JP2002262545A5 - - Google Patents

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Publication number
JP2002262545A5
JP2002262545A5 JP2001053728A JP2001053728A JP2002262545A5 JP 2002262545 A5 JP2002262545 A5 JP 2002262545A5 JP 2001053728 A JP2001053728 A JP 2001053728A JP 2001053728 A JP2001053728 A JP 2001053728A JP 2002262545 A5 JP2002262545 A5 JP 2002262545A5
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JP
Japan
Prior art keywords
coil
transformer
semiconductor device
secondary coil
capacitor
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Application number
JP2001053728A
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English (en)
Japanese (ja)
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JP2002262545A (ja
JP4074064B2 (ja
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Priority to JP2001053728A priority Critical patent/JP4074064B2/ja
Priority claimed from JP2001053728A external-priority patent/JP4074064B2/ja
Publication of JP2002262545A publication Critical patent/JP2002262545A/ja
Publication of JP2002262545A5 publication Critical patent/JP2002262545A5/ja
Application granted granted Critical
Publication of JP4074064B2 publication Critical patent/JP4074064B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2001053728A 2001-02-28 2001-02-28 半導体装置 Expired - Fee Related JP4074064B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001053728A JP4074064B2 (ja) 2001-02-28 2001-02-28 半導体装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001053728A JP4074064B2 (ja) 2001-02-28 2001-02-28 半導体装置

Publications (3)

Publication Number Publication Date
JP2002262545A JP2002262545A (ja) 2002-09-13
JP2002262545A5 true JP2002262545A5 (enrdf_load_stackoverflow) 2005-07-21
JP4074064B2 JP4074064B2 (ja) 2008-04-09

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ID=18914157

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001053728A Expired - Fee Related JP4074064B2 (ja) 2001-02-28 2001-02-28 半導体装置

Country Status (1)

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JP (1) JP4074064B2 (enrdf_load_stackoverflow)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2557416A3 (en) 2002-04-17 2013-02-27 Ebara Corporation Sample surface inspection apparatus and method
DE10393366B4 (de) 2002-09-27 2014-04-03 Nihon University Okkludator
KR100602065B1 (ko) 2003-07-31 2006-07-14 엘지전자 주식회사 전원장치와 그의 구동방법 및 이를 이용한 일렉트로루미네센스 표시소자의 구동장치 및 구동방법
US7489526B2 (en) 2004-08-20 2009-02-10 Analog Devices, Inc. Power and information signal transfer using micro-transformers
JP2007036216A (ja) 2005-06-24 2007-02-08 Semiconductor Energy Lab Co Ltd 半導体装置及び無線通信システム
JP4918795B2 (ja) * 2006-03-16 2012-04-18 富士電機株式会社 パワーエレクトロニクス機器
EP1841049B1 (en) * 2006-03-28 2012-08-15 Infineon Technologies AG Electromagnetic micro-generator
WO2008123082A1 (ja) * 2007-03-29 2008-10-16 Nec Corporation インダクタ、配線基板、および半導体装置
JP5658429B2 (ja) 2008-07-03 2015-01-28 ルネサスエレクトロニクス株式会社 回路装置
JP5755414B2 (ja) 2010-06-08 2015-07-29 日本電産サンキョー株式会社 振れ補正機能付き光学ユニット
JP5357136B2 (ja) * 2010-12-22 2013-12-04 旭化成エレクトロニクス株式会社 変成器
US9536828B2 (en) * 2012-12-19 2017-01-03 Renesas Electronics Corporation Semiconductor device
US9293997B2 (en) 2013-03-14 2016-03-22 Analog Devices Global Isolated error amplifier for isolated power supplies
US10270630B2 (en) 2014-09-15 2019-04-23 Analog Devices, Inc. Demodulation of on-off-key modulated signals in signal isolator systems
US9660848B2 (en) 2014-09-15 2017-05-23 Analog Devices Global Methods and structures to generate on/off keyed carrier signals for signal isolators
US10536309B2 (en) 2014-09-15 2020-01-14 Analog Devices, Inc. Demodulation of on-off-key modulated signals in signal isolator systems
US9998301B2 (en) 2014-11-03 2018-06-12 Analog Devices, Inc. Signal isolator system with protection for common mode transients
JP6030107B2 (ja) * 2014-11-28 2016-11-24 ルネサスエレクトロニクス株式会社 回路装置
JP6238323B2 (ja) * 2016-10-19 2017-11-29 ルネサスエレクトロニクス株式会社 回路装置

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