JP2003140173A - Liquid crystal display device - Google Patents

Liquid crystal display device

Info

Publication number
JP2003140173A
JP2003140173A JP2002297383A JP2002297383A JP2003140173A JP 2003140173 A JP2003140173 A JP 2003140173A JP 2002297383 A JP2002297383 A JP 2002297383A JP 2002297383 A JP2002297383 A JP 2002297383A JP 2003140173 A JP2003140173 A JP 2003140173A
Authority
JP
Japan
Prior art keywords
electrode
liquid crystal
reflective electrode
display device
crystal display
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2002297383A
Other languages
Japanese (ja)
Other versions
JP2003140173A5 (en
JP4084630B2 (en
Inventor
Atsushi Ban
厚志 伴
Masumi Kubo
真澄 久保
Yozo Narutaki
陽三 鳴瀧
Naoyuki Shimada
尚幸 島田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Priority to JP2002297383A priority Critical patent/JP4084630B2/en
Publication of JP2003140173A publication Critical patent/JP2003140173A/en
Publication of JP2003140173A5 publication Critical patent/JP2003140173A5/ja
Application granted granted Critical
Publication of JP4084630B2 publication Critical patent/JP4084630B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Liquid Crystal (AREA)

Abstract

PROBLEM TO BE SOLVED: To prevent the occurrence of a disconnection, etc., in transparent electrodes having a poor coverage characteristic. SOLUTION: An interlayer insulating film 10 consisting of an organic resin film is deposited and the unnecessary segments of the interlayer insulating film 10, such as drain contact holes 12, are removed by using a photolithographic technique. Next a transparent electrode material is deposited and this transparent electrode material is patterned by using the photolithographic technique, by which transparent electrodes 8 are formed. A reflection electrode material is then deposited and this reflection electrode material is patterned by the photolithographic technique, by which the reflection electrodes 11 are formed.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】透過電極と反射電極を備えた
液晶表示装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a liquid crystal display device having a transmissive electrode and a reflective electrode.

【0002】[0002]

【従来の技術】従来の液晶表示装置のアクティブマトリ
クス基板の1画素の断面図を図5に示す。アクティブマ
トリクス基板は、ゲート電極2、ゲート絶縁膜4、半導
体層5、半導体コンタクト層6、透過電極8、ソース電
極9b、ドレイン電極9c、層間絶縁膜10、反射電極
11、コンタクト部12を備えている。
2. Description of the Related Art FIG. 5 shows a sectional view of one pixel of an active matrix substrate of a conventional liquid crystal display device. The active matrix substrate includes a gate electrode 2, a gate insulating film 4, a semiconductor layer 5, a semiconductor contact layer 6, a transmissive electrode 8, a source electrode 9b, a drain electrode 9c, an interlayer insulating film 10, a reflective electrode 11, and a contact portion 12. There is.

【0003】液晶表示装置は、図示しない対向基板と上
記アクティブマトリクス基板の間に液晶層を介在させ
て、アクティブマトリクス基板の透明電極8及び反射電
極11と対向基板に形成された対向電極の間に電圧を印
加して液晶の配向状態を変化させて表示を行う。
In a liquid crystal display device, a liquid crystal layer is interposed between a counter substrate (not shown) and the active matrix substrate, and a transparent electrode 8 and a reflective electrode 11 of the active matrix substrate and a counter electrode formed on the counter substrate. Display is performed by applying a voltage to change the alignment state of the liquid crystal.

【0004】反射電極11では外光等を反射電極11に
て反射させて表示を行い、反射電極11が形成されてい
ない透過電極8の領域では下方に設置されたバックライ
ト等からの光を上方に透過させ表示を行う。
External light or the like is reflected by the reflective electrode 11 to perform display at the reflective electrode 11, and light from a backlight or the like installed below is provided in the region of the transmissive electrode 8 where the reflective electrode 11 is not formed. It is made transparent and displayed.

【0005】従って、図5のアクティブマトリクス基板
を備えた液晶表示装置は、バックライトの光と外光を利
用して明るい表示が得られる。
Therefore, the liquid crystal display device provided with the active matrix substrate of FIG. 5 can obtain a bright display by utilizing the light of the backlight and the external light.

【0006】[0006]

【発明が解決しようとする課題】透過電極8に用いられ
る酸化インジュウム系の薄膜は、カバレッジ特性が悪い
ため、ドレイン電極との接続部であるコンタクト部で断
線が生じやすく、断線が生じた場合、スイッチング素子
から透過電極8や反射電極11に液晶駆動用の電圧が印
加されず表示不良となる。
Since the indium oxide-based thin film used for the transmission electrode 8 has poor coverage characteristics, disconnection is likely to occur at the contact portion which is the connection portion with the drain electrode. A voltage for driving the liquid crystal is not applied from the switching element to the transmissive electrode 8 and the reflective electrode 11, resulting in display failure.

【0007】また、反射電極11上に透過電極8を形成
する場合、反射電極11の端部では透過電極8が反射電
極11を乗り越える形になるため、カバレッジ特性の悪
い透過電極8に断線等が発生や抵抗値が増大して表示不
良となる。
Further, when the transmissive electrode 8 is formed on the reflective electrode 11, since the transmissive electrode 8 is formed over the reflective electrode 11 at the end portion of the reflective electrode 11, the transmissive electrode 8 having poor coverage characteristics may be broken. Occurrence and increase in resistance value result in display failure.

【0008】[0008]

【課題を解決するための手段】本発明は、絶縁性基板上
に形成されたスイッチング素子と、該スイッチング素子
と電気的に接続された反射電極及び透過電極とを備えた
液晶表示装置において、前記反射電極と前記透過電極か
らなる絵素電極を備え、前記透過電極の液晶層側に接す
るように前記反射電極が形成されていることを特徴とす
る。
The present invention provides a liquid crystal display device comprising a switching element formed on an insulating substrate, and a reflective electrode and a transmissive electrode electrically connected to the switching element. A pixel electrode including a reflective electrode and the transmissive electrode is provided, and the reflective electrode is formed so as to be in contact with the liquid crystal layer side of the transmissive electrode.

【0009】また、前記透過電極は、酸化インジュウム
を主成分とする材料であることを特徴とする。
Further, the transparent electrode is made of a material containing indium oxide as a main component.

【0010】また、前記反射電極は、Al、Ag、P
t、Ti、Cr、Mo、W、Niのいづれかの金属、及
びこれらの金属を主成分とする材料であることを特徴と
する。
The reflective electrode is made of Al, Ag, P.
One of t, Ti, Cr, Mo, W, and Ni, and a material containing these metals as a main component.

【0011】また、絶縁性基板上に形成されたスイッチ
ング素子と、該スイッチング素子上に形成された層間絶
縁膜と、該層間絶縁膜の前記スイッチング素子上に形成
されたコンタクト部を介して前記スイッチング素子と電
気的に接続された反射電極及び透過電極とを備えた液晶
表示装置において、前記コンタクト部上には前記反射電
極が形成されていることを特徴としてもよい。
Further, the switching is formed via a switching element formed on the insulating substrate, an interlayer insulating film formed on the switching element, and a contact portion of the interlayer insulating film formed on the switching element. In the liquid crystal display device including the reflective electrode and the transmissive electrode electrically connected to the element, the reflective electrode may be formed on the contact portion.

【0012】以下に本発明による作用について説明す
る。
The operation of the present invention will be described below.

【0013】一般的に透過電極として使われる酸化イン
ジュウム系薄膜は、カバレッジ特性が悪い。
Indium oxide-based thin films generally used as transparent electrodes have poor coverage characteristics.

【0014】本発明によれば、反射電極と透過電極から
なる絵素電極において、透過電極上に反射電極が形成さ
れているため、カバレッジ特性の悪い透過電極に反射電
極による段差が形成されないため、段差での断切れが軽
減される。
According to the present invention, in the pixel electrode composed of the reflective electrode and the transmissive electrode, since the reflective electrode is formed on the transmissive electrode, a step due to the reflective electrode is not formed in the transmissive electrode having poor coverage characteristics. Cuts at steps are reduced.

【0015】また、透過材料と反射材料を連続成膜する
ことによってプロセス短縮が図れ、カバレッジ特性の悪
い透過電極に反射電極による段切れが発生しない液晶表
示装置を作ることができる。
Further, by continuously forming the transmissive material and the reflective material, the process can be shortened, and a liquid crystal display device in which the transmissive electrode having poor coverage characteristics does not cause step disconnection due to the reflective electrode can be manufactured.

【0016】また、層間絶縁膜のコンタクト部を介し
て、反射電極と透過電極からなる絵素電極と、スイッチ
ング素子とを接続する場合に、コンタクト部上にカバレ
ッジ特性の優れた金属層からなる反射電極を形成すれ
ば、絵素電極とスイッチング素子との接続信頼性を向上
させることができる。
Further, when the switching element is connected to the picture element electrode composed of the reflective electrode and the transmissive electrode via the contact portion of the interlayer insulating film, the reflection formed of the metal layer having excellent coverage characteristics is formed on the contact portion. By forming the electrodes, the connection reliability between the pixel electrodes and the switching elements can be improved.

【0017】[0017]

【発明の実施の形態】(実施形態1)図1に、透過反射
両用型液晶表示装置のアクティブマトリクス基板の1絵
素の構成を示す。図2に図1のA−A断面を示す。
DESCRIPTION OF THE PREFERRED EMBODIMENTS (Embodiment 1) FIG. 1 shows the structure of one picture element of an active matrix substrate of a transflective liquid crystal display device. FIG. 2 shows an AA cross section of FIG.

【0018】ガラスからなる絶縁性基板1の上にTaか
らなる導電性の薄膜を形成し、フォトリソグラフィ技術
を用いて、前記導電性の薄膜をパターニングしてゲート
配線3およびゲート電極2を形成する。絶縁性基板1は
他の透明な絶縁性材料でもよく、またゲート材料につい
てもAl、Cr、Mo、W、Cu、Ti等の導電性を有
する他の材料を用いてもよい。
A conductive thin film made of Ta is formed on an insulating substrate 1 made of glass, and the conductive thin film is patterned by photolithography to form a gate wiring 3 and a gate electrode 2. . The insulating substrate 1 may be made of another transparent insulating material, and the gate material may be made of another conductive material such as Al, Cr, Mo, W, Cu, or Ti.

【0019】次にゲート絶縁膜4としてSiNx、半導
体層5としてアモルファスSi、半導体コンタクト層6
としてPをドープしたn+型アモルファスSiをCVD
法で連続成膜した。そしてフォトリソグラフィ技術を用
いて半導体層5と半導体コンタクト層6をパターニング
する。
Next, SiNx is used as the gate insulating film 4, amorphous Si is used as the semiconductor layer 5, and the semiconductor contact layer 6 is used.
CVD of n + type amorphous Si doped with P as
The film was continuously formed by the method. Then, the semiconductor layer 5 and the semiconductor contact layer 6 are patterned by using the photolithography technique.

【0020】次にCrからなる導電膜を成膜し、フォト
リソグラフィ技術を用いて該導電膜をパターニングして
ソース配線9a、ソース電極9b、ドレイン電極9cを
形成する。本実施形態では該導電膜としてCrを用いる
がAl、Mo、Ta、W、Cu、Ti等の導電性を有す
る他の材料を用いてもよい。
Next, a conductive film made of Cr is formed, and the conductive film is patterned by using a photolithography technique to form a source wiring 9a, a source electrode 9b and a drain electrode 9c. Although Cr is used as the conductive film in the present embodiment, other conductive materials such as Al, Mo, Ta, W, Cu, and Ti may be used.

【0021】次にソース電極9b、ドレイン電極9cを
マスクとして半導体コンタクト層6をエッチングし、半
導体コンタクト層6をソース側6aとドレイン側6bに
分けることによりTFT7が形成される。
Next, the semiconductor contact layer 6 is etched by using the source electrode 9b and the drain electrode 9c as a mask, and the semiconductor contact layer 6 is divided into a source side 6a and a drain side 6b to form a TFT 7.

【0022】次に有機樹脂膜からなる層間絶縁膜10を
成膜し、フォトリソグラフィ技術を用いてドレインコン
タクトホール12等の層間絶縁膜10の不要部分を削除
する。このとき、反射電極11を形成する部分の層間絶
縁膜10に入射光を散乱させるための凹凸部14を形成
する。本実施形態では層間絶縁膜10に有機樹脂膜を用
いたが、層間絶縁膜10は異なる材料の積層膜であって
もよく、また表面に凹凸を形成しなくてもよい。
Next, the interlayer insulating film 10 made of an organic resin film is formed, and unnecessary portions of the interlayer insulating film 10 such as the drain contact hole 12 are removed by using the photolithography technique. At this time, the concavo-convex portion 14 for scattering the incident light is formed on the interlayer insulating film 10 where the reflective electrode 11 is formed. Although the organic resin film is used for the interlayer insulating film 10 in the present embodiment, the interlayer insulating film 10 may be a laminated film of different materials, and unevenness may not be formed on the surface.

【0023】次に透過電極材料を成膜し、フォトリソグ
ラフィ技術を用いて透過電極材料をパターニングし透過
電極8を形成する。本実施形態では該透過電極材料にI
TO(In−Sn−0)を用いた。
Next, a transparent electrode material is deposited, and the transparent electrode material is patterned by using a photolithography technique to form a transparent electrode 8. In this embodiment, the transparent electrode material is I
TO (In-Sn-0) was used.

【0024】次に反射電極材料を成膜し、フォトリソグ
ラフィ技術によって反射電極材料をパターニングし反射
電極11を形成する。本実施形態では、反射電極11に
Alを用いた。
Next, a reflective electrode material is deposited, and the reflective electrode material is patterned by a photolithography technique to form the reflective electrode 11. In this embodiment, Al is used for the reflective electrode 11.

【0025】以上により本実施形態のアクティブマトリ
クス基板が得られる。
As described above, the active matrix substrate of this embodiment is obtained.

【0026】本実施形態の液晶表示装置は、図示しない
対向基板と上記アクティブマトリクス基板の間に液晶層
を介在させて、アクティブマトリクス基板の透明電極8
及び反射電極11と対向基板に形成された対向電極の間
に電圧を印加して液晶の配向状態を変化させて表示を行
う。
In the liquid crystal display device of this embodiment, a transparent electrode 8 of the active matrix substrate is formed by interposing a liquid crystal layer between a counter substrate (not shown) and the active matrix substrate.
Also, a voltage is applied between the reflective electrode 11 and the counter electrode formed on the counter substrate to change the alignment state of the liquid crystal, thereby performing display.

【0027】反射電極11では外光等を反射電極11に
て反射させて表示を行い、反射電極11が形成されてい
ない透過電極8の領域では下方に設置されたバックライ
ト等からの光を上方に透過させ表示を行う。
In the reflective electrode 11, external light is reflected by the reflective electrode 11 for display, and in a region of the transmissive electrode 8 where the reflective electrode 11 is not formed, light from a backlight or the like installed below is upward. It is made transparent and displayed.

【0028】従って、本実施形態の液晶表示装置は、バ
ックライトの光と外光を利用して明るい表示が得られ
る。
Therefore, in the liquid crystal display device of this embodiment, a bright display can be obtained by utilizing the light of the backlight and the external light.

【0029】ドレインコンタクト部12においてドレイ
ン電極9cとの接続を反射電極11で行うことにより、
別に接続用の金属を形成することなくドレイン接続の信
頼性を高めた透過電極と反射電極を備えた液晶表示装置
が形成できる。
By connecting the drain electrode 9c in the drain contact portion 12 with the reflective electrode 11,
Separately, it is possible to form a liquid crystal display device including a transmissive electrode and a reflective electrode with improved reliability of drain connection without forming a metal for connection.

【0030】透過電極8は、ITO膜からなる酸化膜の
場合、成膜時に下層膜が酸化される導電材料であればそ
の表面を酸化させるため、酸化絶縁膜によってITO膜
と下層膜のコンタクトが悪化する。特に絶縁性の高い酸
化膜を形成するAlやTaではコンタクト抵抗が大きく
なる。
When the transparent electrode 8 is an oxide film made of an ITO film, the surface of the transparent electrode is oxidized if it is a conductive material whose lower layer film is oxidized at the time of film formation. Therefore, the contact between the ITO film and the lower layer film is made by the oxide insulating film. Getting worse. In particular, Al or Ta forming an oxide film having a high insulating property has a large contact resistance.

【0031】また、反射電極11が透過電極8を覆い、
カバレッジ特性の悪い透過電極8を反射電極11の下層
にすることにより、透過電極8の断線等が少なく透過電
極8と反射電極11の電気的接続に優れ、段切れ等の不
良の発生を抑えることのできる透過反射両用液晶表示装
置が形成できる。
Further, the reflective electrode 11 covers the transmissive electrode 8,
By forming the transmissive electrode 8 having poor coverage characteristics in the lower layer of the reflective electrode 11, the disconnection of the transmissive electrode 8 is reduced and the electrical connection between the transmissive electrode 8 and the reflective electrode 11 is excellent, and the occurrence of defects such as step disconnection is suppressed. Thus, it is possible to form a transmissive / reflective liquid crystal display device.

【0032】(実施形態2)図3に実施形態2のアクテ
ィブマトリクス基板を示す。実施形態1と同一構成には
同一の符号を付している。
(Embodiment 2) FIG. 3 shows an active matrix substrate of Embodiment 2. The same components as those in the first embodiment are designated by the same reference numerals.

【0033】ガラスからなる絶縁性基板1の上にTaか
らなる導電性の薄膜を形成し、フォトリソグラフィ技術
を用いて該導電性の薄膜をパターニングして、ゲート配
線3及びゲート電極2を形成する。絶縁性基板1は、他
の透明基板を用いてもよく、またゲート材料についても
Al、Cr、Mo、W、Cu、Ti等の導電性を有する
他の材料を用いてもよい。
A conductive thin film made of Ta is formed on an insulating substrate 1 made of glass, and the conductive thin film is patterned by using a photolithography technique to form a gate wiring 3 and a gate electrode 2. . Other transparent substrates may be used for the insulating substrate 1, and other conductive materials such as Al, Cr, Mo, W, Cu, and Ti may be used as the gate material.

【0034】次にゲート絶縁膜4としてSiNx、半導
体層5としてアモルファスSi、半導体コンタクト層6
としてPをドープしたn+型アモルファスSiをCVD
法で連続成膜した。そしてフォトリソグラフィ技術を用
いて半導体層5と半導体コンタクト層6をパターニング
する。
Next, SiNx is used as the gate insulating film 4, amorphous Si is used as the semiconductor layer 5, and the semiconductor contact layer 6 is used.
CVD of n + type amorphous Si doped with P as
The film was continuously formed by the method. Then, the semiconductor layer 5 and the semiconductor contact layer 6 are patterned by using the photolithography technique.

【0035】次にCrからなる導電膜を成膜し、フォト
リソグラフィ技術を用いて該導電膜をパターニングして
ソース配線9a、ソース電極9b及びドレイン電極9c
を形成する。本実施形態では該導電膜としてCrを用い
るがAl、Mo、Ta、W、Cu、Ti等の導電性を有
する他の材料を用いてもよい。
Next, a conductive film made of Cr is formed, and the conductive film is patterned by using the photolithography technique to form the source wiring 9a, the source electrode 9b and the drain electrode 9c.
To form. Although Cr is used as the conductive film in the present embodiment, other conductive materials such as Al, Mo, Ta, W, Cu, and Ti may be used.

【0036】次にソース電極9b、ドレイン電極9cを
マスクとして半導体コンタクト層6をエッチングし、半
導体コンタクト層6のソース側6aとドレイン側6bに
分けることによりTFT7が形成される。
Next, the semiconductor contact layer 6 is etched using the source electrode 9b and the drain electrode 9c as a mask to divide the semiconductor contact layer 6 into a source side 6a and a drain side 6b, thereby forming a TFT 7.

【0037】次に有機樹脂膜からなる層間絶縁膜10を
成膜し、フォトリソグラフィ技術を用いてドレインコン
タクトホール12等の層間絶縁膜10の不要部分を削除
する。このとき、反射電極11を形成する部分の層間絶
縁膜10に入射光を散乱させるための凹凸部14を形成
する。本実施形態では層間絶縁膜10に有機樹脂膜を用
いたが、層間絶縁膜10は異なる材料の積層膜であって
もよく、また表面に凹凸を形成しなくてもよい。
Next, the interlayer insulating film 10 made of an organic resin film is formed, and unnecessary portions of the interlayer insulating film 10 such as the drain contact hole 12 are removed by using the photolithography technique. At this time, the concavo-convex portion 14 for scattering the incident light is formed on the interlayer insulating film 10 where the reflective electrode 11 is formed. Although the organic resin film is used for the interlayer insulating film 10 in the present embodiment, the interlayer insulating film 10 may be a laminated film of different materials, and unevenness may not be formed on the surface.

【0038】以下の工程を図3を用いて順を追って説明
する。
The following steps will be described step by step with reference to FIG.

【0039】次に透過電極材料15を成膜し、次に連続
して反射電極材料16を成膜する。本実施形態では透過
電極材料15にITO(In−Sn−0)を、反射電極
材料16にAlを用いた(図3a)。
Next, the transmissive electrode material 15 is deposited, and then the reflective electrode material 16 is deposited continuously. In this embodiment, ITO (In-Sn-0) was used for the transmissive electrode material 15 and Al was used for the reflective electrode material 16 (Fig. 3a).

【0040】次にフォトリソグラフィ技術を用いて透過
電極材料15と反射電極材料16とを、反射電極、透過
電極を含めた絵素電極形状に、連続して同様の形状にパ
ターニングする。本実施形態では、エッチング溶液とし
て塩酸系エッチャントを使用した(図3b)。
Next, the transmissive electrode material 15 and the reflective electrode material 16 are continuously patterned into the same shape as the pixel electrode shape including the reflective electrode and the transmissive electrode by using the photolithography technique. In this embodiment, a hydrochloric acid-based etchant is used as the etching solution (FIG. 3b).

【0041】次にフォトリソグラフィ技術を用いて、透
過領域13上を覆っている反射電極材料16を除去し、
透過電極8と反射電極11を形成する。本実施形態では
エッチング溶液としてリン酸一硝酸一酢酸の混酸を用い
た(図3c)。
Next, by using a photolithography technique, the reflective electrode material 16 covering the transmission region 13 is removed,
The transmissive electrode 8 and the reflective electrode 11 are formed. In the present embodiment, a mixed acid of phosphoric acid mononitric acid monoacetic acid was used as the etching solution (FIG. 3c).

【0042】以上により透過電極8と反射電極11の電
気的接続に優れ、段切れ等の不良の発生を抑えることの
できる液晶表示装置が得られる。
As described above, it is possible to obtain a liquid crystal display device which is excellent in the electrical connection between the transmissive electrode 8 and the reflective electrode 11 and can suppress the occurrence of defects such as step breaks.

【0043】また、コンタクト部12では透過電極上に
反射電極が形成されるため、透過電極のカバレッジが悪
くドレイン電極と透過電極の電気的接続が不十分であっ
ても、反射電極によってドレイン電極との電気的接続が
得られる。
Further, since the reflective electrode is formed on the transmissive electrode at the contact portion 12, even if the coverage of the transmissive electrode is poor and the electrical connection between the drain electrode and the transmissive electrode is insufficient, the reflective electrode is used as the drain electrode. Electrical connection is obtained.

【0044】(実施形態3)図4に実施形態3のアクテ
ィブマトリクス基板を示す。実施形態1と同一構成には
同一の符号を付している。
(Embodiment 3) FIG. 4 shows an active matrix substrate of Embodiment 3. The same components as those in the first embodiment are designated by the same reference numerals.

【0045】ガラスからなる絶縁性基板1の上にTaか
らなる導電性の薄膜を形成し、フォトリソグラフィ技術
を用いて該導電性の薄膜をパターニングして、ゲート配
線3及びゲート電極2を形成する。絶縁性基板1は、他
の透明基板を用いてもよく、またゲート材料についても
Al、Cr、Mo、W、Cu、Ti等の導電性を有する
他の材料を用いてもよい。
A conductive thin film made of Ta is formed on the insulating substrate 1 made of glass, and the conductive thin film is patterned by using a photolithography technique to form the gate wiring 3 and the gate electrode 2. . Other transparent substrates may be used for the insulating substrate 1, and other conductive materials such as Al, Cr, Mo, W, Cu, and Ti may be used as the gate material.

【0046】次にゲート絶縁膜4としてSiNx、半導
体層5としてアモルファスSi、半導体コンタクト層6
としてPをドープしたn+型アモルファスSiをCVD
法で連続成膜した。そしてフォトリソグラフィ技術を用
いて半導体層5と半導体コンタクト層6をパターニング
する。
Next, SiNx is used as the gate insulating film 4, amorphous Si is used as the semiconductor layer 5, and the semiconductor contact layer 6 is used.
CVD of n + type amorphous Si doped with P as
The film was continuously formed by the method. Then, the semiconductor layer 5 and the semiconductor contact layer 6 are patterned by using the photolithography technique.

【0047】次にCrからなる導電膜を成膜し、フォト
リソグラフィ技術を用いて該導電膜をパターニングして
ソース配線9a、ソース電極9b及びドレイン電極9c
を形成する。本実施形態では該導電膜としてCrを用い
るがAl、Mo、Ta、W、Cu、Ti等の導電性を有
する他の材料を用いてもよい。
Next, a conductive film made of Cr is formed, and the conductive film is patterned by using the photolithography technique to form the source wiring 9a, the source electrode 9b and the drain electrode 9c.
To form. Although Cr is used as the conductive film in the present embodiment, other conductive materials such as Al, Mo, Ta, W, Cu, and Ti may be used.

【0048】次にソース電極9b、ドレイン電極9cを
マスクとして半導体コンタクト層6をエッチングし、半
導体コンタクト層6のソース側6aとドレイン側6bに
分けることによりTFT7が形成される。
Next, the semiconductor contact layer 6 is etched by using the source electrode 9b and the drain electrode 9c as a mask to divide the semiconductor contact layer 6 into a source side 6a and a drain side 6b to form a TFT 7.

【0049】次に有機樹脂膜からなる層間絶縁膜10を
成膜し、フォトリソグラフィ技術を用いてドレインコン
タクトホール12等の層間絶縁膜10の不要部分を削除
する。このとき、反射電極11を形成する部分の層間絶
縁膜10に入射光を散乱させるための凹凸部14を形成
する。本実施形態では層間絶縁膜10に有機樹脂膜を用
いたが、層間絶縁膜10は異なる材料の積層膜であって
もよく、また表面に凹凸を形成しなくてもよい。
Next, an interlayer insulating film 10 made of an organic resin film is formed, and unnecessary portions of the interlayer insulating film 10 such as the drain contact hole 12 are removed by using a photolithography technique. At this time, the concavo-convex portion 14 for scattering the incident light is formed on the interlayer insulating film 10 where the reflective electrode 11 is formed. Although the organic resin film is used for the interlayer insulating film 10 in the present embodiment, the interlayer insulating film 10 may be a laminated film of different materials, and unevenness may not be formed on the surface.

【0050】以下の工程を図4を用いて順を追って説明
する。
The following steps will be described step by step with reference to FIG.

【0051】次に透過電極材料15を成膜し、次に連続
して反射電極材料16を成膜する。本実施形態では透過
電極材料15にITO(In−Sn−0)を、反射電極
材料16にAlを用いた(図4a)。
Next, the transmissive electrode material 15 is deposited, and then the reflective electrode material 16 is deposited continuously. In this embodiment, ITO (In-Sn-0) is used for the transmissive electrode material 15 and Al is used for the reflective electrode material 16 (Fig. 4a).

【0052】次にフォトリソグラフィ技術を用いて、反
射電極材料16を反射電極11の形状にパターニングす
る。本実施形態では、エッチング溶液としてリン酸一硝
酸一酢酸の混酸を用いた(図4b)。
Next, the reflective electrode material 16 is patterned into the shape of the reflective electrode 11 by using the photolithography technique. In this embodiment, a mixed acid of phosphoric acid mononitric acid monoacetic acid was used as the etching solution (FIG. 4B).

【0053】次にフォトリソグラフィ技術を用いて、透
過電極材料15を透過電極8の形状にパターニングす
る。本実施形態ではエッチング溶液として塩酸系エッチ
ャントを用いた(図4c)。
Next, the transparent electrode material 15 is patterned into the shape of the transparent electrode 8 by using the photolithography technique. In this embodiment, a hydrochloric acid-based etchant is used as the etching solution (FIG. 4c).

【0054】以上により透過電極8と反射電極11の電
気的接続に優れ、段切れ等の不良の発生を抑えることの
できる液晶表示装置が得られる。
As described above, it is possible to obtain a liquid crystal display device which is excellent in the electrical connection between the transmissive electrode 8 and the reflective electrode 11 and can suppress the occurrence of defects such as step breakage.

【0055】反射電極材料16をパターニングする際
に、透過電極材料15をパターニングしないため、透過
電極材料15が層間絶縁膜10の保護層として作用する
ので、層間絶縁膜10のエッチングによるダメージによ
る表示荒れや絵素間リークを防ぐことができる。
Since the transmissive electrode material 15 is not patterned when the reflective electrode material 16 is patterned, the transmissive electrode material 15 acts as a protective layer of the interlayer insulating film 10, so that the display roughness due to damage due to etching of the interlayer insulating film 10 is caused. And leakage between picture elements can be prevented.

【0056】また、コンタクト部12では透過電極上に
反射電極が形成されるため、透過電極のカバレッジが悪
くドレイン電極と透過電極の電気的接続が不十分であっ
ても、反射電極によってドレイン電極との電気的接続が
得られる。
Further, since the reflective electrode is formed on the transmissive electrode in the contact portion 12, even if the coverage of the transmissive electrode is poor and the electrical connection between the drain electrode and the transmissive electrode is inadequate, the reflective electrode forms the drain electrode. Electrical connection is obtained.

【0057】[0057]

【発明の効果】本発明によれば、反射電極と透過電極か
らなる絵素電極において、透過電極上に反射電極が形成
されているため、カバレッジ特性の悪い透過電極に反射
電極による段差が形成されないため、段差での断切れが
軽減される。
According to the present invention, in the pixel electrode composed of the reflective electrode and the transmissive electrode, since the reflective electrode is formed on the transmissive electrode, the step due to the reflective electrode is not formed in the transmissive electrode having poor coverage characteristics. Therefore, breakage at a step is reduced.

【0058】また、透過材料と反射材料を連続成膜する
ことによってプロセス短縮が図れ、カバレッジ特性の悪
い透過電極に反射電極による段切れが発生しない液晶表
示装置を作ることができる。
Further, by continuously forming the transmissive material and the reflective material, the process can be shortened, and a liquid crystal display device in which step breakage due to the reflective electrode does not occur in the transmissive electrode having poor coverage characteristics can be manufactured.

【0059】また、層間絶縁膜のコンタクト部を介し
て、反射電極と透過電極からなる絵素電極と、スイッチ
ング素子とを接続する場合に、コンタクト部上にカバレ
ッジ特性の優れた金属層からなる反射電極を形成すれ
ば、絵素電極とスイッチング素子との接続信頼性を向上
させることができる。
Further, when the switching element is connected to the pixel electrode composed of the reflective electrode and the transmissive electrode via the contact portion of the interlayer insulating film, the reflection formed of the metal layer having excellent coverage characteristics is formed on the contact portion. By forming the electrodes, the connection reliability between the pixel electrodes and the switching elements can be improved.

【図面の簡単な説明】[Brief description of drawings]

【図1】実施形態1の液晶表示装置のアクティブマトリ
クス基板の1絵素を示す図である。
FIG. 1 is a diagram showing one picture element of an active matrix substrate of a liquid crystal display device according to a first embodiment.

【図2】実施形態1の液晶表示装置の図1のA−Aによ
る断面図である。
FIG. 2 is a cross-sectional view of the liquid crystal display device according to the first embodiment taken along the line AA of FIG.

【図3】実施形態2の液晶表示装置の製造工程を示す断
面図である。
FIG. 3 is a cross-sectional view showing a manufacturing process of the liquid crystal display device of the second embodiment.

【図4】実施形態3の液晶表示装置の製造工程を示す断
面図である。
FIG. 4 is a cross-sectional view showing the manufacturing process of the liquid crystal display device of the third embodiment.

【図5】従来の液晶表示装置のアクティブマトリクス基
板の断面図である。
FIG. 5 is a cross-sectional view of an active matrix substrate of a conventional liquid crystal display device.

【符号の説明】[Explanation of symbols]

1 絶縁性基板 2 ゲート電極 3 ゲート配線 4 ゲート絶縁膜 5 半導体層 6a 半導体コンタクト層(ソース電極側) 6b 半導体コンタクト層(ドレイン電極側) 7 TFT部 8 透過電極 9a ソース配線 9b ソース電極 9c ドレイン電極 10 層間絶縁膜 11 反射電極 12 コンタクト部 13 透過領域 14 反射電極凹凸部 15 透過電極材料 16 反射電極材料 1 Insulating substrate 2 Gate electrode 3 gate wiring 4 Gate insulation film 5 Semiconductor layer 6a Semiconductor contact layer (source electrode side) 6b Semiconductor contact layer (drain electrode side) 7 TFT section 8 Transparent electrode 9a Source wiring 9b source electrode 9c drain electrode 10 Interlayer insulation film 11 Reflective electrode 12 Contact part 13 Transparent area 14 Reflective electrode irregularities 15 Transparent electrode material 16 Reflective electrode material

───────────────────────────────────────────────────── フロントページの続き (72)発明者 鳴瀧 陽三 大阪府大阪市阿倍野区長池町22番22号 シ ャープ株式会社内 (72)発明者 島田 尚幸 大阪府大阪市阿倍野区長池町22番22号 シ ャープ株式会社内 Fターム(参考) 2H091 FA14Y FB08 FC01 FC10 GA03 GA13 LA01 LA12 LA30 2H092 HA04 HA05 JA24 KA05 KA18 KB24 KB25 MA13 MA18 NA15 NA27 NA29    ─────────────────────────────────────────────────── ─── Continued front page    (72) Inventor Yozo Narutaki             22-22 Nagaikecho, Abeno-ku, Osaka-shi, Osaka             Inside the company (72) Inventor Naoyuki Shimada             22-22 Nagaikecho, Abeno-ku, Osaka-shi, Osaka             Inside the company F term (reference) 2H091 FA14Y FB08 FC01 FC10                       GA03 GA13 LA01 LA12 LA30                 2H092 HA04 HA05 JA24 KA05 KA18                       KB24 KB25 MA13 MA18 NA15                       NA27 NA29

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 絶縁性基板上に形成されたスイッチング
素子と、該スイッチング素子と電気的に接続された反射
電極及び透過電極とを備えた液晶表示装置において、 前記反射電極と前記透過電極からなる絵素電極を備え、 前記透過電極の液晶層側に接するように前記反射電極が
形成されていることを特徴とする液晶表示装置。
1. A liquid crystal display device comprising: a switching element formed on an insulating substrate; and a reflective electrode and a transmissive electrode electrically connected to the switching element, the liquid crystal display device comprising the reflective electrode and the transmissive electrode. A liquid crystal display device comprising a pixel electrode, wherein the reflective electrode is formed so as to be in contact with a liquid crystal layer side of the transmissive electrode.
【請求項2】 前記透過電極は、酸化インジュウムを主
成分とする材料であることを特徴とする請求項1記載の
液晶表示装置。
2. The liquid crystal display device according to claim 1, wherein the transmissive electrode is a material containing indium oxide as a main component.
【請求項3】 前記反射電極は、Al、Ag、Pt、T
i、Cr、Mo、W、Niのいづれかの金属、及びこれ
らの金属を主成分とする材料であることを特徴とする請
求項1または請求項2記載の液晶表示装置。
3. The reflective electrode is made of Al, Ag, Pt, T
The liquid crystal display device according to claim 1 or 2, which is made of any one of i, Cr, Mo, W, and Ni, and a material containing these metals as a main component.
JP2002297383A 2002-10-10 2002-10-10 Liquid crystal display Expired - Lifetime JP4084630B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2002297383A JP4084630B2 (en) 2002-10-10 2002-10-10 Liquid crystal display

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002297383A JP4084630B2 (en) 2002-10-10 2002-10-10 Liquid crystal display

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP08539998A Division JP3410656B2 (en) 1998-03-31 1998-03-31 Liquid crystal display device and manufacturing method thereof

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2007302882A Division JP4814862B2 (en) 2007-11-22 2007-11-22 Liquid crystal display

Publications (3)

Publication Number Publication Date
JP2003140173A true JP2003140173A (en) 2003-05-14
JP2003140173A5 JP2003140173A5 (en) 2005-08-18
JP4084630B2 JP4084630B2 (en) 2008-04-30

Family

ID=19197261

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002297383A Expired - Lifetime JP4084630B2 (en) 2002-10-10 2002-10-10 Liquid crystal display

Country Status (1)

Country Link
JP (1) JP4084630B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003043522A (en) * 2001-08-02 2003-02-13 Sony Corp Reflection type liquid crystal display device
JP2005031662A (en) * 2003-07-09 2005-02-03 Samsung Electronics Co Ltd Array substrate, method for manufacturing the same, and liquid crystal display device having the same

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003043522A (en) * 2001-08-02 2003-02-13 Sony Corp Reflection type liquid crystal display device
JP2005031662A (en) * 2003-07-09 2005-02-03 Samsung Electronics Co Ltd Array substrate, method for manufacturing the same, and liquid crystal display device having the same

Also Published As

Publication number Publication date
JP4084630B2 (en) 2008-04-30

Similar Documents

Publication Publication Date Title
JP3410656B2 (en) Liquid crystal display device and manufacturing method thereof
JP4543385B2 (en) Manufacturing method of liquid crystal display device
US7253439B2 (en) Substrate for display, method of manufacturing the same and display having the same
US7833813B2 (en) Thin film transistor array panel and method of manufacturing the same
KR101163622B1 (en) Thin Film Transistor substrate
KR19990083238A (en) Liquid crystal display, matrix array substrate and manufacturihg method thereof
KR20010081250A (en) Liquid crystal display and method for fabricating the same
JP4472990B2 (en) Reflective liquid crystal display device and manufacturing method thereof
KR100673331B1 (en) Liquid crystal display and method for fabricating the same
US7804092B2 (en) Active-matrix-drive display unit including TFT
KR100655278B1 (en) Semi-transmitiv reflection type tft-lcd sevice
US20070188682A1 (en) Method for manufacturing a display device
JP4115761B2 (en) Active matrix substrate, method for manufacturing the same, and display device using the same
KR100660809B1 (en) Liquid crystal display device and method for fabricating the same
JP4354205B2 (en) Liquid crystal display device and manufacturing method thereof
JP3207360B2 (en) TFT liquid crystal display
JP2003140173A (en) Liquid crystal display device
KR20070072113A (en) Liquid crystal display device and fabricating method
JP2690404B2 (en) Active matrix substrate
KR20010048150A (en) A thin film transistor liquid crystal display device capable of displaying images in both reflective and transmissive modes and a method for manufacturing it
JPH1195248A (en) Array substrate for display device and its production
JP2007010738A (en) Transflective tft array substrate, and translucent liquid crystal display device
JP4814862B2 (en) Liquid crystal display
JP4227055B2 (en) Manufacturing method of liquid crystal display device
US20030164908A1 (en) Thin film transistor panel

Legal Events

Date Code Title Description
A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20050203

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20050203

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20070907

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20070925

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20071122

RD01 Notification of change of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7421

Effective date: 20071205

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20080205

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20080215

R150 Certificate of patent or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20110222

Year of fee payment: 3

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120222

Year of fee payment: 4

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120222

Year of fee payment: 4

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130222

Year of fee payment: 5

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130222

Year of fee payment: 5

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20140222

Year of fee payment: 6

EXPY Cancellation because of completion of term