GB997338A - A method and apparatus for producing x-rays of particular wave lengths and applications therefor - Google Patents
A method and apparatus for producing x-rays of particular wave lengths and applications thereforInfo
- Publication number
- GB997338A GB997338A GB4293863A GB4293863A GB997338A GB 997338 A GB997338 A GB 997338A GB 4293863 A GB4293863 A GB 4293863A GB 4293863 A GB4293863 A GB 4293863A GB 997338 A GB997338 A GB 997338A
- Authority
- GB
- United Kingdom
- Prior art keywords
- radiation
- rays
- secondary material
- source
- radioisotope
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| BE641675A BE641675A (US06277897-20010821-C00009.png) | 1963-12-23 | 1963-12-23 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| GB997338A true GB997338A (en) | 1965-07-07 |
Family
ID=3845696
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB4293863A Expired GB997338A (en) | 1963-12-23 | 1963-10-30 | A method and apparatus for producing x-rays of particular wave lengths and applications therefor |
Country Status (2)
| Country | Link |
|---|---|
| BE (1) | BE641675A (US06277897-20010821-C00009.png) |
| GB (1) | GB997338A (US06277897-20010821-C00009.png) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2005040855A1 (en) | 2003-10-27 | 2005-05-06 | Koninklijke Philips Electronics, N.V. | Calibration method and apparatus for pixilated solid state detector |
| GB2552537A (en) * | 2016-07-28 | 2018-01-31 | Smiths Heimann Sas | Inspection system with source of radiation and method |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB1131143A (en) * | 1964-12-17 | 1968-10-23 | British Cellophane Ltd | An improved x-ray gauging apparatus |
-
1963
- 1963-10-30 GB GB4293863A patent/GB997338A/en not_active Expired
- 1963-12-23 BE BE641675A patent/BE641675A/fr unknown
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2005040855A1 (en) | 2003-10-27 | 2005-05-06 | Koninklijke Philips Electronics, N.V. | Calibration method and apparatus for pixilated solid state detector |
| US7518102B2 (en) | 2003-10-27 | 2009-04-14 | Koninklijke Philips Electronics N.V. | Calibration method and apparatus for pixilated solid state detector |
| GB2552537A (en) * | 2016-07-28 | 2018-01-31 | Smiths Heimann Sas | Inspection system with source of radiation and method |
| GB2552537B (en) * | 2016-07-28 | 2020-05-27 | Smiths Heimann Sas | Inspection system with source of radiation and method |
| US10962677B2 (en) | 2016-07-28 | 2021-03-30 | Smiths Heimann Sas | Inspection system with source of radiation and method |
Also Published As
| Publication number | Publication date |
|---|---|
| BE641675A (US06277897-20010821-C00009.png) | 1964-04-16 |
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