GB2156087A - Temperature compensated resistance bridge circuit - Google Patents

Temperature compensated resistance bridge circuit Download PDF

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Publication number
GB2156087A
GB2156087A GB08504323A GB8504323A GB2156087A GB 2156087 A GB2156087 A GB 2156087A GB 08504323 A GB08504323 A GB 08504323A GB 8504323 A GB8504323 A GB 8504323A GB 2156087 A GB2156087 A GB 2156087A
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United Kingdom
Prior art keywords
bridge
voltage
temperature
resistance
value
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Granted
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GB08504323A
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GB2156087B (en
GB8504323D0 (en
Inventor
David Robert Madeley
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ZF International UK Ltd
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Lucas Industries Ltd
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Publication of GB2156087A publication Critical patent/GB2156087A/en
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Publication of GB2156087B publication Critical patent/GB2156087B/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L9/00Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means
    • G01L9/02Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means by making use of variations in ohmic resistance, e.g. of potentiometers, electric circuits therefor, e.g. bridges, amplifiers or signal conditioning
    • G01L9/06Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means by making use of variations in ohmic resistance, e.g. of potentiometers, electric circuits therefor, e.g. bridges, amplifiers or signal conditioning of piezo-resistive devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00Measuring force or stress, in general
    • G01L1/20Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
    • G01L1/22Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
    • G01L1/2268Arrangements for correcting or for compensating unwanted effects
    • G01L1/2281Arrangements for correcting or for compensating unwanted effects for temperature variations
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R17/00Measuring arrangements involving comparison with a reference value, e.g. bridge
    • G01R17/10AC or DC measuring bridges
    • G01R17/105AC or DC measuring bridges for measuring impedance or resistance
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S323/00Electricity: power supply or regulation systems
    • Y10S323/907Temperature compensation of semiconductor

Description

SPECIFICATION
Temperature compensated resistance bridge circuit This invention relates to a temperature compensated resistance bridge circuit ahd a method for providing such a circuit.
It is known to provide transducers which comprise four resistive strain gauges which are arranged as a Wheatstone bridge, the temperature coefficients of resistance (TCR) of the resistive elements being substantially constant over the temperature range at which the 16 transducer is required to operate. However, as a result of manufacturing tolerances the resistances of the four bridge elements are rarely equal at a zero value of the input quantity to which the transducer is intended to respond, the transducer output voltage at zero input being referred to as offset error. Additionally the TCR's of the bridge elements are rarely equal, so that the offset error also changes with temperature. The transducer sensitivity, expressed as change in output voltage at unit supply voltage and a given change of input value, also changes with temperature.
As disclosed in UK patent application 2096332A a resistance bridge circuit may be temperature-compensated by connecting thereto four resistances which have constant values over the temperature range likely to be experienced, the values and positions of these resistances being determined from measure ments, at a plurality of temperature levels and input values, of levels of voltage and resis tance of the bridge. The method described in the above application, though necessary where the bridge is expected to encounter temperatures up to 1 80C, is disadvantageous 105 in that it requires accurate measurements, highly accurate compensating resistors and complex calculations.
It is an object of the present invention to provide a resistance bridge circuit which is temperature compensated by means which avoid the requirement for the aforesaid calculations and highly accurate resistors.
According to the invention there is provided a resistance bridge, means for applying a supply voltage across a first pair of opposite junctions of said bridge and means for deriving an output voltage from a second pair of opposite junctions of said bridge, said means for applying the supply voltage including means for modifying said supply voltage in dependence on the temperature of said bridge in a sense to oppose a change in sensitivity of the bridge with a change in the temperature thereof over a predetermined range, and said means for deriving said output voltage includes means for modifying the derived voltage in accordance with the bridge temperature, in a sense to maintain an offset error of the bridge substantially constant over said GB 2 156 087A 1 predetermined temperature range.
In a preferred embodiment said means for modifying the supply and output voltages comprises means for generating first and sec- ond voltages each of which varies substantially linearly with the temperature of said bridge, and there is provided means for modifying said supply voltage in dependence on said first voltage and a reference voltage, and means for rendering said output voltage dependent on the sum of said second voltage and the voltage across said second pair of bridge junctions.
An embodiment of the invention will now be described by way of example only and with reference to the accompanying drawing which is a circuit diagram of a resistance bridge and associated component for temperature compensation.
In the present example the resistance bridge 20 comprises a silicon diaphragm which is locally doped with germanium to provide four resistances arranged as a Wheatstone bridge. The diaphragm forms part of a pressure trans- ducer of the type available from Kulite Sensors Ltd. of Basingstoke, England. A supply voltage VB is applied across one pair of opposite junctions of the bridge 20 and an output voltage Vo is derived from the potential across the other pair of opposite junctions of the bridge 20, by way of an amplifier 21 which is available from Analog Devices Corporation under the designation AD524. The reference numerals shown at the terminals of this ampli- fier, and of circuit elements 22, 28, 41, indicate the pin numbers thereon to which connections are to be made. Elements 22, 28, 30, 41 are also available from Analog Devices Corporation under designations referred to hereafter. In a bridge circuit of this type the sensitivity dVo/dp, as above defined, falls approximately linearly with increase in temperature. The offset voltage, as above defined, is always negative and becomes more negative with increasing temperature.
As shown, a voltage supply circuit 22, designation AD2702, is connected between a + 1 5V rail 23 and a - 1 5V rail 24 and provides output voltages of + 1 OV and - 1 OV on lines 25, 26 respectively, The line is connected to ground through resistors R1, R2 arranged as a voltage divider. Resistor R1 has a value of 8K06 and the value of resistor R2 is determined as described below.
The junction of resistors 131, R2 is connected by a line 27 to the noninverting input of an amplifier 28, designation AD51 7. The inverting input of amplifier 28 is connected by a line 29 to parallel resistors R3, R4 and thence through a current source 30, designation AD590, to the - 1 OV rail 26. The value of the parallel arrangement of resistors R3, R4 is determined as described below. The current source 30 has an output which varies linearly with temperature and is located so as to be at 2 GB 2 156 087A 2 the same temperature as the bridge 20. The output of amplifier 28 is connected to the base of a npn transistor 31 whose collector is connected to the rail 23 and whose emitter is connected by a line 32 to a supply junction of the bridge 20. A feedback resistor R5, whose value is determined as described below, interconnects the lines 29, 32. The arrangement of the amplifier 28, transistor 31 and resistor R5 is such as to cause the voltage V29 on line 29 to be urged to equality with the voltage V27 on line 27, the voltage V27 providing, in effect, a reference voltage.
The output of the amplifier 21 is connected through a series arrangement of resistors R6, R7 and a line 40 to the inverting input of an amplifier 41, similar to the amplifier 28. The output terminal 42 of amplifier 41 carries a voltage output signal Vo for the circuit as a whole. The terminal 42 is connected to the inverting input through a resistor R8. The value of resistor R8 is typically 20K0, and the value of resistor R7 is 0.95 of the value of R8. The value of resistor R6 is determined as described below. The non-inverting input of amplifier 41 is connected to ground through a 5K0 resistor R9. The junction between the resistors R3, R4 and the current source 30 is connected to the line 40 through a resistor R 10 whose value is equal to that of the resistor R8. The line 40 is connected to the - 1 OV line 26 through a series arrangement of resistors R1 1, R1 2 whose values are determined as described below.
The temperature-dependent errors in both the bridge 20 and amplifier 21 are approxi mately linear. It is therefore possible to com pensate the system as a whole by treating the bridge 20 as the sole source of these errors.
Moreover since the output voltage Vo, for a given sensed pressure, and the offset voltage are subject to negative-going errors with tem perature rise, these errors can be corrected by voltage changes in the same sense. The trans ducer of which the bridge 20 forms part is connected to a pressure source by means of which the transducer can be subjected to a pressure which is as close to a vacuum as can reasonably be obtained, this pressure being referred to hereinafter as zero pressure and designated by the subscript L, and to a pres sure, designated hereafter by the subscript p, which is.75 of full scale. The system is calibrated at these pressures and at WC and 5 1 OWC, indicated hereafter by the subscripts 120 C(cold) and H(hot) respectively.
A procedure for determining the value of the compensating resistors is as follows:
(1) Resistor R5 is short circuited.
Resistors R3, R4, R 10, R 11 and R 12 are rendered open circuit.
Resistor R6 is set to 1 KO.
Resistor R2 is replaced by a decade resis tance box which is maintained an ambient temperature.
(2) The system is initially stabilised at WC (Tc) and the value of R2 is adjusted by the resistance box to set the initial bridge supply voltage V131 to 4.0 volts.
(3) The output voltages VL and Vp at termi nal 42 are measured at zero pressure and.75 full scale respectively.
(4) The sensitivity at WC, Sc.
(VP - VL)/P is calculated.
(5) The sensitivity error E = (Sc-SR)/Sc is calculated, where SR is the required sensitiv ity in volts/unit pressure change.
(6) A new value V132 of bridge supply voltage is calculated from V132 = (1 - E)V131.
(7) The value of R2 is adjusted by the resistance box so that the bridge supply vol tage becomes VB2.
(8) Steps (3) to (7) above are repeated sequentially until Sc = SR 0.00001 volt- s/unit pressure change.
(9) The final values of VBc and VLc are recorded.
(10) The system is stabilised at 1 OWC (TH).
(11) The output voltages VL and VP at terminal 42 are measured at zero pressure and.75 full scale respectively.
(12) The sensitivity at 1 OWC, SH = (VP - VQP is calculated.
(13) The sensitivity error E = (SH-SR)/SH is calculated.
(14) A new value V133 of bridge supply voltage is calculated from V133 = (1 - E)V132.
(15) The value of R2 is adjusted by the resistance box so that the bridge voltage is equal to VB3.
(16) Steps (11) to (15) are repeated sequentially until SH = SR 0.00001 volts/unit pressure change.
(17) The final bridge voltage VBH and out- put voltage V1-H are recorded.
(18) The system is allowed to stabilise at room temperature, e.g. 1WC.
(19) Resistor R 10 is fitted to the circuit.
(20) The resistance RP of the parallel ar- rangement of the resistors R3 and R4 is calculated f rom: R P = R 1 ONR /(1. R 10 - VR) where: resistance values are in kilohms 1 is the current/temperature characteristic of the source 30 in u A/'C, and VR = (VLc - VLH)/(TH - Tc) in mV/'C.
(21) A combination of resistors R3 and R4 is selected to give the closest obtainable approximation RPa to the calculated value of R P.
(22) The value of resistor R5 is calculated from R5 = VBs (R1 0 + RPa)/LR10 where VBs = (VBH-VBc)/(TH-Tc).
(23) A resistor having the nearest obtainable value R5a to the calculated value R5 is fitted in place of the short circuit provided in step (1) above.
(24) The value of R2 is calculated from R2 V27.Rl/(10-V27) since +1Ovoltsis applied on the line 25 to R1 and where V27 has the value shown in equation (i) in Figure 3 GB 2 156 087A 3 2.
(25) A resistor having the nearest obtaina ble value R2a to the calculated value is substi tuted for the resistance box previously fitted in step (1).
(26) With the system still stabilised at room temperature the resistance R6 is shbrt-circu ited.
(27) The output voltages VL and VP are measured at zero pressure and.75 full scale 75 respectively.
(28) The sensitivity S = (VP-VL)/P is calcu lated.
(29) The sensitivity error E = (S-SR)/S (30) The value of R6 is calculated from 80 R6 = R7.E/(l - E) (31) A resistor having the nearest obtaina ble value R6a is substituted for the resistor R6 originally inserted in step (1) (32) A decade resistance box is connected in place of resistors R 11, R 12 which were made open circuit in step 1, and with zero pressure applied to the transducer the resis tance box is adjusted until the output voltage at terminal 42 is equal to Vd 0.001 volts, where Vd is the desired output voltage at zero pressure.
(33) A resistor having the nearest value R 1 2a below resistance box value given by the foregoing step is connected for R 12, the resistance box being retained in place of R 11.
(34) With zero pressure applied to the trans ducer the resistance box is adjusted until the voltage at terminal 42 = Vd 0.001 volts.
(35) A resistor having the nearest obtaina- 100 ble value R 11 a to the preceding resistance box reading is fitted as R1 1.
The foregoing procedures result in a bridge voltage VB having the value shown in equa- tion (ii) in Figure 2, and an offset voltage Ve having the value shown in equation (iii). In both of these equations the factor IT represents the current output of the source 30 at a temperature of T'K. In both equations the first term corresponds to the slope of V13 or Ve with temperature in volts/C, and the second term is a constant.
The voltage V27 is fixed as a reference voltage by resistor R2, and the supply voltage V13 is dependent, inter alia, on V27 and V29, and on the current through resistor R5 this current being in turn dependent on the temperature characteristic of the source 30. The voltage Vo is dependent on the sum of the voltages applied to line 40, and these include voltages arising from the currents in resistors R 10, R 11, R 12, the first of these also being dependent on the temperature characteristic of the source 30.

Claims (9)

1. A temperature compensated resistance bridge circuit, comprising a resistance bridge, means for applying a supply voltage across a first pair of opposite junctions of said bridge and means for deriving an output voltage from a second pair of opposite junctions of said bridge, said means for applying the supply voltage including means for modifying said supply voltage in dependence on the temperature of said bridge in a sense to oppose a change in sensitivity of the bridge with a change in the temperature thereof over a predetermined range, and said means for deriving said output voltage includes means for modifying the derived voltage in accordance with the bridge temperature, in a sense to maintain an offset error of the bridge substantially constant over said predetermined temperature range.
2. A circuit as claimed in claim 1 in which said means for modifiying the supply and output voltages comprises means for generating first and second voltages each of which varies substantially linearly with the temperature of said bridge, and there is provided means for modifying said supply voltage in dependence on said first voltage and a reference voltage, and means for rendering said output voltage dependent on the sum of said second voltage and the voltage across said second pair of bridge junctions.
3. A circuit as claimed in claim 2 in which said means for generating said first and sec- ond voltages includes a temperature--dependent current source which is located so as to be at substantially the same temperature as that of said bridge.
4. A circuit as claimed in claim 3 in which said means for generating the first voltage further comprises a first, difference amplifier, means for applying a reference voltage to one input of said amplifier, a first resistance connecting said current source to a second input of said difference amplifier, means for regulating said bridge supply voltage in response to an output from said amplifier, and a second, feedback resistance between said second input and a connection of said supply voltage to said bridge.
5. A circuit as claimed in claim 3 or claim 4 in which said means for generating said second voltage comprises third and fourth resistances connected in parallel with said current source, said second voltage being derived from the junction of said third and fourth resistances.
6. A circuit as claimed in any of claims 3 to 5 which includes a second amplifier for pro- viding a third voltage dependent on the voltage across said second pair of opposite junctions of the bridge, and a third amplifier responsive to the sum of said second and third voltages for generating said output vol- tage.
7. A method of providing temperature compensation for a device which comprises a resistance bridge and means for applying a supply voltage to two terminals of said bridge, said bridge having two further terminals from 4 GB 2 156 087A 4 which an output voltage can be derived by way of an output resistance path, said method comprising (i) maintaining the bridge at a first tempera ture and varying the value of an input quan- 70 tity to which the bridge is required to re spond, and calculating the sensitivity error from readings of the bridge output voltage, (ii) calculating and applying to the bridge a new level of supply voltage which will reduce the sensitivity error, (iii) repeating steps (i) and (ii) until an acceptable level of sensitivity error is reached, (iv) maintaining the bridge at a second temperature, varying the value of said input quantity and calculating the sensitivity error from output voltage readings so obtained, (v) calculating and applying to the bridge a new supply voltage level which will reduce the sensitivity error, (vi) repeating steps (iv) and (v) until an acceptable level of sensitivity error is obtained, (vii) connecting a temperature-responsive current source and a first resistance in series, said first resistance being between said cur rent source and an output end of said output resistance path.
(viii) calculating the value of a second resis tance from the current/temperature character istic of said source, the value of said first resistance and the change of output voltage with temperature at a constant value of said input quantity, calculating the value of a third resistance from the value of said first resis tance the change with temperature of said supply voltage and the current/temperature characteristic of said source.
(ix) fitting said second and third resistances in series with said source to provide a first temperature responsive voltage for modifying said supply voltage.
(x) calculating from the value of said first resistance the value of a desired reference voltage for said supply voltage applying means and adjusting said reference voltage to correspond substantially to its calculated value.
(xi) subjecting said bridge and said current source to a temperature intermediate said first and second temperatures.
(xii) measuring the bridge output voltage at a plurality of levels of said input quantity, and calculating the sensitivity error and a desired resistance value of said output path from the measurements so obtained, (xiv) setting the resistance of said output path to its desired value, (xv) connecting a fourth resistance in series with said first resistance so that said first and fourth resistances are in parallel with said current source, a second temperature-respon sive voltage being derived from the junction of said first and fourth resistances.
(xvi) applying a low value of said input quantity and varying the value of said third resistance until a desired output voltage is obtained.
8. A tem perature-co m pen sated resistance bridge circuit, substantially as hereinbefore described with reference to the accompanying drawings.
9. A method of providing temperature compensation for a resistance bridge, substantially as hereinbefore described.
Printed in the United Kingdom for Her Majesty's Stationery Office, Dd 8818935, 1985, 4235. Published at The Patent Office, 25 Southampton Buildings, London, WC2A 'I AY, from which copies may be obtained.
GB08504323A 1984-03-20 1985-02-20 Temperature compensated resistance bridge circuit Expired GB2156087B (en)

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GB848407192A GB8407192D0 (en) 1984-03-20 1984-03-20 Circuit

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GB2156087A true GB2156087A (en) 1985-10-02
GB2156087B GB2156087B (en) 1987-07-01

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GB08504323A Expired GB2156087B (en) 1984-03-20 1985-02-20 Temperature compensated resistance bridge circuit

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1990011500A1 (en) * 1989-03-17 1990-10-04 Robert Bosch Gmbh Process and device for measuring mechanical deformation
DE19617238A1 (en) * 1996-04-30 1997-11-06 Leybold Vakuum Gmbh Circuit for temperature compensation of a thermal conduction vacuum meter

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Publication number Priority date Publication date Assignee Title
DE3503489A1 (en) * 1985-01-30 1986-07-31 Siemens AG, 1000 Berlin und 8000 München CIRCUIT ARRANGEMENT FOR COMPENSATING THE TEMPERATURE DEPENDENCY OF SENSITIVITY AND ZERO POINT OF A PIEZORESISTIVE PRESSURE SENSOR
US4736155A (en) * 1987-03-06 1988-04-05 Colt Industries Inc Transducer temperature control circuit and method
JP2768219B2 (en) * 1993-06-24 1998-06-25 日本電気株式会社 Distortion amount detection device, drive circuit thereof, and amplifier circuit
US5726564A (en) * 1994-10-27 1998-03-10 Zexel Corporation Temperature-compensating method for a resistance bridge circuit, resistance bridge circuit with temperature-compensating circuit, and acceleration sensor using the same
US5686826A (en) * 1996-03-15 1997-11-11 Kulite Semiconductor Products Ambient temperature compensation for semiconductor transducer structures
US6334093B1 (en) * 1997-12-24 2001-12-25 Edward S. More Method and apparatus for economical drift compensation in high resolution difference measurements and exemplary low cost, high resolution differential digital thermometer
US6651020B2 (en) * 1997-12-24 2003-11-18 Edward S. More Method and apparatus for economical drift compensation in high resolution measurements
US7288983B1 (en) 2006-08-30 2007-10-30 Broadlight Ltd. Method and circuit for providing a temperature dependent current source
JP6237453B2 (en) 2014-03-05 2017-11-29 株式会社デンソー Physical quantity detection device
US9535099B2 (en) * 2014-05-19 2017-01-03 Honeywell International Inc. Systems and methods that allow for simultaneous sensor and signal conditioning circuit performance testing
DE112022000965T5 (en) * 2021-03-31 2023-11-23 Murata Manufacturing Co., Ltd. SENSOR OUTPUT COMPENSATION CIRCUIT

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US3490272A (en) * 1966-12-22 1970-01-20 Whittaker Corp Temperature compensated resistance measurement bridge
US3495159A (en) * 1967-06-05 1970-02-10 Honeywell Inc Temperature compensation circuit for impedance bridges
US3654545A (en) * 1970-08-11 1972-04-04 Honeywell Inc Semiconductor strain gauge amplifier
GB2043915A (en) * 1979-02-26 1980-10-08 Hitachi Ltd Semiconductor pressure detector apparatus with zeropoint temperature compensation

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US3831042A (en) * 1972-10-27 1974-08-20 Bell & Howell Co Temperature compensation circuit for sensor of physical variables such as temperature and pressure
US4233848A (en) * 1978-01-06 1980-11-18 Hitachi, Ltd. Strain gauge pressure transducer apparatus having an improved impedance bridge
US4444056A (en) * 1982-05-05 1984-04-24 Itt Corporation Temperature compensated circuit
JPS5939105A (en) * 1982-08-27 1984-03-03 Fujitsu Ltd Temperature compensating circuit

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3490272A (en) * 1966-12-22 1970-01-20 Whittaker Corp Temperature compensated resistance measurement bridge
US3495159A (en) * 1967-06-05 1970-02-10 Honeywell Inc Temperature compensation circuit for impedance bridges
US3654545A (en) * 1970-08-11 1972-04-04 Honeywell Inc Semiconductor strain gauge amplifier
GB2043915A (en) * 1979-02-26 1980-10-08 Hitachi Ltd Semiconductor pressure detector apparatus with zeropoint temperature compensation

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1990011500A1 (en) * 1989-03-17 1990-10-04 Robert Bosch Gmbh Process and device for measuring mechanical deformation
DE19617238A1 (en) * 1996-04-30 1997-11-06 Leybold Vakuum Gmbh Circuit for temperature compensation of a thermal conduction vacuum meter

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US4611163A (en) 1986-09-09
GB2156087B (en) 1987-07-01
GB8407192D0 (en) 1984-04-26
GB8504323D0 (en) 1985-03-20

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Effective date: 19980220