JP2004004049A5 - - Google Patents

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Publication number
JP2004004049A5
JP2004004049A5 JP2003115611A JP2003115611A JP2004004049A5 JP 2004004049 A5 JP2004004049 A5 JP 2004004049A5 JP 2003115611 A JP2003115611 A JP 2003115611A JP 2003115611 A JP2003115611 A JP 2003115611A JP 2004004049 A5 JP2004004049 A5 JP 2004004049A5
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JP
Japan
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Application number
JP2003115611A
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Japanese (ja)
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JP4360825B2 (ja
JP2004004049A (ja
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Priority to JP2003115611A priority Critical patent/JP4360825B2/ja
Priority claimed from JP2003115611A external-priority patent/JP4360825B2/ja
Publication of JP2004004049A publication Critical patent/JP2004004049A/ja
Publication of JP2004004049A5 publication Critical patent/JP2004004049A5/ja
Application granted granted Critical
Publication of JP4360825B2 publication Critical patent/JP4360825B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2003115611A 2002-04-24 2003-04-21 半導体装置の寿命予測方法 Expired - Fee Related JP4360825B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2003115611A JP4360825B2 (ja) 2002-04-24 2003-04-21 半導体装置の寿命予測方法

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2002123269 2002-04-24
JP2003115611A JP4360825B2 (ja) 2002-04-24 2003-04-21 半導体装置の寿命予測方法

Publications (3)

Publication Number Publication Date
JP2004004049A JP2004004049A (ja) 2004-01-08
JP2004004049A5 true JP2004004049A5 (enrdf_load_stackoverflow) 2006-05-18
JP4360825B2 JP4360825B2 (ja) 2009-11-11

Family

ID=30447400

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003115611A Expired - Fee Related JP4360825B2 (ja) 2002-04-24 2003-04-21 半導体装置の寿命予測方法

Country Status (1)

Country Link
JP (1) JP4360825B2 (enrdf_load_stackoverflow)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7495519B2 (en) * 2007-04-30 2009-02-24 International Business Machines Corporation System and method for monitoring reliability of a digital system
DE102008059502A1 (de) * 2008-11-28 2010-06-10 Advanced Micro Devices, Inc., Sunnyvale Kompensation der Leistungsbeeinträchtigung von Halbleiterbauelementen durch Anpassung des Tastgrades des Taktsignals
CN104122492B (zh) * 2014-07-24 2016-10-05 北京大学 一种预测半导体器件10年寿命对应的工作电压的方法

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