IL132554A0 - Semiconductor imaging device - Google Patents

Semiconductor imaging device

Info

Publication number
IL132554A0
IL132554A0 IL13255498A IL13255498A IL132554A0 IL 132554 A0 IL132554 A0 IL 132554A0 IL 13255498 A IL13255498 A IL 13255498A IL 13255498 A IL13255498 A IL 13255498A IL 132554 A0 IL132554 A0 IL 132554A0
Authority
IL
Israel
Prior art keywords
imaging device
semiconductor imaging
semiconductor
imaging
Prior art date
Application number
IL13255498A
Other languages
English (en)
Original Assignee
Simage Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Simage Oy filed Critical Simage Oy
Publication of IL132554A0 publication Critical patent/IL132554A0/xx

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14643—Photodiode arrays; MOS imagers
    • H01L27/14658—X-ray, gamma-ray or corpuscular radiation imagers
    • H01L27/14661—X-ray, gamma-ray or corpuscular radiation imagers of the hybrid type
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14618—Containers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732—Location after the connecting process
    • H01L2224/73251—Location after the connecting process on different surfaces
    • H01L2224/73253—Bump and layer connectors

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Measurement Of Radiation (AREA)
  • Light Receiving Elements (AREA)
  • Solid State Image Pick-Up Elements (AREA)
IL13255498A 1997-05-06 1998-05-01 Semiconductor imaging device IL132554A0 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB9709160A GB2325081B (en) 1997-05-06 1997-05-06 Semiconductor imaging device
PCT/EP1998/002786 WO1998050955A1 (en) 1997-05-06 1998-05-01 Semiconductor imaging device

Publications (1)

Publication Number Publication Date
IL132554A0 true IL132554A0 (en) 2001-03-19

Family

ID=10811870

Family Applications (1)

Application Number Title Priority Date Filing Date
IL13255498A IL132554A0 (en) 1997-05-06 1998-05-01 Semiconductor imaging device

Country Status (7)

Country Link
US (1) US6188089B1 (xx)
EP (1) EP0980587A1 (xx)
JP (1) JP2001525924A (xx)
AU (1) AU7764298A (xx)
GB (1) GB2325081B (xx)
IL (1) IL132554A0 (xx)
WO (1) WO1998050955A1 (xx)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2289983B (en) 1994-06-01 1996-10-16 Simage Oy Imaging devices,systems and methods
GB2318448B (en) * 1996-10-18 2002-01-16 Simage Oy Imaging detector and method of production
US9029793B2 (en) 1998-11-05 2015-05-12 Siemens Aktiengesellschaft Imaging device
GB0224689D0 (en) * 2002-10-23 2002-12-04 Simage Oy Formation of contacts on semiconductor substrates
ATE440383T1 (de) * 2002-10-25 2009-09-15 Ipl Intellectual Property Lice Schaltungssubstrat und verfahren
US7223981B1 (en) 2002-12-04 2007-05-29 Aguila Technologies Inc. Gamma ray detector modules
DE10357135B4 (de) * 2003-12-06 2007-01-04 X-Fab Semiconductor Foundries Ag Fotodetektor mit Transimpendanzverstärker und Auswerteelektronik in monolithischer Integration und Herstellungsverfahren
US7495225B2 (en) * 2004-12-08 2009-02-24 General Electric Company Methods and apparatus for pixilated detector masking
JP2008546177A (ja) * 2005-05-16 2008-12-18 Ｉｉ−Ｖｉ インコーポレイテッド 高性能のＣｄｘＺｎ１−ｘＴｅ（０≦ｘ≦１）のＸ線及びγ線の放射線検出器およびその製造方法
DE102005063106A1 (de) * 2005-12-30 2007-07-05 Patent-Treuhand-Gesellschaft für elektrische Glühlampen mbH Optoelektronischer Halbleiterchip und optoelektronisches Bauelement mit solch einem Halbleiterchip
DE102006046314A1 (de) * 2006-09-29 2008-04-03 Siemens Ag Strahlungsdirektkonvertermodul und Strahlungsdirektkonverter
FR2944140B1 (fr) * 2009-04-02 2011-09-16 Commissariat Energie Atomique Dispositif de detection d'image electronique
US9847369B2 (en) 2015-02-17 2017-12-19 Redlen Technologies, Inc. High-performance radiation detectors and methods of fabricating thereof
US9613993B2 (en) 2015-09-03 2017-04-04 The Regents Of The University Of California Segmented AC-coupled readout from continuous collection electrodes in semiconductor sensors
EP3690490A1 (en) * 2019-02-04 2020-08-05 ams International AG X-ray detector component, x-ray detection module, imaging device and method for manufacturing an x-ray detector component
US11378701B2 (en) 2019-10-08 2022-07-05 Redlen Technologies, Inc. Low dark current radiation detector and method of making the same
US11733408B2 (en) 2020-04-28 2023-08-22 Redlen Technologies, Inc. High-performance radiation detectors and methods of fabricating thereof

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2132050C3 (de) * 1971-06-28 1981-01-15 Siemens Ag, 1000 Berlin Und 8000 Muenchen Detektor zum Nachweis und zur Messung ionisierender Strahlung
US3864722A (en) * 1973-05-02 1975-02-04 Rca Corp Radiation sensing arrays
CA1177148A (en) * 1981-10-06 1984-10-30 Robert J. Mcintyre Avalanche photodiode array
US4517464A (en) * 1982-09-30 1985-05-14 The United States Of America As Represented By The Secretary Of The Air Force Sensor system
DE3536299A1 (de) * 1985-10-11 1987-04-16 Nukem Gmbh Solarzelle aus silizium
US4783594A (en) * 1987-11-20 1988-11-08 Santa Barbara Research Center Reticular detector array
JP3115148B2 (ja) * 1993-03-31 2000-12-04 株式会社東芝 半導体装置の製造方法
US5515411A (en) * 1993-03-31 1996-05-07 Shimadzu Corporation X-ray image pickup tube
US5536680A (en) * 1995-05-08 1996-07-16 Texas Instruments Incorporated Self-aligned bump bond infrared focal plane array architecture
JPH0936410A (ja) * 1995-07-24 1997-02-07 Shimadzu Corp 半導体放射線検出素子
GB2307785B (en) * 1995-11-29 1998-04-29 Simage Oy Forming contacts on semiconductor substrates for radiation detectors and imaging devices

Also Published As

Publication number Publication date
GB2325081B (en) 2000-01-26
WO1998050955A1 (en) 1998-11-12
EP0980587A1 (en) 2000-02-23
US6188089B1 (en) 2001-02-13
GB9709160D0 (en) 1997-06-25
AU7764298A (en) 1998-11-27
JP2001525924A (ja) 2001-12-11
GB2325081A (en) 1998-11-11

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