IT1402537B1 - DEVICE TO MEASURE THE PROPERTY OF A BODY THROUGH RADIATION DIFFUSION AND RELATIVE METHOD - Google Patents

DEVICE TO MEASURE THE PROPERTY OF A BODY THROUGH RADIATION DIFFUSION AND RELATIVE METHOD

Info

Publication number
IT1402537B1
IT1402537B1 ITMI2010A001992A ITMI20101992A IT1402537B1 IT 1402537 B1 IT1402537 B1 IT 1402537B1 IT MI2010A001992 A ITMI2010A001992 A IT MI2010A001992A IT MI20101992 A ITMI20101992 A IT MI20101992A IT 1402537 B1 IT1402537 B1 IT 1402537B1
Authority
IT
Italy
Prior art keywords
measure
property
relative method
radiation diffusion
diffusion
Prior art date
Application number
ITMI2010A001992A
Other languages
Italian (it)
Inventor
Roberto Ziano
Francesco Mantegazza
Doriano Costantino Brogioli
Domenico Salerno
Original Assignee
Università Degli Studi Di Milano Bicocca
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Università Degli Studi Di Milano Bicocca filed Critical Università Degli Studi Di Milano Bicocca
Priority to ITMI2010A001992A priority Critical patent/IT1402537B1/en
Priority to PCT/IB2011/054783 priority patent/WO2012056413A1/en
Publication of ITMI20101992A1 publication Critical patent/ITMI20101992A1/en
Application granted granted Critical
Publication of IT1402537B1 publication Critical patent/IT1402537B1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4795—Scattering, i.e. diffuse reflection spatially resolved investigating of object in scattering medium
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/201—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by measuring small-angle scattering
    • G01N23/202—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by measuring small-angle scattering using neutrons
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4795—Scattering, i.e. diffuse reflection spatially resolved investigating of object in scattering medium
    • G01N2021/4797—Scattering, i.e. diffuse reflection spatially resolved investigating of object in scattering medium time resolved, e.g. analysis of ballistic photons
ITMI2010A001992A 2010-10-27 2010-10-27 DEVICE TO MEASURE THE PROPERTY OF A BODY THROUGH RADIATION DIFFUSION AND RELATIVE METHOD IT1402537B1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
ITMI2010A001992A IT1402537B1 (en) 2010-10-27 2010-10-27 DEVICE TO MEASURE THE PROPERTY OF A BODY THROUGH RADIATION DIFFUSION AND RELATIVE METHOD
PCT/IB2011/054783 WO2012056413A1 (en) 2010-10-27 2011-10-26 Device for measuring properties of a medium by scattered radiation and relative method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ITMI2010A001992A IT1402537B1 (en) 2010-10-27 2010-10-27 DEVICE TO MEASURE THE PROPERTY OF A BODY THROUGH RADIATION DIFFUSION AND RELATIVE METHOD

Publications (2)

Publication Number Publication Date
ITMI20101992A1 ITMI20101992A1 (en) 2012-04-28
IT1402537B1 true IT1402537B1 (en) 2013-09-13

Family

ID=43738109

Family Applications (1)

Application Number Title Priority Date Filing Date
ITMI2010A001992A IT1402537B1 (en) 2010-10-27 2010-10-27 DEVICE TO MEASURE THE PROPERTY OF A BODY THROUGH RADIATION DIFFUSION AND RELATIVE METHOD

Country Status (2)

Country Link
IT (1) IT1402537B1 (en)
WO (1) WO2012056413A1 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10060865B2 (en) * 2015-03-10 2018-08-28 Lyncean Technologies, Inc. Measurement of critical dimensions of nanostructures using X-ray grazing incidence in-plane diffraction
CN114678076B (en) * 2022-03-31 2023-07-18 西安交通大学 Thermal neutron scattering law data calculation method based on atomic track
CN114895343A (en) * 2022-04-18 2022-08-12 山东理工大学 Perovskite-based X-ray radiation dosimeter and manufacturing method thereof

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5155549A (en) * 1990-10-25 1992-10-13 The Research Of State University Of New York Method and apparatus for determining the physical properties of materials using dynamic light scattering techniques
US6738144B1 (en) 1999-12-17 2004-05-18 University Of Central Florida Non-invasive method and low-coherence apparatus system analysis and process control
DE10245676B4 (en) * 2002-09-30 2008-01-17 Siemens Ag Phase-contrast x-ray machine with line focus for creating a phase-contrast image of an object and method for producing the phase-contrast image
JP3860162B2 (en) * 2003-10-20 2006-12-20 大塚電子株式会社 Dynamic light scattering measurement system using phase modulation interferometry
US8614792B2 (en) * 2009-03-04 2013-12-24 Malvern Instruments, Ltd. Particle characterization

Also Published As

Publication number Publication date
WO2012056413A1 (en) 2012-05-03
ITMI20101992A1 (en) 2012-04-28

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