JP2001242204A - Direct current resistance measuring method of capacitor and its device - Google Patents

Direct current resistance measuring method of capacitor and its device

Info

Publication number
JP2001242204A
JP2001242204A JP2000051563A JP2000051563A JP2001242204A JP 2001242204 A JP2001242204 A JP 2001242204A JP 2000051563 A JP2000051563 A JP 2000051563A JP 2000051563 A JP2000051563 A JP 2000051563A JP 2001242204 A JP2001242204 A JP 2001242204A
Authority
JP
Japan
Prior art keywords
capacitor
voltage
resistance
charging
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000051563A
Other languages
Japanese (ja)
Inventor
Masayuki Mori
正行 森
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Chemi Con Corp
Original Assignee
Nippon Chemi Con Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Chemi Con Corp filed Critical Nippon Chemi Con Corp
Priority to JP2000051563A priority Critical patent/JP2001242204A/en
Publication of JP2001242204A publication Critical patent/JP2001242204A/en
Pending legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To provide a direct current resistance measuring method of a capacitor and its device capable of measuring a direct current resistance simply, quickly and accurately. SOLUTION: In this direct current measuring method and its device, a capacitor 4 is charged by a charging current ic of a constant current or the like up to a prescribed voltage Vm, and then an inter-terminal voltage Vn is measured after leaving the capacitor 4 in the open state as long as a fixed time, and a voltage drop ΔV=Vr is obtained by subtracting the inter-terminal voltage Vn after elapse of the fixed time from the prescribed voltage Vm, and the voltage drop is divided by the charging current ic, to thereby calculate the direct current resistance r of the capacitor. The direct current resistance of an electric double-layer capacitor can be obtained simply, quickly and accurately by this constitution.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、電気二重層コンデ
ンサ等のコンデンサの直流抵抗の測定に用いられる直流
抵抗測定方法及びその装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method and an apparatus for measuring a DC resistance of a capacitor such as an electric double layer capacitor.

【0002】[0002]

【従来の技術】電気二重層コンデンサ等のコンデンサ
は、その性能を示すパラメータとして直流抵抗が存在
し、理想コンデンサと直流抵抗との直列回路がその等価
回路として知られている。コンデンサが持つ直流抵抗を
把握することは、コンデンサの品質や特性を評価するた
めに不可欠である。コンデンサの直流抵抗を測定する技
術には、例えば、特開平10−319066号「容量性
素子の等価直列抵抗測定方法および等価直列抵抗測定装
置」が知られているが、その測定方法は極めて複雑であ
る。
2. Description of the Related Art A capacitor such as an electric double layer capacitor has a DC resistance as a parameter indicating its performance, and a series circuit of an ideal capacitor and a DC resistance is known as an equivalent circuit thereof. Understanding the DC resistance of a capacitor is indispensable for evaluating the quality and characteristics of a capacitor. As a technique for measuring the DC resistance of a capacitor, for example, Japanese Unexamined Patent Application Publication No. 10-319066 “Method for measuring equivalent series resistance of capacitive element and apparatus for measuring equivalent series resistance” is known, but the measuring method is extremely complicated. is there.

【0003】[0003]

【発明が解決しようとする課題】ところで、従来の電気
二重層コンデンサ等のコンデンサの直流抵抗の測定に
は、従前より各種の抵抗測定法が用いられているが、簡
単かつ迅速に測定し、しかも、短時間で正確な直流抵抗
を求めることができなかった。
Various conventional resistance measuring methods have been used for measuring the DC resistance of a conventional capacitor such as an electric double layer capacitor. However, the DC resistance is measured simply and quickly. However, accurate DC resistance could not be obtained in a short time.

【0004】そこで、本発明の課題は、簡単かつ迅速に
しかも正確に直流抵抗を測定できるコンデンサの直流抵
抗測定方法及びその装置を提供することにある。
An object of the present invention is to provide a method and an apparatus for measuring the DC resistance of a capacitor, which can measure the DC resistance simply, quickly and accurately.

【0005】[0005]

【課題を解決するための手段】本発明は、コンデンサ
(4)を定電流等の所定の充電電流(ic)で所定電圧
(Vm)まで充電させた後、コンデンサ(4)を一定時
間開放状態に置いて端子間電圧(Vn)を測定し、前記
所定電圧(Vm)から前記一定時間経過後の端子間電圧
(Vn)を減算して電圧降下(ΔV=Vr)を求め、こ
の電圧降下を充電電流(ic)で除すことにより、コン
デンサの直流抵抗(r)を算出する直流測定方法及びそ
の装置である。このような構成によれば、簡単かつ迅速
にしかも正確に電気二重層コンデンサの直流抵抗を求め
ることができる。
According to the present invention, after a capacitor (4) is charged to a predetermined voltage (Vm) with a predetermined charging current (ic) such as a constant current, the capacitor (4) is opened for a predetermined time. To measure the inter-terminal voltage (Vn), and subtract the inter-terminal voltage (Vn) after the elapse of the predetermined time from the predetermined voltage (Vm) to obtain a voltage drop (ΔV = Vr). A DC measurement method and apparatus for calculating a DC resistance (r) of a capacitor by dividing by a charging current (ic). According to such a configuration, the DC resistance of the electric double layer capacitor can be obtained simply, quickly and accurately.

【0006】本発明のコンデンサの直流抵抗測定方法
は、コンデンサ(4)を定電流又は定電流と同等の電流
を充電電流(ic)として充電する工程と、前記コンデ
ンサの端子間電圧を所定電圧(Vm)に到達させた後、
前記コンデンサを開放状態にする工程と、前記開放状態
で一定時間(T)が経過した後、前記コンデンサの端子
間電圧(Vn)を測定する工程と、前記所定電圧から前
記一定時間経過後の前記端子間電圧を減算して算出され
る電圧降下(ΔV)を前記充電電流で除して前記コンデ
ンサの直流抵抗(r)を算出する工程とを備えたことを
特徴とする。
The method for measuring the DC resistance of a capacitor according to the present invention comprises the steps of: charging a capacitor (4) as a constant current or a current equivalent to a constant current as a charging current (ic); Vm),
Setting the capacitor to an open state; measuring a voltage (Vn) between terminals of the capacitor after a lapse of a predetermined time (T) in the open state; Calculating a DC resistance (r) of the capacitor by dividing a voltage drop (ΔV) calculated by subtracting a voltage between terminals by the charging current.

【0007】ところで、コンデンサは、直流抵抗(r)
と容量(C)との直列回路で構成される。このコンデン
サを定電流からなる充電電流(ic)で所定電圧(V
m)まで充電すると、この所定電圧(Vm)は、直流抵
抗(r)による電圧降下(Vr)と容量(C)による電
圧降下の加算値で与えられる。所定電圧(Vm)に充電
されたコンデンサを一定時間(T)だけ開放状態してコ
ンデンサの端子間電圧(Vn)を測定する。この場合、
直流抵抗(r)における電圧降下が消失し、容量(C)
における電圧降下が残留するので、これが端子間電圧
(Vn)として測定される。そこで、所定電圧(Vm)
から端子間電圧(Vn)を減算すると、直流抵抗(r)
における電圧降下(Vr)が電圧降下(ΔV)として求
められる。この電圧降下(ΔV)は充電電流(ic)と
直流抵抗(r)の積(ΔV=r・ic)であるから、電
圧降下(ΔV)を充電電流(ic)で除すことで、コン
デンサの直流抵抗(r)が算出される。
By the way, the capacitor has a DC resistance (r).
And a capacitor (C) in series. This capacitor is charged at a predetermined voltage (V) with a charging current (ic) consisting of a constant current.
m), the predetermined voltage (Vm) is given by the sum of the voltage drop (Vr) due to the DC resistance (r) and the voltage drop due to the capacitance (C). The capacitor charged to the predetermined voltage (Vm) is opened for a predetermined time (T), and the voltage (Vn) between the terminals of the capacitor is measured. in this case,
The voltage drop in the DC resistance (r) disappears and the capacity (C)
Is measured as the voltage between terminals (Vn). Therefore, the predetermined voltage (Vm)
When the terminal voltage (Vn) is subtracted from, the DC resistance (r)
Is obtained as the voltage drop (ΔV). Since this voltage drop (ΔV) is the product (ΔV = r · ic) of the charging current (ic) and the DC resistance (r), the voltage drop (ΔV) is divided by the charging current (ic) to obtain the capacitor. DC resistance (r) is calculated.

【0008】本発明のコンデンサの直流抵抗測定装置
は、コンデンサ(4)を定電流又は定電流と同等の電流
を充電電流として供給する充電手段(電源装置2及び充
電回路14)と、前記コンデンサの端子間電圧を所定電
圧(Vm)に到達させた後、前記コンデンサを前記充電
手段から切り離し、開放状態にする切換手段(スイッチ
8)と、前記開放状態で一定時間が経過した後、前記コ
ンデンサの端子間電圧(Vn)を測定する測定手段(電
圧計18)と、前記所定電圧から前記一定時間経過後の
前記端子間電圧を減算して算出される電圧降下(ΔV)
を前記充電電流で除して前記コンデンサの直流抵抗を算
出する演算手段(演算装置20)とを備えたことを特徴
とする。この直流抵抗測定装置は、前記測定方法を装置
として実現したものであり、前記測定原理を以てコンデ
ンサの直流抵抗を容易かつ迅速に算出することができ
る。
A DC resistance measuring apparatus for a capacitor according to the present invention comprises: charging means (power supply device 2 and charging circuit 14) for supplying a constant current or a current equivalent to a constant current to a capacitor (4) as a charging current; Switching means (switch 8) for disconnecting the capacitor from the charging means after the terminal-to-terminal voltage reaches a predetermined voltage (Vm) and opening the capacitor; Measuring means (voltmeter 18) for measuring the terminal-to-terminal voltage (Vn); and a voltage drop (ΔV) calculated by subtracting the terminal-to-terminal voltage after the lapse of the predetermined time from the predetermined voltage.
And a calculating means (calculating device 20) for calculating the DC resistance of the capacitor by dividing by the charging current. This DC resistance measuring device realizes the measuring method as a device, and can easily and quickly calculate the DC resistance of the capacitor based on the measuring principle.

【0009】[0009]

【発明の実施の形態】図1は、本発明のコンデンサの直
流抵抗測定方法に用いられる直流抵抗測定装置の実施形
態を示している。
FIG. 1 shows an embodiment of a DC resistance measuring apparatus used in a DC resistance measuring method for a capacitor according to the present invention.

【0010】電源装置2は、直流抵抗を測定する試料と
してのコンデンサ4に充電電流を流す充電手段であっ
て、正側の出力端子+OUT 、負側の出力端子−OUT 、正
側のセンス端子+SENSE 、負側のセンス端子−SENSE を
備えている。
The power supply 2 is a charging means for supplying a charging current to a capacitor 4 as a sample for measuring a DC resistance, and includes a positive output terminal + OUT, a negative output terminal −OUT, and a positive sense terminal + SENSE. , And a negative sense terminal -SENSE.

【0011】電源装置2の出力端子+OUT とコンデンサ
4の正極側端子10との間には抵抗6及び切換手段とし
てスイッチ8が接続されているとともに、電源端子2の
センス端子+SENSE とコンデンサ4の正極側端子10と
が直結されている。また、コンデンサ4の負極側端子1
2は、電源装置2の出力端子−OUT 及び電源装置2のセ
ンス端子−SENSE に直結されている。即ち、電源装置2
の出力端子+OUT と出力端子−OUT との間には抵抗6、
スイッチ8及びコンデンサ4が直列に接続され、コンデ
ンサ4の充電回路14が構成されている。
A resistor 6 and a switch 8 as switching means are connected between the output terminal + OUT of the power supply device 2 and the positive terminal 10 of the capacitor 4, and the sense terminal + SENSE of the power terminal 2 and the positive terminal of the capacitor 4 are connected. The side terminal 10 is directly connected. Also, the negative terminal 1 of the capacitor 4
2 is directly connected to the output terminal −OUT of the power supply 2 and the sense terminal −SENSE of the power supply 2. That is, the power supply 2
Between the output terminal + OUT and the output terminal -OUT
The switch 8 and the capacitor 4 are connected in series, and a charging circuit 14 for the capacitor 4 is configured.

【0012】また、抵抗6の端子間には充電電流icを
測定する電流計16が接続され、また、電源装置2のセ
ンス端子+SENSE とセンス端子−SENSE との間にはコン
デンサ4の端子間電圧を測定する電圧計18が接続され
ている。
An ammeter 16 for measuring the charging current ic is connected between the terminals of the resistor 6, and a voltage between the terminals of the capacitor 4 is connected between the sense terminal + SENSE and the sense terminal -SENSE of the power supply device 2. Is connected.

【0013】そして、電流計16及び電圧計18の測定
値からコンデンサ4の直流抵抗rを演算する演算装置2
0が設置されており、この演算装置20はパーソナルコ
ンピュータ又は他の演算手段で構成されている。演算装
置20は、内部又は外部に記憶手段を備えて、電流計1
6及び電圧計18の測定値を記憶し、演算プログラムに
従って直流抵抗rを算出する。
An arithmetic unit 2 for calculating the DC resistance r of the capacitor 4 from the measured values of the ammeter 16 and the voltmeter 18
0, and the arithmetic unit 20 is constituted by a personal computer or other arithmetic means. The arithmetic unit 20 includes a storage unit inside or outside, and
6 and the measured value of the voltmeter 18 are stored, and the DC resistance r is calculated according to an arithmetic program.

【0014】次に、コンデンサ4の直流抵抗測定方法を
説明すると、充電工程では、スイッチ8を閉じてコンデ
ンサ4に充電回路14を通して電源装置2から所定の充
電電流icを供給し、コンデンサ4を所定電圧Vmまで
充電する。この充電電流icは定電流又は定電流と同等
の電流を設定すればよい。この充電電流icは、所定の
値に予め設定するとともに電流計16で測定し、この測
定値は演算装置20のメモリに格納される。
Next, a method of measuring the DC resistance of the capacitor 4 will be described. In the charging step, the switch 8 is closed, a predetermined charging current ic is supplied from the power supply 2 to the capacitor 4 through the charging circuit 14, and the capacitor 4 is switched to the predetermined state. Charge up to the voltage Vm. The charging current ic may be set to a constant current or a current equivalent to the constant current. The charging current ic is set in advance to a predetermined value and measured by the ammeter 16, and the measured value is stored in the memory of the arithmetic device 20.

【0015】次に、コンデンサ4が所定電圧Vmに到達
した後、スイッチ8を開いてコンデンサ4を一定時間T
だけ開放状態とする。
Next, after the capacitor 4 reaches the predetermined voltage Vm, the switch 8 is opened and the capacitor 4 is set to a predetermined time Tm.
Only open.

【0016】この開放工程を経た後、コンデンサ4の端
子間電圧Vnを電圧計18で測定し、この測定値は演算
装置20のメモリに格納される。
After the opening step, the voltage Vn between the terminals of the capacitor 4 is measured by the voltmeter 18, and the measured value is stored in the memory of the arithmetic unit 20.

【0017】図2において、(A)はコンデンサ4の充
電電圧(V)の推移、(B)は定電流による充電電流i
cを示しており、t1 は所定の端子間電圧Vmに到達
し、スイッチ8を開いた時点、t2 は時点t1 から一定
時間Tが経過した時点、即ち、コンデンサ4の端子間電
圧Vnを測定する時点である。
In FIG. 2, (A) shows the transition of the charging voltage (V) of the capacitor 4, and (B) shows the charging current i by the constant current.
c, where t 1 reaches a predetermined terminal voltage Vm and the switch 8 is opened, and t 2 is a point in time when a predetermined time T has elapsed from the time t 1 , that is, the terminal voltage Vn of the capacitor 4. Is the time to measure.

【0018】ここで、コンデンサ4の等価回路は、図3
に示すように、直流抵抗rと容量Cとの直列回路で与ら
れる。そこで、このコンデンサ4に定電流からなる充電
電流icを流すと、図4の(A)に示すように、直流抵
抗rには電圧降下Vr、容量Cには電圧降下Vcが発生
し、所定電圧Vmまで充電した場合、電圧Vmは、 Vm=Vr+Vc =r・ic+Vc ・・・(1) である。そして、コンデンサ4を開放状態に一定時間T
放置した後、コンデンサ4の端子間電圧Vnは、直流抵
抗rの電圧降下(r・ic)は消失するので、この端子
間電圧Vnは、コンデンサ4の容量Cで保持されている
電圧であり、式(1)から、 Vn≒Vc ・・・(2) となる。自然放電を無視すれば、Vn=Vcとなる。
Here, an equivalent circuit of the capacitor 4 is shown in FIG.
As shown in the figure, the resistance is given by a series circuit of a DC resistance r and a capacitance C. Therefore, when a charging current ic consisting of a constant current is passed through the capacitor 4, a voltage drop Vr occurs in the DC resistance r and a voltage drop Vc occurs in the capacitor C as shown in FIG. When charged to Vm, the voltage Vm is as follows: Vm = Vr + Vc = r · ic + Vc (1) Then, the capacitor 4 is kept in the open state for a predetermined time T.
After the standing, the voltage Vn between the terminals of the capacitor 4 loses the voltage drop (r · ic) of the DC resistance r, and thus the voltage Vn between the terminals is a voltage held by the capacitance C of the capacitor 4. From equation (1), Vn ≒ Vc (2) If the natural discharge is ignored, Vn = Vc.

【0019】そこで、演算工程では、演算装置20で次
のような演算が行なわれる。即ち、端子間電圧Vmから
端子間電圧Vnが減算され、その結果、電圧降下ΔVが
算出される。即ち、電圧降下ΔVは、 ΔV=Vm−Vn=Vr ・・・(3) であり、電圧降下ΔVは、直流抵抗rの電圧降下Vr
(=r・ic)である。
Therefore, in the calculation step, the following calculation is performed by the calculation device 20. That is, the terminal voltage Vn is subtracted from the terminal voltage Vm, and as a result, a voltage drop ΔV is calculated. That is, the voltage drop ΔV is ΔV = Vm−Vn = Vr (3), and the voltage drop ΔV is the voltage drop Vr of the DC resistance r.
(= R · ic).

【0020】そこで、式(1)、(2)及び(3)から Vr=r・ic=Vm−Vn=ΔV ・・・(4) となり、コンデンサ4の直流抵抗rは、 r=(Vm−Vn)/ic=ΔV/ic ・・・(5) となる。したがって、電圧降下ΔVを充電電流icで除
すことで、コンデンサ4の直流抵抗rが算出される。
Therefore, from the equations (1), (2) and (3), Vr = r · ic = Vm−Vn = ΔV (4), and the DC resistance r of the capacitor 4 is r = (Vm− Vn) / ic = ΔV / ic (5) Therefore, the DC resistance r of the capacitor 4 is calculated by dividing the voltage drop ΔV by the charging current ic.

【0021】このように、コンデンサ4を定電流又は定
電流と同等の電流からなる充電電流icで所定電圧Vm
まで充電した後、一定時間Tだけ開放状態にして端子間
電圧Vnを測定し、端子間電圧Vmと端子間電圧Vnと
の差電圧、即ち、電圧降下ΔVを充電電流icで除すこ
とにより、直流抵抗rを算出することができ、極めて簡
単かつ迅速にしかも正確にコンデンサ4の直流抵抗rを
求めることができる。
As described above, the capacitor 4 is charged with the predetermined voltage Vm by the charging current ic consisting of a constant current or a current equivalent to the constant current.
After charging the battery to the open state for a certain period of time T, the terminal voltage Vn is measured, and the voltage difference between the terminal voltage Vm and the terminal voltage Vn, that is, the voltage drop ΔV is divided by the charging current ic. The DC resistance r can be calculated, and the DC resistance r of the capacitor 4 can be obtained very simply, quickly and accurately.

【0022】なお、実施の形態では、充電電流icを定
電流として説明したが、定電流と同等又は平均値が定電
流と見做すことができる電流を用いても同様に電気二重
層コンデンサ等のコンデンサの直流抵抗rを測定するこ
とができる。
In the embodiment, the charging current ic is described as a constant current. However, an electric double layer capacitor or the like can be similarly used by using a current that can be regarded as a constant current equivalent to or having an average value equal to the constant current. Of the capacitor can be measured.

【0023】[0023]

【発明の効果】以上説明したように、本発明によれば、
次の効果が得られる。 a 簡単かつ迅速にしかも正確に電気二重層コンデンサ
等のコンデンサの直流抵抗を測定することができる。 b 測定装置は定電流を発生する既存の電源装置やパー
ソナルコンピュータを用いて実現することができ、信頼
性の高い測定を行なうことができる。
As described above, according to the present invention,
The following effects are obtained. a The DC resistance of a capacitor such as an electric double layer capacitor can be measured simply, quickly and accurately. b The measuring device can be realized using an existing power supply device or personal computer that generates a constant current, and can perform highly reliable measurement.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明のコンデンサの直流抵抗測定方法及びそ
の装置の実施形態である直流抵抗測定装置を示すブロッ
ク図である。
FIG. 1 is a block diagram showing a DC resistance measuring apparatus which is an embodiment of a method and apparatus for measuring a DC resistance of a capacitor according to the present invention.

【図2】本発明のコンデンサの直流抵抗測定方法の実施
形態であるコンデンサの充電電圧の推移及び充電電流を
示す図である。
FIG. 2 is a diagram showing a transition of a charging voltage and a charging current of a capacitor which is an embodiment of the method for measuring a DC resistance of the capacitor of the present invention.

【図3】コンデンサの等価回路を示す回路図である。FIG. 3 is a circuit diagram showing an equivalent circuit of a capacitor.

【図4】コンデンサの充電時の端子間電圧の構成、コン
デンサの開放時の端子間電圧を示す回路図である。
FIG. 4 is a circuit diagram showing a configuration of a voltage between terminals when the capacitor is charged, and a voltage between terminals when the capacitor is opened.

【符号の説明】[Explanation of symbols]

2 電源装置(充電手段) 4 コンデンサ 8 スイッチ(切換手段) 14 充電回路(充電手段) 16 電流計 18 電圧計(測定手段) 20 演算装置(演算手段) 2 Power supply device (charging means) 4 Capacitor 8 Switch (switching means) 14 Charging circuit (charging means) 16 Ammeter 18 Voltmeter (measuring means) 20 Arithmetic device (arithmetic means)

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 コンデンサを定電流又は定電流と同等の
電流を充電電流として充電する工程と、 前記コンデンサの端子間電圧を所定電圧に到達させた
後、前記コンデンサを開放状態にする工程と、 前記開放状態で一定時間が経過した後、前記コンデンサ
の端子間電圧を測定する工程と、 前記所定電圧から前記一定時間経過後の前記端子間電圧
を減算して算出される電圧降下を前記充電電流で除して
前記コンデンサの直流抵抗を算出する工程と、を備えた
ことを特徴とするコンデンサの直流抵抗測定方法。
A step of charging the capacitor with a constant current or a current equivalent to the constant current as a charging current; a step of bringing the capacitor into an open state after allowing a voltage between terminals of the capacitor to reach a predetermined voltage; Measuring a voltage between terminals of the capacitor after a lapse of a predetermined time in the open state; and calculating a voltage drop calculated by subtracting the voltage between the terminals after the lapse of the predetermined time from the predetermined voltage. Calculating the DC resistance of the capacitor by dividing by DC.
【請求項2】 コンデンサを定電流又は定電流と同等の
電流を充電電流として供給する充電手段と、 前記コンデンサの端子間電圧を所定電圧に到達させた
後、前記コンデンサを前記充電手段から切り離し、開放
状態にする切換手段と、 前記開放状態で一定時間が経過した後、前記コンデンサ
の端子間電圧を測定する測定手段と、 前記所定電圧から前記一定時間経過後の前記端子間電圧
を減算して算出される電圧降下を前記充電電流で除して
前記コンデンサの直流抵抗を算出する演算手段と、を備
えたことを特徴とするコンデンサの直流抵抗測定装置。
2. A charging means for supplying a constant current or a current equivalent to the constant current as a charging current to the capacitor, and after the terminal voltage of the capacitor reaches a predetermined voltage, the capacitor is separated from the charging means; Switching means for switching to an open state; measuring means for measuring a voltage between terminals of the capacitor after a lapse of a predetermined time in the open state; and subtracting the voltage between the terminals after the lapse of the predetermined time from the predetermined voltage. Calculating means for calculating the DC resistance of the capacitor by dividing the calculated voltage drop by the charging current.
JP2000051563A 2000-02-28 2000-02-28 Direct current resistance measuring method of capacitor and its device Pending JP2001242204A (en)

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Application Number Priority Date Filing Date Title
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Country Link
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Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003075483A (en) * 2001-08-31 2003-03-12 Hioki Ee Corp Method for measuring equivalent parallel resistance of rechargeable apparatus
KR101147378B1 (en) * 2010-11-04 2012-05-23 김동균 Measurement apparatus for measuring serial impedance in power source instantaneously
CN105067890A (en) * 2015-07-14 2015-11-18 东营市双益电气有限责任公司 Method for measuring transformer DC resistance by utilizing zero flux method and measuring system thereof
CN109142872A (en) * 2017-06-16 2019-01-04 日本贵弥功株式会社 The measuring method and measurement device of the resistance of charge storage element
JP2019062656A (en) * 2017-09-26 2019-04-18 株式会社三社電機製作所 Inspection device
JP2019060719A (en) * 2017-09-26 2019-04-18 株式会社三社電機製作所 Inspection device
JP2019060718A (en) * 2017-09-26 2019-04-18 株式会社三社電機製作所 Inspection device
JP2019060720A (en) * 2017-09-26 2019-04-18 株式会社三社電機製作所 Inspection device

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JPH02154156A (en) * 1988-12-06 1990-06-13 Matsushita Electron Corp Measuring instrument for electronic circuit
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JPH09211041A (en) * 1996-01-30 1997-08-15 Hioki Ee Corp Method and device for measuring equivalent series resistance of capacitive element
JPH10319066A (en) * 1997-05-16 1998-12-04 Hioki Ee Corp Method and device for measuring equivalent series resistance of capacitive element

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JPS54162579A (en) * 1978-06-13 1979-12-24 Seiko Instr & Electronics Ltd Measuring method of internal equivalent circuit constant of primary batteries
JPH01213579A (en) * 1988-02-22 1989-08-28 Oki Electric Ind Co Ltd Method and device for measuring surface resistance
JPH02154156A (en) * 1988-12-06 1990-06-13 Matsushita Electron Corp Measuring instrument for electronic circuit
JPH07198765A (en) * 1993-12-28 1995-08-01 Yokogawa Hewlett Packard Ltd Impedance meter
JPH09211041A (en) * 1996-01-30 1997-08-15 Hioki Ee Corp Method and device for measuring equivalent series resistance of capacitive element
JPH10319066A (en) * 1997-05-16 1998-12-04 Hioki Ee Corp Method and device for measuring equivalent series resistance of capacitive element

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003075483A (en) * 2001-08-31 2003-03-12 Hioki Ee Corp Method for measuring equivalent parallel resistance of rechargeable apparatus
JP4659296B2 (en) * 2001-08-31 2011-03-30 日置電機株式会社 Method for measuring equivalent parallel resistance of power storage device
KR101147378B1 (en) * 2010-11-04 2012-05-23 김동균 Measurement apparatus for measuring serial impedance in power source instantaneously
CN105067890A (en) * 2015-07-14 2015-11-18 东营市双益电气有限责任公司 Method for measuring transformer DC resistance by utilizing zero flux method and measuring system thereof
CN109142872A (en) * 2017-06-16 2019-01-04 日本贵弥功株式会社 The measuring method and measurement device of the resistance of charge storage element
JP2019062656A (en) * 2017-09-26 2019-04-18 株式会社三社電機製作所 Inspection device
JP2019060719A (en) * 2017-09-26 2019-04-18 株式会社三社電機製作所 Inspection device
JP2019060718A (en) * 2017-09-26 2019-04-18 株式会社三社電機製作所 Inspection device
JP2019060720A (en) * 2017-09-26 2019-04-18 株式会社三社電機製作所 Inspection device

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