JP2001330969A - Apparatus for removing photoresist - Google Patents

Apparatus for removing photoresist

Info

Publication number
JP2001330969A
JP2001330969A JP2000151565A JP2000151565A JP2001330969A JP 2001330969 A JP2001330969 A JP 2001330969A JP 2000151565 A JP2000151565 A JP 2000151565A JP 2000151565 A JP2000151565 A JP 2000151565A JP 2001330969 A JP2001330969 A JP 2001330969A
Authority
JP
Japan
Prior art keywords
ozone
water
photoresist
ozone gas
gas
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000151565A
Other languages
Japanese (ja)
Inventor
Kazutoshi Yamazaki
和俊 山崎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sekisui Chemical Co Ltd
Original Assignee
Sekisui Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sekisui Chemical Co Ltd filed Critical Sekisui Chemical Co Ltd
Priority to JP2000151565A priority Critical patent/JP2001330969A/en
Priority to TW090100662A priority patent/TWI280891B/en
Priority to PCT/JP2001/000121 priority patent/WO2001051187A1/en
Priority to DE60143019T priority patent/DE60143019D1/en
Priority to KR1020027008791A priority patent/KR20020071011A/en
Priority to US10/169,946 priority patent/US6955758B2/en
Priority to EP01900696A priority patent/EP1254698B1/en
Publication of JP2001330969A publication Critical patent/JP2001330969A/en
Pending legal-status Critical Current

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  • Photosensitive Polymer And Photoresist Processing (AREA)
  • Oxygen, Ozone, And Oxides In General (AREA)
  • Weting (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a space-saving apparatus for removing a photoresist in which ozonized water of a high concentration is rapidly and precisely produced, a photoresist unnecessitated in a photolithography step in the production of a semiconductor, a liquid crystal or the like can be removed with good production efficiency and an aerator and a vapor-liquid separation tower are unnecessary. SOLUTION: In the apparatus for removing a photoresist, the photoresist pattern layer of each photoresist laminate unnecessitated after the etching of the photoresist laminate with the photoresist pattern layer formed on a substrate is removed with ozonized water produced by separating raw water and gaseous ozone using a gaseous ozone permeation membrane being gas- permeable but liquid-impermeable and dissolving gaseous ozone in the raw water.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、半導体や液晶の製
造におけるフォトリソグラフィー工程で、不要になった
フォトレジストを除去するための装置に関する。
[0001] 1. Field of the Invention [0002] The present invention relates to an apparatus for removing unnecessary photoresist in a photolithography process in the production of semiconductors and liquid crystals.

【0002】[0002]

【従来の技術】半導体や液晶の製造では、フォトリソグ
ラフィー工程で不要となったフォトレジストを除去する
剥離工程が繰り返し行われる。このフォトレジスト剥離
工程では、大量の薬液を使用することや高温処理のため
クリーンルーム内の空調に負担がかかるといった問題が
あり、環境への関心が高まる中、これらに代わる方法と
して、オゾン水を用いたレジスト剥離プロセスが注目さ
れている。
2. Description of the Related Art In the manufacture of semiconductors and liquid crystals, a peeling step of removing a photoresist that is no longer required in a photolithography step is repeatedly performed. In this photoresist stripping process, there is a problem in that a large amount of chemical solution is used, and high-temperature processing imposes a burden on air conditioning in a clean room. With concern about the environment increasing, ozone water is used as an alternative method. Attention has been focused on the resist stripping process.

【0003】上記オゾン水を用いたレジスト剥離プロセ
スにおいて、オゾン水濃度と剥離速度との関係が検討さ
れ、オゾン水の高濃度化が剥離速度に非常に有効である
ということが明らかにされている(第8回日本オゾン協
会年次研究講演会講演集、14〜16頁:1998年、
3月、3日発行)。
In the resist stripping process using ozone water, the relationship between the concentration of ozone water and the stripping speed has been studied, and it has been found that increasing the concentration of ozone water is very effective in stripping speed. (The 8th Annual Meeting of the Ozone Society of Japan Annual Lectures, pp. 14-16: 1998,
Issued on March 3rd.

【0004】上記オゾン水によるレジスト剥離を検討す
る際、そのオゾン水生成方法として、従来からある方法
としては、例えば、水中にオゾンガス(気泡)を注入す
るバブリングタイプや、混合器(エジェクタ)を用いた
タイプ等のばっ気方式等が考えられるが、ばっ気方式の
場合、気相(オゾン)濃度と液相(オゾン水)濃度の
比、すなわち、分配係数が温度により一義的に決められ
ているため、オゾン水濃度を高く設定出来にくいこと、
また、水にオゾンガスを溶解させる際に効率が悪く、濃
度を適正にコントロールすることも難しい等という不具
合がある。
When examining the resist stripping using ozone water, as the ozone water generation method, a conventional method such as a bubbling type in which ozone gas (bubbles) is injected into water or a mixer (ejector) is used. In the case of the aeration method, the ratio between the gas phase (ozone) concentration and the liquid phase (ozone water) concentration, that is, the distribution coefficient is uniquely determined by the temperature. Therefore, it is difficult to set the ozone water concentration high,
Further, there is a problem that the efficiency of dissolving ozone gas in water is low, and it is difficult to properly control the concentration.

【0005】[0005]

【発明が解決しようとする課題】本発明はこのような従
来の不具合に鑑みてなされたものであり、半導体や液晶
の製造におけるフォトリソグラフィー工程で、不要にな
ったフォトレジストを除去する際、迅速に精度良く高濃
度のオゾン水を生成させて、生産効率良くフォトレジス
トを除去出来、且つ、ばっ気設備や気液分離塔は必要が
ない、小型設備で可能なフォトレジスト除去装置を提供
するものである。
SUMMARY OF THE INVENTION The present invention has been made in consideration of the above-mentioned problems, and has been made in consideration of the need for removing unnecessary photoresist in a photolithography process in the production of semiconductors and liquid crystals. To provide a photoresist removal device that can remove photoresist with good production efficiency by generating high-concentration ozone water with high accuracy and that does not require an aeration facility or a gas-liquid separation tower. It is.

【0006】[0006]

【課題を解決するための手段】本発明は、基盤上にフォ
トレジスト層が形成させたフォトレジスト積層体を、エ
ッチング処理した後、不要となった前記積層体のフォト
レジスト層を、オゾン水を用いて除去するフォトレジス
トの除去装置であって、上記オゾン水は、原料水とオゾ
ンガスとを、気体のみを通し液体の透過を阻止するオゾ
ンガス透過膜で隔離せしめ、該オゾンガス透過膜を通し
て上記原料水に、上記オゾンガスを溶け込ますようにし
て製造することを特徴とするフォトレジスト除去装置で
ある(請求項1)。この際、上記オゾンガス透過膜を中
空管状(チューブ状)に形成して収容容器内に設置して
なるものが好ましい(請求項2)。更には、上記オゾン
ガス透過膜をフッ素系樹脂、又はシリコン系樹脂から形
成されてなることが好ましい(請求項3)。
SUMMARY OF THE INVENTION According to the present invention, after a photoresist laminate having a photoresist layer formed on a substrate is subjected to an etching treatment, the photoresist layer of the laminate which has become unnecessary is treated with ozone water. The ozone water is used to separate the raw water and the ozone gas with an ozone gas permeable membrane that passes only the gas and prevents liquid permeation, and passes the raw water through the ozone gas permeable membrane. The photoresist removing apparatus is manufactured by dissolving the ozone gas therein (claim 1). At this time, it is preferable that the ozone gas permeable membrane is formed in a hollow tubular shape (tube shape) and installed in a storage container (claim 2). Further, it is preferable that the ozone gas permeable film is formed of a fluorine resin or a silicon resin.

【0007】[0007]

【発明の実施の形態】以下、本発明を図1に示した図面
に基づいて詳細に説明するが、これら実施例に限定され
るものではない。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, the present invention will be described in detail with reference to the drawings shown in FIG. 1, but the present invention is not limited to these embodiments.

【0008】本発明に係るフォトレジストの除去装置の
概念図を図1に示す。図中、符号2はオゾン水(OW)
を生成するためのオゾン溶解部(オゾン水溶解モジュー
ル)を示し、−1はフォトレジスト除去槽を示す。−2
はフォトレジスト積層体を示し、−3はフォトレジスト
が除去されたエッチング処理後の基盤を示す。上記オゾ
ン溶解部2でオゾン水を生成した後、このオゾン水をフ
ォトレジスト除去槽−1に移送して貯蔵する。このフォ
トレジスト除去槽−1に貯蔵された高濃度オゾン水中
に、フォトレジスト積層体−2を浸漬することによりフ
ォトレジスト層のみを除去出来、エッチング処理された
基盤−3のみを取り出すことが出来る。フォトレジスト
除去槽−1のオゾン水は、所望の一定濃度を確保するた
めオゾン溶解部2に再びリサイクルされるようにする。
FIG. 1 shows a conceptual diagram of an apparatus for removing a photoresist according to the present invention. In the drawing, reference numeral 2 denotes ozone water (OW).
Indicates an ozone dissolving unit (ozone water dissolving module) for generating, and -1 indicates a photoresist removal tank. -2
Indicates a photoresist laminated body, and -3 indicates a substrate after the etching process from which the photoresist was removed. After the ozone water is generated in the ozone dissolving section 2, the ozone water is transferred to and stored in the photoresist removal tank-1. By immersing the photoresist laminate 2 in high-concentration ozone water stored in the photoresist removal tank 1, only the photoresist layer can be removed, and only the etched base 3 can be taken out. The ozone water in the photoresist removing tank-1 is recycled to the ozone dissolving section 2 again in order to secure a desired constant concentration.

【0009】本発明において、フォトレジスト積層体の
基盤とは、例えば、半導体の場合には、シリコーンウエ
ハであり、液晶表示盤の場合には、ガラス板の材料膜を
意味するもので、本発明の構成を満たすものであれば限
定されるものではない。また、オゾン水を用いてフォト
レジスト層を除去する手段の一実施形態として、上記除
去槽なるバッチ式のものを用いた循環方式のものを挙げ
たが、必ずしもこの方法に限定されるものではなく、例
えば、スプレー方式、カーテンフロー方式等を利用して
接触させる方法等も挙げられる。
In the present invention, the substrate of the photoresist laminate is, for example, a silicon wafer in the case of a semiconductor, or a material film of a glass plate in the case of a liquid crystal display panel. The configuration is not limited as long as the configuration satisfies the above configuration. Also, as an embodiment of the means for removing the photoresist layer using ozone water, a circulation type using a batch type of the removal tank is mentioned, but is not necessarily limited to this method. For example, a method of making contact using a spray method, a curtain flow method, or the like can also be used.

【0010】次いで、本発明に係るフォトレジストの除
去装置において、オゾン水生成部分の詳細を図2に示
す。オゾン水生成部分は、図中、符号2で示したところ
の原料水(W’)に、オゾンガス(OG)を溶け込まし
てオゾン水(OW)を生成するためのオゾン溶解部(オ
ゾン溶解モジュール)を基本構成とし、これに、イオン
交換水や超純水等の原料水(W)から溶存ガスを脱気し
て、オゾンガスを溶け込ませやすくするための脱気部1
と、上記オゾン溶解部2で生成された一次オゾン水(O
W)から所要量の溶存オゾンを脱気して溶存オゾンガス
濃度をコントロールすることにより最終的に使用される
二次オゾン水(OW’)を生成するためのオゾン濃度調
整部3を加えて構成され、更には必要に応じて上記オゾ
ン溶解部2で生成された一次オゾン水(OW)の溶存オ
ゾンガス濃度を検出するための第1オゾン検出器4と、
上記オゾン濃度調整部3で生成された二次オゾン水(O
W’)の溶存オゾンガス濃度を検出するための第2オゾ
ン検出器5とを具備する。
Next, FIG. 2 shows details of the ozone water generating portion in the photoresist removing apparatus according to the present invention. The ozone water generating portion is an ozone dissolving section (ozone dissolving module) for dissolving ozone gas (OG) into raw water (W ′) indicated by reference numeral 2 in the drawing to generate ozone water (OW). And a degassing unit 1 for degassing dissolved gas from raw water (W) such as ion-exchanged water or ultrapure water to facilitate the incorporation of ozone gas.
And the primary ozone water (O
W), a required amount of dissolved ozone is degassed to control the dissolved ozone gas concentration, and an ozone concentration adjusting unit 3 for generating secondary ozone water (OW ′) finally used is added. A first ozone detector 4 for detecting the concentration of dissolved ozone gas in the primary ozone water (OW) generated by the ozone dissolving section 2 as required;
The secondary ozone water (O
And a second ozone detector 5 for detecting the concentration of dissolved ozone gas W ′).

【0011】脱気部1は、オゾンガスを溶解させる原料
水(イオン交換水,超純水等)(W)から溶存ガスを脱
気することによりオゾン水にオゾン以外の余分な気体が
溶存しないようにすると共にオゾンガスを溶解しやすく
するためのものであり、公知の真空脱気装置と同様に、
真空容器11と、真空容器11の内部を減圧するための
真空ポンプ(図示せず)と、真空容器11内に設置され
て原料水(W)を流通させるための脱気用チューブ12
等で構成される。
The degassing section 1 degass a dissolved gas from raw water (ion-exchanged water, ultrapure water, etc.) (W) in which ozone gas is dissolved, so that an extra gas other than ozone is not dissolved in ozone water. And to facilitate the dissolution of ozone gas, similar to known vacuum deaerators,
A vacuum vessel 11, a vacuum pump (not shown) for reducing the pressure inside the vacuum vessel 11, and a deaeration tube 12 installed in the vacuum vessel 11 for flowing the raw water (W)
Etc.

【0012】脱気部1で使用される脱気用チューブ12
は、例えばフッ素系樹脂重合体や、シリコン系樹脂重合
体などからなる気体のみを通し液体の透過を阻止する公
知の材料を用いて所要の内径及び長さを有する中空管状
(チューブ状)に形成され、真空容器11の内部に設置
されて、その一端開口が液入口として原料水(W)の供
給源(貯水槽)10に接続され他端開口が液出口として
オゾン溶解部2に連通接続され、真空容器11の内部を
真空ポンプ等で減圧コントロールしながら原料水(W)
を上記液入口から当該脱気用チューブ12の内部に流通
させることにより、液出口から出てくる間に原料水
(W)から溶存ガスが脱気される仕組みになっている。
Tube 12 for deaeration used in deaeration section 1
Is formed into a hollow tube (tube shape) having a required inner diameter and length using a known material that allows only a gas made of, for example, a fluororesin polymer or a silicon-based resin polymer to pass through and prevent liquid from permeating. The one end opening is connected to a supply source (water storage tank) 10 of raw water (W) as a liquid inlet and the other end is connected to the ozone dissolving section 2 as a liquid outlet. While controlling the pressure inside the vacuum vessel 11 with a vacuum pump or the like, the raw water
Is passed from the liquid inlet to the inside of the degassing tube 12, whereby the dissolved gas is degassed from the raw water (W) while coming out of the liquid outlet.

【0013】次に、オゾン溶解モジュールの詳細を図3
に示す。オゾン溶解部2は、原料水にオゾンガスを溶け
込ましてオゾン水を生成するためのものであり、具体的
には予め溶存ガスが脱気された原料水(W’)にオゾン
ガス(OG)を溶け込まして一次オゾン水(OW)を生
成するためのものであり、収容容器21と、該収容容器
21内に設置されて予め溶存ガスが脱気された原料水
(W’)とオゾン発生器6から供給されるオゾンガス
(OG)とを隔離するオゾンガス透過膜22等からオゾ
ン溶解モジュールを構成してなる。
Next, the details of the ozone dissolving module are shown in FIG.
Shown in The ozone dissolving unit 2 is for dissolving ozone gas into raw water to generate ozone water. Specifically, the ozone dissolving unit 2 dissolves ozone gas (OG) into raw water (W ′) from which dissolved gas has been degassed in advance. To generate primary ozone water (OW), and a container 21, a raw water (W ′) installed in the container 21 from which dissolved gas has been degassed in advance, and an ozone generator 6. An ozone dissolving module is composed of an ozone gas permeable membrane 22 and the like for isolating ozone gas (OG) supplied from the apparatus.

【0014】オゾン溶解部2で使用するオゾンガス透過
膜22は、気体のみを通し、液体の透過を阻止する膜
材、好ましくはオゾンガスに対して耐食性及び耐劣化性
に優れ且つオゾンガスを選択的に透過させる性質を有す
る膜材、具体的にはフッ素系樹脂材、又はシリコン系樹
脂材、更に詳しくはフッ素系樹脂材である四弗化エチレ
ン系樹脂重合体なら例えば、テトラフルオロエチレン樹
脂(PTFE)や、パーフルオロアルコキシ樹脂(PF
A)、フッ化エチレンプロピレン樹脂(FEP)、或い
はフッ素系ゴム材等、シリコン系樹脂材ならメチルシリ
コーンゴム等からなる膜材を用いて、平膜形状又は所要
の内径及び長さを有する中空管状(チューブ状)に形成
し、脱気部2から供給される原料水(W’)とオゾン発
生器6から供給されるオゾンガス(OG)とを隔てるよ
うに収容容器21内に設置せしめ、原料水(W’)と接
触させた状態でオゾンガス(OG)の供給ラインを加圧
する、すなわちオゾンガス(OG)を加圧しながらオゾ
ンガス透過膜22を通過させるようにする。
The ozone gas permeable film 22 used in the ozone dissolving section 2 is a film material that allows only gas to pass and prevents liquid from permeating, preferably has excellent corrosion resistance and deterioration resistance to ozone gas and selectively transmits ozone gas. A film material having the property of causing the resin to be formed, specifically, a fluorine-based resin material or a silicon-based resin material, more specifically, a tetrafluoroethylene-based resin polymer which is a fluorine-based resin material, such as tetrafluoroethylene resin (PTFE) or , Perfluoroalkoxy resin (PF
A), a hollow film having a flat membrane shape or a required inner diameter and length using a membrane material such as methylsilicone rubber or the like for a silicone resin material such as a fluororesin material such as fluoroethylene propylene resin (FEP) or a fluorine rubber material. (Water) supplied from the deaeration unit 2 and ozone gas (OG) supplied from the ozone generator 6 are placed in the container 21 so as to be separated from each other. The supply line of the ozone gas (OG) is pressurized in a state where the ozone gas (OG) is in contact with (W ′), that is, the ozone gas (OG) is allowed to pass through the ozone gas permeable membrane 22 while being pressurized.

【0015】即ち、オゾンガス透過膜22を中空管状
(チューブ状)に形成した場合には、チューブ状に形成
したオゾンガス透過膜22を収容容器21内に設置し
て、収容容器21内にオゾンガス(OG)を充満または
流通させると共に、チューブ状に形成されたオゾンガス
透過膜22内に原料水(W’)を、充満または流通させ
るか、逆に、収容容器21内に原料水(W’)を充満ま
たは流通させチューブ状に形成されたオゾンガス透過膜
22内に、オゾンガス(OG)を充満または流通させる
ものである。尚、収容容器21としては、タンク形状に
形成されたものでも、或いは所要の長さを有する中空管
形状に形成されたものでも良い。
That is, when the ozone gas permeable film 22 is formed in a hollow tube (tube shape), the ozone gas permeable film 22 formed in a tube shape is installed in the storage container 21 and the ozone gas (OG) is stored in the storage container 21. ) Is filled or circulated, and the raw water (W ′) is filled or circulated in the ozone gas permeable membrane 22 formed in a tubular shape, or conversely, the raw water (W ′) is filled in the storage container 21. Alternatively, the ozone gas (OG) is filled or circulated in the ozone gas permeable film 22 formed in a tubular shape. The storage container 21 may be formed in a tank shape or a hollow tube shape having a required length.

【0016】ちなみに、図示実施例のオゾン溶解部2
は、チューブ状に形成した複数本のオゾンガス透過膜2
2の両端口をそれぞれ融着するか接着して束ね、一方収
容容器21をステンレス材等の耐オゾン性に優れた材料
で気密性を備えた略円筒形状に形成し、収容容器21内
にチューブ状オゾンガス透過膜22を収容せしめると共
に、チューブ状オゾンガス透過膜22の一端開口を収容
容器21の液入口21aに隣設させ他端開口を収容容器
21の液出口21bに臨設させてオゾン溶解モジュール
を構成せしめ、収容容器21の液出口21aを脱気部1
に連通接続させて原料水(W’)の入口とし、収容容器
21の液出口21bを、オゾン濃度調整部3ないしは貯
留タンク7に接続させて、一次オゾン水(OW)の出口
としたものである。
Incidentally, the ozone dissolving unit 2 of the illustrated embodiment
Is a plurality of ozone gas permeable membranes 2 formed in a tube shape.
The two ends of each of the two are fused or bonded to each other, and the storage container 21 is formed in a substantially cylindrical shape having airtightness with a material excellent in ozone resistance such as stainless steel. The ozone gas permeable membrane 22 is housed, the one end opening of the tubular ozone gas permeable membrane 22 is located next to the liquid inlet 21a of the housing container 21, and the other end is opened to the liquid outlet 21b of the housing container 21, and the ozone dissolving module is installed. The liquid outlet 21a of the container 21 is connected to the degassing unit 1
To the inlet of the raw water (W ′), and the liquid outlet 21b of the container 21 is connected to the ozone concentration controller 3 or the storage tank 7 to serve as the outlet of the primary ozone water (OW). is there.

【0017】そして、収容容器21に液入口21aとは
反対側に形成したガス入口21cにオゾン発生器6を接
続せしめ、収容容器21の内部をオゾン発生器6から供
給されるオゾンガス(OG)で外部より高圧状態にし、
その状態でもって、脱気部1で脱気された原料水
(W’)を液入口21aからチューブ状オゾンガス透過
膜22の内部にオゾンガス(OG)とは向流式に流通さ
せることにより、収容容器21内の高圧オゾンガス(O
G)がチューブ状オゾンガス透過膜22を通して、原料
水(W’)中に溶け込み、収容容器21の液出口21b
から出てくる間に、一次オゾン水(OW)が生成され、
余剰のオゾンガス(OG)が収容容器21のガス出口2
1dから外部へ排出される仕組みになっている。
An ozone generator 6 is connected to a gas inlet 21c formed on the side opposite to the liquid inlet 21a of the container 21. The inside of the container 21 is filled with ozone gas (OG) supplied from the ozone generator 6. High pressure from outside,
In this state, the raw water (W ′) degassed in the degassing section 1 is stored in the tubular ozone gas permeable membrane 22 through the liquid inlet 21a by flowing the ozone gas (OG) in a countercurrent manner. High-pressure ozone gas (O
G) dissolves in the raw water (W ′) through the tubular ozone gas permeable membrane 22, and the liquid outlet 21b of the storage container 21
Primary ozone water (OW) is generated while coming out of
Excess ozone gas (OG) is discharged from the gas outlet 2 of the container 21.
It is designed to be discharged from 1d to the outside.

【0018】尚、図示実施例のものとは逆に、収容容器
21の液入口21aからチューブ状オゾンガス透過膜2
2の内部にオゾンガス(OG)を流通させ、収容容器2
1のガス入口21cから原料水(W’)を流通させるこ
とにより、チューブ状オゾンガス透過膜22を通して原
料水(W’)にオゾンガス(OG)を溶け込ますように
しても良い。
It is to be noted that, contrary to the embodiment shown in FIG.
Ozone gas (OG) is circulated inside the container 2 and the container 2
The ozone gas (OG) may be dissolved into the raw water (W ′) through the tubular ozone gas permeable membrane 22 by flowing the raw water (W ′) from the first gas inlet 21 c.

【0019】オゾン溶解部2で生成された一次オゾン水
(OW)の溶存オゾンガス濃度は、オゾン溶解部2に接
続された第1オゾン検出器4により管理(モニター)さ
れる。通常、オゾン溶解部2で生成された、一次オゾン
水(OW)の溶存オゾンガス濃度は、かなり高くなるの
で、一旦、貯留タンク7(フォトレジスト除去水槽−1
にもなり得る)に貯留して置き、オゾン濃度調整部3で
溶存オゾンガス濃度を適正に調整することによりオゾン
水濃度をコントロール出来る。
The dissolved ozone gas concentration of the primary ozone water (OW) generated in the ozone dissolving section 2 is managed (monitored) by a first ozone detector 4 connected to the ozone dissolving section 2. Usually, the concentration of dissolved ozone gas in the primary ozone water (OW) generated in the ozone dissolving section 2 becomes considerably high.
The ozone water concentration can be controlled by appropriately adjusting the dissolved ozone gas concentration by the ozone concentration adjusting unit 3.

【0020】オゾン濃度調整部3は、オゾン溶解部2で
生成された一次オゾン水(OW)から所要量の溶存オゾ
ンを脱気して(最終的に使用する)二次オゾン水(O
W’)の溶存オゾンガス濃度をコントロールするための
ものであり、減圧容器31と、減圧容器31の内部を減
圧するための真空ポンプ(図示せず)と、減圧容器31
内に設置される脱気チューブ32等から構成され、減圧
容器31内を減圧した状態でもって、脱気チューブ32
の内部にオゾン溶解部2から供給された、一次オゾン水
(OW)を流通させるか、或いは脱気チューブ32内を
減圧した状態で減圧容器31内に、オゾン溶解部2から
供給された一次オゾン水(OW)を、供給することによ
り、オゾン溶解部2で生成された一次オゾン水(OW)
から所要量の溶存オゾンガスが脱気されて溶存オゾンガ
ス濃度が調整され、所望オゾンガス濃度の二次オゾン水
(OW’)が生成される。
The ozone concentration adjusting section 3 degass a required amount of dissolved ozone from the primary ozone water (OW) generated in the ozone dissolving section 2 (finally uses the dissolved ozone) and ultimately uses the secondary ozone water (O).
W ′) for controlling the concentration of the dissolved ozone gas, a pressure reducing vessel 31, a vacuum pump (not shown) for reducing the pressure inside the pressure reducing vessel 31, and a pressure reducing vessel 31.
The degassing tube 32 is provided in the decompression tube 31 in a state where the pressure inside the decompression container 31 is reduced.
The primary ozone supplied from the ozone dissolving unit 2 is supplied to the decompression container 31 while the primary ozone water (OW) supplied from the ozone dissolving unit 2 is circulated inside the degassing tube 32. The primary ozone water (OW) generated in the ozone dissolving section 2 by supplying water (OW)
, A required amount of dissolved ozone gas is degassed, the dissolved ozone gas concentration is adjusted, and secondary ozone water (OW ′) having a desired ozone gas concentration is generated.

【0021】このオゾン濃度調整部3で用いる脱気チュ
ーブ32としては、気体のみを通し液体の透過を阻止す
る膜材、好ましくはオゾンガスに対して、耐食性及び耐
劣化性に優れた膜材、具体的にはフッ素系樹脂材または
シリコン系樹脂材、更に詳しくは、フッ素系樹脂材であ
る四弗化エチレン系樹脂重合体なら例えば、テトラフル
オロエチレン樹脂(PTFE)や、パーフルオロアルコ
キシ樹脂(PFA)、フッ化エチレンプロピレン樹脂
(FEP)、或いはフッ素系ゴム材等、シリコン系樹脂
材ならメチルシリコーンゴム等からなる膜材を用いて、
所要の内径及び長さを有する中空管状(チューブ状)に
形成され、減圧容器31の内部に設置される。
The deaeration tube 32 used in the ozone concentration adjusting section 3 is a film material that allows only gas to pass and prevents liquid from permeating, preferably a film material that is excellent in corrosion resistance and deterioration resistance to ozone gas. Specifically, a fluorine-based resin material or a silicon-based resin material, more specifically, a tetrafluoroethylene-based resin polymer which is a fluorine-based resin material, for example, tetrafluoroethylene resin (PTFE) or perfluoroalkoxy resin (PFA) Using a film material made of methylsilicone rubber or the like for a silicone resin material, such as fluorinated ethylene propylene resin (FEP) or fluorine rubber material,
It is formed in a hollow tube (tube shape) having a required inner diameter and length, and is installed inside the decompression vessel 31.

【0022】そして、図示実施例の場合、脱気チューブ
32の一端開口を、一次オゾン水(OW)の液入口とし
て、オゾン溶解部2に接続すると共に、他端開口を液出
口として、オゾン水貯留タンク8(フォトレジスト除去
水槽−1にもなり得る)に接続せしめ、減圧容器31の
内部を真空ポンプ等で減圧コントロールしながらオゾン
溶解部2で生成された、一次オゾン水(OW)を、上記
液入口から当該脱気チューブ32の内部に流通させるこ
とにより、液出口から出てくる間に一次オゾン水(O
W)から所要量の溶存ガスが脱気されて、溶存オゾンガ
ス濃度が調整され、その結果、所望オゾンガス濃度の二
次オゾン水(OW’)が生成される仕組みになってい
る。
In the case of the illustrated embodiment, one end opening of the degassing tube 32 is connected to the ozone dissolving section 2 as a liquid inlet for primary ozone water (OW), and the other end opening is used as a liquid outlet. The primary ozone water (OW) generated in the ozone dissolving unit 2 while being connected to the storage tank 8 (which can also be a photoresist removal water tank-1) and controlling the inside of the vacuum container 31 with a vacuum pump or the like is removed. By flowing the liquid from the liquid inlet to the inside of the degassing tube 32, the primary ozone water (O
A required amount of dissolved gas is degassed from W), the dissolved ozone gas concentration is adjusted, and as a result, secondary ozone water (OW ′) having a desired ozone gas concentration is generated.

【0023】オゾン濃度調整部3で生成された二次オゾ
ン水(OW’)の溶存オゾンガス濃度は、オゾン濃度調
整部3に接続された第2オゾン検出器5により管理(モ
ニター)されるが、この第2オゾン検出器5とオゾン溶
解部2で生成された一次オゾン水(OW)の溶存オゾン
ガス濃度を管理(モニター)する第1オゾン検出器4と
を切換えバルブ(図示せず)等で切り替えることによ
り、オゾン処理装置としては1台のオゾン検出器で済ま
すことも可能である。そして、オゾン検出器4,5とし
ては、紫外線吸光光度法を利用した連続測定式溶存オゾ
ンモニター等の市販されているものを利用することが出
来る。
The dissolved ozone gas concentration of the secondary ozone water (OW ′) generated by the ozone concentration adjusting section 3 is managed (monitored) by the second ozone detector 5 connected to the ozone concentration adjusting section 3. The second ozone detector 5 and the first ozone detector 4 for managing (monitoring) the dissolved ozone gas concentration of the primary ozone water (OW) generated by the ozone dissolving unit 2 are switched by a switching valve (not shown) or the like. Thus, it is possible to use only one ozone detector as the ozone treatment device. As the ozone detectors 4 and 5, commercially available ozone detectors such as a continuous measurement type dissolved ozone monitor using an ultraviolet absorption method can be used.

【0024】尚、本発明におけるオゾン発生器6として
は、空気や酸素ガスを無声放電の中に通してオゾンガス
を発生させる無声放電式のものや紫外線照射式のものな
ど、市販されているものを利用することが出来る。
As the ozone generator 6 in the present invention, a commercially available one such as a silent discharge type in which air or oxygen gas is passed through a silent discharge to generate ozone gas or an ultraviolet irradiation type is used. Can be used.

【0025】次に、オゾン溶解モジュール(オゾン溶解
部)2を用いた、オゾン水生成システムについて、図4
を参照しながら説明する。尚、図2で示した構成部材と
同じ構成部材には同じ符号を付して、説明は省略する。
原料水(W)として室温と同じ温度に調整された水道水
を用い、図示していないポンプ(日機装社製 GY14
−PYTE−45/54)により流量計91を通してオ
ゾン溶解モジュール2のチューブ状オゾンガス透過膜2
2内へ流通させ、一方、オゾンガス(OG)の原料とし
て酸素ガスを用い、流量計93を通してオゾン発生器6
(テクノエコー社製OZG−600)でオゾン化し、そ
のオゾンガス濃度をオゾンガス検出器(理工科学社製0
ZR911)94でモニターした後、オゾン溶解モジュ
ール2の内部(収容容器21の内部)に供給して、チュ
ーブ状オゾンガス透過膜22を通して原料水(W)に溶
け込ます。生成されたオゾン水(OW)のオゾンガス濃
度を、オゾンガス検出器(理工科学社製0ZR911
4)で検出する。
Next, an ozone water generation system using an ozone dissolution module (ozone dissolution unit) 2 will be described with reference to FIG.
This will be described with reference to FIG. The same components as those shown in FIG. 2 are denoted by the same reference numerals, and description thereof will be omitted.
As a raw water (W), tap water adjusted to the same temperature as room temperature was used, and a pump (not shown, GY14 manufactured by Nikkiso Co., Ltd.) was used.
-PYTE-45 / 54) through the flow meter 91 to form a tubular ozone gas permeable membrane 2 of the ozone dissolving module 2
2, while using oxygen gas as a raw material of ozone gas (OG) and passing through an ozone generator 6 through a flow meter 93.
(OZG-600 manufactured by Techno Echo Co., Ltd.) and the ozone gas concentration is measured using an ozone gas detector (0
After monitoring by ZR911) 94, the water is supplied to the inside of the ozone dissolving module 2 (the inside of the container 21), and is dissolved in the raw water (W) through the tubular ozone gas permeable membrane 22. The ozone gas concentration of the generated ozone water (OW) is measured with an ozone gas detector (0ZR911 manufactured by Riko Kagaku Co., Ltd.).
Detect in 4).

【0026】尚、上述のようにオゾン生成部の詳細を説
明したが、生成したオゾン水は、本発明の装置にどう適
用するかは、前述したように適宜選択出来る。すなわ
ち、オゾン水貯留タンク7,8等を、そのままフォトレ
ジスト除去槽として利用しても良いし、また、これらタ
ンクに一旦、保存したものを上述のような別の方法で、
オゾン水を用いた除去方法として利用しても良い。
Although the ozone generator has been described in detail above, how the generated ozone water is applied to the apparatus of the present invention can be appropriately selected as described above. That is, the ozone water storage tanks 7 and 8 and the like may be used as a photoresist removal tank as they are, or those once stored in these tanks may be used in another method as described above.
It may be used as a removal method using ozone water.

【0027】<オゾン水生成例1>上述した図3に示し
たオゾン溶解モジュール2と、図4に示したシステムを
用い、チューブ状オゾンガス透過膜22として、AWG
(アメリカ ワイヤードゲージ規格)24に準拠した内
径0.5mmφ、厚み0.15mm、長さ3.5mのテ
トラフルオロエチレン樹脂(PTFE)製中空管(チュ
ーブ)を150本束ねたものを用い、これを内径100
mmφ、長さ170mmに形成されたステンレス製の収
容容器21内にセットし、オゾン溶解モジュール2の液
入口21aからチューブ状オゾンガス透過膜22内に室
温(22℃)と同じ温度に調整した水道水を流通させる
と共に、オゾン溶解モジュール2のガス入口21cから
濃度31mg/Lのオゾンガスを水道水の流れに対して
向流で130mL/minの流量で供給し、水道水の流
速を段階的に変えて生成されたオゾン水のオゾンガス濃
度を測定した。
<Example 1 of Ozone Water Generation> The ozone dissolving module 2 shown in FIG. 3 and the system shown in FIG.
A bundle of 150 hollow tubes (tubes) made of tetrafluoroethylene resin (PTFE) having an inner diameter of 0.5 mmφ, a thickness of 0.15 mm, and a length of 3.5 m in accordance with (American Wired Gauge Standard) 24 is used. The inner diameter 100
tap water adjusted to the same temperature as room temperature (22 ° C.) in a tubular ozone gas permeable membrane 22 through a liquid inlet 21 a of the ozone dissolving module 2 through a stainless steel container 21 having a diameter of 170 mm and a length of 170 mm. And the ozone gas having a concentration of 31 mg / L is supplied from the gas inlet 21c of the ozone dissolving module 2 at a flow rate of 130 mL / min countercurrent to the flow of the tap water, and the flow rate of the tap water is changed stepwise. The ozone gas concentration of the generated ozone water was measured.

【0028】この測定結果より、流速25mL/min
で瞬時に16.5mg/Lと高濃度のオゾン水が得ら
れ、気相濃度と液体濃度の比、すなわち分配係数(液体
オゾンガス濃度/気体オゾンガス濃度)は水流速25m
L/minで0.53とばっ気方式(オゾン水生成例3
参照)と比較して、約2.5倍の分配率であった。
From the measurement results, the flow rate was 25 mL / min.
Instantaneously yields a high concentration of 16.5 mg / L of ozone water, and the ratio between the gas phase concentration and the liquid concentration, that is, the distribution coefficient (liquid ozone gas concentration / gas ozone gas concentration) is 25 m
Aeration method with 0.53 at L / min (Ozone water generation example 3
) Was about 2.5 times the distribution ratio.

【0029】<オゾン水生成例2>チューブ状オゾンガ
ス透過膜22として、内径1.0mmφ、内径2.0m
mφ、厚み0.5mm、長さ3.5mの東洋紡エンジニ
アリング社製のシリコン中空管(チューブ)を10本束
ねたものを用いた以外はオゾン水生成例1と同様にし
て、生成されたオゾン水のオゾンガス濃度を測定した。
その結果、オゾンガス濃度16.2mg/Lのオゾン水
が得られ、分配係数は0.52であり、ばっ気方式(オ
ゾン水生成例3参照)と比較して、約2.5倍の分配率
であることが実証された。
<Example 2 of Ozone Water Generation> The tube-shaped ozone gas permeable membrane 22 has an inner diameter of 1.0 mmφ and an inner diameter of 2.0 m.
Ozone generated in the same manner as in Ozone water generation example 1 except that ten silicon hollow tubes (tubes) manufactured by Toyobo Engineering Co., Ltd. having a diameter of 0.5 mm, a thickness of 0.5 mm, and a length of 3.5 m were used. The ozone gas concentration of water was measured.
As a result, ozone water having an ozone gas concentration of 16.2 mg / L was obtained, and the distribution coefficient was 0.52, which was about 2.5 times that of the aeration method (see ozone water generation example 3). It was proved that.

【0030】<オゾン水生成例3>オゾン溶解モジュー
ルの代わりに、内径60mmφ、長さ1.0mのポリ塩
化ビニル樹脂製パイプを縦型にセットし、その低部から
セラミック製の焼結フィルターを通してオゾンガスを噴
出させることにより気泡化すると共に、上部から室温
(20℃)に調整された水道水を流速25mL/min
で流し、ばっ気開始から10分後のオゾンガス濃度を測
定した以外は、オゾン水生成例1と同様にした。その結
果、オゾンガス濃度6.5mg/Lのオゾン水が得ら
れ、この比較から、ばっ気方式ではオゾンガス濃度が
0.21の分配係数であり、同じオゾンガス濃度のオゾ
ン水生成例1の流速25mL/min、オゾン水濃度1
6.5mg/Lと比較して39%の濃度であった。これ
ら結果を、表1に示した。
<Example 3 of ozone water generation> Instead of the ozone dissolving module, a pipe made of polyvinyl chloride resin having an inner diameter of 60 mm and a length of 1.0 m was set in a vertical shape, and a ceramic sintered filter was passed through a lower part thereof. Ozone gas is spouted to form bubbles, and tap water adjusted to room temperature (20 ° C.) is flowed from the top at a flow rate of 25 mL / min.
And ozone water generation example 1 was carried out except that the ozone gas concentration 10 minutes after the start of aeration was measured. As a result, ozone water having an ozone gas concentration of 6.5 mg / L was obtained. From this comparison, the ozone gas concentration was 0.21 in the aeration method, and the flow rate of the ozone water generation example 1 with the same ozone gas concentration was 25 mL / L. min, ozone water concentration 1
The concentration was 39% as compared with 6.5 mg / L. The results are shown in Table 1.

【0031】[0031]

【表1】 [Table 1]

【0032】<実施例、フォトレジスト除去作業>10
00×1000mm角のガラス板上に、TFT用ポジ型
レジスト(商品名「OFPR−PR13」、東京応化工
業社製)を、スピンコーター(商品名「1H−DXNI
I」、ミカサ社製)を用いて均一塗布し、90℃、30
分間加熱乾燥してフォトレジスト層を積層させた。以上
の方法により、フォトレジスト積層体の試料を得た。
尚、上記フォトレジスト層の厚みは、1.1μmであっ
た。上記試料を用いて、上記オゾン水生成例1〜3で作
成したオゾン水により満たしたフォトレジスト除去水槽
のオゾン水中に30分間浸漬し、フォトレジスト層の除
去具合を確認した。その結果、オゾン水生成例1、2の
ものを使用した場合には、フォトレジスト層は、完全に
除去されていたが、オゾン水生成例3のものは0.3μ
mしか、除去されていなかった。
<Example, Photoresist Removal Operation> 10
A positive resist for TFT (trade name “OFPR-PR13”, manufactured by Tokyo Ohka Kogyo Co., Ltd.) is coated on a 00 × 1000 mm square glass plate by a spin coater (trade name “1H-DXNI”).
I ", manufactured by Mikasa Co., Ltd.)
After heating and drying for a minute, a photoresist layer was laminated. By the above method, a sample of the photoresist laminated body was obtained.
Incidentally, the thickness of the photoresist layer was 1.1 μm. Using the sample, the sample was immersed in ozone water in a photoresist removal tank filled with the ozone water created in the ozone water generation examples 1 to 30 for 30 minutes, and the removal condition of the photoresist layer was confirmed. As a result, when the ozone water generation examples 1 and 2 were used, the photoresist layer was completely removed.
m had been removed.

【0033】[0033]

【発明の効果】本発明のフォトレジスト除去装置によれ
ば、高濃度なオゾン水を用いてフォトレジスト除去作業
が出来るので、大量の薬液や、高温処理をすることな
く、生産性良く、エッチング後のフォトレジスト除去を
することが出来る。さらに、本発明の装置では、上記オ
ゾン水は、原料水とオゾンガスとを気体のみを通し液体
の透過を阻止するオゾンガス透過膜で隔離せしめ、該オ
ゾンガス透過膜を通して上記原料水に上記オゾンガスを
溶け込ますようにして生成するので、人に対して有毒な
オゾンガスは原料水に、ばっ気されないため安全、且つ
高濃度なオゾン水が簡単な機構・設備でもって効率良く
生成可能となる。
According to the photoresist removing apparatus of the present invention, the photoresist can be removed using high-concentration ozone water. Of the photoresist can be removed. Further, in the apparatus of the present invention, the ozone water separates the raw water and the ozone gas by an ozone gas permeable membrane that passes only gas and prevents liquid permeation, and dissolves the ozone gas into the raw water through the ozone gas permeable membrane. Since ozone gas toxic to humans is not aerated in the raw material water, safe and high-concentration ozone water can be efficiently generated with simple mechanisms and equipment.

【0034】さらに、上記オゾンガス透過膜を中空管状
に形成し、該オゾンガス透過膜を収容容器内に設置した
ので、簡単な構成でもって、原料水にオゾンガスを容易
に溶け込まして高濃度なオゾン水を生成することが出来
る。
Further, since the ozone gas permeable membrane is formed in a hollow tubular shape and the ozone gas permeable membrane is installed in the container, the ozone gas can be easily dissolved in the raw water by a simple structure and the ozone gas having a high concentration can be obtained. Can be generated.

【0035】さらに、上記オゾンガス透過膜をフッ素樹
脂で形成してなるので、オゾンガスに対して耐食性及び
耐劣化性に優れ且つオゾンガスを選択的に透過させるこ
とが可能となり、従って、オゾン水を効率的に生成する
ことが出来る。
Further, since the ozone gas permeable film is formed of a fluororesin, it is excellent in corrosion resistance and deterioration resistance to ozone gas, and can selectively transmit ozone gas. Can be generated.

【図面の簡単な説明】[Brief description of the drawings]

【図1】 本発明の装置の一実施形態を示す概略図であ
る。
FIG. 1 is a schematic diagram showing an embodiment of the apparatus of the present invention.

【図2】 本発明の装置のオゾン水生成部分の説明図で
ある。
FIG. 2 is an explanatory view of an ozone water generating portion of the apparatus of the present invention.

【図3】 本発明の装置における、オゾン水生成部分で
あるオゾン溶解モジュールの一実施形態を示す模式図で
ある。
FIG. 3 is a schematic diagram showing an embodiment of an ozone dissolving module which is an ozone water generating part in the apparatus of the present invention.

【図4】 本発明の装置における、オゾン水生成部分で
あるオゾン溶解システムの一実施形態を示す説明図であ
る。
FIG. 4 is an explanatory view showing an embodiment of an ozone dissolving system which is an ozone water generating part in the apparatus of the present invention.

【符号の説明】[Explanation of symbols]

−1:フォトレジスト除去槽 −2:フォトレジスト積層体 −3:フォトレジストが除去されたエッチング処理後の
基盤 1:脱気部 11:真空容器 12:脱気用チューブ 2:オゾン溶解部 21:収容容器 22:オゾンガス透過膜 3:オゾン濃度調整部 31:減圧容器 32:脱気チューブ 4:第1オゾン検出器 5:第2オゾ
ン検出器 6:オゾン発生器 7:貯留タン
ク 8:オゾン水貯留タンク 10:原料水供
給源(貯水槽) W,W’:原料水 OG:オゾン
ガス OW:一次オゾン水 OW’:二次オ
ゾン水
-1: Photoresist removal tank -2: Photoresist laminate -3: Substrate after etching treatment with photoresist removed 1: Degassing section 11: Vacuum container 12: Degassing tube 2: Ozone dissolving section 21: Storage container 22: Ozone gas permeable membrane 3: Ozone concentration adjustment unit 31: Decompression container 32: Degassing tube 4: First ozone detector 5: Second ozone detector 6: Ozone generator 7: Storage tank 8: Ozone water storage Tank 10: raw water supply source (water storage tank) W, W ': raw water OG: ozone gas OW: primary ozone water OW': secondary ozone water

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 基盤上にフォトレジスト層が形成させた
フォトレジスト積層体をエッチング処理した後、不要と
なった前記積層体のフォトレジスト層を、オゾン水を用
いて除去するフォトレジスト除去装置であって、 上記オゾン水は、原料水とオゾンガスとを気体のみを通
し液体の透過を阻止するオゾンガス透過膜で隔離せし
め、該オゾンガス透過膜を通して上記原料水に、上記オ
ゾンガスを溶け込ますようにして生成することを特徴と
するフォトレジスト除去装置。
1. A photoresist removing apparatus for removing a photoresist layer of an unnecessary laminate using ozone water after etching a photoresist laminate having a photoresist layer formed on a substrate. The ozone water is generated by isolating the raw water and ozone gas by an ozone gas permeable membrane that passes only gas and prevents liquid permeation, and dissolves the ozone gas into the raw water through the ozone gas permeable membrane. A photoresist removing apparatus.
【請求項2】 上記オゾンガス透過膜が中空管状に形成
され、該オゾンガス透過膜を収容容器内に設置してなる
請求項1記載のフォトレジスト除去装置。
2. The photoresist removing apparatus according to claim 1, wherein the ozone gas permeable film is formed in a hollow tubular shape, and the ozone gas permeable film is installed in a container.
【請求項3】 上記オゾンガス透過膜が、フッ素系樹脂
又はシリコン系樹脂から形成されてなる請求項1、又は
2記載のフォトレジスト除去装置。
3. The photoresist removing apparatus according to claim 1, wherein the ozone gas permeable film is formed of a fluorine-based resin or a silicon-based resin.
JP2000151565A 2000-01-12 2000-05-23 Apparatus for removing photoresist Pending JP2001330969A (en)

Priority Applications (7)

Application Number Priority Date Filing Date Title
JP2000151565A JP2001330969A (en) 2000-05-23 2000-05-23 Apparatus for removing photoresist
TW090100662A TWI280891B (en) 2000-01-12 2001-01-12 Ozonization apparatus, photoresist remove apparatus, and substrate rinsing apparatus
PCT/JP2001/000121 WO2001051187A1 (en) 2000-01-12 2001-01-12 Ozone treating apparatus
DE60143019T DE60143019D1 (en) 2000-01-12 2001-01-12 DEVICE FOR TREATMENT WITH OZONE
KR1020027008791A KR20020071011A (en) 2000-01-12 2001-01-12 Ozone treating apparatus
US10/169,946 US6955758B2 (en) 2000-01-12 2001-01-12 Ozone treating apparatus
EP01900696A EP1254698B1 (en) 2000-01-12 2001-01-12 Ozone treating apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000151565A JP2001330969A (en) 2000-05-23 2000-05-23 Apparatus for removing photoresist

Publications (1)

Publication Number Publication Date
JP2001330969A true JP2001330969A (en) 2001-11-30

Family

ID=18657103

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000151565A Pending JP2001330969A (en) 2000-01-12 2000-05-23 Apparatus for removing photoresist

Country Status (1)

Country Link
JP (1) JP2001330969A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007063701A1 (en) 2005-12-02 2007-06-07 Sekisui Chemical Co., Ltd. Hydrophilic polymer microparticle, filler for ion exchange liquid chromatography, and method for production of filler for ion exchange liquid chromatography
JP2009033163A (en) * 2007-07-24 2009-02-12 Asml Netherlands Bv Lithographic apparatus and contamination removal or prevention method
WO2012096329A1 (en) 2011-01-12 2012-07-19 積水メディカル株式会社 Method for detecting single nucleotide polymorphisms
WO2012133834A1 (en) 2011-03-31 2012-10-04 積水メディカル株式会社 Sample nucleic acid for single nucleotide polymorphism detection purposes, pcr primer for preparing sample for single nucleotide polymorphism detection purposes, and method for preparing sample for single nucleotide polymorphism detection purposes which can be used in ion exchange chromatographic analysis
US9158206B2 (en) 2007-07-24 2015-10-13 Asml Netherlands B.V. Lithographic apparatus and contamination removal or prevention method
US10290511B2 (en) 2012-08-08 2019-05-14 SCREEN Holdings Co., Ltd Substrate treatment apparatus and substrate treatment method

Citations (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6269612A (en) * 1985-09-24 1987-03-30 Hitachi Ltd Treating device
JPH04111308A (en) * 1990-08-30 1992-04-13 Chlorine Eng Corp Ltd Method for removing organic material film
JPH05152270A (en) * 1991-11-29 1993-06-18 Chlorine Eng Corp Ltd Substrate treatment method
JPH0699197A (en) * 1991-05-17 1994-04-12 Ebara Res Co Ltd Method and equipment for purifying pure water or ultrapure water
JPH07213880A (en) * 1994-01-31 1995-08-15 Japan Gore Tex Inc Tubular membrane
JPH08196879A (en) * 1995-01-30 1996-08-06 Ebara Corp Production of ozone water and equipment therefor
JPH0994449A (en) * 1995-10-02 1997-04-08 Shuzo Matsumura Gas liquid contact reactor
JPH10202074A (en) * 1997-01-21 1998-08-04 Nitto Denko Corp Asymmetric structural fluororesin tube, production thereof, deaerating method using the tube and device therefor
JPH10277370A (en) * 1997-04-10 1998-10-20 Nitto Denko Corp Spiral type membrane module
JPH1171600A (en) * 1997-06-24 1999-03-16 Furontetsuku:Kk Production of cleaning solution and apparatus therefor
JPH1177023A (en) * 1997-09-02 1999-03-23 Kurita Water Ind Ltd Preparation of hydrogen-containing ultrapure water
JPH11174692A (en) * 1997-08-27 1999-07-02 Motorola Inc Device and method for removing photo-resist on semiconductor substrate
JPH11227087A (en) * 1998-02-17 1999-08-24 Sumitomo Electric Ind Ltd Porous polytetrafluoroethylene membrane for gas dissolution
JPH11333284A (en) * 1998-05-25 1999-12-07 Nitto Denko Corp Gas-liquid contact membrane device
JP2000037695A (en) * 1998-07-24 2000-02-08 Kurita Water Ind Ltd Apparatus for supplying ozone water
WO2001051187A1 (en) * 2000-01-12 2001-07-19 Sekisui Chemical Co., Ltd. Ozone treating apparatus
JP2001223206A (en) * 1999-12-03 2001-08-17 Mitsubishi Electric Corp Substrate treating method and device
JP2002028462A (en) * 2000-01-12 2002-01-29 Sekisui Chem Co Ltd Ozone treating device
JP2002057136A (en) * 2000-08-09 2002-02-22 Sekisui Chem Co Ltd Wafer washing device

Patent Citations (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6269612A (en) * 1985-09-24 1987-03-30 Hitachi Ltd Treating device
JPH04111308A (en) * 1990-08-30 1992-04-13 Chlorine Eng Corp Ltd Method for removing organic material film
JPH0699197A (en) * 1991-05-17 1994-04-12 Ebara Res Co Ltd Method and equipment for purifying pure water or ultrapure water
JPH05152270A (en) * 1991-11-29 1993-06-18 Chlorine Eng Corp Ltd Substrate treatment method
JPH07213880A (en) * 1994-01-31 1995-08-15 Japan Gore Tex Inc Tubular membrane
JPH08196879A (en) * 1995-01-30 1996-08-06 Ebara Corp Production of ozone water and equipment therefor
JPH0994449A (en) * 1995-10-02 1997-04-08 Shuzo Matsumura Gas liquid contact reactor
JPH10202074A (en) * 1997-01-21 1998-08-04 Nitto Denko Corp Asymmetric structural fluororesin tube, production thereof, deaerating method using the tube and device therefor
JPH10277370A (en) * 1997-04-10 1998-10-20 Nitto Denko Corp Spiral type membrane module
JPH1171600A (en) * 1997-06-24 1999-03-16 Furontetsuku:Kk Production of cleaning solution and apparatus therefor
JPH11174692A (en) * 1997-08-27 1999-07-02 Motorola Inc Device and method for removing photo-resist on semiconductor substrate
JPH1177023A (en) * 1997-09-02 1999-03-23 Kurita Water Ind Ltd Preparation of hydrogen-containing ultrapure water
JPH11227087A (en) * 1998-02-17 1999-08-24 Sumitomo Electric Ind Ltd Porous polytetrafluoroethylene membrane for gas dissolution
JPH11333284A (en) * 1998-05-25 1999-12-07 Nitto Denko Corp Gas-liquid contact membrane device
JP2000037695A (en) * 1998-07-24 2000-02-08 Kurita Water Ind Ltd Apparatus for supplying ozone water
JP2001223206A (en) * 1999-12-03 2001-08-17 Mitsubishi Electric Corp Substrate treating method and device
WO2001051187A1 (en) * 2000-01-12 2001-07-19 Sekisui Chemical Co., Ltd. Ozone treating apparatus
JP2002028462A (en) * 2000-01-12 2002-01-29 Sekisui Chem Co Ltd Ozone treating device
JP2002057136A (en) * 2000-08-09 2002-02-22 Sekisui Chem Co Ltd Wafer washing device

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007063701A1 (en) 2005-12-02 2007-06-07 Sekisui Chemical Co., Ltd. Hydrophilic polymer microparticle, filler for ion exchange liquid chromatography, and method for production of filler for ion exchange liquid chromatography
EP2602021A1 (en) 2005-12-02 2013-06-12 Sekisui Chemical Co., Ltd. Filler for ion exchange liquid chromatography, method for production of filler for ion exchange liquid chromatography and method for analyzing a glycosylated hemoglobin
EP3040120A1 (en) 2005-12-02 2016-07-06 Sekisui Chemical Co., Ltd. Filler for ion exchange liquid chromatography, method for production of filler for ion exchange liquid chromatography and method for analyzing a glycosylated hemoglobin
JP2009033163A (en) * 2007-07-24 2009-02-12 Asml Netherlands Bv Lithographic apparatus and contamination removal or prevention method
US9019466B2 (en) 2007-07-24 2015-04-28 Asml Netherlands B.V. Lithographic apparatus, reflective member and a method of irradiating the underside of a liquid supply system
US9158206B2 (en) 2007-07-24 2015-10-13 Asml Netherlands B.V. Lithographic apparatus and contamination removal or prevention method
US9599908B2 (en) 2007-07-24 2017-03-21 Asml Netherlands B.V. Lithographic apparatus and contamination removal or prevention method
WO2012096329A1 (en) 2011-01-12 2012-07-19 積水メディカル株式会社 Method for detecting single nucleotide polymorphisms
WO2012133834A1 (en) 2011-03-31 2012-10-04 積水メディカル株式会社 Sample nucleic acid for single nucleotide polymorphism detection purposes, pcr primer for preparing sample for single nucleotide polymorphism detection purposes, and method for preparing sample for single nucleotide polymorphism detection purposes which can be used in ion exchange chromatographic analysis
US10290511B2 (en) 2012-08-08 2019-05-14 SCREEN Holdings Co., Ltd Substrate treatment apparatus and substrate treatment method

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