shape data of the object to be measured. The three-dimensional shape measuring apparatus according to claim 2, wherein:
  4.   Luminance and color information of each coordinate point on the irradiation area from the irradiation area formed on the surface of the measurement object obtained by emitting the white light source on each side in the projector and imaging by the imaging means 4. The three-dimensional shape measuring apparatus according to claim 2, wherein the texture of the surface of the object to be measured is detected simultaneously with the shape measurement by extracting.
JP2003282282A 2003-07-30 2003-07-30 Floodlight using white light source, and three-dimensional shape measuring device using it Pending JP2005049247A (en)

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Application Number Priority Date Filing Date Title
JP2003282282A JP2005049247A (en) 2003-07-30 2003-07-30 Floodlight using white light source, and three-dimensional shape measuring device using it

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010512524A (en) * 2006-12-15 2010-04-22 フラウンホッファー−ゲゼルシャフト ツァ フェルダールング デァ アンゲヴァンテン フォアシュンク エー.ファオ Method and apparatus for thickness measurement

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010512524A (en) * 2006-12-15 2010-04-22 フラウンホッファー−ゲゼルシャフト ツァ フェルダールング デァ アンゲヴァンテン フォアシュンク エー.ファオ Method and apparatus for thickness measurement

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