FR2463975B1 - - Google Patents
Info
- Publication number
- FR2463975B1 FR2463975B1 FR7921128A FR7921128A FR2463975B1 FR 2463975 B1 FR2463975 B1 FR 2463975B1 FR 7921128 A FR7921128 A FR 7921128A FR 7921128 A FR7921128 A FR 7921128A FR 2463975 B1 FR2463975 B1 FR 2463975B1
- Authority
- FR
- France
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32917—Plasma diagnostics
- H01J37/32935—Monitoring and controlling tubes by information coming from the object and/or discharge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/26—Bombardment with radiation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/3065—Plasma etching; Reactive-ion etching
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Toxicology (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Health & Medical Sciences (AREA)
- High Energy & Nuclear Physics (AREA)
- Drying Of Semiconductors (AREA)
- ing And Chemical Polishing (AREA)
Priority Applications (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR7921128A FR2463975A1 (fr) | 1979-08-22 | 1979-08-22 | Procede et appareil pour la gravure chimique par voie seche des circuits integres |
| DE19803031220 DE3031220A1 (de) | 1979-08-22 | 1980-08-19 | Verfahren und einrichtung zum gravieren integrierter schaltungen |
| US06/179,788 US4316791A (en) | 1979-08-22 | 1980-08-20 | Device for chemical dry etching of integrated circuits |
| GB8027391A GB2056919B (en) | 1979-08-22 | 1980-08-22 | Chemical dry etching of integrated circuits |
| JP11489580A JPS5664437A (en) | 1979-08-22 | 1980-08-22 | Method and device for chemically etching integrated circuit by dry process |
| JP62283234A JPS63158839A (ja) | 1979-08-22 | 1987-11-11 | 集積回路のプラズマエッチング方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR7921128A FR2463975A1 (fr) | 1979-08-22 | 1979-08-22 | Procede et appareil pour la gravure chimique par voie seche des circuits integres |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| FR2463975A1 FR2463975A1 (fr) | 1981-02-27 |
| FR2463975B1 true FR2463975B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1983-05-20 |
Family
ID=9228999
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FR7921128A Granted FR2463975A1 (fr) | 1979-08-22 | 1979-08-22 | Procede et appareil pour la gravure chimique par voie seche des circuits integres |
Country Status (5)
Families Citing this family (35)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2463975A1 (fr) * | 1979-08-22 | 1981-02-27 | Onera (Off Nat Aerospatiale) | Procede et appareil pour la gravure chimique par voie seche des circuits integres |
| US4718976A (en) * | 1982-03-31 | 1988-01-12 | Fujitsu Limited | Process and apparatus for plasma treatment |
| JPS599173A (ja) * | 1982-07-06 | 1984-01-18 | ザ・パ−キン−エルマ−・コ−ポレイシヨン | 材料を制御可能にエツチングする方法および装置 |
| JPH06105597B2 (ja) * | 1982-08-30 | 1994-12-21 | 株式会社日立製作所 | マイクロ波プラズマ源 |
| DE3245272A1 (de) * | 1982-12-07 | 1984-06-07 | Ernst Roederstein Spezialfabrik für Kondensatoren GmbH, 8300 Landshut | Verfahren zur herstellung miniaturisierter dick- und duennschichtschaltungen |
| AU549376B2 (en) * | 1983-02-25 | 1986-01-23 | Toyota Jidosha Kabushiki Kaisha | Plasma treatment |
| US4534842A (en) * | 1983-06-15 | 1985-08-13 | Centre National De La Recherche Scientifique (Cnrs) | Process and device for producing a homogeneous large-volume plasma of high density and of low electronic temperature |
| JPS6037129A (ja) * | 1983-08-10 | 1985-02-26 | Hitachi Ltd | 半導体製造装置 |
| KR890004881B1 (ko) * | 1983-10-19 | 1989-11-30 | 가부시기가이샤 히다찌세이사꾸쇼 | 플라즈마 처리 방법 및 그 장치 |
| JPS60126832A (ja) * | 1983-12-14 | 1985-07-06 | Hitachi Ltd | ドライエツチング方法および装置 |
| US4579618A (en) * | 1984-01-06 | 1986-04-01 | Tegal Corporation | Plasma reactor apparatus |
| US4554047A (en) * | 1984-10-12 | 1985-11-19 | At&T Bell Laboratories | Downstream apparatus and technique |
| US4581100A (en) * | 1984-10-29 | 1986-04-08 | International Business Machines Corporation | Mixed excitation plasma etching system |
| US5364519A (en) * | 1984-11-30 | 1994-11-15 | Fujitsu Limited | Microwave plasma processing process and apparatus |
| JPS61131454A (ja) * | 1984-11-30 | 1986-06-19 | Fujitsu Ltd | マイクロ波プラズマ処理方法と装置 |
| JPS61222534A (ja) * | 1985-03-28 | 1986-10-03 | Anelva Corp | 表面処理方法および装置 |
| DE3518197A1 (de) * | 1985-05-21 | 1986-11-27 | Heinrich 7413 Gomaringen Grünwald | Verfahren zur entfernung von metallionen aus koerpern aus glas, keramischen werkstoffen und sonstigen amorphen werkstoffen sowie kristallinen werkstoffen |
| US4673456A (en) * | 1985-09-17 | 1987-06-16 | Machine Technology, Inc. | Microwave apparatus for generating plasma afterglows |
| DE3705666A1 (de) * | 1987-02-21 | 1988-09-01 | Leybold Ag | Einrichtung zum herstellen eines plasmas und zur behandlung von substraten darin |
| JPS6423536A (en) * | 1987-07-20 | 1989-01-26 | Hitachi Ltd | Sputter-etching device |
| GB2212974B (en) * | 1987-11-25 | 1992-02-12 | Fuji Electric Co Ltd | Plasma processing apparatus |
| JPH0351971Y2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) * | 1988-05-12 | 1991-11-08 | ||
| US4888088A (en) * | 1989-03-06 | 1989-12-19 | Tegal Corporation | Ignitor for a microwave sustained plasma |
| US5173146A (en) * | 1989-08-31 | 1992-12-22 | Toyoda Gosei Co., Ltd. | Plasma treatment method |
| US5298720A (en) * | 1990-04-25 | 1994-03-29 | International Business Machines Corporation | Method and apparatus for contamination control in processing apparatus containing voltage driven electrode |
| US5167748A (en) * | 1990-09-06 | 1992-12-01 | Charles Evans And Associates | Plasma etching method and apparatus |
| KR940004959B1 (ko) * | 1991-08-17 | 1994-06-07 | 삼성전자 주식회사 | 유도전동기의 슬립각속도 연산방법 |
| US5665167A (en) * | 1993-02-16 | 1997-09-09 | Tokyo Electron Kabushiki Kaisha | Plasma treatment apparatus having a workpiece-side electrode grounding circuit |
| WO1994028568A1 (en) * | 1993-05-28 | 1994-12-08 | The University Of Tennessee | Method and apparatus for glow discharge plasma treatment of polymer materials at atmospheric pressure |
| US5746835A (en) * | 1994-06-02 | 1998-05-05 | Texas Instruments Incorporated | Retractable probe system with in situ fabrication environment process parameter sensing |
| US5667701A (en) * | 1995-06-07 | 1997-09-16 | Applied Materials, Inc. | Method of measuring the amount of capacitive coupling of RF power in an inductively coupled plasma |
| GB9620151D0 (en) * | 1996-09-27 | 1996-11-13 | Surface Tech Sys Ltd | Plasma processing apparatus |
| GB2360530A (en) * | 2000-03-25 | 2001-09-26 | Plasma Quest Ltd | High target utilisation sputtering system with remote plasma source |
| US7019543B2 (en) * | 2001-03-16 | 2006-03-28 | Tokyo Electron Limited | Impedance monitoring system and method |
| EP3309815B1 (de) * | 2016-10-12 | 2019-03-20 | Meyer Burger (Germany) AG | Plasmabehandlungsvorrichtung mit zwei, miteinander gekoppelten mikrowellenplasmaquellen sowie verfahren zum betreiben einer solchen plasmabehandlungsvorrichtung |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3451917A (en) * | 1966-01-10 | 1969-06-24 | Bendix Corp | Radio frequency sputtering apparatus |
| US3598710A (en) * | 1966-04-04 | 1971-08-10 | Ibm | Etching method |
| US3481854A (en) * | 1967-01-20 | 1969-12-02 | Us Air Force | Preparation of thin cermet films by radio frequency sputtering |
| GB1461636A (en) * | 1974-03-05 | 1977-01-13 | Standard Telephones Cables Ltd | Plasna etching |
| US4233109A (en) * | 1976-01-16 | 1980-11-11 | Zaidan Hojin Handotai Kenkyu Shinkokai | Dry etching method |
| JPS5291650A (en) * | 1976-01-29 | 1977-08-02 | Toshiba Corp | Continuous gas plasma etching apparatus |
| GB1523267A (en) * | 1976-04-15 | 1978-08-31 | Hitachi Ltd | Plasma etching apparatus |
| JPS5368171A (en) * | 1976-11-30 | 1978-06-17 | Hitachi Ltd | Method and apparatus for plasma treatment |
| JPS53114679A (en) * | 1977-03-17 | 1978-10-06 | Fujitsu Ltd | Plasm etching unit |
| JPS53121469A (en) * | 1977-03-31 | 1978-10-23 | Toshiba Corp | Gas etching unit |
| JPS5424580A (en) * | 1977-07-27 | 1979-02-23 | Toshiba Corp | Etching method |
| JPS54141491A (en) * | 1978-04-26 | 1979-11-02 | Handotai Kenkyu Shinkokai | Plasma etching |
| US4222838A (en) * | 1978-06-13 | 1980-09-16 | General Motors Corporation | Method for controlling plasma etching rates |
| US4229233A (en) * | 1979-02-05 | 1980-10-21 | International Business Machines Corporation | Method for fabricating non-reflective semiconductor surfaces by anisotropic reactive ion etching |
| US4253907A (en) * | 1979-03-28 | 1981-03-03 | Western Electric Company, Inc. | Anisotropic plasma etching |
| FR2463975A1 (fr) * | 1979-08-22 | 1981-02-27 | Onera (Off Nat Aerospatiale) | Procede et appareil pour la gravure chimique par voie seche des circuits integres |
-
1979
- 1979-08-22 FR FR7921128A patent/FR2463975A1/fr active Granted
-
1980
- 1980-08-19 DE DE19803031220 patent/DE3031220A1/de active Granted
- 1980-08-20 US US06/179,788 patent/US4316791A/en not_active Expired - Lifetime
- 1980-08-22 GB GB8027391A patent/GB2056919B/en not_active Expired
- 1980-08-22 JP JP11489580A patent/JPS5664437A/ja active Granted
-
1987
- 1987-11-11 JP JP62283234A patent/JPS63158839A/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| GB2056919B (en) | 1983-06-22 |
| DE3031220A1 (de) | 1981-03-26 |
| FR2463975A1 (fr) | 1981-02-27 |
| JPH0313741B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1991-02-25 |
| JPS5664437A (en) | 1981-06-01 |
| GB2056919A (en) | 1981-03-25 |
| JPS63158839A (ja) | 1988-07-01 |
| US4316791A (en) | 1982-02-23 |
| DE3031220C2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1988-03-03 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| CL | Concession to grant licences | ||
| ST | Notification of lapse |