IT201700091869A1 - A method for programming quickly a test machine for testing electronic components - Google Patents

A method for programming quickly a test machine for testing electronic components

Info

Publication number
IT201700091869A1
IT201700091869A1 IT102017000091869A IT201700091869A IT201700091869A1 IT 201700091869 A1 IT201700091869 A1 IT 201700091869A1 IT 102017000091869 A IT102017000091869 A IT 102017000091869A IT 201700091869 A IT201700091869 A IT 201700091869A IT 201700091869 A1 IT201700091869 A1 IT 201700091869A1
Authority
IT
Italy
Prior art keywords
method
electronic components
test machine
testing electronic
programming
Prior art date
Application number
IT102017000091869A
Other languages
Italian (it)
Inventor
Giuseppe Amelio
Original Assignee
Microtest S R L
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Microtest S R L filed Critical Microtest S R L
Priority to IT102017000091869A priority Critical patent/IT201700091869A1/en
Publication of IT201700091869A1 publication Critical patent/IT201700091869A1/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/3183Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318307Generation of test inputs, e.g. test vectors, patterns or sequences computer-aided, e.g. automatic test program generator [ATPG], program translations, test program debugging
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/319Tester hardware, i.e. output processing circuit
    • G01R31/31903Tester hardware, i.e. output processing circuit tester configuration
    • G01R31/31912Tester/user interface
    • GPHYSICS
    • G06COMPUTING; CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26Functional testing
    • G06F11/263Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers
IT102017000091869A 2017-08-08 2017-08-08 A method for programming quickly a test machine for testing electronic components IT201700091869A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
IT102017000091869A IT201700091869A1 (en) 2017-08-08 2017-08-08 A method for programming quickly a test machine for testing electronic components

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT102017000091869A IT201700091869A1 (en) 2017-08-08 2017-08-08 A method for programming quickly a test machine for testing electronic components

Publications (1)

Publication Number Publication Date
IT201700091869A1 true IT201700091869A1 (en) 2019-02-08

Family

ID=61006003

Family Applications (1)

Application Number Title Priority Date Filing Date
IT102017000091869A IT201700091869A1 (en) 2017-08-08 2017-08-08 A method for programming quickly a test machine for testing electronic components

Country Status (1)

Country Link
IT (1) IT201700091869A1 (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6128759A (en) * 1998-03-20 2000-10-03 Teradyne, Inc. Flexible test environment for automatic test equipment
US20030212522A1 (en) * 2002-05-09 2003-11-13 Sutton Christopher K. Externally controllable electronic test program
US20040220765A1 (en) * 2003-02-28 2004-11-04 Josef Gluch Method for communication with a test system for integrated circuits

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6128759A (en) * 1998-03-20 2000-10-03 Teradyne, Inc. Flexible test environment for automatic test equipment
US20030212522A1 (en) * 2002-05-09 2003-11-13 Sutton Christopher K. Externally controllable electronic test program
US20040220765A1 (en) * 2003-02-28 2004-11-04 Josef Gluch Method for communication with a test system for integrated circuits

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