GB202019646D0 - Analyzing apparatus - Google Patents

Analyzing apparatus

Info

Publication number
GB202019646D0
GB202019646D0 GBGB2019646.5A GB202019646A GB202019646D0 GB 202019646 D0 GB202019646 D0 GB 202019646D0 GB 202019646 A GB202019646 A GB 202019646A GB 202019646 D0 GB202019646 D0 GB 202019646D0
Authority
GB
United Kingdom
Prior art keywords
analyzing apparatus
analyzing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
GBGB2019646.5A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
MONS, University of
Universite de Mons
Original Assignee
MONS, University of
Universite de Mons
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by MONS, University of, Universite de Mons filed Critical MONS, University of
Priority to GBGB2019646.5A priority Critical patent/GB202019646D0/en
Publication of GB202019646D0 publication Critical patent/GB202019646D0/en
Priority to LU501011A priority patent/LU501011B1/en
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0046—Arrangements for measuring currents or voltages or for indicating presence or sign thereof characterised by a specific application or detail not covered by any other subgroup of G01R19/00
    • G01R19/0061—Measuring currents of particle-beams, currents from electron multipliers, photocurrents, ion currents; Measuring in plasmas
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2632—Circuits therefor for testing diodes
    • G01R31/2635—Testing light-emitting diodes, laser diodes or photodiodes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/305—Contactless testing using electron beams
GBGB2019646.5A 2020-12-14 2020-12-14 Analyzing apparatus Ceased GB202019646D0 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
GBGB2019646.5A GB202019646D0 (en) 2020-12-14 2020-12-14 Analyzing apparatus
LU501011A LU501011B1 (en) 2020-12-14 2021-12-14 Analyzing apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GBGB2019646.5A GB202019646D0 (en) 2020-12-14 2020-12-14 Analyzing apparatus

Publications (1)

Publication Number Publication Date
GB202019646D0 true GB202019646D0 (en) 2021-01-27

Family

ID=74188913

Family Applications (1)

Application Number Title Priority Date Filing Date
GBGB2019646.5A Ceased GB202019646D0 (en) 2020-12-14 2020-12-14 Analyzing apparatus

Country Status (2)

Country Link
GB (1) GB202019646D0 (en)
LU (1) LU501011B1 (en)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105974294B (en) * 2016-07-05 2018-11-27 西交利物浦大学 A kind of real-time in-line testing system of semiconductor devices gamma Rays response
CN111239579A (en) * 2020-02-26 2020-06-05 成都信息工程大学 X-ray detector electrical parameter testing system and testing method thereof

Also Published As

Publication number Publication date
LU501011B1 (en) 2023-03-16
LU501011A1 (en) 2022-06-14

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Legal Events

Date Code Title Description
AT Applications terminated before publication under section 16(1)