IL300758A - The composition, its use and a process for selective burning of silicon-germanium material - Google Patents

The composition, its use and a process for selective burning of silicon-germanium material

Info

Publication number
IL300758A
IL300758A IL300758A IL30075823A IL300758A IL 300758 A IL300758 A IL 300758A IL 300758 A IL300758 A IL 300758A IL 30075823 A IL30075823 A IL 30075823A IL 300758 A IL300758 A IL 300758A
Authority
IL
Israel
Prior art keywords
weight
acid
silicon
layer
composition
Prior art date
Application number
IL300758A
Other languages
English (en)
Hebrew (he)
Original Assignee
Basf Se
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Basf Se filed Critical Basf Se
Publication of IL300758A publication Critical patent/IL300758A/en

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09KMATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K13/00Etching, surface-brightening or pickling compositions
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P50/00Etching of wafers, substrates or parts of devices
    • H10P50/60Wet etching
    • H10P50/64Wet etching of semiconductor materials
    • H10P50/642Chemical etching

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Organic Chemistry (AREA)
  • Weting (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • ing And Chemical Polishing (AREA)
  • Drying Of Semiconductors (AREA)
IL300758A 2020-08-24 2021-08-18 The composition, its use and a process for selective burning of silicon-germanium material IL300758A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP20192464 2020-08-24
PCT/EP2021/072975 WO2022043165A1 (en) 2020-08-24 2021-08-18 Composition, its use and a process for selectively etching silicon-germanium material

Publications (1)

Publication Number Publication Date
IL300758A true IL300758A (en) 2023-04-01

Family

ID=72240282

Family Applications (1)

Application Number Title Priority Date Filing Date
IL300758A IL300758A (en) 2020-08-24 2021-08-18 The composition, its use and a process for selective burning of silicon-germanium material

Country Status (7)

Country Link
US (1) US20230326759A1 (https=)
EP (1) EP4200895A1 (https=)
JP (1) JP7754920B2 (https=)
KR (1) KR20230054674A (https=)
CN (1) CN116195036A (https=)
IL (1) IL300758A (https=)
WO (1) WO2022043165A1 (https=)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2022008306A1 (en) * 2020-07-09 2022-01-13 Basf Se Composition comprising a siloxane and an alkane for avoiding pattern collapse when treating patterned materials with line-space dimensions of 50 nm or below
KR20250148723A (ko) * 2023-03-24 2025-10-14 후지필름 가부시키가이샤 처리액, 처리 방법
WO2025064429A1 (en) * 2023-09-22 2025-03-27 Entegris, Inc. Etchant compositions and related methods
WO2026022021A1 (en) 2024-07-25 2026-01-29 Basf Se Composition, its use and a process for selectively etching silicon-germanium layers
WO2026042511A1 (ja) * 2024-08-20 2026-02-26 富士フイルム株式会社 薬液、被処理物の処理方法、半導体デバイスの製造方法
CN119979170B (zh) * 2024-12-13 2026-03-03 湖北兴福电子材料股份有限公司 一种适用于微电子器件从硅锗/硅叠层中相对于硅选择性去除硅锗的组合物

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11186771B2 (en) 2017-06-05 2021-11-30 Versum Materials Us, Llc Etching solution for selectively removing silicon nitride during manufacture of a semiconductor device
US10879076B2 (en) 2017-08-25 2020-12-29 Versum Materials Us, Llc Etching solution for selectively removing silicon-germanium alloy from a silicon-germanium/silicon stack during manufacture of a semiconductor device
US10934484B2 (en) 2018-03-09 2021-03-02 Versum Materials Us, Llc Etching solution for selectively removing silicon-germanium alloy from a silicon-germanium/ germanium stack during manufacture of a semiconductor device
CN115651656B (zh) 2018-12-03 2024-09-03 富士胶片电子材料美国有限公司 蚀刻组合物
JP7450334B2 (ja) 2018-12-27 2024-03-15 東京応化工業株式会社 エッチング液、及び半導体素子の製造方法

Also Published As

Publication number Publication date
KR20230054674A (ko) 2023-04-25
US20230326759A1 (en) 2023-10-12
JP7754920B2 (ja) 2025-10-15
WO2022043165A1 (en) 2022-03-03
JP2023539238A (ja) 2023-09-13
TW202219323A (zh) 2022-05-16
CN116195036A (zh) 2023-05-30
EP4200895A1 (en) 2023-06-28

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