FR2574542B1 - Device for analyzing a continuous particle beam for viewing the variations in the energy distribution of this beam as a function of time - Google Patents

Device for analyzing a continuous particle beam for viewing the variations in the energy distribution of this beam as a function of time

Info

Publication number
FR2574542B1
FR2574542B1 FR8418996A FR8418996A FR2574542B1 FR 2574542 B1 FR2574542 B1 FR 2574542B1 FR 8418996 A FR8418996 A FR 8418996A FR 8418996 A FR8418996 A FR 8418996A FR 2574542 B1 FR2574542 B1 FR 2574542B1
Authority
FR
France
Prior art keywords
viewing
analyzing
variations
function
time
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8418996A
Other languages
French (fr)
Other versions
FR2574542A1 (en
Inventor
Jean Pascal Alfille
Phillip De Beaucourt
Jean Paul Noel
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives
Original Assignee
Commissariat a lEnergie Atomique et aux Energies Alternatives
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique et aux Energies Alternatives filed Critical Commissariat a lEnergie Atomique et aux Energies Alternatives
Priority to FR8418996A priority Critical patent/FR2574542B1/en
Publication of FR2574542A1 publication Critical patent/FR2574542A1/en
Application granted granted Critical
Publication of FR2574542B1 publication Critical patent/FR2574542B1/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4257Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam
FR8418996A 1984-12-12 1984-12-12 Device for analyzing a continuous particle beam for viewing the variations in the energy distribution of this beam as a function of time Expired FR2574542B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR8418996A FR2574542B1 (en) 1984-12-12 1984-12-12 Device for analyzing a continuous particle beam for viewing the variations in the energy distribution of this beam as a function of time

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8418996A FR2574542B1 (en) 1984-12-12 1984-12-12 Device for analyzing a continuous particle beam for viewing the variations in the energy distribution of this beam as a function of time

Publications (2)

Publication Number Publication Date
FR2574542A1 FR2574542A1 (en) 1986-06-13
FR2574542B1 true FR2574542B1 (en) 1988-07-29

Family

ID=9310523

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8418996A Expired FR2574542B1 (en) 1984-12-12 1984-12-12 Device for analyzing a continuous particle beam for viewing the variations in the energy distribution of this beam as a function of time

Country Status (1)

Country Link
FR (1) FR2574542B1 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3706271C2 (en) * 1987-02-26 1989-10-26 Erwin 8000 Muenchen De Strigl
US4828384A (en) * 1987-12-03 1989-05-09 Westinghouse Electric Corp. High power laser beam intensity mapping apparatus
DE102010053323B3 (en) * 2010-12-02 2012-05-24 Xtreme Technologies Gmbh Method for the spatially resolved measurement of parameters in a cross section of a beam of high-energy, high-intensity radiation

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6031247B2 (en) * 1978-04-07 1985-07-20 Hitachi Ltd
US4260255A (en) * 1979-10-22 1981-04-07 The United States Of America As Represented By The Secretary Of The Army High energy laser beam sampling meter
JPS58139032A (en) * 1982-02-15 1983-08-18 Toshiba Corp Device for measuring diameter of laser light beam

Also Published As

Publication number Publication date
FR2574542A1 (en) 1986-06-13

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Legal Events

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