JP2000354945A - Chemical and mechanical polishing method - Google Patents

Chemical and mechanical polishing method

Info

Publication number
JP2000354945A
JP2000354945A JP21479899A JP21479899A JP2000354945A JP 2000354945 A JP2000354945 A JP 2000354945A JP 21479899 A JP21479899 A JP 21479899A JP 21479899 A JP21479899 A JP 21479899A JP 2000354945 A JP2000354945 A JP 2000354945A
Authority
JP
Japan
Prior art keywords
tape
glass substrate
mechanical polishing
chemical mechanical
polishing method
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP21479899A
Other languages
Japanese (ja)
Inventor
Takafumi Marukawa
隆文 丸川
Kanichi Endo
寛一 遠藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nihon Micro Coating Co Ltd
Original Assignee
Nihon Micro Coating Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Micro Coating Co Ltd filed Critical Nihon Micro Coating Co Ltd
Priority to JP21479899A priority Critical patent/JP2000354945A/en
Publication of JP2000354945A publication Critical patent/JP2000354945A/en
Pending legal-status Critical Current

Links

Landscapes

  • Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a chemical and mechanical polishing method capable of mirror finishing a glass substrate to a degree where no abnormal protrusions can be seen on a surface. SOLUTION: A chemical and mechanical polishing method is constituted of a process to travel a tape T having voids on its surface by pushhing it on a surface of a glass substrate D while supplying a coolant L to which a solution having a hydroxyl group is added to the surface of the glass substrate D. A plastic fiber made woven or unwoven fabric tape, a tape on a plastic film surface of which a foaming body layer is fixed or a tape on the plastic film surface of which a foaming body layer on the surface of which abrasive grains are fixed is used for this tape T. The coolant L added with a solution having a hydroxyl group of a potassium hydroxide solution, sodium hydroxide solution, etc., is used.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する分野】本発明は、磁気ディスク用のガラ
ス基板の鏡面加工を行う化学的機械的研磨加工方法に関
する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a chemical mechanical polishing method for mirror-polishing a glass substrate for a magnetic disk.

【0002】[0002]

【従来の技術及び発明の解決しようとする課題】磁気デ
ィスク用のガラス基板は、その表面に鏡面加工が施さ
れ、次に所定の表面粗度をもつようにテクスチャ加工さ
れた後、その表面上に磁性層が形成され、磁気記録媒体
として製品化されている。このような鏡面加工には、C
MP法(Chemical Mechanical P
olishing)といわれる化学的機械的研磨加工法
が応用されている。
2. Description of the Related Art A glass substrate for a magnetic disk is mirror-finished on its surface and then textured so as to have a predetermined surface roughness. A magnetic layer is formed on the magnetic recording medium, and it is commercialized as a magnetic recording medium. For such mirror finishing, C
MP method (Chemical Mechanical P
A chemical mechanical polishing method called "olishing" is applied.

【0003】この化学的機械的研磨加工法は、固体と被
加工物との接触界面に固相反応を生じさせ、この接触界
面に異質な物質を生成し、この接触界面部分を除去しな
がら加工する、という加工法であり、加工単位が極めて
小さいので高度の平坦化がなされ、化学反応を利用して
いるため加工変質が極めて少ないという利点がある。
In this chemical mechanical polishing method, a solid phase reaction is caused at a contact interface between a solid and a workpiece, a foreign substance is generated at the contact interface, and processing is performed while removing the contact interface. This is a processing method in which the processing unit is extremely small, so that a high degree of flattening is performed, and the use of a chemical reaction has an advantage that processing deterioration is extremely small.

【0004】化学的機械的研磨加工は、一般に、砥粒と
しての粒径約5μm以下の炭化珪素、酸化クロム、アル
ミナ、等の粉末を酸性又はアルカリ性の液中に分散した
砥粒懸濁液を、耐薬品性に優れ、適度な硬度をもった人
工皮革、等のバフとガラス基板表面との間に介在させ、
両者を相対的に移動させて行われ、片面研磨加工機(図
2(a)に略示する)や両面研磨加工機(図2(b)に
略示する)を使用して行われる。
[0004] In the chemical mechanical polishing process, generally, an abrasive grain suspension obtained by dispersing powder of silicon carbide, chromium oxide, alumina, or the like having an average particle size of about 5 μm or less in an acidic or alkaline liquid is used. Excellent in chemical resistance, artificial leather with moderate hardness, etc., between the buff and the glass substrate surface,
The two are relatively moved, and are performed using a single-side polishing machine (not shown in FIG. 2A) or a double-side polishing machine (not shown in FIG. 2B).

【0005】片面研磨加工機では、図2(a)に示すよ
うに、加圧ヘッドHの下面に貼り付け又は真空吸着させ
たガラス基板Dを定盤J1上に貼り付けたバフC上に押
し付け(矢印Vの方向)、ノズルNを通じて砥粒懸濁液
Sを定盤J1上のバフCに供給しつつ、加圧ヘッドHと
一緒にガラス基板Dを自転(矢印X1の方向)させ、定
盤J1を回転(矢印W1の方向)させてガラス基板Dの
片面の化学的機械的研磨加工が行われる。
In the single-side polishing machine, as shown in FIG. 2 (a), a glass substrate D attached to the lower surface of a pressure head H or vacuum-adsorbed is pressed onto a buff C attached to a surface plate J1. (In the direction of arrow V), the glass substrate D is rotated (in the direction of arrow X1) together with the pressure head H while the abrasive suspension S is supplied to the buff C on the surface plate J1 through the nozzle N, By rotating the board J1 (in the direction of the arrow W1), one side of the glass substrate D is subjected to chemical mechanical polishing.

【0006】また、両面研磨加工機は、図2(b)に示
すように、遊星ギヤG3の複数の開口K内にそれぞれ配
置した複数のガラス基板Dを載置するためのドーナッツ
状の下定盤J2と、下定盤J2と同形のドーナッツ状の
上定盤(図示せず)とから構成される定盤を有する。下
定盤J2上のガラス基板Dは、上定盤によって、上側か
ら押さえ付けられる。定盤の中心には外部の駆動モータ
に連結した太陽ギア(外歯歯車)G1が位置し、定盤の
周囲にはインターナルギア(内歯歯車)G2が固定され
ている。上定盤には、複数の砥粒懸濁液供給用の穴(図
示せず)が設けられており、これら穴を通じて上記の砥
粒懸濁液が上下定盤の間に供給される。図示の両面研磨
加工機では、上定盤に設けた砥粒懸濁液供給用の穴を通
じて砥粒懸濁液を上下定盤の間に供給しつつ太陽ギアG
1を矢印W2の方向に回転させ、太陽ギアG1とインタ
ーナルギアG2にかみ合わされ且つ上下定盤の間に位置
した遊星ギヤG3を上下定盤の間で矢印X2の方向に自
転させるとともに矢印Yの方向に公転させて、遊星ギア
G3のそれぞれの開口K内に配置した複数のガラス基板
Dの両面の化学的機械的研磨加工がバッチ式に行われ
る。一般に、このような両面研磨加工方式は「ツーウェ
イ(two−way)方式」といわれる。
Further, as shown in FIG. 2 (b), the double-side polishing machine has a donut-shaped lower surface plate for mounting a plurality of glass substrates D disposed in a plurality of openings K of the planetary gear G3. It has a surface plate composed of J2 and a donut-shaped upper surface plate (not shown) having the same shape as the lower surface plate J2. The glass substrate D on the lower platen J2 is pressed from above by the upper platen. A sun gear (external gear) G1 connected to an external drive motor is located at the center of the surface plate, and an internal gear (internal gear) G2 is fixed around the surface plate. The upper platen is provided with a plurality of abrasive grain suspension supply holes (not shown), and the above-mentioned abrasive suspension is supplied between the upper and lower platens through these holes. In the illustrated double-side polishing machine, the sun gear G is supplied between the upper and lower platens while the abrasive suspension is supplied between the upper and lower plates through a hole for supplying the abrasive suspension provided on the upper platen.
1 is rotated in the direction of arrow W2, and the planetary gear G3 meshed with the sun gear G1 and the internal gear G2 and located between the upper and lower stool is rotated in the direction of arrow X2 between the upper and lower stool. In this direction, the two sides of the plurality of glass substrates D arranged in the respective openings K of the planetary gear G3 are chemically and mechanically polished in a batch manner. Generally, such a double-side polishing processing method is called a “two-way method”.

【0007】このように、従来、上記の化学的機械的研
磨加工は砥粒懸濁液を使用して行われるので、化学的機
械的研磨加工終了後、ガラス基板表面上に残留する砥粒
懸濁液や研磨クズを除去するために、研磨加工機を停止
し、研磨加工機からガラス基板を取り出してガラス基板
を各種洗浄液で洗浄していた。
[0007] As described above, conventionally, the above-mentioned chemical mechanical polishing is performed using an abrasive suspension. Therefore, after the chemical mechanical polishing is completed, the abrasive suspension remaining on the surface of the glass substrate is removed. In order to remove suspended liquids and polishing debris, the polishing machine was stopped, the glass substrate was taken out of the polishing machine, and the glass substrate was washed with various cleaning liquids.

【0008】しかし、研磨加工機を停止してからガラス
基板を研磨加工機から取り出して洗浄するまでの間、ガ
ラス基板表面は砥粒懸濁液と接触したままの状態にある
ので、砥粒懸濁液中の砥粒(固体)とガラス基板(被加
工物)との接触界面に生じる固相反応によりこの接触界
面に異質な物質が生成されてガラス基板表面に洗浄によ
り除去し得ない不要の異常突起が形成され、ガラス基板
表面を高度に平坦化すなわち鏡面加工できない、という
問題が生じる。
However, since the surface of the glass substrate is kept in contact with the abrasive suspension between the time when the polishing machine is stopped and the time when the glass substrate is taken out of the polishing machine and washed, the abrasive suspension is used. An extraneous substance is generated at the contact interface between the abrasive grains (solid) in the suspension and the contact interface between the glass substrate (workpiece) and this unnecessary interface that cannot be removed by washing on the glass substrate surface. There is a problem that abnormal projections are formed and the surface of the glass substrate cannot be highly flattened, ie, cannot be mirror-finished.

【0009】したがって、本発明の課題は、表面に異常
突起がみられない程度にガラス基板を鏡面加工できる化
学的機械的研磨加工方法を提供することである。
Accordingly, an object of the present invention is to provide a chemical mechanical polishing method capable of mirror-polishing a glass substrate to the extent that abnormal projections are not seen on the surface.

【0010】[0010]

【課題を解決するための手段】上記課題を解決する本発
明の化学的機械的研磨加工方法は、水酸基を有する溶液
を添加したクーラントを磁気ディスク用のガラス基板表
面に供給しつつ、表面に空隙を有するテープをガラス基
板表面に押し付けて走行させる工程、から構成される。
According to a chemical mechanical polishing method of the present invention for solving the above-mentioned problems, a coolant containing a solution having a hydroxyl group is supplied to the surface of a glass substrate for a magnetic disk while a gap is formed on the surface. Pressing the tape having the above to the glass substrate surface and running the tape.

【0011】表面に空隙を有するテープには、ポリエス
テル、ナイロン、レーヨン、等のプラスチック繊維から
なる織布又は不織布テープ、発泡ポリウレタン、等の発
泡体の層をポリエステル、ポリエチレンテレフタレー
ト、等のプラスチック製のフィルムの表面に固定したテ
ープ、又は表面に砥粒を固定した発泡体の層をプラスチ
ックフィルム表面に固定したテープ、が使用される。
The tape having voids on the surface is made of a woven or non-woven fabric tape made of plastic fiber such as polyester, nylon, rayon, or the like, or a foam layer such as foamed polyurethane, made of a plastic material such as polyester or polyethylene terephthalate. A tape fixed to the surface of the film or a tape fixed to the surface of the plastic film with a foam layer having abrasive particles fixed to the surface is used.

【0012】ガラス基板表面に供給されるクーラント
は、水酸化カリウム溶液、水酸化ナトリウム溶液、等の
水酸基を有する溶液を添加したものである。このクーラ
ントは、テープとガラス基板との機械的研磨により発生
する摩擦熱を吸収するだけでなく、クーラントに添加し
た水酸基を有する溶液が、テープ(固体)とガラス基板
(被加工物)との接触界面に生じる固相反応による化学
的研磨を促進する。このクーラントを供給したガラス基
板の表面に上記のテープを押し付けて走行させると、テ
ープを構成するプラスチック繊維、発泡体層、又は発泡
体層に固定した砥粒がガラス基板表面に押し付けられ、
これらの接触界面で固相反応が生じ、ガラス基板表面の
突起がテープにより削り取られ、削り取られた異物は、
テープ表面の空隙(すなわち、プラスチック繊維の間の
空隙、又は発泡時に発泡体層表面に形成された多数の空
隙)内に取り込まれる。
The coolant supplied to the surface of the glass substrate is obtained by adding a solution having a hydroxyl group, such as a potassium hydroxide solution or a sodium hydroxide solution. This coolant not only absorbs the frictional heat generated by the mechanical polishing between the tape and the glass substrate, but also allows the solution containing hydroxyl groups added to the coolant to contact the tape (solid) with the glass substrate (workpiece). It promotes chemical polishing by solid phase reaction occurring at the interface. When the tape is pressed against the surface of the glass substrate to which the coolant has been supplied and run, the plastic fibers constituting the tape, a foam layer, or abrasive grains fixed to the foam layer are pressed against the glass substrate surface,
A solid phase reaction occurs at these contact interfaces, the protrusions on the glass substrate surface are scraped off by tape, and the scraped off foreign matter is
It is taken into the voids on the tape surface (ie, voids between the plastic fibers, or numerous voids formed on the foam layer surface during foaming).

【0013】本発明の化学的機械的研磨加工方法では、
ガラス基板表面に押し付けられて走行しているテープを
ガラス基板表面から離すと、テープとガラス基板との接
触界面にこれ以上の固相反応が生じず、化学的機械的研
磨加工が終了する。化学的機械的研磨加工終了後、直ち
にガラス基板表面を洗浄して、ガラス基板表面に残留す
るクーラントを容易且つ速やかに洗い流すことができ
る。
In the chemical mechanical polishing method of the present invention,
When the tape running while being pressed against the surface of the glass substrate is separated from the surface of the glass substrate, no further solid phase reaction occurs at the contact interface between the tape and the glass substrate, and the chemical mechanical polishing is completed. Immediately after the completion of the chemical mechanical polishing, the surface of the glass substrate is washed, and the coolant remaining on the surface of the glass substrate can be easily and quickly washed away.

【0014】[0014]

【発明の実施の形態】本発明に従った化学的機械的研磨
加工は、水酸基を有する溶液を添加したクーラントを磁
気ディスク用のガラス基板の表面に供給しつつ、表面に
空隙を有するテープをガラス基板表面に押し付けて走行
させることにより行われる。
BEST MODE FOR CARRYING OUT THE INVENTION In the chemical mechanical polishing according to the present invention, while supplying a coolant containing a solution having a hydroxyl group to the surface of a glass substrate for a magnetic disk, a tape having a void on the surface is made of glass. This is performed by pressing the substrate against the substrate surface and running.

【0015】表面に空隙を有するテープには、ポリエス
テル、ナイロン、レーヨン、等の耐熱性に優れ、高引張
強度の太さ0.05〜5デニールのプラスチック繊維か
らなる厚さ5μm〜3000μmの織布又は不織布テー
プ、ポリウレタン、等の発泡材料を発泡、成形した厚さ
0.1mm〜1mm、硬度10〜90の発泡体の層をポ
リエステル、ポリエチレンテレフタレート、等のプラス
チック製のフィルムの表面に固定したテープ(例えば、
特開平11−151651号を参照)、又は表面に砥粒
を固定した発泡体の層をプラスチックフィルム表面に固
定したテープ(例えば、特開平10−337795号を
参照)、が使用できる。
The tape having voids on its surface is made of a woven fabric of 5 to 3000 μm thick made of 0.05 to 5 denier plastic fiber having excellent heat resistance such as polyester, nylon and rayon and having high tensile strength. Or a tape in which a foamed material having a thickness of 0.1 mm to 1 mm and a hardness of 10 to 90 formed by foaming and molding a foamed material such as a nonwoven fabric tape or polyurethane is fixed to the surface of a plastic film such as polyester or polyethylene terephthalate. (For example,
JP-A-11-151651), or a tape in which a layer of a foam having abrasive grains fixed on the surface thereof is fixed to the surface of a plastic film (for example, see JP-A-10-337795) can be used.

【0016】ここで、例えば、ポリウレタンからなる発
泡体層(発泡ポリウレタン層)は、イソシアナート類と
官能水酸基をもったポリエステルとを反応させる際に水
を加えてよく撹拌し、炭酸ガスの微小な気泡を分散し、
成形型内で硬化させて発泡、成形される。この発泡体層
の表面には、炭酸ガスの気泡によって形成された多数の
空隙が分散する。砥粒は、この発泡体層の表面に砥粒と
ポリウレタン樹脂系等の水溶性接着剤との混合溶液を、
発泡体層表面の空隙を塞がないように塗布し、乾燥させ
ることにより発泡体層の表面に固定できる。
Here, for example, a foam layer made of polyurethane (foamed polyurethane layer) is mixed well with water at the time of reacting isocyanates with polyester having a functional hydroxyl group, and the mixture is finely mixed with carbon dioxide gas. Disperse air bubbles,
It is cured and foamed and molded in a mold. A large number of voids formed by carbon dioxide gas bubbles are dispersed on the surface of the foam layer. Abrasive grains, on the surface of the foam layer, a mixed solution of abrasive grains and a water-soluble adhesive such as polyurethane resin,
It can be fixed to the surface of the foam layer by applying it so that the voids on the surface of the foam layer are not closed and drying it.

【0017】砥粒には、平均粒径0.01μm〜10μ
mの炭化珪素、酸化クロム、アルミナ、酸化セリウム、
酸化マグネシウム、等の微粉が使用され、プラスチック
フィルムには、耐薬品性があり、高引張強度の厚さ5μ
m〜10μmのポリエステル、ポリエチレンテレフタレ
ート、等のプラスチックのフィルムが使用される。
The abrasive has an average particle size of 0.01 μm to 10 μm.
m silicon carbide, chromium oxide, alumina, cerium oxide,
Fine powder such as magnesium oxide is used. The plastic film has chemical resistance and high tensile strength with a thickness of 5μ.
A plastic film such as polyester, polyethylene terephthalate or the like having a thickness of 10 to 10 μm is used.

【0018】クーラントは、水酸基を有する溶液を水に
添加したものであり、水酸基を有する溶液には、水酸化
カリウム、水酸化ナトリウム、水酸化セシウム、等の溶
液がある。
The coolant is obtained by adding a solution having a hydroxyl group to water. Examples of the solution having a hydroxyl group include potassium hydroxide, sodium hydroxide, and cesium hydroxide.

【0019】本発明に従った化学的機械的研磨加工は、
片面研磨加工機(図1(a))又は両面研磨加工機(図
1(b))を使用して行われる。
The chemical mechanical polishing according to the present invention comprises:
This is performed using a single-side polishing machine (FIG. 1A) or a double-side polishing machine (FIG. 1B).

【0020】図1(a)に示す片面研磨加工機では、水
酸基を有する溶液を添加したクーラントLをノズルNを
通じてガラス基板Dの表面に供給しつつ、ガラス基板D
を矢印Rの方向に回転させ、表面に空隙を有するテープ
Tをガラス基板Dの表面にゴムローラPを介して押し付
け、このテープTをガラス基板Dの回転方向Rと逆方向
(矢印Mの方向)に走行させて化学的機械的研磨加工が
行われる。
In the single-side polishing machine shown in FIG. 1A, a coolant L to which a solution having a hydroxyl group is added is supplied to the surface of the glass substrate D through a nozzle N,
Is rotated in the direction of arrow R, and a tape T having a gap on the surface is pressed against the surface of the glass substrate D via a rubber roller P, and the tape T is rotated in the direction opposite to the rotation direction R of the glass substrate D (direction of arrow M). To perform a chemical mechanical polishing process.

【0021】図1(b)に示す両面研磨加工機では、水
酸基を有する溶液を添加したクーラントLを左右のノズ
ルNを通じて略垂直平面内で矢印Rの方向に回転するガ
ラス基板Dの両面に供給しつつ、このガラス基板Dの左
右両側からテープTをガラス基板Dの両面にゴムローラ
Pを介して押し付け、テープTをガラス基板Dの回転方
向Rと逆方向(矢印Mの方向)に走行させて化学的機械
的研磨加工が行われる。
In the double-side polishing machine shown in FIG. 1B, a coolant L to which a solution having a hydroxyl group is added is supplied to both surfaces of a glass substrate D rotating in the direction of arrow R in a substantially vertical plane through left and right nozzles N. While pressing, the tape T is pressed against both sides of the glass substrate D via rubber rollers P from both left and right sides of the glass substrate D, and the tape T is caused to run in a direction opposite to the rotation direction R of the glass substrate D (the direction of arrow M). A chemical mechanical polishing process is performed.

【0022】これら片面及び両面研磨加工機において、
ゴムローラPをガラス基板Dの表面からテープTととも
に遠ざけ、テープTをガラス基板Dの表面から離すこと
によって化学的機械的研磨加工が終了する。そして、化
学的機械的研磨加工終了後、ガラス基板Dの表面に残留
するクーラントLは、ガラス基板Dを研磨加工機に取り
付けたままガラス基板Dの表面に水を吹きかけて容易且
つ速やかに洗い流すことができる。
In these single-side and double-side polishing machines,
When the rubber roller P is moved away from the surface of the glass substrate D together with the tape T, and the tape T is separated from the surface of the glass substrate D, the chemical mechanical polishing is completed. After the completion of the chemical mechanical polishing, the coolant L remaining on the surface of the glass substrate D is easily and quickly washed away by spraying water on the surface of the glass substrate D while the glass substrate D is mounted on the polishing machine. Can be.

【0023】[0023]

【実施例】従来の化学的機械的研磨加工方法により磁気
ディスク用のガラス基板を鏡面研磨した後、本発明の化
学的機械的研磨加工方法に従って、このガラス基板の片
面の鏡面加工をさらに行った。
EXAMPLE After a glass substrate for a magnetic disk was mirror-polished by a conventional chemical mechanical polishing method, one surface of the glass substrate was further mirror-finished according to the chemical mechanical polishing method of the present invention. .

【0024】従来の化学的機械的研磨加工は、図2
(b)に示す両面研磨加工機を使用して行った。上下定
盤にそれぞれ貼り付けたバフには、発泡ポリウレタン製
の湿式ポリッシングパッド(RODEL社、DG(製品
名))を使用した。使用した砥粒懸濁液の組成、及び研
磨加工条件は、それぞれ、表1及び表2に示すとおりで
ある。
FIG. 2 shows a conventional chemical mechanical polishing process.
This was performed using a double-side polishing machine shown in (b). For the buffs respectively attached to the upper and lower platens, a wet polishing pad made of foamed polyurethane (Rodel, DG (product name)) was used. The composition of the abrasive suspension used and the polishing conditions are as shown in Tables 1 and 2, respectively.

【0025】[0025]

【表1】 [Table 1]

【0026】[0026]

【表2】 [Table 2]

【0027】従来の化学的機械的研磨加工後、ガラス基
板を両面研磨加工機から取り出して水で洗浄し、研磨加
工後のガラス基板表面上の任意の30μm×30μmの
範囲を走査型プローブ顕微鏡(デジタルインスツルメン
ト社、ナノスコープDimention3100シリー
ズ)を使用して走査(256ポイント)して、この走査
範囲における平均表面粗度(Ra)及び最大表面粗度
(Ry)を計測した。従来の化学的機械的研磨加工後の
平均表面粗度は4.50Å、最大表面粗度は177.0
3Åであった(これら計測値は、下記の表5(加工前)
に示す)。
After the conventional chemical mechanical polishing, the glass substrate is taken out of the double-side polishing machine and washed with water, and an arbitrary area of 30 μm × 30 μm on the surface of the polished glass substrate is scanned with a scanning probe microscope. Scanning was performed using a digital instrument (Nanoscope Dimension 3100 series) (256 points), and the average surface roughness (Ra) and the maximum surface roughness (Ry) in this scanning range were measured. The average surface roughness after conventional chemical mechanical polishing is 4.50 ° and the maximum surface roughness is 177.0.
(These measured values are shown in Table 5 below (before processing)
Shown).

【0028】次に、本発明に従って、図1(a)に示す
片面研磨加工機を使用して、従来の化学的機械的研磨加
工を行った後のガラス基板(平均表面粗度4.50Å、
最大表面粗度177.03Å)の片面の鏡面加工をさら
に行った(実施例1〜4)。その平均表面粗度を上記の
走査型プローブ顕微鏡を使用して計測した。実施例1〜
4における研磨加工条件は、表3に示すとおりである。
実施例1〜4は、それぞれ異なったテープを使用して行
われ、テープの種類以外、研磨加工条件及び使用したク
ーラントの組成は各実施例において同一であった。
Next, according to the present invention, the glass substrate (average surface roughness 4.50 °, average surface roughness 4.50 ° C.) after the conventional chemical mechanical polishing was performed using the single-side polishing machine shown in FIG.
Mirror finishing on one side having a maximum surface roughness of 177.03 °) was further performed (Examples 1 to 4). The average surface roughness was measured using the scanning probe microscope described above. Example 1
Polishing conditions in No. 4 are as shown in Table 3.
Examples 1 to 4 were performed using different tapes, and the polishing conditions and the composition of the coolant used were the same in each example, except for the type of tape.

【0029】[0029]

【表3】 [Table 3]

【0030】<実施例1> 実施例1では、太さ0.0
6デニールのポリエステル繊維からなる厚さ300μm
の織布テープを使用した。
<Example 1> In Example 1, a thickness of 0.0
300 μm thick made of 6 denier polyester fiber
Woven cloth tape was used.

【0031】<実施例2> 実施例2では、太さ2デニ
ールのポリエステル繊維からなる厚さ1000μmの不
織布テープを使用した。
<Example 2> In Example 2, a nonwoven fabric tape having a thickness of 1000 µm and made of polyester fiber having a thickness of 2 deniers was used.

【0032】<実施例3> 硬度60、厚さ500μm
の発泡ポリウレタン層を厚さ25μmのポリエステルフ
ィルム表面に接着固定したテープを使用した。
Example 3 Hardness 60, thickness 500 μm
Was used in which a foamed polyurethane layer was bonded and fixed to the surface of a polyester film having a thickness of 25 μm.

【0033】<実施例4> 平均粒径1.0μmの酸化
セリウム微粉とポリエステル樹脂との溶液を、硬度6
0、厚さ0.5mmの発泡ポリウレタン層の表面に塗布
し、乾燥させて酸化セリウム微粉を発泡ポリウレタン層
の表面に固定し、この発泡ポリウレタン層を厚さ25μ
mのポリエステルフィルム表面に接着固定したテープを
使用した。
Example 4 A solution of a cerium oxide fine powder having an average particle size of 1.0 μm and a polyester resin was prepared with a hardness of 6
0, applied to the surface of the foamed polyurethane layer having a thickness of 0.5 mm, and dried to fix fine cerium oxide powder on the surface of the foamed polyurethane layer.
m, a tape adhered and fixed to the surface of a polyester film was used.

【0034】上記の実施例1〜4で使用したクーラント
の組成は、表4に示すとおりである。
The composition of the coolant used in Examples 1 to 4 is as shown in Table 4.

【0035】[0035]

【表4】 [Table 4]

【0036】上記の実施例1〜4の本発明に従った化学
的機械的研磨加工後、ガラス基板を片面研磨加工機に取
り付けたまま水で洗浄し、研磨加工後のガラス基板表面
上の任意の30μm×30μmの範囲を上記の走査型プ
ローブ顕微鏡を使用して走査(256ポイント)して、
この走査範囲における平均表面粗度(Ra)及び最大表
面粗度(Ry)を計測した。本発明に従った上記実施例
1〜4の化学的機械的研磨加工後の平均表面粗度及び最
大表面粗度を下記の表5に示す。
After the chemical-mechanical polishing according to the present invention described in Examples 1 to 4, the glass substrate is washed with water while being attached to the single-side polishing machine, and the glass substrate is polished and the glass substrate is polished. The area of 30 μm × 30 μm is scanned (256 points) using the above scanning probe microscope,
The average surface roughness (Ra) and the maximum surface roughness (Ry) in this scanning range were measured. Table 5 below shows the average surface roughness and the maximum surface roughness after the chemical mechanical polishing in Examples 1 to 4 according to the present invention.

【0037】[0037]

【表5】 [Table 5]

【0038】表5に示すように、本発明に従うと、従来
の化学的機械的研磨加工により得られたガラス基板表面
よりも平坦に鏡面加工された。また、従来の研磨加工後
と本発明に従った研磨加工後のガラス基板表面の状態を
上記の走査型プローブ顕微鏡にて観察したが、従来の研
磨加工後のガラス基板表面には目視できる異常突起が散
在していたが、本発明に従った研磨加工後のガラス基板
表面には、顕微鏡で目視できるような異常突起が観察で
きなかった。
As shown in Table 5, according to the present invention, the mirror surface was flattened more than the surface of the glass substrate obtained by the conventional chemical mechanical polishing. In addition, the state of the glass substrate surface after the conventional polishing process and after the polishing process according to the present invention was observed with the above-mentioned scanning probe microscope. Were scattered, but no abnormal protrusions visible with a microscope could be observed on the surface of the glass substrate after polishing according to the present invention.

【0039】[0039]

【発明の効果】本発明の化学的機械的研磨加工方法に従
うと、表面に空隙を有するテープをガラス基板表面から
離すと、このテープとガラス基板との接触界面にこれ以
上の固相反応が生じないので、異常突起のない高度に平
坦な表面が得られる、という効果を奏する。
According to the chemical mechanical polishing method of the present invention, when a tape having a void on the surface is separated from the surface of the glass substrate, a further solid phase reaction occurs at the contact interface between the tape and the glass substrate. As a result, there is an effect that a highly flat surface without abnormal projections can be obtained.

【0040】また、本発明の化学的機械的研磨加工法に
従うと、化学的機械的研磨加工の終了後、直ちにガラス
基板表面を洗浄できるので、ガラス基板表面の洗浄のた
めに研磨加工機を停止して研磨加工機からガラス基板を
取り出す時間と手間が省け、次の処理工程への移行時間
が短縮できる、という効果を奏する。
According to the chemical mechanical polishing method of the present invention, the surface of the glass substrate can be washed immediately after the completion of the chemical mechanical polishing, so that the polishing machine is stopped for cleaning the surface of the glass substrate. In addition, the time and labor required to take out the glass substrate from the polishing machine can be saved, and the time required to shift to the next processing step can be shortened.

【図面の簡単な説明】[Brief description of the drawings]

【図1】図1は、本発明に使用する片面研磨加工機(図
1(a))及び両面研磨加工機(図1(b))の略図で
ある。
FIG. 1 is a schematic view of a single-side polishing machine (FIG. 1 (a)) and a double-side polishing machine (FIG. 1 (b)) used in the present invention.

【図2】図2は、片面研磨加工機(図2(a))及びバ
ッチ式の両面研磨加工機の下定盤付近(図2(b))の
略図である。
FIG. 2 is a schematic view of the vicinity of a lower surface plate of a single-side polishing machine (FIG. 2A) and a batch-type double-side polishing machine (FIG. 2B).

【符号の説明】[Explanation of symbols]

C ・・・バフ D ・・・ガラス基板 G1・・・太陽ギア G2・・・インターナルギア G3・・・遊星ギア H ・・・加圧ヘッド J1・・・定盤 J2・・・下定盤 K ・・・遊星ギアの開口 L ・・・クーラント N ・・・ノズル P ・・・ゴムローラ S ・・・砥粒懸濁液 T ・・・表面に空隙を有するテープ M ・・・研磨テープ走行方向 R ・・・ガラス基板回転方向 V ・・・加圧ヘッド押付け方向 W1・・・定盤回転方向 W2・・・太陽ギア回転方向 X1・・・加圧ヘッド自転方向 X2・・・遊星ギア自転方向 Y ・・・遊星ギア公転方向 C: Buff D: Glass substrate G1: Sun gear G2: Internal gear G3: Planetary gear H: Pressurizing head J1: Platen J2: Lower platen K ··· Opening of planetary gears L ··· Coolant N ··· Nozzle P ··· Rubber roller S · ··· Abrasive suspension T · · · Tape with voids on the surface M · · · Polishing tape running direction R · ··· Glass substrate rotation direction V ··· Pressing head pressing direction W1 ··· Plate surface rotation direction W2 ··· Sun gear rotation direction X1 ··· Pressing head rotation direction X2 ··· Planetary gear rotation direction Y · ..Planetary gear revolution direction

フロントページの続き Fターム(参考) 3C049 AA05 AA07 AA09 AA12 AA18 AC04 CA01 CB02 3C058 AA05 AA07 AA09 AA12 AA18 AC04 CA01 CB02 DA12 Continued on the front page F term (reference) 3C049 AA05 AA07 AA09 AA12 AA18 AC04 CA01 CB02 3C058 AA05 AA07 AA09 AA12 AA18 AC04 CA01 CB02 DA12

Claims (8)

【特許請求の範囲】[Claims] 【請求項1】水酸基を有する溶液を添加したクーラント
をガラス基板表面に供給しつつ、表面に空隙を有するテ
ープを前記ガラス基板表面に押し付けて走行させる工
程、から成る化学的機械的研磨加工方法。
1. A chemical mechanical polishing method comprising: a step of supplying a coolant containing a solution having a hydroxyl group to a surface of a glass substrate while pressing a tape having a void on the surface against the surface of the glass substrate to run the tape.
【請求項2】前記テープとして、プラスチック繊維から
なる織布又は不織布テープ、発泡体層をプラスチックフ
ィルム表面に固定したテープ、又は表面に砥粒を固定し
た発泡体層をプラスチックフィルム表面に固定したテー
プが使用される、請求項1の化学的機械的研磨加工方
法。
2. A tape made of a woven or non-woven fabric made of plastic fibers, a tape having a foam layer fixed on the surface of a plastic film, or a tape having a foam layer having abrasive particles fixed on the surface thereof, fixed on the surface of the plastic film. The chemical mechanical polishing method according to claim 1, wherein is used.
【請求項3】前記水酸基を有する溶液として、水酸化カ
リウム溶液が使用される、請求項1又は2の化学的機械
的仕上げ加工方法。
3. The chemical mechanical finishing method according to claim 1, wherein a potassium hydroxide solution is used as the solution having a hydroxyl group.
【請求項4】磁気ディスク用のガラス基板の化学的機械
的研磨加工方法であって、(1)前記ガラス基板を回転
させる工程、(2)水酸基を有する溶液を添加したクー
ラントを前記ガラス基板の表面に供給する工程、及び
(3)表面に空隙を有するテープを前記ガラス基板の表
面に押し付けて、このテープを走行させる工程、から成
る化学的機械的研磨加工方法。
4. A method for chemically and mechanically polishing a glass substrate for a magnetic disk, comprising: (1) a step of rotating the glass substrate; and (2) a step of adding a coolant containing a solution having a hydroxyl group to the glass substrate. A chemical mechanical polishing method comprising: a step of supplying the tape to the surface; and (3) a step of pressing a tape having voids on the surface against the surface of the glass substrate and running the tape.
【請求項5】前記テープを前記ガラス基板の表面から離
す工程、をさらに含み、これにより、化学的機械的研磨
が終了する、請求項4の化学的機械的研磨加工方法。
5. The chemical mechanical polishing method according to claim 4, further comprising the step of separating the tape from the surface of the glass substrate, whereby the chemical mechanical polishing is completed.
【請求項6】前記テープを前記ガラス基板の表面から離
した後に、前記ガラス基板の表面に洗浄液を吹きかける
工程、をさらに含む請求項5の化学的機械的研磨加工方
法。
6. The chemical mechanical polishing method according to claim 5, further comprising a step of spraying a cleaning liquid onto the surface of the glass substrate after separating the tape from the surface of the glass substrate.
【請求項7】前記テープとして、プラスチック繊維から
なる織布又は不織布テープ、発泡体層をプラスチックフ
ィルム表面に固定したテープ、又は表面に砥粒を固定し
た発泡体層をプラスチックフィルム表面に固定したテー
プが使用される、請求項4〜6のいずれか1の化学的機
械的研磨加工方法。
7. As the tape, a woven or nonwoven fabric tape made of plastic fiber, a tape having a foam layer fixed on the surface of a plastic film, or a tape having a foam layer having abrasive particles fixed on the surface of the plastic film The chemical mechanical polishing method according to any one of claims 4 to 6, wherein
【請求項8】前記水酸基を有する溶液として、水酸化カ
リウム溶液が使用される、請求項4〜7のいずれか1の
化学的機械的研磨加工方法。
8. The chemical mechanical polishing method according to claim 4, wherein a potassium hydroxide solution is used as the solution having a hydroxyl group.
JP21479899A 1999-04-08 1999-07-29 Chemical and mechanical polishing method Pending JP2000354945A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP21479899A JP2000354945A (en) 1999-04-08 1999-07-29 Chemical and mechanical polishing method

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP10118199 1999-04-08
JP11-101181 1999-04-08
JP21479899A JP2000354945A (en) 1999-04-08 1999-07-29 Chemical and mechanical polishing method

Publications (1)

Publication Number Publication Date
JP2000354945A true JP2000354945A (en) 2000-12-26

Family

ID=26442096

Family Applications (1)

Application Number Title Priority Date Filing Date
JP21479899A Pending JP2000354945A (en) 1999-04-08 1999-07-29 Chemical and mechanical polishing method

Country Status (1)

Country Link
JP (1) JP2000354945A (en)

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