GB2442766B - Workpiece height adjustment in an eletron beam lithography machine - Google Patents
Workpiece height adjustment in an eletron beam lithography machineInfo
- Publication number
- GB2442766B GB2442766B GB0620287A GB0620287A GB2442766B GB 2442766 B GB2442766 B GB 2442766B GB 0620287 A GB0620287 A GB 0620287A GB 0620287 A GB0620287 A GB 0620287A GB 2442766 B GB2442766 B GB 2442766B
- Authority
- GB
- United Kingdom
- Prior art keywords
- height adjustment
- beam lithography
- lithography machine
- workpiece height
- eletron
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000001459 lithography Methods 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
- H01J37/3174—Particle-beam lithography, e.g. electron beam lithography
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/023—Means for mechanically adjusting components not otherwise provided for
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/304—Controlling tubes by information coming from the objects or from the beam, e.g. correction signals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/304—Controlling tubes by information coming from the objects or from the beam, e.g. correction signals
- H01J37/3045—Object or beam position registration
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
- H01J2237/202—Movement
- H01J2237/20221—Translation
- H01J2237/20235—Z movement or adjustment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
- H01J2237/202—Movement
- H01J2237/20292—Means for position and/or orientation registration
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/248—Components associated with the control of the tube
- H01J2237/2482—Optical means
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Physics & Mathematics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Electron Beam Exposure (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB0620287A GB2442766B (en) | 2006-10-12 | 2006-10-12 | Workpiece height adjustment in an eletron beam lithography machine |
PCT/GB2007/003866 WO2008044030A1 (en) | 2006-10-12 | 2007-10-11 | Workpiece height adjustment in an electron beam lithography machine |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB0620287A GB2442766B (en) | 2006-10-12 | 2006-10-12 | Workpiece height adjustment in an eletron beam lithography machine |
Publications (3)
Publication Number | Publication Date |
---|---|
GB0620287D0 GB0620287D0 (en) | 2006-11-22 |
GB2442766A GB2442766A (en) | 2008-04-16 |
GB2442766B true GB2442766B (en) | 2009-06-24 |
Family
ID=37491420
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB0620287A Expired - Fee Related GB2442766B (en) | 2006-10-12 | 2006-10-12 | Workpiece height adjustment in an eletron beam lithography machine |
Country Status (2)
Country | Link |
---|---|
GB (1) | GB2442766B (en) |
WO (1) | WO2008044030A1 (en) |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4560880A (en) * | 1983-09-19 | 1985-12-24 | Varian Associates, Inc. | Apparatus for positioning a workpiece in a localized vacuum processing system |
US4891526A (en) * | 1986-12-29 | 1990-01-02 | Hughes Aircraft Company | X-Y-θ-Z positioning stage |
GB2324650A (en) * | 1997-04-25 | 1998-10-28 | Leica Lithography Systems Ltd | Pattern-writing machine |
EP1003201A2 (en) * | 1998-11-17 | 2000-05-24 | Advantest Corporation | Electron beam exposure apparatus and exposure method |
WO2001095364A1 (en) * | 2000-06-09 | 2001-12-13 | Advantest Corporation | Electron beam generator and method of electron beam irradiation |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2644290A1 (en) * | 1989-03-10 | 1990-09-14 | Labo Electronique Physique | MICROMANIPULATOR |
US5731641A (en) * | 1996-02-28 | 1998-03-24 | Aerotech, Inc. | Linear motor driven vertical lift stage |
JP3704694B2 (en) * | 1996-03-22 | 2005-10-12 | 株式会社ニコン | Charged particle beam transfer device |
JP3940310B2 (en) * | 2002-04-04 | 2007-07-04 | 株式会社日立ハイテクノロジーズ | Electron beam drawing method, drawing apparatus, and semiconductor manufacturing method using the same |
-
2006
- 2006-10-12 GB GB0620287A patent/GB2442766B/en not_active Expired - Fee Related
-
2007
- 2007-10-11 WO PCT/GB2007/003866 patent/WO2008044030A1/en active Application Filing
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4560880A (en) * | 1983-09-19 | 1985-12-24 | Varian Associates, Inc. | Apparatus for positioning a workpiece in a localized vacuum processing system |
US4891526A (en) * | 1986-12-29 | 1990-01-02 | Hughes Aircraft Company | X-Y-θ-Z positioning stage |
GB2324650A (en) * | 1997-04-25 | 1998-10-28 | Leica Lithography Systems Ltd | Pattern-writing machine |
EP1003201A2 (en) * | 1998-11-17 | 2000-05-24 | Advantest Corporation | Electron beam exposure apparatus and exposure method |
WO2001095364A1 (en) * | 2000-06-09 | 2001-12-13 | Advantest Corporation | Electron beam generator and method of electron beam irradiation |
Also Published As
Publication number | Publication date |
---|---|
WO2008044030A1 (en) | 2008-04-17 |
GB2442766A (en) | 2008-04-16 |
GB0620287D0 (en) | 2006-11-22 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 20111012 |