JP2000075497A - Aligner - Google Patents

Aligner

Info

Publication number
JP2000075497A
JP2000075497A JP10254649A JP25464998A JP2000075497A JP 2000075497 A JP2000075497 A JP 2000075497A JP 10254649 A JP10254649 A JP 10254649A JP 25464998 A JP25464998 A JP 25464998A JP 2000075497 A JP2000075497 A JP 2000075497A
Authority
JP
Japan
Prior art keywords
photomask
exposure
cylindrical
pattern
pitch
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10254649A
Other languages
Japanese (ja)
Inventor
Katsuya Sannomiya
宮 勝 也 三
Ryoichi Ida
田 良 一 井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Adtec Engineering Co Ltd
Original Assignee
Adtec Engineering Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Adtec Engineering Co Ltd filed Critical Adtec Engineering Co Ltd
Priority to JP10254649A priority Critical patent/JP2000075497A/en
Publication of JP2000075497A publication Critical patent/JP2000075497A/en
Pending legal-status Critical Current

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  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide an aligner capable of realizing consecutive exposure. SOLUTION: A cylindrical photomask 1 is rotated, and a work W is carried in synchronization with the rotation of the photomask 1 and exposed at an exposing position E by an exposing light source 2 provided in the photomask 1. The pattern pitch of a film mask 10 is previously measured and the rotation of a cylindrical body 11 is controlled in according with the pattern pitch.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】この発明は、露光装置に関す
る。
[0001] The present invention relates to an exposure apparatus.

【0002】[0002]

【従来の技術】プリント回路基板などを作成する際に、
回路パターン等を描いたフォトマスクを用い、ワーク側
に回路パターンを焼き付けて回路基板を作成する方法が
普及しており、そのための露光装置が種々使用されてい
る。
2. Description of the Related Art When manufacturing a printed circuit board or the like,
2. Description of the Related Art A method of printing a circuit pattern on a work side using a photomask on which a circuit pattern or the like is drawn to form a circuit board has been widely used, and various exposure apparatuses have been used.

【0003】[0003]

【発明が解決しようとする課題】上記した従来の露光装
置において、例えばフープ材のような長尺の連続的なワ
ークに連続的なパターンを形成する際には、フォトマス
クに描かれた或一定のエリア毎に露光とワーク搬送を繰
り返しながら全体の露光を行うことになる。しかし、上
記した方法による露光の場合、隣同士の露光エリアの境
目のパターンの精度に問題が生じる。即ち、露光エリア
がわずかに重なったり、ギャップが生じた状態で露光が
行われることがあり、これがパターンの寸法的な不具合
として表れる問題がある。隣同士の露光エリアが重なら
ないよう或いはギャップが生じないように露光する事は
従来の装置では不可能であり、この点の改善が望まれて
いた。本発明は上記従来技術の欠点を改善することを目
的とする。
In the above-described conventional exposure apparatus, when a continuous pattern is formed on a long continuous work such as a hoop material, a fixed pattern drawn on a photomask is required. The entire exposure is performed while repeating the exposure and the work transfer for each area. However, in the case of the exposure by the above-described method, a problem occurs in the accuracy of the pattern at the boundary between adjacent exposure areas. That is, exposure may be performed in a state where the exposure areas are slightly overlapped or a gap is generated, and this is a problem that appears as a dimensional defect of the pattern. It is impossible with a conventional apparatus to perform exposure so that adjacent exposure areas do not overlap or a gap does not occur, and improvement of this point has been desired. The present invention aims to remedy the disadvantages of the prior art.

【0004】[0004]

【課題を解決するための手段】上記目的を達成するため
に、本発明の露光装置は、円筒状のフォトマスクと、露
光対象物を所定方向に搬送する手段と、前記円筒状のフ
ォトマスクを該露光対象物の搬送と同期させて回転させ
る手段と、前記フォトマスクのパターンピッチに対応し
て、前記フォトマスクの回転と露光対象物の搬送の中の
1又は両方を制御する制御手段と、前記円筒状のフォト
マスクを透過して前記露光対象物に光を照射する光源
と、を備えたことを特徴とする。該円筒状のフォトマス
クは、フォトマスク自体を円筒状としても良いし、或い
は露光波長透過性の材質で円筒を形成し、該円筒にフィ
ルム状のマスクを張り付ける等種々の態様が可能であ
る。フォトマスクと露光対象物は接触させても良いし、
或いは非接触でも良い。該光源は円筒内に設けるのが望
ましく、また遮光カバーと光学系を設け、前記円筒状の
フォトマスクの側周面内側に向けて円筒長さ方向に平行
な線に沿って光を照射する、ように構成することが望ま
しい。フォトマスクのパターンピッチには種々の理由に
より誤差が生じ、これを希望の寸法精度に納めることは
非常に難しい。そのため、この発明においては、パター
ンピッチに対応してフォトマスクの回転或いは露光対象
物の搬送を制御するように構成し、この制御によりパタ
ーンピッチの誤差を補償するように構成されている。具
体的な例として、例えばフォトマスクが円筒体とそこに
装着されたフィルムマスクを有する場合、前記フィルム
マスクの繋ぎ目におけるパターンピッチに基づいて、該
繋ぎ目部分において該フォトマスクの回転制御を行う。
In order to achieve the above object, an exposure apparatus according to the present invention comprises a cylindrical photomask, a unit for conveying an object to be exposed in a predetermined direction, and a cylindrical photomask. Means for rotating in synchronization with the transport of the exposure object, and control means for controlling one or both of the rotation of the photomask and the transport of the exposure object, corresponding to the pattern pitch of the photomask, And a light source for irradiating the exposure object with light through the cylindrical photomask. The cylindrical photomask may be in various forms such as a photomask itself having a cylindrical shape, or a cylinder formed of a material that transmits the exposure wavelength, and a film-shaped mask attached to the cylinder. . The photomask and the object to be exposed may be in contact with each other,
Alternatively, non-contact may be used. The light source is preferably provided in a cylinder, and a light-shielding cover and an optical system are provided, and light is emitted along a line parallel to the cylinder length direction toward the inside of the side peripheral surface of the cylindrical photomask. It is desirable to configure as follows. An error occurs in the pattern pitch of the photomask for various reasons, and it is very difficult to control the error to a desired dimensional accuracy. Therefore, in the present invention, the rotation of the photomask or the conveyance of the object to be exposed is controlled in accordance with the pattern pitch, and the control is performed to compensate for errors in the pattern pitch. As a specific example, for example, when the photomask has a cylindrical body and a film mask mounted thereon, the rotation of the photomask is controlled at the joint based on the pattern pitch at the joint of the film mask. .

【0005】[0005]

【発明の実施の形態】以下本発明の実施の形態を図面に
基づいて説明する。図1及び図2において、円筒状フォ
トマスク1は矢印方向に回転可能になっており、表面に
所定のマスクパターンが描かれている。円筒状の露光波
長透過材にフィルムマスクを張り付けても良い。円筒状
フォトマスク1の下側にワークWが矢印方向に搬送され
るようになっている。ワークW表面には感光レジストが
塗布されており、円筒状フォトマスク1のマスクパター
ンに応じて感光されるようになっている。円筒状フォト
マスク1とワークWとは接触させても良いし、非接触と
しても良い。円筒状フォトマスク1とワークWとは制御
装置20、駆動装置21、22から成るサーボ駆動機構
により高精度に同期させて駆動されるように構成されて
いる。
Embodiments of the present invention will be described below with reference to the drawings. 1 and 2, the cylindrical photomask 1 is rotatable in the direction of an arrow, and a predetermined mask pattern is drawn on the surface. A film mask may be attached to a cylindrical exposure wavelength transmitting material. The work W is transported in the direction of the arrow below the cylindrical photomask 1. A photosensitive resist is applied to the surface of the work W, and is exposed according to the mask pattern of the cylindrical photomask 1. The cylindrical photomask 1 and the workpiece W may be in contact with each other or may be non-contact. The cylindrical photomask 1 and the workpiece W are configured to be synchronously driven with high accuracy by a servo drive mechanism including a control device 20 and drive devices 21 and 22.

【0006】円筒状フォトマスク1の内部には露光光源
2が設けられ、露光周波数の光を照射するように構成さ
れている。露光光源2は円筒状フォトマスク1の回転軸
を通る径線上に円筒長さ方向ほぼ全体にわたって設けら
れている。露光光源2には反射板3が設けられ、露光光
源2の下側(ワークW側)に設けられたレンズ6へ光を
反射して平行光とするようになっている。レンズ6は露
光光源2の光路途中に設けられており、円筒状フォトマ
スク1の円筒長さ方向ほぼ全体にわたって設けられてお
り、円筒長さ方向に所定の面積を有する線条の光を照射
するようになっている。レンズ6は露光光源2の下側か
ら円筒状フォトマスク1とワークWが接触或いは最も近
接する位置の円筒状フォトマスク1内壁側の位置に達す
るように設けられており、該位置まで露光光源2からの
光を伝播するようになっている。この位置が露光位置E
となり、この露光位置Eに円筒状フォトマスク1の円筒
長さに応じた線条の露光部が形成されるようになってい
る。レンズ6は円筒状フォトマスク1の内壁に非接触に
近接するように構成されている。遮光カバー4は露光光
源2と反射板3を覆い、遮光カバー5はレンズ6を覆う
ようになっており、露光を露光位置E以外に漏洩させな
いように構成されている。遮光カバー5は円筒状フォト
マスク1の内壁に出来る限り近接させて非接触とし、ノ
イズ光の侵入を防ぐと共に円筒状フォトマスク1の回転
を阻害しないように構成している。
An exposure light source 2 is provided inside a cylindrical photomask 1 so as to irradiate light of an exposure frequency. The exposure light source 2 is provided over substantially the entire length of the cylindrical photomask 1 on a radial line passing through the rotation axis of the cylindrical photomask 1. The exposure light source 2 is provided with a reflection plate 3 so that light is reflected to a lens 6 provided below the exposure light source 2 (on the side of the work W) to become parallel light. The lens 6 is provided in the middle of the optical path of the exposure light source 2, and is provided over substantially the entire length of the cylindrical photomask 1 in the cylindrical length direction, and irradiates linear light having a predetermined area in the cylindrical length direction. It has become. The lens 6 is provided from the lower side of the exposure light source 2 so as to reach a position on the inner wall side of the cylindrical photomask 1 where the cylindrical photomask 1 and the workpiece W are in contact with or closest to each other. Light from the light source. This position is the exposure position E
In this exposure position E, a linear exposure portion corresponding to the cylindrical length of the cylindrical photomask 1 is formed. The lens 6 is configured to approach the inner wall of the cylindrical photomask 1 in a non-contact manner. The light-shielding cover 4 covers the exposure light source 2 and the reflection plate 3, and the light-shielding cover 5 covers the lens 6, so that exposure is prevented from leaking to positions other than the exposure position E. The light-shielding cover 5 is arranged so as to be as close as possible to the inner wall of the cylindrical photomask 1 so as to be in non-contact, so as to prevent intrusion of noise light and not to hinder the rotation of the cylindrical photomask 1.

【0007】円筒状フォトマスク1にはゴミ取りローラ
7が接触し、またワークWにはゴミ取りローラ8が接触
してゴミ取りを行うようになっている。
A dust removing roller 7 contacts the cylindrical photomask 1 and a dust removing roller 8 contacts the work W to remove dust.

【0008】以上の構成において、ワークWは矢印方向
に搬送し、これに同期して円筒状フォトマスク1が矢印
方向に回転する。そして、露光位置Eにおいて露光光源
2からの光により線条の露光が行われる。円筒状フォト
マスク1が1回転した後も連続的に次の回転が行われる
から、円筒状フォトマスク1に描かれたマスクパターン
を連続的にワークW上に焼き付けることが可能であり、
パターンとパターンのつなぎ目にギャップや重なりが生
ずることがなく、高精度に連続的なパターン形成が可能
である。
In the above configuration, the work W is transported in the direction of the arrow, and the cylindrical photomask 1 rotates in the direction of the arrow in synchronization with the transfer. Then, at the exposure position E, the light from the exposure light source 2 is used to expose the line. Since the next rotation is performed continuously even after the cylindrical photomask 1 makes one rotation, it is possible to continuously print the mask pattern drawn on the cylindrical photomask 1 on the work W,
There is no gap or overlap at the joint between the patterns, and continuous pattern formation with high precision is possible.

【0009】なお、上記では、ワークWの片面にのみ露
光する装置を説明したが、同一の構成をワークWの表裏
に設けてワークWの表裏に同時に露光を行うように構成
することも可能である。
Although the apparatus for exposing only one side of the work W has been described above, it is also possible to provide the same structure on the front and back of the work W and to simultaneously expose the front and back of the work W. is there.

【0010】制御装置20にはパターンピッチ入力装置
19が接続され、適宜円筒状フォトマスク1のパターン
ピッチを入力できるようになっている。このパターンピ
ッチは予め測定した値でも良いし、或いは自動的にピッ
チを測定して入力するようにしても良い。
A pattern pitch input device 19 is connected to the control device 20 so that the pattern pitch of the cylindrical photomask 1 can be appropriately input. The pattern pitch may be a value measured in advance, or the pitch may be automatically measured and input.

【0011】図3と図4によりパターンピッチの誤差に
ついて説明する。前述したように、円筒状フォトマスク
1には露光波長透過材料を使用した円筒の外周に直接パ
ターンを描いたものや、パターンが描かれたフィルムマ
スクを露光波長透過性の円筒の外周に密着固定したもの
が使用可能である。ここでは、円筒状フォトマスク1が
フィルムマスク10と円筒体11を有し、該円筒体11
上にフィルムマスク10を装着した場合について説明す
る。図示するようにフィルムマスク10を装着する場
合、その端部と端部の間で繋ぎ目が発生する。この時、
始点付近のパターンと終点付近のパターンの両者のピッ
チを希望の寸法精度に納めることは非常に困難であり、
このピッチが正確に出来てないと露光対象物への露光パ
ターンは不正確なものとなる。図3の〜はフィルム
マスク10に描かれた各パターンの中心位置を示す。こ
こでは円筒体11を半径方向8分割しており、との
間に繋ぎ目12が発生する。この繋ぎ目12は構造上重
ね合わせることができず、通常は空隙となる。上記した
例において、各中心位置を通る半径の角度はθ1からθ
8まで等角度であることが望ましい。θ1からθ7間で
の精度は、フィルムマスク10の作画精度でほぼ決定さ
れるため、図4に示すからまでのピッチは希望の寸
法を確保するのが容易である。しかし、θ8をθ1〜θ
7と同等に合わせるのは非常に困難である。何故なら
ば、〜の累積精度や円筒体11へのフィルムマスク
10の密着固定精度或いは円筒体11の外周長さの精度
等の各誤差が累積されるからである。そのため、単純に
円筒体11とワークWとを同期させて運転させると、ピ
ッチP8が他のピッチPと異なる現象が生じることにな
る。
The error in the pattern pitch will be described with reference to FIGS. As described above, the cylindrical photomask 1 is obtained by directly drawing a pattern on the outer periphery of a cylinder using an exposure wavelength transmitting material, or a film mask on which the pattern is drawn is closely adhered to the outer periphery of the exposure wavelength transmitting cylinder. Can be used. Here, the cylindrical photomask 1 has a film mask 10 and a cylindrical body 11.
The case where the film mask 10 is mounted thereon will be described. As shown in the drawing, when the film mask 10 is mounted, a seam occurs between the ends. At this time,
It is very difficult to adjust the pitch of both the pattern near the start point and the pattern near the end point to the desired dimensional accuracy.
If this pitch is not made accurately, the exposure pattern on the exposure object will be inaccurate. 3 indicate the center position of each pattern drawn on the film mask 10. Here, the cylindrical body 11 is divided into eight in the radial direction, and a joint 12 is generated between the cylindrical body 11 and the cylindrical body 11. The seam 12 cannot be superposed on the structure, and usually forms a gap. In the above example, the angle of the radius passing through each center position is from θ1 to θ.
It is desirable that the angle be equal to 8. Since the accuracy between θ1 and θ7 is substantially determined by the image forming accuracy of the film mask 10, it is easy to secure a desired pitch as shown in FIG. However, θ8 is set to θ1 to θ
It is very difficult to make it equal to 7. This is because errors such as accumulative accuracy of 〜, accuracy of fixing the film mask 10 to the cylindrical body 11 or accuracy of the outer peripheral length of the cylindrical body 11 are accumulated. Therefore, when the cylinder 11 and the work W are simply operated in synchronization with each other, a phenomenon occurs in which the pitch P8 is different from other pitches P.

【0012】この実施形態では、パターンピッチ入力装
置19を備えており、予めフィルムマスク10を円筒体
11に装着した状態でピッチを測定し、これを入力でき
るように構成されている。自動的にピッチ測定を及び入
力を行うようにしても良い。図4ではピッチP8のみ他
と異なるので、このピッチだけを入力し、駆動装置21
にのθ8分だけ回転させるように制御する。ワークW
は通常通り搬送する。このように、フィルムマスク10
のパターンピッチを事前に測定し、そのピッチに対応し
て円筒体11の回転制御を行うことにより、ワークWに
正確なピッチの露光が行える。そのため、フィルムマス
ク10を円筒体11に装着する際に精度を気にしなくて
良く、操作性が向上する。
In this embodiment, a pattern pitch input device 19 is provided so that the pitch can be measured with the film mask 10 mounted on the cylindrical body 11 in advance, and the pitch can be input. The pitch measurement and the input may be automatically performed. In FIG. 4, only the pitch P8 is different from the others, so only this pitch is input and the driving device 21
Is controlled so as to rotate only by θ8. Work W
Is transported as usual. Thus, the film mask 10
By measuring the pattern pitch in advance and controlling the rotation of the cylindrical body 11 in accordance with the pitch, exposure of the workpiece W at a precise pitch can be performed. Therefore, when mounting the film mask 10 on the cylindrical body 11, it is not necessary to worry about the accuracy, and the operability is improved.

【0013】なお、上記では円筒体11側の回転制御の
みを行うようにしているが、ワークWの搬送制御を行っ
ても良い。また回転制御と搬送制御を両方行っても良
い。また、パターンピッチ入力装置19からは予め測定
したピッチを入力するようなっているが、露光継続中に
露光完成品のピッチ誤差を測定して、制御装置20にフ
ィードバックすることなども可能である。
In the above description, only the rotation control of the cylindrical body 11 is performed, but the transfer control of the work W may be performed. Further, both the rotation control and the transport control may be performed. Further, the pitch measured in advance is input from the pattern pitch input device 19, but it is also possible to measure the pitch error of the completed exposure product during the continuation of the exposure and feed it back to the control device 20.

【0014】図5に上記した動作のフローチャートを示
す。図中ステップS4とS5は露光完成品のピッチの誤
差測定に係るものであって、必ずしも行う必要はない。
FIG. 5 shows a flowchart of the above operation. Steps S4 and S5 in the figure relate to the measurement of the pitch error of the exposed product, and need not necessarily be performed.

【0015】[0015]

【発明の効果】以上説明したように本発明の露光装置に
よれば、パターンの連続的な露光を行え、従来のように
露光とワークWの搬送を間欠的に行うことがなく、その
ためパターンとパターンの間にギャップを生じたり、重
なりを生じることがない。その結果高精度の連続露光が
可能になる。また、フィルムマスクを用いる場合でも、
その装着が容易であり、装着精度に高いものを要求され
ないから、操作性が良い等の効果がある。
As described above, according to the exposure apparatus of the present invention, continuous exposure of a pattern can be performed, and exposure and transfer of a work W are not performed intermittently as in the prior art. There is no gap or overlap between the patterns. As a result, continuous exposure with high precision becomes possible. Also, even when using a film mask,
Since the mounting is easy and the mounting precision is not required, there are effects such as good operability.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施形態を示す概略正面図。FIG. 1 is a schematic front view showing an embodiment of the present invention.

【図2】本発明の一実施形態を示す概略斜視図。FIG. 2 is a schematic perspective view showing one embodiment of the present invention.

【図3】本発明の一実施形態におけるフィルムマスク1
0の円筒体11への装着状態の説明図。
FIG. 3 is a film mask 1 according to an embodiment of the present invention.
FIG. 3 is an explanatory view of a state of attachment to the cylindrical body 11 of FIG.

【図4】本発明の一実施形態におけるパターンピッチの
説明図。
FIG. 4 is an explanatory diagram of a pattern pitch in one embodiment of the present invention.

【図5】本発明の一実施形態の動作を説明するフローチ
ャート図。
FIG. 5 is a flowchart illustrating the operation of the embodiment of the present invention.

【符号の説明】[Explanation of symbols]

1:円筒状フォトマスク、2:露光光源、3:反射板、
4:遮光カバー、5:遮光カバー、6:レンズ、7:ゴ
ミ取りローラ、8:ゴミ取りローラ、10:フィルムマ
スク、11:円筒体、12:繋ぎ目、19:パターンピ
ッチ入力装置、20:制御装置、21:駆動装置、2
2:駆動装置。
1: cylindrical photomask, 2: exposure light source, 3: reflection plate,
4: light shielding cover, 5: light shielding cover, 6: lens, 7: dust removal roller, 8: dust removal roller, 10: film mask, 11: cylindrical body, 12: joint, 19: pattern pitch input device, 20: Control device, 21: drive device, 2
2: Drive device.

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 円筒状のフォトマスクと、 露光対象物を所定方向に搬送する手段と、 前記円筒状のフォトマスクを該露光対象物の搬送と同期
させて回転させる手段と、 前記フォトマスクのパターンピッチに対応して、前記フ
ォトマスクの回転と露光対象物の搬送の中の1又は両方
を制御する制御手段と、 前記円筒状のフォトマスクを透過して前記露光対象物に
光を照射する光源と、を備えたことを特徴とする露光装
置。
1. A cylindrical photomask, means for conveying an object to be exposed in a predetermined direction, means for rotating the cylindrical photomask in synchronization with conveyance of the object to be exposed, Control means for controlling one or both of the rotation of the photomask and the transport of the exposure target in accordance with the pattern pitch; and irradiating the exposure target with light through the cylindrical photomask. An exposure apparatus comprising: a light source.
【請求項2】 前記円筒状のフォトマスクが円筒体とそ
こに装着されたフィルムマスクを有し、 前記フィルムマスクの繋ぎ目におけるパターンピッチに
基づいて、該繋ぎ目部分において該フォトマスクの回転
制御を行う、 ことを特徴とする請求項1に記載の露光装置。
2. The method according to claim 1, wherein the cylindrical photomask has a cylindrical body and a film mask mounted thereon, and controls rotation of the photomask at the joint based on a pattern pitch at a joint of the film mask. The exposure apparatus according to claim 1, wherein:
JP10254649A 1998-08-26 1998-08-26 Aligner Pending JP2000075497A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10254649A JP2000075497A (en) 1998-08-26 1998-08-26 Aligner

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Application Number Priority Date Filing Date Title
JP10254649A JP2000075497A (en) 1998-08-26 1998-08-26 Aligner

Publications (1)

Publication Number Publication Date
JP2000075497A true JP2000075497A (en) 2000-03-14

Family

ID=17267959

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
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