JP2001021489A - Spectroscopic analyzer - Google Patents

Abstract

PROBLEM TO BE SOLVED: To achieve cost reduction while making it possible to analyze a sample by removing the data based on disturbance light other than the reflected light or transmitted light from the sample based on measuring light. SOLUTION: In constitution such that a plurality of filters F permitting light with a measuring wavelength for analyzing a sample to transmit are provided in a filter support 7, which is driven so as to be altered positionally, so as to be selectively positioned within the irradiation light path from a light source part 1 to the sample accompanying the positional alteration of the filter support 7, a shading part 7s is provided in the filter support 7 so as to be positioned within the irradiation light path P on the way of the movement of the filter support 7 from a state wherein one filter F is positioned within the irradiation light path P to a state wherein the other filter F is positioned therewithin. An analyzing means A processes the data obtained when the shading part 7s is positioned within the irradiation light path P as the data based on disturbance light to analyze the sample.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION The present invention relates to a filter support for driving a position change, wherein a plurality of filters for transmitting light of a measurement wavelength for analyzing a sample among light from a light source section are provided. With the change in the position of the support, selectively provided is provided in an irradiation optical path from the light source unit to the sample, and analyzing means for analyzing the sample based on reflected light or transmitted light from the sample. The present invention relates to a spectroscopic analyzer provided.

[0002]

2. Description of the Related Art In such a spectroscopic analyzer, light other than measurement light transmitted through a filter, such as sunlight or an electric lamp, is irradiated onto a sample, and reflected or transmitted from the sample received for analysis of the sample. To prevent the light from containing light based on light other than the measurement light, or light other than reflected light or transmitted light from the sample being received for analysis,
It is conceivable to use the device in such a manner that the surroundings of the spectroscopic analyzer are shielded or light other than the measurement light is prevented from being irradiated on the sample. However, using such a light-shielding operation is inconvenient, so it is preferable to use it without the light-shielding operation.

Therefore, conventionally, a shutter operable to switch between an open state for transmitting light and a closed state for blocking light is provided in the middle of the irradiation optical path, and information obtained when the shutter is switched to the closed state is provided. , As information based on disturbance light other than the reflected light or transmitted light from the sample based on the measurement light (hereinafter, may be simply referred to as disturbance light), by removing the information based on such disturbance light, The sample was configured to be analyzed.

[0004]

However, in the prior art, for analyzing disturbance light when analyzing a sample,
The provision of the shutter complicates the configuration of the apparatus, causing an increase in cost, and there is room for improvement in cost reduction.

The present invention has been made in view of the above circumstances, and an object of the present invention is to remove information based on disturbance light other than reflected light or transmitted light from a sample based on measurement light and to remove the sample. The goal is to reduce costs while enabling the analysis of the information.

[0006]

Means for Solving the Problems [Invention according to claim 1]
In the characteristic configuration according to the first aspect, the light blocking unit that blocks light includes:
While the filter support is moving from a state where one filter is located in the irradiation light path to a state where another filter is located, the filter support is provided on the filter support so as to be located in the irradiation light path, The analyzing means processes information obtained when the light shielding portion is located in the irradiation light path as information based on disturbance light other than reflected light or transmitted light from the sample based on measurement light passing through the filter. And analyzing the sample.

According to the first aspect, when the filter support is driven to change the position, the filter support is moved from a state where one filter is located in the irradiation optical path to a state where another filter is located. During the movement, the light shielding portion is located in the irradiation optical path. Then, the analysis means processes the information obtained when the light shielding portion is located in the irradiation optical path as information based on disturbance light, and analyzes the sample. That is, when the filter is located in the irradiation optical path, the sample is irradiated with the measurement light, and the information obtained at that time is reflected light or transmitted light from the sample based on the measurement light and disturbance light. Are based on the combined light, and when the light-shielding portion is located in the irradiation light path, the measurement light is not irradiated on the sample, and thus the information obtained at that time is considered to be based only on the disturbance light. Therefore, information obtained when the light-shielding portion is located in the irradiation optical path is processed as information based on disturbance light to remove the influence of disturbance light on the analysis. And
The drive means originally provided for driving the position change of the shutter support plate is also used to bring out a state in which the measurement light is not irradiated on the sample, so that the conventionally provided shutter is unnecessary. Therefore, it is possible to reduce the cost while performing a process of removing information based on disturbance light other than reflected light or transmitted light from the sample based on the measurement light so that the sample can be analyzed. Was.

According to a second aspect of the present invention, the filter support is configured to be driven to rotate, and the filter support includes the plurality of filters and the light shielding portion. The filter is selectively positioned in the irradiation light path along with the rotational driving of the filter support, and the filter is moved from a state in which one filter is positioned in the irradiation light path to a state in which another filter is positioned. The light-shielding portion is provided so as to be positioned in the irradiation optical path while the filter support is moving.

According to the characteristic feature of the second aspect, when the filter support is rotationally driven, the filter is selectively positioned in the irradiation light path, and as such, one filter is positioned in the irradiation light path. During the movement of the filter support from the state where the filter is turned on to the state where another filter is located, the light shielding portion is positioned in the irradiation optical path. In addition, since the filter support is driven to rotate, a plurality of filters and light-shielding portions are positioned in the irradiation optical path in a certain order to obtain information, thereby performing one analysis or one analysis. In a case where a process of obtaining information by arranging a plurality of filters and light shielding portions in the irradiation optical path in a certain order is performed repeatedly, the control configuration can be simplified and the analysis can be performed efficiently. it can. Incidentally, by linearly driving the filter support, the filter is selectively positioned in the irradiation light path, and as such, the filter is moved from a state in which one filter is positioned in the irradiation light path to a state in which another filter is positioned. It is assumed that the light shielding unit is located in the irradiation light path while the support is moving. However, in this case,
When repeatedly arranging a plurality of filters and light-shielding portions in the irradiation light path in a certain order, the control configuration becomes complicated and it cannot be performed efficiently. Therefore,
According to the characteristic configuration of the second aspect, it is possible to provide a preferable specific configuration in order to enable efficient analysis while simplifying the control configuration.

[0010] According to a third aspect of the present invention, in the characteristic configuration according to the third aspect, the analyzing means obtains information a plurality of times when the light-shielding portion is located in the irradiation optical path, and obtains the information a plurality of times. When analyzing a sample on the basis of the information obtained over a period of time, the information removal processing based on the disturbance light is performed.

Although the amount of disturbance light is considered to have a large variation in the amount of light, according to the characteristic configuration of the third aspect, information when the light-shielding portion is located in the irradiation optical path is obtained a plurality of times. When the sample is analyzed based on the information obtained over a period of time, information removal processing based on disturbance light is performed, so that the influence of variations in the amount of disturbance light on the analysis can be further reduced. Therefore,
The analysis accuracy of the sample can be further improved.

[0012]

Embodiments of the present invention will be described below with reference to the drawings. As shown in FIG. 1, the spectroscopic analyzer includes a light source unit 5 and a plurality of interference filters F that transmit light in a set wavelength range including a measurement wavelength for analyzing a sample among the light from the light source unit 5. To guide the sample S to irradiate the sample S with the measurement light irradiation unit U1 that emits the light transmitted through each interference filter F as measurement light, and the measurement light emitted from the measurement light irradiation unit U1. At the same time, the light emitting and receiving guide unit U2 for guiding the reflected light from the sample S to the light receiving element 1 to analyze the sample based on the output information of the light receiving element 1, and controls various controls of the spectroscopic analyzer. The processing unit 2 includes a display unit 3 for displaying analysis information of the processing unit 2. That is, the light-receiving element 1 and the processing unit 2 constitute the analysis unit A. The measuring light irradiation unit U1 and the light emitting / receiving guide unit U2 are integrally assembled so that the measuring light from the measuring light irradiation unit U1 enters the inside of the light emitting / receiving guide unit U2 from the entrance opening 9i, The light emitting / receiving unit U is configured.

Referring to FIG. 1, a description will be given of the measuring light irradiation unit U1. The measurement light irradiation unit U1 includes a light source unit 5 and a light source lens 6 for converting light from the light source unit 5 into parallel rays in a dark box 4, and further includes four interference filters F
Is irradiated so that each interference filter F sequentially intersects the optical axis of the light source lens 6, in other words, each interference filter F sequentially emits light from the light source unit 5 to the sample. It is provided so as to be located in the optical path P in a state of being rotationally driven by the filter electric motor 8.
The light source unit 5 is configured by a tungsten-halogen lamp that emits infrared light.

The filter support plate 7 is formed of a material that blocks light, and as shown in FIG.
Are formed at equal intervals along the circumference C of the virtual circle centered on the center of the filter circle, and the interference filter F is fitted into each filter support opening 7w, and the filter support plate 7 Are arranged so that the circumference C of the virtual circle intersects with the optical axis of the light source lens 6 (corresponding to the irradiation optical path P) so as to be freely rotatable, and the filter electric motor 8 It is configured to rotate around the center as the rotation axis. In the filter support plate 7, a portion 7s between the interference filters F is made to function as a light blocking portion for blocking light.

That is, a plurality of filters F are mounted on the filter support plate 7 which is rotationally driven by the filter electric motor 8.
With the rotation of the filter support plate 7,
In the configuration provided so as to be located in the irradiation optical path P, the light shielding unit 7s for blocking light is supported by a filter from a state in which one interference filter F is located in the irradiation optical path P to a state in which another interference filter F is located. The filter 7 is provided on the filter support plate 7 so as to be positioned in the irradiation optical path P while the plate 7 is moving. In this embodiment, a light shielding portion 7s is provided between adjacent interference filters F, and the interference filter F is located in the irradiation optical path P, and the light shielding portion 7s is located in the irradiation optical path P. The state is alternately repeated.

The four interference filters F have different center wavelengths in the wavelength range of light to be transmitted, and the center wavelength of each interference filter F is set to a measurement wavelength correlated with a component to be analyzed, which will be described later. It has been set. In the following, the four interference filters F are distinguished by different center frequencies, and
₁ , F ₂ , F ₃ and F ₄ may be described.

As shown in FIGS. 1 and 2, the light transmitting / receiving guide section U2 has a first condensing lens in a dark box 9 having an incident opening 9i on a side face and a light passing section 9o on one end face. 11
Is arranged so as to focus incident measurement light so as to focus on a position in front of the light passage portion 9o and at a position separated from the light passage portion 9o.
It is arranged so that the measurement light incident from i is reflected toward the first condenser lens 11 and the light from the first condenser lens 11 side is transmitted. In addition, the half mirror 10
It is arranged on the optical axis of the first condenser lens 11. Further, in the dark box 9, a second condenser lens 12 is provided with a half mirror 10.
Is disposed on the side opposite to the first condenser lens 11 so that the optical axis of the first condenser lens 11 is coincident with that of the first condenser lens 11, and a parallel light beam entering from the light passage portion 9 o and passing through the first condenser lens 11 The light is focused. The light passage section 9o is a dark box 9
A transparent glass 17 capable of transmitting light is fitted into the opening provided in the box 9 to prevent dust and the like from entering the dark box 9.

The light receiving element 1 is provided such that its light receiving surface is located at a position where the light is focused by the second condenser lens 12. The light receiving element 1 is configured to output a signal corresponding to the intensity of the received light beam.

As shown in FIG. 4, in the dark box 9,
Between the first condenser lens 11 and the light passing portion 9o, there is provided a disk-shaped movable mirror 14 which is swung around a radial axis by a mirror electric motor 13, and a mirror surface of which is a first condenser lens. The first condensing lens 11 faces the 11th side so that the posture can be freely changed between a posture orthogonal to the optical axis of the first condenser lens 11 (see FIG. 4A) and a posture along the optical axis (see FIG. 4B). It is arranged in. That is, the movable mirror 14 is driven by the mirror electric motor 13.
As shown in (a) of FIG. 4, the light passing portion 9o is set in a posture orthogonal to the optical axis of the first condenser lens 11 (hereinafter, sometimes referred to as a measurement light reflection state). In a state in which light from the lens is blocked from entering the first condenser lens 11, the light for measurement from the half mirror 10 is reflected and received by the light receiving element 1, and as shown in FIG. In addition, by setting the posture along the optical axis (hereinafter, sometimes referred to as a measurement light irradiation state), the irradiation of the sample S with the measurement light is allowed, and the incident light from the light passage portion 9o is The light receiving element 1 is set to receive light.

On the end face of the dark box 9 provided with the light passing portion 9o for transmitting and receiving light, four spacing rods 15 are erected, and the tip of each of the four spacing rods 15 is provided with a central portion. A disk 16 having an opening 16w is attached to the disk. The length of the spacing rod 15 is set so that the focal point of the first condenser lens 11 is located within the opening 16w of the disk 16.

The dark box 4 is connected to the dark box 9 so that the measuring light transmitted through the interference filter F is made to enter the dark box 10 through the entrance opening 9i.

Then, the light emitting / receiving unit U configured as described above is installed so that the analysis target portion of the sample S is located in the opening 16w of the disk 16. Then, when the movable mirror 14 is in the measurement light irradiation state, the filter F
Is reflected by the half mirror 10 and is incident on the first condenser lens 11, and is condensed by the first condenser lens 11 so as to be focused on the analysis target portion of the sample S. Is done. The reflected light from the sample S enters the dark box 9 from the light passing portion 9o, is converted into parallel rays by the first condenser lens 11, enters the second condenser lens 12, and is incident on the second condenser lens 12. The light is condensed so as to be focused on the light receiving surface of the light receiving element 1 and received by the light receiving element 1.

Assuming that the movable mirror 14 is in the above-mentioned measuring light reflecting state, the measuring light transmitted through the filter F is reflected by the half mirror 10, transmitted through the first condenser lens 11, and reflected by the movable mirror 14. Then, the light passes through the first condenser lens 11 and the half mirror 10, enters the second condenser lens 12, and is focused by the second condenser lens 12 so that the light receiving surface of the light receiving element 1 is focused. The light is received by the light receiving element 1.

With the light emitting / receiving unit U configured as described above, for example, when the sample S is on a horizontal plane, the light emitting / receiving unit U can be installed in a state of being independent by the disk 16. Since the operator does not need to hold the light emitting and receiving unit U, the handling is further facilitated. Sample S
Is a soil such as a farmland, the light emitting and receiving unit U may be installed independently on the ground to be analyzed. Further, since the light transmitting portion 9o is not in contact with the sample, it is possible to avoid a problem that the sample adheres to the transparent glass 17 of the light transmitting portion 9o and hinders the analysis.

The processing section 2 is constituted by using a microcomputer, and sets the movable mirror 14 in the measurement light irradiation state to rotate the filter support plate 7 and sets the movable mirror 14 in the measurement light reflection state. So that the filter support plate 7 is rotated.
And the operation of the mirror electric motor 13 is controlled. Further, the processing unit 2 responds to the measurement light of the measurement wavelength transmitted through each interference filter F based on the output signal from the light receiving element 1 when the light shielding unit 7s is located in the irradiation optical path P. The information, as information based on disturbance light other than the reflected light from the sample based on the measurement light, remove the information based on the disturbance light, obtain the absorbance, based on the absorbance of each measurement wavelength, the following The component amount Q is calculated based on the calibration equation shown in Expression 1.

[0026]

## EQU1 ## Q = K ₀ + K ₁ × A (λ ₁ ) + K ₂ × A
(Λ ₂ ) + K ₃ × A (λ ₃ ) + K ₄ × A (λ ₄ )

Where, λ ₁ , λ ₂ , λ ₃ , λ ₄ ...; Measurement wavelengths A (λ ₁ ), A (λ ₂ ), A (λ ₃ ), A ( λ ₄ )…
…; Absorbance at measurement wavelength K ₀ , K ₁ , K ₂ , K ₃ , K ₄ ……; Least squares method based on measured values of component amounts measured in a sufficiently large population and absorbance at measurement wavelength Coefficient set in

Incidentally, the sample S is soil,
When the component is nitrate nitrogen, the following λ₁, Λ
_Two, Λ_Three, Λ_FourUsing the four measurement wavelengths of
K₀, K ₁, K_Two, K_Three, K_FourIs set as follows
You. Therefore, four interference filters F are provided as described above.
The four interference filters F₁, F_Two, F_Three, F_Four
Let each center wavelength be λ₁, Λ_Two, Λ_Three, Λ_FourFour measurements
Set to one of the regular wavelengths. Each interference filter F
Is set to a value in the range of 10 to 40 nm.
You.

Λ ₁ = 1574 nm λ ₂ = 1592 nm λ ₃ = 1628 nm λ ₄ = 1736 nm K ₀ = −36.306 K ₁ = −92554 K ₂ = 164580 K ₃ = −81344 K ₄ = 9362.9

Next, the control operation of the processing section 2 will be described. In the following control operation, the filter support plate 7
Is controlled to rotate the filter electric motor 8 at a constant speed, and the execution of the control causes a state where the interference filter F is located in the irradiation optical path P periodically. In other words, a state in which the light shielding unit 7s is located in the irradiation optical path P occurs periodically. Therefore, as shown in FIG. 5, when the interference filter F is located in the irradiation optical path P, the corresponding signal A is output from the light receiving element 1 at a constant frequency. A signal B is output when the unit 7s is in the irradiation optical path P.
Incidentally, the rotation speed of the filter support plate 7 is, for example, 50
Set to about 0 times / second.

As shown in FIG. 5, the signal A is an interference signal.
Filter F₁When the signal is located in the irradiation optical path P
A₁, Interference filter F_TwoIs located in the irradiation optical path P
Signal A at_Two, Interference filter F_ThreeIs in the irradiation optical path P
Signal A when located _Three, And interference filter F
_FourA in a state where is located in the irradiation optical path P_FourFrom
And those signals A₁, A_Two, A_Three, A_FourIs the prescribed order
(In the embodiment, in the order described).
Is forced. Therefore, for example, the rotation axis of the filter support plate 7
Based on the signal of the rotary encoder
Filter F₁, F_Two, F_Three, F_Four, And the light shielding portion 7s
Extract each signal when is in the irradiation optical path P
And can be read.

When the movable mirror 14 is in the measurement light irradiation state, the signal A is based on the reflected light from the sample based on the measurement light transmitted through the interference filter F and the other combined disturbance light. The signal B is a signal based on disturbance light. When the movable mirror 14 is in the measuring light reflection state, the signal A is a signal based on the measuring light itself transmitted through the interference filter F. Therefore, the signal B when the movable mirror 14 is in the measurement light irradiation state and the light shielding unit 7s is located in the irradiation light path P is defined as a signal based on disturbance light, and a signal based on the disturbance light is removed. The components can be analyzed. For example, the signal A when the movable mirror 14 is in the measurement light reflecting state is defined as the intensity of the measurement light irradiated on the sample, and the signal A and the signal B when the movable mirror 14 is in the measurement light irradiation state are used. The difference is defined as the intensity of the reflected light from the sample, and the absorbance is determined based on the intensity of the measuring light irradiated on the sample and the intensity of the reflected light from the sample. The absorbance is determined for each measurement wavelength, and the components are analyzed based on the above-determined absorbance at each measurement wavelength based on the above calibration formula.

An example of the control operation for calculating the component amount will be described based on the flowchart shown in FIG. The filter electric motor 8 is operated so as to rotate the filter support plate 7 at a constant speed, and the mirror electric motor 13 is operated such that the movable mirror 14 is in the measuring light reflection state (step # 1, step # 1). # 2). Interference filter F ₁ reads the signal A ₁ corresponding to the state located in the irradiation optical path P, and the intensity of the measuring light applied to the signal A ₁ to the sample (Step # 3).

Subsequently, the movable mirror 14 is illuminated by the measuring light source.
Activates the mirror electric motor 13 so that it is in the shooting state
From the output signal of the light receiving element 1, the signal A₁, B, A_Two,
B, A _Three, B, A_Four, B in the order described (step
# 4, # 5). Then, the difference between the signal A and the next signal B
By calculating the value of
Determine the intensity of the reflected light, and use the sample for each measurement wavelength.
The intensity of the reflected light of the sample and the sample read in step # 3.
For each measurement wavelength, based on the intensity of the emitted measurement light,
The absorbance is determined (steps # 6 and # 7).

The control for calculating the absorbance for each measurement wavelength as described above is executed a set number of N times (for example, three times) (steps # 2 to # 10). Subsequently, for each measurement wavelength, the N absorbances are averaged to obtain an average absorbance. Based on the average absorbance at each measurement wavelength, the component amount is calculated by the above calibration formula, and the filter electric power is calculated. The motor 8 is stopped, and the process ends (steps # 11 to # 13).

[Another Embodiment] Next, another embodiment will be described. (A) The control configuration for calculating the component amount is not limited to the configuration exemplified in the above embodiment. For example, a control configuration based on the flowcharts shown in FIGS. 7 and 8 is also possible. That is, the mirror electric motor 13 is operated so that the movable mirror 14 is in the measuring light reflection state, and the filter electric motor 8 is operated so as to rotate the filter support plate 7 at a constant speed. While the plate 7 rotates N times, the signals A ₁ , A ₂ , A ₃ , and A ₄ , that is, the intensity of the measuring light of each measuring wavelength, are read N times from the output signal of the light receiving element 1 a set number of times. (Step # 2
1 to # 27). Subsequently, an average value of the intensity of the measurement light is calculated for each measurement wavelength (step # 28).

Subsequently, the mirror electric motor 13 is operated so that the movable mirror 14 is brought into the above-mentioned measuring light irradiation state, and the signals A ₁ ,
B, A ₂ , B, A ₃ , B, A ₄ , and B are read N times in the order described (steps # 29 to # 34).

Subsequently, for each measurement wavelength, the difference between the signal A and the next signal B is calculated each time to obtain the intensity of the reflected light from the sample, and the obtained intensity of the reflected light is calculated. By averaging, the average value of the intensity of the reflected light is obtained (step # 35). Subsequently, step # 28 is performed for each measurement wavelength.
The average value of the intensity of the measurement light obtained in step # 3 and step # 3
Absorbance is calculated based on the average value of the intensity of the reflected light obtained in step 5, and then, based on the absorbance at each measurement wavelength, the component amount is calculated according to the above calibration formula.
Is stopped, and the process ends (steps # 36 to # 38).

In the above control configuration, the intensity of the measuring light applied to the sample is obtained for each measuring wavelength, so that the analysis accuracy of the components can be further improved. Also, the movable mirror 14
Since the number of times of switching between the measurement light reflection state and the measurement light irradiation state can be reduced, the time required for analysis can be shortened.

(B) The number of interference filters F provided on the filter support plate 7 is 4
The number is not limited to the number but is set by the number of measurement wavelengths used for analyzing the component to be analyzed. Also, 1
Instead of providing the interference filter F so as to include the measurement wavelengths required to analyze the types of components, to include a plurality of measurement wavelengths required to obtain a plurality of types of components,
A plurality of interference filters F may be provided on the filter support plate 7. In this case, an interference filter F corresponding to one component to be analyzed is selected from the plurality of interference filters F provided on the filter support plate 7, and the signal of the light receiving element 1 corresponds to the selected interference filter F. A signal is extracted and read out, so that a plurality of types of components can be analyzed.

(C) The calculation method for removing disturbance light is not limited to the method exemplified in the above embodiment. For example, the absorbance may be calculated based on the signal A, and the calculated absorbance may be multiplied by a coefficient set according to the signal B. Alternatively, the component amount may be calculated based on the absorbance calculated based on the signal A, and the calculated component amount may be multiplied by a coefficient set according to the signal B.

(D) In the above embodiment, the signal A and the signal B are obtained a plurality of times, and the signals A and B are averaged to determine the absorbance. , And the absorbance may be obtained from them.

(E) The position change mode when the filter support plate 7 is driven to change the position is not limited to the rotation mode exemplified in the above embodiment, and may be, for example, a linear movement mode.

(F) In the above embodiment, the case where the light-shielding portions 7s are provided between the adjacent interference filters F has been exemplified. However, the light-shielding portions 7s are provided between the adjacent interference filters F. It is not necessary to provide each of them, and for example, they may be provided only at one place.

(G) In the above embodiment, the case where the sample is irradiated with the measuring light transmitted through the interference filter F and the sample is analyzed based on the reflected light from the sample has been exemplified. Alternatively, the sample may be configured to irradiate the sample with measurement light transmitted through the interference filter F and analyze the sample based on the transmitted light transmitted through the sample.

[Brief description of the drawings]

FIG. 1 is a sectional view of a spectroscopic analyzer according to an embodiment.

FIG. 2 is a perspective view of a light emitting and receiving unit of the spectroscopic analyzer according to the embodiment.

FIG. 3 is a diagram of the filter support plate of the spectroscopic analyzer according to the embodiment as viewed in the direction of the rotation axis.

FIG. 4 is a perspective view of a movable mirror of the spectroscopic analyzer according to the embodiment.

FIG. 5 is a diagram showing an output signal of a light receiving element of the spectroscopic analyzer according to the embodiment.

FIG. 6 is a diagram showing a flowchart of a control operation of the spectroscopic analyzer according to the embodiment.

FIG. 7 is a diagram showing a flowchart of a control operation of a spectroscopic analyzer according to another embodiment.

FIG. 8 is a diagram showing a flowchart of a control operation of a spectroscopic analyzer according to another embodiment.

[Explanation of Symbols] 5 light source unit 7 filter support 7s light shielding unit F filter P irradiation light path A analysis means

 ────────────────────────────────────────────────── ─── Continuing from the front page (72) Inventor Shinya Tsujikura 1-1-1 Hama, Amagasaki-shi, Hyogo F-term in Kubota Technology Development Laboratory Co., Ltd. (reference) 2G059 AA01 EE01 EE02 EE11 GG10 HH01 HH06 JJ03 JJ23 LL04 MM03 MM14 NN01

Claims (3)

[Claims] 1. A filter support driven to change its position,
Among the light from the light source unit, a plurality of filters that transmit light having a measurement wavelength for analyzing the sample are selectively irradiated with the change in the position of the filter support, from the light source unit to the sample. A spectroscopic analyzer provided so as to be located in an optical path, and provided with analysis means for analyzing a sample based on reflected light or transmitted light from the sample, wherein a light-shielding unit for blocking light is provided on the irradiation optical path. The filter support is provided on the filter support so as to be located in the irradiation optical path while the filter support is moving from a state in which one filter is located in the other filter to a state in which the other filter is located. The information obtained when the light-shielding portion is located in the irradiation light path is processed as information based on disturbance light other than reflected light or transmitted light from the sample based on the measurement light passing through the filter, Trial Spectroscopic analyzing apparatus is configured to analyze. 2. The filter support is configured to be driven to rotate. The filter support includes a plurality of filters and the light-shielding portion, and the filter is selected by the drive of the filter support. The light shielding unit is positioned in the irradiation light path, and while the filter support is moving from a state in which one filter is positioned in the irradiation light path to a state in which another filter is positioned in the irradiation light path. The spectroscopic analyzer according to claim 1, wherein the spectroscopic analyzer is provided so as to be located in the inside. 3. The analysis means obtains information when the light-shielding portion is located in the irradiation optical path a plurality of times,
3. The spectroscopic analyzer according to claim 1, wherein when analyzing the sample based on the information obtained a plurality of times, a process of removing information based on the disturbance light is performed.