JP2001023882A - 振動センサ付きペデスタルおよびこれを用いた露光装置 - Google Patents
振動センサ付きペデスタルおよびこれを用いた露光装置Info
- Publication number
- JP2001023882A JP2001023882A JP11193650A JP19365099A JP2001023882A JP 2001023882 A JP2001023882 A JP 2001023882A JP 11193650 A JP11193650 A JP 11193650A JP 19365099 A JP19365099 A JP 19365099A JP 2001023882 A JP2001023882 A JP 2001023882A
- Authority
- JP
- Japan
- Prior art keywords
- vibration
- pedestal
- vibration sensor
- exposure apparatus
- sensor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
- F16F—SPRINGS; SHOCK-ABSORBERS; MEANS FOR DAMPING VIBRATION
- F16F15/00—Suppression of vibrations in systems; Means or arrangements for avoiding or reducing out-of-balance forces, e.g. due to motion
- F16F15/02—Suppression of vibrations of non-rotating, e.g. reciprocating systems; Suppression of vibrations of rotating systems by use of members not moving with the rotating systems
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70808—Construction details, e.g. housing, load-lock, seals or windows for passing light in or out of apparatus
- G03F7/70833—Mounting of optical systems, e.g. mounting of illumination system, projection system or stage systems on base-plate or ground
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70858—Environment aspects, e.g. pressure of beam-path gas, temperature
- G03F7/709—Vibration, e.g. vibration detection, compensation, suppression or isolation
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/06—Apparatus for monitoring, sorting, marking, testing or measuring
- H10P72/0604—Process monitoring, e.g. flow or thickness monitoring
Landscapes
- Engineering & Computer Science (AREA)
- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Epidemiology (AREA)
- General Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Public Health (AREA)
- Environmental & Geological Engineering (AREA)
- Acoustics & Sound (AREA)
- Aviation & Aerospace Engineering (AREA)
- Mechanical Engineering (AREA)
- Life Sciences & Earth Sciences (AREA)
- Atmospheric Sciences (AREA)
- Toxicology (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
- Vibration Prevention Devices (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11193650A JP2001023882A (ja) | 1999-07-07 | 1999-07-07 | 振動センサ付きペデスタルおよびこれを用いた露光装置 |
| US09/612,554 US6477908B1 (en) | 1999-07-07 | 2000-07-07 | Pedestal with vibration sensor, and exposure apparatus having the same |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11193650A JP2001023882A (ja) | 1999-07-07 | 1999-07-07 | 振動センサ付きペデスタルおよびこれを用いた露光装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2001023882A true JP2001023882A (ja) | 2001-01-26 |
| JP2001023882A5 JP2001023882A5 (https=) | 2006-08-24 |
Family
ID=16311482
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11193650A Pending JP2001023882A (ja) | 1999-07-07 | 1999-07-07 | 振動センサ付きペデスタルおよびこれを用いた露光装置 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US6477908B1 (https=) |
| JP (1) | JP2001023882A (https=) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7122065B2 (en) * | 2004-02-25 | 2006-10-17 | Honeywell International, Inc. | Adapter for low volume air sampler |
| GB0506990D0 (en) * | 2005-04-06 | 2005-05-11 | Bae Systems Plc | Vibration isolation |
| KR20080066013A (ko) * | 2005-11-08 | 2008-07-15 | 코닌클리케 필립스 일렉트로닉스 엔.브이. | 진동 분리 시스템 및 방법 |
| US8302456B2 (en) * | 2006-02-23 | 2012-11-06 | Asylum Research Corporation | Active damping of high speed scanning probe microscope components |
| BRPI0708836B1 (pt) * | 2006-04-03 | 2018-02-06 | Vonroll Infratec | Disposição de sensor de vibração, e, uso da disposição de sensor de vibração |
| US8170225B2 (en) * | 2007-02-14 | 2012-05-01 | Integrated Dynamics Engineering Gmbh | Method for adapting a vibration isolation system |
| NL2017809A (en) | 2015-12-21 | 2017-06-27 | Asml Netherlands Bv | Lithographic apparatus having an active base frame support |
| CN110375843A (zh) * | 2019-07-22 | 2019-10-25 | 淮阴师范学院 | 一种基于wnn的振动速度传感器幅频特性补偿方法 |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB8729632D0 (en) * | 1987-12-18 | 1988-02-03 | Renishaw Plc | Workpiece inspection |
| US5176140A (en) * | 1989-08-14 | 1993-01-05 | Olympus Optical Co., Ltd. | Ultrasonic probe |
| DE69322983T2 (de) | 1992-02-21 | 1999-07-15 | Canon K.K., Tokio/Tokyo | System zum Steuern von Trägerplatten |
| JP3217522B2 (ja) | 1992-03-02 | 2001-10-09 | キヤノン株式会社 | 精密位置決め装置 |
| JPH0730360A (ja) * | 1993-07-06 | 1995-01-31 | Citizen Watch Co Ltd | 圧電振動装置 |
| JP3184044B2 (ja) | 1994-05-24 | 2001-07-09 | キヤノン株式会社 | 微動位置決め制御装置 |
| JP3224489B2 (ja) | 1995-03-28 | 2001-10-29 | キヤノン株式会社 | 空気バネ式除振装置 |
| JP3733174B2 (ja) | 1996-06-19 | 2006-01-11 | キヤノン株式会社 | 走査型投影露光装置 |
| US6170622B1 (en) | 1997-03-07 | 2001-01-09 | Canon Kabushiki Kaisha | Anti-vibration apparatus and anti-vibration method thereof |
| JP3825869B2 (ja) * | 1997-03-19 | 2006-09-27 | キヤノン株式会社 | 能動除振装置 |
-
1999
- 1999-07-07 JP JP11193650A patent/JP2001023882A/ja active Pending
-
2000
- 2000-07-07 US US09/612,554 patent/US6477908B1/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US6477908B1 (en) | 2002-11-12 |
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Legal Events
| Date | Code | Title | Description |
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