GB1563913A - Method of making schottky-barrier gallium arsenide field effect devices - Google Patents
Method of making schottky-barrier gallium arsenide field effect devices Download PDFInfo
- Publication number
- GB1563913A GB1563913A GB48979/76A GB4897976A GB1563913A GB 1563913 A GB1563913 A GB 1563913A GB 48979/76 A GB48979/76 A GB 48979/76A GB 4897976 A GB4897976 A GB 4897976A GB 1563913 A GB1563913 A GB 1563913A
- Authority
- GB
- United Kingdom
- Prior art keywords
- gate
- channel
- source
- region
- metal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 title claims description 33
- 229910001218 Gallium arsenide Inorganic materials 0.000 title claims description 33
- 230000005669 field effect Effects 0.000 title claims description 30
- 238000004519 manufacturing process Methods 0.000 title description 5
- 229910052751 metal Inorganic materials 0.000 claims description 31
- 239000002184 metal Substances 0.000 claims description 31
- 239000004065 semiconductor Substances 0.000 claims description 24
- 239000000758 substrate Substances 0.000 claims description 24
- 238000000034 method Methods 0.000 claims description 21
- 229920002120 photoresistant polymer Polymers 0.000 claims description 13
- 238000005530 etching Methods 0.000 claims description 11
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 10
- 230000002829 reductive effect Effects 0.000 claims description 7
- 238000005468 ion implantation Methods 0.000 claims description 6
- 238000000137 annealing Methods 0.000 claims description 5
- 229910052681 coesite Inorganic materials 0.000 claims description 5
- 229910052906 cristobalite Inorganic materials 0.000 claims description 5
- 150000002500 ions Chemical class 0.000 claims description 5
- 239000000463 material Substances 0.000 claims description 5
- 239000000377 silicon dioxide Substances 0.000 claims description 5
- 235000012239 silicon dioxide Nutrition 0.000 claims description 5
- 229910052682 stishovite Inorganic materials 0.000 claims description 5
- 229910052905 tridymite Inorganic materials 0.000 claims description 5
- 239000011651 chromium Substances 0.000 claims description 4
- 238000001465 metallisation Methods 0.000 claims description 4
- 150000002739 metals Chemical class 0.000 claims description 4
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 claims description 3
- 229910052782 aluminium Inorganic materials 0.000 claims description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 3
- 230000004888 barrier function Effects 0.000 claims description 3
- 230000015572 biosynthetic process Effects 0.000 claims description 3
- 229910052804 chromium Inorganic materials 0.000 claims description 3
- 238000002513 implantation Methods 0.000 claims description 3
- VHUUQVKOLVNVRT-UHFFFAOYSA-N Ammonium hydroxide Chemical compound [NH4+].[OH-] VHUUQVKOLVNVRT-UHFFFAOYSA-N 0.000 claims description 2
- 229910017401 Au—Ge Inorganic materials 0.000 claims description 2
- 238000005275 alloying Methods 0.000 claims description 2
- 235000011114 ammonium hydroxide Nutrition 0.000 claims description 2
- 239000004020 conductor Substances 0.000 claims description 2
- 238000009792 diffusion process Methods 0.000 claims description 2
- 239000006023 eutectic alloy Substances 0.000 claims description 2
- 230000008020 evaporation Effects 0.000 claims description 2
- 238000001704 evaporation Methods 0.000 claims description 2
- 235000015250 liver sausages Nutrition 0.000 claims description 2
- 230000000873 masking effect Effects 0.000 claims description 2
- 239000000126 substance Substances 0.000 claims description 2
- 239000012535 impurity Substances 0.000 claims 4
- 239000013078 crystal Substances 0.000 claims 1
- 230000037230 mobility Effects 0.000 claims 1
- 239000005864 Sulphur Substances 0.000 description 7
- -1 sulphur ions Chemical class 0.000 description 3
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- 229910000927 Ge alloy Inorganic materials 0.000 description 1
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- BYDQGSVXQDOSJJ-UHFFFAOYSA-N [Ge].[Au] Chemical compound [Ge].[Au] BYDQGSVXQDOSJJ-UHFFFAOYSA-N 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 230000002146 bilateral effect Effects 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 238000003486 chemical etching Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 230000000670 limiting effect Effects 0.000 description 1
- 238000004943 liquid phase epitaxy Methods 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 238000000197 pyrolysis Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 230000002441 reversible effect Effects 0.000 description 1
- 229910000077 silane Inorganic materials 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000012808 vapor phase Substances 0.000 description 1
- 238000000927 vapour-phase epitaxy Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/01—Manufacture or treatment
- H10D30/061—Manufacture or treatment of FETs having Schottky gates
- H10D30/0612—Manufacture or treatment of FETs having Schottky gates of lateral single-gate Schottky FETs
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
- H01L21/285—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation
- H01L21/28506—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers
- H01L21/28575—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising AIIIBV compounds
- H01L21/28587—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising AIIIBV compounds characterised by the sectional shape, e.g. T, inverted T
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/80—FETs having rectifying junction gate electrodes
- H10D30/87—FETs having Schottky gate electrodes, e.g. metal-semiconductor FETs [MESFET]
- H10D30/877—FETs having Schottky gate electrodes, e.g. metal-semiconductor FETs [MESFET] having recessed gate electrodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/117—Shapes of semiconductor bodies
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Junction Field-Effect Transistors (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US64012475A | 1975-12-12 | 1975-12-12 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| GB1563913A true GB1563913A (en) | 1980-04-02 |
Family
ID=24566939
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB48979/76A Expired GB1563913A (en) | 1975-12-12 | 1976-11-24 | Method of making schottky-barrier gallium arsenide field effect devices |
Country Status (2)
| Country | Link |
|---|---|
| FR (1) | FR2335041A1 (enrdf_load_stackoverflow) |
| GB (1) | GB1563913A (enrdf_load_stackoverflow) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2133621A (en) * | 1983-01-11 | 1984-07-25 | Emi Ltd | Junction field effect transistor |
| CN113053742A (zh) * | 2021-03-12 | 2021-06-29 | 浙江集迈科微电子有限公司 | GaN器件及制备方法 |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| IT1131450B (it) * | 1980-05-07 | 1986-06-25 | Cise Spa | Procedimento per la produzione di transistori ad effetto di campo per microonde |
| FR2496982A1 (fr) * | 1980-12-24 | 1982-06-25 | Labo Electronique Physique | Procede de fabrication de transistors a effet de champ, a grille auto-alignee, et transistors ainsi obtenus |
| FR2558647B1 (fr) * | 1984-01-23 | 1986-05-09 | Labo Electronique Physique | Transistor a effet de champ de type schottky pour applications hyperfrequences et procede de realisation permettant d'obtenir un tel transistor |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2104704B1 (enrdf_load_stackoverflow) * | 1970-08-07 | 1973-11-23 | Thomson Csf | |
| US3920861A (en) * | 1972-12-18 | 1975-11-18 | Rca Corp | Method of making a semiconductor device |
| US3942186A (en) * | 1973-10-09 | 1976-03-02 | Westinghouse Electric Corporation | High frequency, field-effect transistor |
| US3898353A (en) * | 1974-10-03 | 1975-08-05 | Us Army | Self aligned drain and gate field effect transistor |
-
1976
- 1976-11-24 GB GB48979/76A patent/GB1563913A/en not_active Expired
- 1976-12-10 FR FR7637401A patent/FR2335041A1/fr active Granted
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2133621A (en) * | 1983-01-11 | 1984-07-25 | Emi Ltd | Junction field effect transistor |
| CN113053742A (zh) * | 2021-03-12 | 2021-06-29 | 浙江集迈科微电子有限公司 | GaN器件及制备方法 |
| CN113053742B (zh) * | 2021-03-12 | 2024-06-11 | 浙江集迈科微电子有限公司 | GaN器件及制备方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| FR2335041B1 (enrdf_load_stackoverflow) | 1980-08-14 |
| FR2335041A1 (fr) | 1977-07-08 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PS | Patent sealed [section 19, patents act 1949] | ||
| PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 19921124 |