FR2901660B1 - Dispositif, procede et systeme de discrimination de materiau par rayons x. - Google Patents

Dispositif, procede et systeme de discrimination de materiau par rayons x.

Info

Publication number
FR2901660B1
FR2901660B1 FR0703571A FR0703571A FR2901660B1 FR 2901660 B1 FR2901660 B1 FR 2901660B1 FR 0703571 A FR0703571 A FR 0703571A FR 0703571 A FR0703571 A FR 0703571A FR 2901660 B1 FR2901660 B1 FR 2901660B1
Authority
FR
France
Prior art keywords
discrimination
ray material
ray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
FR0703571A
Other languages
English (en)
Other versions
FR2901660A1 (fr
Inventor
Yaohong Liu
Chuanxiang Tang
Zhiqiang Chen
Huaibi Chen
Jinsheng Liu
Jianjun Gao
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tsinghua University
Nuctech Co Ltd
Original Assignee
Tsinghua University
Nuctech Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tsinghua University, Nuctech Co Ltd filed Critical Tsinghua University
Publication of FR2901660A1 publication Critical patent/FR2901660A1/fr
Application granted granted Critical
Publication of FR2901660B1 publication Critical patent/FR2901660B1/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G01N23/087—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays using polyenergetic X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of nuclear radiation, e.g. of natural or induced radioactivity
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G2/00—Apparatus or processes specially adapted for producing X-rays, not involving X-ray tubes, e.g. involving generation of a plasma
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/20—Sources of radiation
    • G01N2223/206—Sources of radiation sources operating at different energy levels
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/639—Specific applications or type of materials material in a container
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/58—Switching arrangements for changing-over from one mode of operation to another, e.g. from radioscopy to radiography, from radioscopy to irradiation or from one tube voltage to another
FR0703571A 2006-05-19 2007-05-18 Dispositif, procede et systeme de discrimination de materiau par rayons x. Active FR2901660B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2006100119444A CN101076218B (zh) 2006-05-19 2006-05-19 产生具有不同能量的x射线的设备、方法及材料识别系统

Publications (2)

Publication Number Publication Date
FR2901660A1 FR2901660A1 (fr) 2007-11-30
FR2901660B1 true FR2901660B1 (fr) 2016-02-12

Family

ID=38234714

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0703571A Active FR2901660B1 (fr) 2006-05-19 2007-05-18 Dispositif, procede et systeme de discrimination de materiau par rayons x.

Country Status (9)

Country Link
US (1) US7646851B2 (fr)
CN (1) CN101076218B (fr)
AU (1) AU2007252163B2 (fr)
DE (1) DE102007020984B4 (fr)
FR (1) FR2901660B1 (fr)
GB (1) GB2444570B (fr)
IT (1) ITTO20070167A1 (fr)
RU (1) RU2340127C1 (fr)
WO (1) WO2007134514A1 (fr)

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US9258876B2 (en) 2010-10-01 2016-02-09 Accuray, Inc. Traveling wave linear accelerator based x-ray source using pulse width to modulate pulse-to-pulse dosage
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JP6104526B2 (ja) * 2011-06-28 2017-03-29 東芝メディカルシステムズ株式会社 Ｘ線管球及びｘ線ｃｔ装置
JP2013026070A (ja) * 2011-07-22 2013-02-04 Mitsubishi Heavy Ind Ltd Ｘ線発生装置及びｘ線発生装置の制御方法
US9213006B2 (en) 2011-12-02 2015-12-15 Lockheed Martin Corporation Modulated X-ray harmonic detection
US9274065B2 (en) 2012-02-08 2016-03-01 Rapiscan Systems, Inc. High-speed security inspection system
US9778391B2 (en) * 2013-03-15 2017-10-03 Varex Imaging Corporation Systems and methods for multi-view imaging and tomography
WO2014185078A1 (fr) * 2013-05-15 2014-11-20 国立大学法人京都大学 Procede de traitement d'image de tomodensitometrie (ct) a rayons x, programme de traitement d'image de tomodensitometrie a rayons x et dispositif d'image de tomodensitometrie a rayons x
EP2983012B1 (fr) * 2013-11-14 2018-08-08 Tsinghua University Accélérateur à énergies et dosages multiples, système d'examen rapide comprenant l'accélérateur et procédé d'examen rapide associé
CN104749199B (zh) 2013-12-30 2019-02-19 同方威视技术股份有限公司 双能/双视角的高能x射线透视成像系统
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CN106353828B (zh) * 2015-07-22 2018-09-21 清华大学 在安检系统中估算被检查物体重量的方法和装置
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Also Published As

Publication number Publication date
DE102007020984A1 (de) 2007-11-22
GB2444570A (en) 2008-06-11
AU2007252163A1 (en) 2007-11-29
CN101076218A (zh) 2007-11-21
AU2007252163B2 (en) 2011-02-10
FR2901660A1 (fr) 2007-11-30
RU2340127C1 (ru) 2008-11-27
CN101076218B (zh) 2011-05-11
ITTO20070167A1 (it) 2007-11-20
WO2007134514A1 (fr) 2007-11-29
GB2444570B (en) 2009-06-24
US7646851B2 (en) 2010-01-12
GB0709608D0 (en) 2007-06-27
DE102007020984B4 (de) 2017-10-26
US20070269013A1 (en) 2007-11-22

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