FR2450503A1 - Housing for semiconductor device - has borosilicate glass seal with specified coefft. of thermal expansion for alloy leads to eyelet carrier - Google Patents

Housing for semiconductor device - has borosilicate glass seal with specified coefft. of thermal expansion for alloy leads to eyelet carrier

Info

Publication number
FR2450503A1
FR2450503A1 FR8004531A FR8004531A FR2450503A1 FR 2450503 A1 FR2450503 A1 FR 2450503A1 FR 8004531 A FR8004531 A FR 8004531A FR 8004531 A FR8004531 A FR 8004531A FR 2450503 A1 FR2450503 A1 FR 2450503A1
Authority
FR
France
Prior art keywords
housing
semiconductor device
thermal expansion
borosilicate glass
glass seal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
FR8004531A
Other languages
French (fr)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Texas Instruments Inc
Original Assignee
Texas Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments Inc filed Critical Texas Instruments Inc
Publication of FR2450503A1 publication Critical patent/FR2450503A1/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/492Bases or plates or solder therefor
    • H01L23/4924Bases or plates or solder therefor characterised by the materials
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/02Containers; Seals
    • H01L23/04Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls
    • H01L23/043Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls the container being a hollow construction and having a conductive base as a mounting as well as a lead for the semiconductor body
    • H01L23/045Containers; Seals characterised by the shape of the container or parts, e.g. caps, walls the container being a hollow construction and having a conductive base as a mounting as well as a lead for the semiconductor body the other leads having an insulating passage through the base
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/02Containers; Seals
    • H01L23/10Containers; Seals characterised by the material or arrangement of seals between parts, e.g. between cap and base of the container or between leads and walls of the container
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/44Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L2224/45Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H01L2224/45001Core members of the connector
    • H01L2224/45099Material
    • H01L2224/451Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H01L2224/491Disposition
    • H01L2224/4912Layout
    • H01L2224/49171Fan-out arrangements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42Wire connectors; Manufacturing methods related thereto
    • H01L24/44Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L24/45Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42Wire connectors; Manufacturing methods related thereto
    • H01L24/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L24/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01014Silicon [Si]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/0102Calcium [Ca]

Abstract

Housing for a semiconductor device contains an eyelet carrier of Fe-Ni alloy (42% Ni, rest Fe). It has Fe-Ni-Co (29% Ni, 17% Co, rest Fe) leads hermetically sealed with a borosilicate glass. The glass pref. has a coefft. of thermal expansion of ca. 4.6 x 10-6 cm/cm degrees C. The integrity of the seal is maintained during temp. variations during mfr. and test. The housing, esp. a TO-5 housing, is reliable and capable of withstanding extreme thermal shock or heat cycles.
FR8004531A 1979-03-02 1980-02-29 Housing for semiconductor device - has borosilicate glass seal with specified coefft. of thermal expansion for alloy leads to eyelet carrier Pending FR2450503A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US1675679A 1979-03-02 1979-03-02

Publications (1)

Publication Number Publication Date
FR2450503A1 true FR2450503A1 (en) 1980-09-26

Family

ID=21778792

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8004531A Pending FR2450503A1 (en) 1979-03-02 1980-02-29 Housing for semiconductor device - has borosilicate glass seal with specified coefft. of thermal expansion for alloy leads to eyelet carrier

Country Status (3)

Country Link
JP (1) JPS55146949A (en)
DE (1) DE3007141A1 (en)
FR (1) FR2450503A1 (en)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3618203A (en) * 1969-08-25 1971-11-09 Olin Mathieson Method of making a glass or ceramic-to-composite metal seal
US3689996A (en) * 1966-05-19 1972-09-12 Philips Corp Manufacturing a plurality of semiconductor device headers
US4128697A (en) * 1977-04-22 1978-12-05 Corning Glass Works Hermetic glass-metal compression seal
FR2427758A1 (en) * 1978-06-03 1979-12-28 Jenaer Glaswerk Schott & Gen BOX FOR ELECTRICAL AND ELECTRONIC COMPONENTS

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3689996A (en) * 1966-05-19 1972-09-12 Philips Corp Manufacturing a plurality of semiconductor device headers
US3618203A (en) * 1969-08-25 1971-11-09 Olin Mathieson Method of making a glass or ceramic-to-composite metal seal
US4128697A (en) * 1977-04-22 1978-12-05 Corning Glass Works Hermetic glass-metal compression seal
FR2427758A1 (en) * 1978-06-03 1979-12-28 Jenaer Glaswerk Schott & Gen BOX FOR ELECTRICAL AND ELECTRONIC COMPONENTS

Also Published As

Publication number Publication date
DE3007141A1 (en) 1980-09-11
JPS55146949A (en) 1980-11-15

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