FR2985812B1 - Procede et dispositif de test de substrats semi-conducteurs pour applications radiofrequences - Google Patents
Procede et dispositif de test de substrats semi-conducteurs pour applications radiofrequencesInfo
- Publication number
- FR2985812B1 FR2985812B1 FR1250396A FR1250396A FR2985812B1 FR 2985812 B1 FR2985812 B1 FR 2985812B1 FR 1250396 A FR1250396 A FR 1250396A FR 1250396 A FR1250396 A FR 1250396A FR 2985812 B1 FR2985812 B1 FR 2985812B1
- Authority
- FR
- France
- Prior art keywords
- radio frequency
- semiconductor substrates
- frequency applications
- testing semiconductor
- testing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 239000004065 semiconductor Substances 0.000 title 1
- 239000000758 substrate Substances 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2831—Testing of materials or semi-finished products, e.g. semiconductor wafers or substrates
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
- G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
- G01N27/041—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of a solid body
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Life Sciences & Earth Sciences (AREA)
- Electrochemistry (AREA)
- Health & Medical Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1250396A FR2985812B1 (fr) | 2012-01-16 | 2012-01-16 | Procede et dispositif de test de substrats semi-conducteurs pour applications radiofrequences |
JP2014551689A JP6026558B2 (ja) | 2012-01-16 | 2013-01-15 | 高周波アプリケーション用半導体基板の試験方法及び試験デバイス |
CN201380005587.9A CN104204786B (zh) | 2012-01-16 | 2013-01-15 | 检测用于射频应用的半导体基板的方法和装置 |
PCT/IB2013/000044 WO2013108107A1 (fr) | 2012-01-16 | 2013-01-15 | Procédé et dispositif de test de substrats à semi-conducteurs pour une application de radiofréquence |
US14/372,192 US20150168326A1 (en) | 2012-01-16 | 2013-01-15 | Method and device for testing semiconductor subtrates for radiofrequency application |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1250396A FR2985812B1 (fr) | 2012-01-16 | 2012-01-16 | Procede et dispositif de test de substrats semi-conducteurs pour applications radiofrequences |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2985812A1 FR2985812A1 (fr) | 2013-07-19 |
FR2985812B1 true FR2985812B1 (fr) | 2014-02-07 |
Family
ID=47630450
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR1250396A Active FR2985812B1 (fr) | 2012-01-16 | 2012-01-16 | Procede et dispositif de test de substrats semi-conducteurs pour applications radiofrequences |
Country Status (5)
Country | Link |
---|---|
US (1) | US20150168326A1 (fr) |
JP (1) | JP6026558B2 (fr) |
CN (1) | CN104204786B (fr) |
FR (1) | FR2985812B1 (fr) |
WO (1) | WO2013108107A1 (fr) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR3032038B1 (fr) * | 2015-01-27 | 2018-07-27 | Soitec | Procede, dispositif et systeme de mesure d'une caracteristique electrique d'un substrat |
CN106980046A (zh) * | 2016-01-15 | 2017-07-25 | 无锡华润上华半导体有限公司 | 一种半导体材料的电阻率的测试方法 |
FR3062238A1 (fr) | 2017-01-26 | 2018-07-27 | Soitec | Support pour une structure semi-conductrice |
FR3098342B1 (fr) | 2019-07-02 | 2021-06-04 | Soitec Silicon On Insulator | structure semi-conductrice comprenant une couche poreuse enterrée, pour applications RF |
FR3098642B1 (fr) | 2019-07-12 | 2021-06-11 | Soitec Silicon On Insulator | procédé de fabrication d'une structure comprenant une couche mince reportée sur un support muni d’une couche de piégeage de charges |
FR3119046B1 (fr) | 2021-01-15 | 2022-12-23 | Applied Materials Inc | Substrat support en silicium adapte aux applications radiofrequences et procede de fabrication associe |
JP2023019611A (ja) * | 2021-07-29 | 2023-02-09 | 信越半導体株式会社 | 半導体デバイス用基板及びその製造方法 |
FR3129029B1 (fr) | 2021-11-09 | 2023-09-29 | Soitec Silicon On Insulator | Procede de preparation d’un substrat support muni d’une couche de piegeage de charges |
FR3129028B1 (fr) | 2021-11-09 | 2023-11-10 | Soitec Silicon On Insulator | Procede de preparation d’un substrat support muni d’une couche de piegeage de charges |
US11841296B2 (en) * | 2021-12-02 | 2023-12-12 | Globalfoundries U.S. Inc. | Semiconductor substrates for electrical resistivity measurements |
JP2023122671A (ja) | 2022-02-24 | 2023-09-05 | 信越半導体株式会社 | 高周波デバイス用基板、及びその製造方法 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3660250A (en) * | 1967-12-22 | 1972-05-02 | Ibm | Method of determining impurity profile of a semiconductor body |
US3487301A (en) * | 1968-03-04 | 1969-12-30 | Ibm | Measurement of semiconductor resistivity profiles by measuring voltages,calculating apparent resistivities and applying correction factors |
JPH071780B2 (ja) * | 1988-11-25 | 1995-01-11 | 信越半導体株式会社 | エピタキシャルウエーハの遷移領域の評価方法 |
JPH0493045A (ja) * | 1990-08-08 | 1992-03-25 | Seiko Epson Corp | 拡がり抵抗測定装置 |
US5217907A (en) * | 1992-01-28 | 1993-06-08 | National Semiconductor Corporation | Array spreading resistance probe (ASRP) method for profile extraction from semiconductor chips of cellular construction |
US5347226A (en) * | 1992-11-16 | 1994-09-13 | National Semiconductor Corporation | Array spreading resistance probe (ASRP) method for profile extraction from semiconductor chips of cellular construction |
US5710052A (en) * | 1995-10-17 | 1998-01-20 | Advanced Micro Devices, Inc. | Scanning spreading resistance probe |
US6052653A (en) * | 1997-07-11 | 2000-04-18 | Solid State Measurements, Inc. | Spreading resistance profiling system |
JP4821948B2 (ja) * | 2004-12-07 | 2011-11-24 | 信越半導体株式会社 | Soi層の拡がり抵抗測定方法およびsoiチップ |
JP2009174951A (ja) * | 2008-01-23 | 2009-08-06 | Oki Electric Ind Co Ltd | 誘電正接評価方法 |
CN102183717B (zh) * | 2010-12-29 | 2013-05-29 | 淄博盛康电气有限公司 | 四针压敏电阻测试仪及其分级测试方法 |
-
2012
- 2012-01-16 FR FR1250396A patent/FR2985812B1/fr active Active
-
2013
- 2013-01-15 WO PCT/IB2013/000044 patent/WO2013108107A1/fr active Application Filing
- 2013-01-15 JP JP2014551689A patent/JP6026558B2/ja active Active
- 2013-01-15 US US14/372,192 patent/US20150168326A1/en not_active Abandoned
- 2013-01-15 CN CN201380005587.9A patent/CN104204786B/zh active Active
Also Published As
Publication number | Publication date |
---|---|
WO2013108107A1 (fr) | 2013-07-25 |
JP6026558B2 (ja) | 2016-11-16 |
CN104204786B (zh) | 2017-03-01 |
JP2015503853A (ja) | 2015-02-02 |
US20150168326A1 (en) | 2015-06-18 |
CN104204786A (zh) | 2014-12-10 |
FR2985812A1 (fr) | 2013-07-19 |
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