GB2250089A - Spectrometer - Google Patents

Spectrometer Download PDF

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Publication number
GB2250089A
GB2250089A GB9025345A GB9025345A GB2250089A GB 2250089 A GB2250089 A GB 2250089A GB 9025345 A GB9025345 A GB 9025345A GB 9025345 A GB9025345 A GB 9025345A GB 2250089 A GB2250089 A GB 2250089A
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GB
United Kingdom
Prior art keywords
charge
spectrometer
detector
charges
radiation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GB9025345A
Other versions
GB9025345D0 (en
Inventor
Huw Prytherch
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Philips Electronics UK Ltd
Original Assignee
Philips Electronic and Associated Industries Ltd
Philips Electronics UK Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Electronic and Associated Industries Ltd, Philips Electronics UK Ltd filed Critical Philips Electronic and Associated Industries Ltd
Priority to GB9025345A priority Critical patent/GB2250089A/en
Publication of GB9025345D0 publication Critical patent/GB9025345D0/en
Priority to DE69107583T priority patent/DE69107583T2/en
Priority to EP91202957A priority patent/EP0487143B1/en
Priority to US07/795,166 priority patent/US5235402A/en
Priority to JP3304824A priority patent/JPH04268422A/en
Publication of GB2250089A publication Critical patent/GB2250089A/en
Withdrawn legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44Electric circuits
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/2803Investigating the spectrum using photoelectric array detector

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)

Description

22500,39 1
DESCRIPTION
SPECTROMETER The invention relates to a spectrometer comprising a radiation source, means for directing radiation from the source through a sample compartment, means for dispersing the radiation emerging from the sample compartment and directing it onto a radiation detector, signal processing means for processing the signal produced by the radiation detector, and display means for displaying the processed signal, wherein the detector comprises an m column by R row array of charge coupled devices, means for accumulating the charges from a plurality of devices on an output capacitor, and means for producing an output signal representing the charge on the output capacitor.
Such a spectrometer is described in the following three papers.
1) Charge Transfer Device Detectors for Analytical Optical Spectroscopy Operation and Characteristics by R.B. Bilhorn, J.V. Sweedler, P.M.E. Epperson, and M.B. Denton; published in Applied Spectroscopy, Volume 41, Number 7, 1987, pages 1114 to 1125:
2) Intensified charged-coupled-device cameras for a spatially resolving extreme ultraviolet spectrometer by D. Content, M. Perry, D. Wroblewski, and H.W. Moor; published in Optical Engineering, Volume 26, Number 8, August 1987, pages 806 to 812: and 3) Optimising charge-coupled-device detector operation for optical astromony by Robert W. Leach; published in Optical Engineering, Volume 26, Number 10, October 1987, pages 1061 to 1066. They all refer to the advantage of charge coupled device (CCD) detectors in that a read-out mode in which the charge from more than one detector element can be combined within the CCD before being read out. This process is called binning. The advantage of summing the analogue signal "on chip", as compared with digital summing in memory, is that the summed charge is subject to only one read operation and as a result has only the 2 PHB 33681 noise associated with one read operation; whereas digitally summing the data also sums the noise associated with each read out operation.
This technique can only be applied where either a small number of detector elements which accumulate a maximum charge are binned or if a large number of detector elements are binned they can only accumulate a small charge. This is because in one direction of the array the shift register can only hold a small amount of charge, typically between one and five times the maximum detector element charge, and in the other direction the output capacitor has a small charge handling capacity, again typically not more than five times a shift register stage charge.
It is an object of the invention to enable the extent of binning in a CCD detector for spectrophotometers to be increased.
The invention provides a spectrometer as set forth in the opening paragraph characterised in that a further, external, capacitor is connected in series with said output capacitor.
CCDs are commonly used for capturing the image in video cameras and are commonly made in arrays of 600 by 575 detector elements (or pixels in television terminology), see for example the Philips NXA 1001 solid state image sensor. Typically a polychromator disperses the source radiation and causes a narrowband of wavelengths to illuminate each column of the detector. In order to obtain maximum sensitivity it is des.ixable to use all or a substantial proportion of the elements of a column to detect radiation of the narrow band of wavelengths. This means that for wavelengths where the absorbance of a sample is low and hence the energy falling on the detector is high each detector element in a column will accumulate a large charge and consequently binning on the output capacitor of the CCD becomes impossible. Possible alternatives are to restrict the energy of the radiation so that no detector element accumulates a latge charge regardless of the absorbance of the sample or the integration time or to read out individual or a small number of detector elements and sum them digitally. The first alternative 1 1 1 1 i i 3 PHB 33681 suffers from the disadvantage that when there is significant sample absorbance the radiation received by the detector will be very low and hence will result in reduced sensitivity and increased noise. The second alternative has the disadvantage of increasing the read out noise as discussed hereinbefore. By adding extra external capacitance it is possible to sum the charges from many picture elements as the external capacitor can be made much larger than the "on chip" output capacitor provided in the CCD. Thus the invention allows the use of low cost standard CCD chips designed for consumer applications such as video cameras as detectors for spectrometers and enables the signal to be read out with a minimum of added noise. The charges from a complete column of detector elements may be accumulated on said capacitors and the output signal produced when said charges have been accumulated. This enables a maximum sensitivity of measurement since when low level signals are received at the detector a large detector area is available which maximises the total radiation received and for signal shot noise limited operation as the signal increases the noise increases as the square root of the signal and hence the signal to noise ratio is increased.
The charges from a selected number of the detector elements of a column may be accumulated on said capacitors and the output signal produced when said charges have been accumulated. This enables a standard array to be tailored to the optical system being used i.e. only those elements which are illuminated by the measurement beam are read out, it being a relatively straightforward process to select those elements enabling easy accommodation of different sized samples where the measurement beam may be altered in size in order to improve measurement performance.
The spectrometer may include a transistor connected tb the parallel arrangement of said capacitors and control means for controlling the transistor to cause it to reset the capacitors to a given state of charge when the output signal has been produced.
4 PEB 33681 By this means minimal change is required to the normal operation of a CCD chip. The pixel reset transistor is isolated from the reference supply and instead of resetting the internal capacitor it causes charge sharing between the internal and external capacitors. The resetting function is then performed by the external transistor which serves to isolate the internal transistor from the reference voltage source used to reset the capacitors to a given charge state.
The above and other features and advantages of the invention will be apparent from an embodiment of the invention which will now be described, by way of example, with reference to the accompanying drawings, in which:Figure 1 shows in block schematic form a spectrometer according to the invention, Figure 2 shows in block schematic form a detector comprising a charge coupled device array and control circuitry, Figure 3 shows a circuit diagram of the read out circuit of the detector show in Figure 1, and Figure 4 shows waveforms useful for understanding the operation of the read out circuit shown in Figure 3.
As shown in Figure 1 the spectrometer comprises a radiation source 1 which emits wideband radiation. Many such sources are known, for example tungsten filament lamps for visible wavelengths or deuterium lamps for ultra violet (UV) wavelengths. The radiation from the source 1 is directed through a sample compartment 2 onto a dispersing element 3. Conventionally the radiation is directed through the sample compartment by appropriate optical means, mirrors and/or lenses, onto the dispersing means which may be a prism or a diffraction grating. Again appropriate optical elements are used to collimate and focus the radiation beam where appropriate. The dispersed radiation beam is directed onto a detector 4 whith comprises a charge coupled device array. The detector 4 comprises a regular array of m rows by n columns of charge coupled devices as is conventionally used in television cameras.
i i 1 PHB 33681 A control and signal processing circuit 5 provides the necessary signals to read the output of the detector 4 and processes the signal read out for display on a display device 6. The display devices 6 may take any convenient form, for example video display unit, chart recorder, X-Y plotter, etc.
Figure 2 shows the detector 4 which is in the form of a charge coupled device in the form of an array 50 having n columns of m charge coupled devices. An output shift register 51 is connected to an output circuit 52 which produces an output signal at an output terminal 53. The detector 4 may comprise a commercially available CCD array and has associated with it control circuitry 54 to enable the charge to be accumulated and readout. Details of such control circuitry are readily available, for example in a data handbook entitled Solid State Image Sensors and Peripheral Integrated Circuits published by Philips Components (Book PC11, 1989). The control circuitry produces appropriate clocking and readout signals which cause the charges from each device to be read in sequence one column at a time in parallel into the shift register 51 from where it is shifted serially into the output circuit 52 from which it is fed to output 53 for connection to the control and processing circuit 5.
Figure 3 shows how the output circuit 52 is modified to allow binning of all the charges in a column or of a substantial portion of them regardless of the charge accumulated by each of the elements. The-dotted box 52 represents the output circuit shown in Figure 2. A first input 61 is connected to the junction of a capacitor Cl and the source electrode of an n-channel field effect transistor Tl and also to the gate electrode of an n-channel field effect transistor T2. The other end of the capacitor C1 is connected to a negative supply rail -V while the drain electrode of transistor T2 is connected to a positivO supply rail +V. The drain electrode of transistor TI is connected to the junction of a capacitor C2 and the source electrode of an n-channel field effect transistor T3. The other
6 PHB 33681 end of capacitor C2 is connected to the negative supply rail -V while the drain electrode of transistor T3 is connected to the gate electrode of transistor T1 while a third input 63 is connected to the gate electrode of transistor T3. The source electrode of transistor T2 is connected to the output terminal 53.
In operation charges from the shift register 51 are fed to the first input 61 while a pixel reset control signal is fed to the second input 62. A column reset control signal is fed to the third input 63. Normally the drain electrode of transistor T1 would be connected directly to the reference voltage VR and consequently when the pixel reset pulses are received this would reset the charge on capacitor C1 to a given value. This charge is then incremented by each of the charge packets received from the shift register 51 at input 61. The pixel reset pulses are normally applied after receipt of each charge packet so that a series of pulses are produced at output 53 which correspond in magnitude to the magnitude of the individual charge packets. However, by reducing the frequency of the pixel reset pulses it is possible to accumulate a limited number of charge packets on the capacitor Cl. The number is limited by the value of the capacitor C1, which cannot conveniently be made large by integrated circuit techniques, and the size of the charge packets, i.e. if it can be ensured that only a small charge accumulates on each element of the array then a greater number can be accumulated on capacitor C1.
The arrangement shown in Figure 3 includes transistor T3 and capacitor C2 connected externally to the CCD array such that the transistor T3 is connected between the reference source VR and the drain electrode of transistor T1. Transistor T3 is controlled by a column reset signal applied to terminal 63 and isolates transistor Ti from the reference source VR except-when the reset signal is present. Consequently as each charge packet is received it accumulates on capacitors C1 and C2 which are connected in parallel when transistor T1 is switched on by the 1 J' 7 PHB 33681 pixel reset pulses. Capacitor C2 can be chosen to be much larger than capacitor Cl as it is realised as a discrete component. This charge is accumulated on the parallel combination of capacitors Cl and C2 and a whole column of CCDs can be binned in this combination even when all the elements have accumulated their maximum charge.
Figure 4 is a timing diagram showing in Figure 4a) the charge packets applied to input 61, in Figure 4b) the pixel reset pulses applied to input 62, in Figure 4c) the column reset pulses applied to input 63, and in Figure 4d) the output signal at terminal 53.
It is also possible to connect the gate electrode to transistor Tl in terminal 62 to a constant bias potential so that transistor Tl is continuous by conducting and thus permanently connects capacitors Cl and C2 in parallel, the combination of capacitors Cl and C2 being set to the given charge by the column reset pulses. This has the advantage of reducing inaccuracies caused by the switching of transistor Tl which has parasitic capacitance associated with it. In this case the waveform shown in Figure 4(b) would be replaced by a constant bias level.
From reading the present disclosure, other modifications will be apparent to persons skilled in the art. Such modifications may involve other features which are already known in the design, manufacture and use of analytical instrumentp and component parts thereof and which may be used instead of or in addition to features already described herein. Although claims have been formulated in this application to particular combinations of features, it should be understood that the scope of the disclosure of the present application also includes any novel feature or any novel combination of features disclosed herein either explicitly or implicitly or any generalisation thereof, whether or not it relates to the same invention as presently claimed in any claim and whether or not it mitigates any or all of the same technical problems as does the present invention. The applicants hereby give notice that new claims may 8 PHB 33681 be formulated to such features and/or combinations of such features during the prosecution of the present application or of any further application derived therefrom.
i 1 9 PHB 33681

Claims (6)

  1. CLAIM(S)
    I. A spectrometer comprising a radiation source, means for directing radiation from the source through a sample compartment, means for dispersing the radiation emerging from the sample compartment and directing it onto a radiation detector, signal processing means for processing the signal produced by the radiation detector, and display means for displaying the processed signal, wherein the detector comprises an m column by n row array of charge coupled devices, means for accumulating the charges from a plurality of the devices on an output capacitor, and means for producing an output signal representing the charge on the output capacitor characterised in that a further external capacitor is connected in parallel with said output capacitor.
  2. 2. A spectrometer as claimed in Claim 1 in which the charges from a complete column of detector elements are accumulated on said capacitors, the output signal being produced when said charges have been accumulated.
  3. 3. A spectrometer as claimed in Claim I in which the charges from a selected number of the detector elements of a column are accumulated on said capacitors, the output signal being produced when said charges have been accumulated.
  4. 4. A spectrometer as claimed in any of Claims 1 to 3 comprising a transistor connected to the parallel arrangement of said capacitors and control means for controlling the transistor to cause it to reset the capacitors to a given state of charge when the output signal has been produced.
  5. 5. A spectrometer substantially as described herein with reference to the accompanying drawings.
  6. 6. Any novel feature or novel combination of features disclosed herein either explicitly or implicitly whether or not it relates to the same invention as that claimed in any preceding claim.
GB9025345A 1990-11-21 1990-11-21 Spectrometer Withdrawn GB2250089A (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
GB9025345A GB2250089A (en) 1990-11-21 1990-11-21 Spectrometer
DE69107583T DE69107583T2 (en) 1990-11-21 1991-11-14 Spectrometer.
EP91202957A EP0487143B1 (en) 1990-11-21 1991-11-14 Spectrometer
US07/795,166 US5235402A (en) 1990-11-21 1991-11-18 Spectrometer
JP3304824A JPH04268422A (en) 1990-11-21 1991-11-20 Spectroscope apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB9025345A GB2250089A (en) 1990-11-21 1990-11-21 Spectrometer

Publications (2)

Publication Number Publication Date
GB9025345D0 GB9025345D0 (en) 1991-01-02
GB2250089A true GB2250089A (en) 1992-05-27

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Application Number Title Priority Date Filing Date
GB9025345A Withdrawn GB2250089A (en) 1990-11-21 1990-11-21 Spectrometer

Country Status (5)

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US (1) US5235402A (en)
EP (1) EP0487143B1 (en)
JP (1) JPH04268422A (en)
DE (1) DE69107583T2 (en)
GB (1) GB2250089A (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5493122A (en) * 1994-02-04 1996-02-20 Nucleonics Development Company Energy resolving x-ray detector
US5590660A (en) * 1994-03-28 1997-01-07 Xillix Technologies Corp. Apparatus and method for imaging diseased tissue using integrated autofluorescence
DE4413096B4 (en) * 1994-04-15 2004-09-09 Berthold Gmbh & Co. Kg Multi-element atomic absorption spectrometer and measuring method using such an atomic absorption spectrometer
US7084973B1 (en) 2002-06-11 2006-08-01 Dalsa Inc. Variable binning CCD for spectroscopy

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4004163A (en) * 1976-03-11 1977-01-18 Rockwell International Corporation Time delay, charge, transfer circuit
JPS6134798A (en) * 1984-07-25 1986-02-19 Sharp Corp Output signal processing circuit of charge transfer element
ES2035985T3 (en) * 1989-05-20 1993-05-01 Hewlett-Packard Gmbh METHOD OF OPERATION OF A SPECTOMETER OF PHOTODIODS AND CORRESPONDING PHOTODIODES SPECTOMETER.

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
Applied spectroscopy, Vol 41, No. 7,1987, pp.1114-1125. *
Optical engineering,Vol 26, No. 10,October 1987, pp. 1016- 1066 *
Optical engineering,Vol 26, No.8, August 1987, pp.806-812. *

Also Published As

Publication number Publication date
EP0487143A2 (en) 1992-05-27
EP0487143A3 (en) 1992-09-02
US5235402A (en) 1993-08-10
JPH04268422A (en) 1992-09-24
DE69107583T2 (en) 1995-09-07
EP0487143B1 (en) 1995-02-22
GB9025345D0 (en) 1991-01-02
DE69107583D1 (en) 1995-03-30

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WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)