GB2351622B - System and method for disabling static current paths in fuse logic - Google Patents

System and method for disabling static current paths in fuse logic

Info

Publication number
GB2351622B
GB2351622B GB0022585A GB0022585A GB2351622B GB 2351622 B GB2351622 B GB 2351622B GB 0022585 A GB0022585 A GB 0022585A GB 0022585 A GB0022585 A GB 0022585A GB 2351622 B GB2351622 B GB 2351622B
Authority
GB
United Kingdom
Prior art keywords
disabling
system
method
current paths
static current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB0022585A
Other versions
GB0022585D0 (en
GB2351622A (en
Inventor
Michael J Bennett
Robert W Proulx
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HP Inc
Original Assignee
HP Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to US08/683,485 priority Critical patent/US5663902A/en
Application filed by HP Inc filed Critical HP Inc
Priority to GB9712967A priority patent/GB2315624B/en
Publication of GB0022585D0 publication Critical patent/GB0022585D0/en
Publication of GB2351622A publication Critical patent/GB2351622A/en
Application granted granted Critical
Publication of GB2351622B publication Critical patent/GB2351622B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C17/00Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
    • G11C17/14Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM
    • G11C17/18Auxiliary circuits, e.g. for writing into memory
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C17/00Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
    • G11C17/14Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM
    • G11C17/16Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM using electrically-fusible links
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/31702Testing digital circuits including elements other than semiconductor transistors, e.g. biochips, nanofabrics, mems, chips with magnetic elements
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
GB0022585A 1996-07-18 1997-06-19 System and method for disabling static current paths in fuse logic Expired - Fee Related GB2351622B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
US08/683,485 US5663902A (en) 1996-07-18 1996-07-18 System and method for disabling static current paths in fuse logic
GB9712967A GB2315624B (en) 1996-07-18 1997-06-19 System and method for disabling static current paths in fuse logic

Publications (3)

Publication Number Publication Date
GB0022585D0 GB0022585D0 (en) 2000-11-01
GB2351622A GB2351622A (en) 2001-01-03
GB2351622B true GB2351622B (en) 2001-06-27

Family

ID=26311762

Family Applications (1)

Application Number Title Priority Date Filing Date
GB0022585A Expired - Fee Related GB2351622B (en) 1996-07-18 1997-06-19 System and method for disabling static current paths in fuse logic

Country Status (1)

Country Link
GB (1) GB2351622B (en)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4896055A (en) * 1987-03-06 1990-01-23 Kabushiki Kaisha Toshiba Semiconductor integrated circuit technology for eliminating circuits or arrays having abnormal operating characteristics
US4996670A (en) * 1989-09-28 1991-02-26 International Business Machines Corporation Zero standby power, radiation hardened, memory redundancy circuit
US5222043A (en) * 1989-06-29 1993-06-22 Siemens Aktiengesellschaft Circuit configuration for identification of integrated semiconductor circuitries
US5301143A (en) * 1992-12-31 1994-04-05 Micron Semiconductor, Inc. Method for identifying a semiconductor die using an IC with programmable links
US5530749A (en) * 1994-08-15 1996-06-25 International Business Machines Corporation Methods and apparatus for secure hardware configuration

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4896055A (en) * 1987-03-06 1990-01-23 Kabushiki Kaisha Toshiba Semiconductor integrated circuit technology for eliminating circuits or arrays having abnormal operating characteristics
US5222043A (en) * 1989-06-29 1993-06-22 Siemens Aktiengesellschaft Circuit configuration for identification of integrated semiconductor circuitries
US4996670A (en) * 1989-09-28 1991-02-26 International Business Machines Corporation Zero standby power, radiation hardened, memory redundancy circuit
US5301143A (en) * 1992-12-31 1994-04-05 Micron Semiconductor, Inc. Method for identifying a semiconductor die using an IC with programmable links
US5530749A (en) * 1994-08-15 1996-06-25 International Business Machines Corporation Methods and apparatus for secure hardware configuration

Also Published As

Publication number Publication date
GB0022585D0 (en) 2000-11-01
GB2351622A (en) 2001-01-03

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20080619