FR2485205B1 - - Google Patents
Info
- Publication number
- FR2485205B1 FR2485205B1 FR8105778A FR8105778A FR2485205B1 FR 2485205 B1 FR2485205 B1 FR 2485205B1 FR 8105778 A FR8105778 A FR 8105778A FR 8105778 A FR8105778 A FR 8105778A FR 2485205 B1 FR2485205 B1 FR 2485205B1
- Authority
- FR
- France
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/08—Locating faults in cables, transmission lines, or networks
- G01R31/081—Locating faults in cables, transmission lines, or networks according to type of conductors
- G01R31/083—Locating faults in cables, transmission lines, or networks according to type of conductors in cables, e.g. underground
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2605—Measuring capacitance
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Locating Faults (AREA)
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19803023373 DE3023373C2 (de) | 1980-06-23 | 1980-06-23 | Verfahren zur Messung von Kapazitäten und zum Orten von Unterbrechungen in Kabeln und Leitungen |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| FR2485205A1 FR2485205A1 (fr) | 1981-12-24 |
| FR2485205B1 true FR2485205B1 (US06826419-20041130-M00005.png) | 1985-03-22 |
Family
ID=6105197
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FR8105778A Granted FR2485205A1 (fr) | 1980-06-23 | 1981-03-23 | Procede pour mesurer des capacites et pour localiser des coupures dans des cables ou canalisations electriques |
Country Status (3)
| Country | Link |
|---|---|
| DE (1) | DE3023373C2 (US06826419-20041130-M00005.png) |
| FR (1) | FR2485205A1 (US06826419-20041130-M00005.png) |
| GB (1) | GB2080549B (US06826419-20041130-M00005.png) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3588276B2 (ja) * | 1999-07-26 | 2004-11-10 | 株式会社山武 | センサ信号処理回路 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4209837A (en) * | 1978-07-03 | 1980-06-24 | Beckman Instruments, Inc. | Programmable controller |
| DE2949467C2 (de) * | 1979-12-08 | 1983-11-03 | Philips Kommunikations Industrie AG, 8500 Nürnberg | Verfahren zur Messung von Widerständen, Widerstandsdifferenzen und zum Fehlerorten |
-
1980
- 1980-06-23 DE DE19803023373 patent/DE3023373C2/de not_active Expired
-
1981
- 1981-03-23 FR FR8105778A patent/FR2485205A1/fr active Granted
- 1981-04-13 GB GB8111654A patent/GB2080549B/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| GB2080549A (en) | 1982-02-03 |
| GB2080549B (en) | 1984-07-04 |
| DE3023373C2 (de) | 1983-01-20 |
| DE3023373A1 (de) | 1982-01-14 |
| FR2485205A1 (fr) | 1981-12-24 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| ST | Notification of lapse |