GB2217444B - Method of and apparatus for optically checking the appearances of chip-type components and sorting the chip-type components - Google Patents

Method of and apparatus for optically checking the appearances of chip-type components and sorting the chip-type components

Info

Publication number
GB2217444B
GB2217444B GB8904468A GB8904468A GB2217444B GB 2217444 B GB2217444 B GB 2217444B GB 8904468 A GB8904468 A GB 8904468A GB 8904468 A GB8904468 A GB 8904468A GB 2217444 B GB2217444 B GB 2217444B
Authority
GB
United Kingdom
Prior art keywords
chip
type components
appearances
sorting
optically checking
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB8904468A
Other languages
English (en)
Other versions
GB8904468D0 (en
GB2217444A (en
Inventor
Touru Mizuno
Yasuhiko Kitajima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TDK Corp
Original Assignee
TDK Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by TDK Corp filed Critical TDK Corp
Publication of GB8904468D0 publication Critical patent/GB8904468D0/en
Publication of GB2217444A publication Critical patent/GB2217444A/en
Application granted granted Critical
Publication of GB2217444B publication Critical patent/GB2217444B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/02—Measures preceding sorting, e.g. arranging articles in a stream orientating
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/04—Sorting according to size
    • B07C5/10—Sorting according to size measured by light-responsive means
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S209/00—Classifying, separating, and assorting solids
    • Y10S209/906—Pneumatic or liquid stream feeding item
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S209/00—Classifying, separating, and assorting solids
    • Y10S209/911—Feed means supporting or guiding item moving under influence of gravity
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S209/00—Classifying, separating, and assorting solids
    • Y10S209/934—Moving items to sorting means in spaced relation lengthwise of feed path
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S209/00—Classifying, separating, and assorting solids
    • Y10S209/939—Video scanning

Landscapes

  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Sorting Of Articles (AREA)
  • Branching, Merging, And Special Transfer Between Conveyors (AREA)
  • Image Processing (AREA)
  • Discharge Of Articles From Conveyors (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
GB8904468A 1988-03-31 1989-02-28 Method of and apparatus for optically checking the appearances of chip-type components and sorting the chip-type components Expired - Fee Related GB2217444B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63079578A JPH01249181A (ja) 1988-03-31 1988-03-31 チップ部品自動外観選別機における部品仕分け方法

Publications (3)

Publication Number Publication Date
GB8904468D0 GB8904468D0 (en) 1989-04-12
GB2217444A GB2217444A (en) 1989-10-25
GB2217444B true GB2217444B (en) 1992-05-13

Family

ID=13693870

Family Applications (1)

Application Number Title Priority Date Filing Date
GB8904468A Expired - Fee Related GB2217444B (en) 1988-03-31 1989-02-28 Method of and apparatus for optically checking the appearances of chip-type components and sorting the chip-type components

Country Status (6)

Country Link
US (1) US4976356A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JP (1) JPH01249181A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
CN (1) CN1018799B (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
DE (1) DE3906281A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
FR (1) FR2629585B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
GB (1) GB2217444B (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

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US5436028A (en) * 1992-07-27 1995-07-25 Motorola, Inc. Method and apparatus for selectively applying solder paste to multiple types of printed circuit boards
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US5348164A (en) * 1993-04-13 1994-09-20 Micron Semiconductor, Inc. Method and apparatus for testing integrated circuits
DE4314396A1 (de) * 1993-04-30 1994-11-03 Robert Prof Dr Ing Massen Optische Sortierung von Kunststoffen
WO1994025186A1 (de) * 1993-04-30 1994-11-10 Robert Massen Verfahren und vorrichtung zur sortierung von materialteilen
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DE19506550A1 (de) * 1995-02-24 1996-08-29 Inst Chemo Biosensorik Verfahren zur verzugsfreien Feststellung von und zur Warnung vor durch Glättebildung bedingte Gefahren und Vorrichtung zur Durchführung des Verfahrens
DE19616708A1 (de) * 1996-04-26 1997-10-30 Wolfgang Hoermle Vorrichtung zur Vermessung und Sortierung von Werkstücken
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DE10034432B4 (de) * 2000-07-10 2004-08-26 Demag Ergotech Gmbh Weiche zum Sortieren und Führen von Teilen
US6444935B1 (en) * 2000-10-18 2002-09-03 Electro Scientific Industries, Inc. High speed track shutter system for semi-conductor inspection
JP4887523B2 (ja) * 2000-12-28 2012-02-29 リンテック株式会社 多面体検査用フィーダー及び多面体検査装置
DE10149505A1 (de) * 2001-10-02 2003-04-10 Krieg Gunther Verfahren und Vorrichtung zur Selektierung von Kunststoffen und anderen Materialien bezüglich Farbe und Zusammensetzung
US8436268B1 (en) 2002-08-12 2013-05-07 Ecullet Method of and apparatus for type and color sorting of cullet
US7351929B2 (en) * 2002-08-12 2008-04-01 Ecullet Method of and apparatus for high speed, high quality, contaminant removal and color sorting of glass cullet
US7355140B1 (en) 2002-08-12 2008-04-08 Ecullet Method of and apparatus for multi-stage sorting of glass cullets
DE102004051301A1 (de) * 2004-10-20 2006-06-01 Ief Werner Gmbh Vorrichtung zur optischen Prüfung von Bauteilen
US8121392B2 (en) 2004-10-25 2012-02-21 Parata Systems, Llc Embedded imaging and control system
US20060118530A1 (en) * 2004-12-07 2006-06-08 Chih-Ming Hsu Method and apparatus for cutting a chip by laser
JP5122322B2 (ja) * 2008-02-15 2013-01-16 日東精工株式会社 部品検査装置
US20100230330A1 (en) * 2009-03-16 2010-09-16 Ecullet Method of and apparatus for the pre-processing of single stream recyclable material for sorting
JP5449997B2 (ja) * 2009-11-09 2014-03-19 株式会社マルハニチロ水産 魚卵熟度判定装置及び魚卵熟度判定方法
CN102553837A (zh) * 2012-01-10 2012-07-11 梅州市宇通科技有限公司 一种石英晶片外观分选装置
CN105083977B (zh) * 2014-05-14 2018-04-10 泰科电子(上海)有限公司 自动配料设备
CN104550043A (zh) * 2015-01-12 2015-04-29 无锡东禾电子有限公司 一种垫片表面缺陷分捡系统
CA2976394C (en) * 2015-02-17 2023-01-03 Blak & Sorensen Aps Transport system
US9769970B2 (en) * 2015-12-16 2017-09-19 Panasonic Factory Solutions Asia Pacific Apparatus and method for feeding electronic components for insertion onto circuit boards
CN105436091B (zh) * 2015-12-29 2018-06-08 临海市锦铮机械有限公司 镜片分检输送装置
CN105797977B (zh) * 2016-04-01 2018-06-29 开平帛汉电子有限公司 电子元件检测装置
DE102016109752A1 (de) * 2016-05-26 2017-11-30 Sikora Ag Vorrichtung und Verfahren zum Untersuchen von Schüttgut
CN109688837B (zh) * 2016-09-20 2022-08-09 日本水产株式会社 除去了异物的鱼子酱的制造方法和除去了异物的鱼子酱的制造装置
CN111659633A (zh) * 2020-06-05 2020-09-15 珠海格力智能装备有限公司 工装产品分类系统、方法
CN111721782A (zh) * 2020-06-28 2020-09-29 苏州天准科技股份有限公司 光学检测设备
JPWO2023053986A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * 2021-09-30 2023-04-06
CN113857065A (zh) * 2021-11-01 2021-12-31 合肥泰禾智能科技集团股份有限公司 分选机构及分选装置
CN115921330B (zh) * 2022-09-08 2024-09-06 宁德时代新能源科技股份有限公司 夹针位置的检测方法、装置、电芯的夹针设备及卷料系统
CN115582281A (zh) * 2022-12-12 2023-01-10 常州湖南大学机械装备研究院 一种检测分拣装置
CN116475101A (zh) * 2023-05-09 2023-07-25 绍兴宏邦电子科技有限公司 集成电路芯片分选系统及其集成电路芯片感应方法
CN116441193B (zh) * 2023-05-15 2025-07-08 嘉兴九纵智能科技有限公司 一种新型电镀芯片外观缺陷检测设备及其检测方法

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Also Published As

Publication number Publication date
GB8904468D0 (en) 1989-04-12
DE3906281A1 (de) 1989-10-19
CN1018799B (zh) 1992-10-28
US4976356A (en) 1990-12-11
FR2629585A1 (fr) 1989-10-06
FR2629585B1 (fr) 1994-04-08
CN1038343A (zh) 1989-12-27
JPH01249181A (ja) 1989-10-04
JPH0577475B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1993-10-26
GB2217444A (en) 1989-10-25

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20080228