ITMI20102125A1 - A contact probe for a testing head of electronic devices - Google Patents

A contact probe for a testing head of electronic devices

Info

Publication number
ITMI20102125A1
ITMI20102125A1 ITMI20102125A ITMI20102125A1 IT MI20102125 A1 ITMI20102125 A1 IT MI20102125A1 IT MI20102125 A ITMI20102125 A IT MI20102125A IT MI20102125 A1 ITMI20102125 A1 IT MI20102125A1
Authority
IT
Italy
Prior art keywords
electronic devices
contact probe
testing head
testing
head
Prior art date
Application number
Other languages
Italian (it)
Inventor
Giuseppe Crippa
Roberto Crippa
Original Assignee
Technoprobe Spa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Technoprobe Spa filed Critical Technoprobe Spa
Priority to ITMI20102125 priority Critical patent/ITMI20102125A1/en
Publication of ITMI20102125A1 publication Critical patent/ITMI20102125A1/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733Geometry aspects
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • G01R1/07307Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
ITMI20102125 2010-11-16 2010-11-16 A contact probe for a testing head of electronic devices ITMI20102125A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
ITMI20102125 ITMI20102125A1 (en) 2010-11-16 2010-11-16 A contact probe for a testing head of electronic devices

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ITMI20102125 ITMI20102125A1 (en) 2010-11-16 2010-11-16 A contact probe for a testing head of electronic devices

Publications (1)

Publication Number Publication Date
ITMI20102125A1 true ITMI20102125A1 (en) 2012-05-17

Family

ID=43742740

Family Applications (1)

Application Number Title Priority Date Filing Date
ITMI20102125 ITMI20102125A1 (en) 2010-11-16 2010-11-16 A contact probe for a testing head of electronic devices

Country Status (1)

Country Link
IT (1) ITMI20102125A1 (en)

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5378971A (en) * 1990-11-30 1995-01-03 Tokyo Electron Limited Probe and a method of manufacturing the same
JP2001041976A (en) * 1999-08-03 2001-02-16 Nec Corp Probe for electric inspection
EP1197756A2 (en) * 2000-08-09 2002-04-17 Nihon Denshizairyo Kabushiki Kaisha Probe card for testing integrated circuits
US20020113612A1 (en) * 2001-02-20 2002-08-22 Nguyen Vinh T. Contact probe pin for wafer probing apparatus
US20080238452A1 (en) * 2007-03-30 2008-10-02 Dsl Labs, Incorporated Vertical micro probes
EP2088443A1 (en) * 2008-02-08 2009-08-12 Technoprobe S.p.A Contact probe for a testing head having vertical probes with improved scrub movement

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5378971A (en) * 1990-11-30 1995-01-03 Tokyo Electron Limited Probe and a method of manufacturing the same
JP2001041976A (en) * 1999-08-03 2001-02-16 Nec Corp Probe for electric inspection
EP1197756A2 (en) * 2000-08-09 2002-04-17 Nihon Denshizairyo Kabushiki Kaisha Probe card for testing integrated circuits
US20020113612A1 (en) * 2001-02-20 2002-08-22 Nguyen Vinh T. Contact probe pin for wafer probing apparatus
US20080238452A1 (en) * 2007-03-30 2008-10-02 Dsl Labs, Incorporated Vertical micro probes
EP2088443A1 (en) * 2008-02-08 2009-08-12 Technoprobe S.p.A Contact probe for a testing head having vertical probes with improved scrub movement

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