FR2257084A1 - Analysis of elements close to the surface of a solid - by directing pure molecular beam over the surface, and observing the light spectrum - Google Patents

Analysis of elements close to the surface of a solid - by directing pure molecular beam over the surface, and observing the light spectrum

Info

Publication number
FR2257084A1
FR2257084A1 FR7400388A FR7400388A FR2257084A1 FR 2257084 A1 FR2257084 A1 FR 2257084A1 FR 7400388 A FR7400388 A FR 7400388A FR 7400388 A FR7400388 A FR 7400388A FR 2257084 A1 FR2257084 A1 FR 2257084A1
Authority
FR
France
Prior art keywords
elements
molecular beam
analysis
pure molecular
electron
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7400388A
Other languages
English (en)
French (fr)
Other versions
FR2257084B1 (US07179912-20070220-C00144.png
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Bpifrance Financement SA
Original Assignee
Agence National de Valorisation de la Recherche ANVAR
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agence National de Valorisation de la Recherche ANVAR filed Critical Agence National de Valorisation de la Recherche ANVAR
Priority to FR7400388A priority Critical patent/FR2257084A1/fr
Publication of FR2257084A1 publication Critical patent/FR2257084A1/fr
Application granted granted Critical
Publication of FR2257084B1 publication Critical patent/FR2257084B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/105—Different kinds of radiation or particles molecular or atomic beams
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/302—Accessories, mechanical or electrical features comparative arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/612—Specific applications or type of materials biological material

Landscapes

  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FR7400388A 1974-01-07 1974-01-07 Analysis of elements close to the surface of a solid - by directing pure molecular beam over the surface, and observing the light spectrum Granted FR2257084A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR7400388A FR2257084A1 (en) 1974-01-07 1974-01-07 Analysis of elements close to the surface of a solid - by directing pure molecular beam over the surface, and observing the light spectrum

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7400388A FR2257084A1 (en) 1974-01-07 1974-01-07 Analysis of elements close to the surface of a solid - by directing pure molecular beam over the surface, and observing the light spectrum

Publications (2)

Publication Number Publication Date
FR2257084A1 true FR2257084A1 (en) 1975-08-01
FR2257084B1 FR2257084B1 (US07179912-20070220-C00144.png) 1976-11-26

Family

ID=9133141

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7400388A Granted FR2257084A1 (en) 1974-01-07 1974-01-07 Analysis of elements close to the surface of a solid - by directing pure molecular beam over the surface, and observing the light spectrum

Country Status (1)

Country Link
FR (1) FR2257084A1 (US07179912-20070220-C00144.png)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2841989A1 (fr) * 2002-07-08 2004-01-09 Fernand Marcel Devienne Dispositif pour recueillir, analyser et traiter des micro-organismes presents dans un gaz ou un melange de gaz

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2841989A1 (fr) * 2002-07-08 2004-01-09 Fernand Marcel Devienne Dispositif pour recueillir, analyser et traiter des micro-organismes presents dans un gaz ou un melange de gaz

Also Published As

Publication number Publication date
FR2257084B1 (US07179912-20070220-C00144.png) 1976-11-26

Similar Documents

Publication Publication Date Title
US4452679A (en) Substrate with chemically modified surface and method of manufacture thereof
CA2137863A1 (en) Ultraviolet light chamber
KR910008162A (ko) 합성 수지 기판 특히 폴리메틸 메타크릴레이트 기판을 알루미늄으로 코우팅하기 위한 장치 및 방법
Zmbov et al. A mass spectrometric study of heteronuclear diatomic alkali metal molecules. Dissociation energies and ionization potentials of NaLi, KLi, and NaK.
FR2257084A1 (en) Analysis of elements close to the surface of a solid - by directing pure molecular beam over the surface, and observing the light spectrum
Higashi et al. Vibrational spectroscopy of growth surfaces during photochemical deposition of aluminum from trimethylaluminum vapor
Campbell et al. Investigation of positive and negative ionic products from laser ablation of polymers
Counts et al. Electron spectroscopy for chemical analysis study of lead adsorbed on montmorillonite
Evans The influence of oxygen on the nitrogen corona treatment of polyolefins
Chisholm et al. Iron enneacarbonyl
Fernando et al. Gas-phase inorganic chemistry: laser spectroscopy of calcium and strontium monothiolates and monohydrosulfides
Pierce et al. Examination of Surfaces by scanning with Charged Particles
Zhang et al. UV excimer laser photoproducts from absorbing and transparent surfaces covered by aluminum alkyl adsorbates
Wilson The Infrared and Raman Spectra of α-and β-Pinenes
Petukh et al. The spectral intensity of the plasma of single and double laser pulses
WO1998007175A3 (en) Electron-beam irradiation apparatus
GB1414907A (en) Method of performing a non-destructive chemical analysis
Bulatov et al. Reaction of OH radicals with CS2
Oki et al. UV-laser ablation spectroscopy in element analysis of solid surface
EP0058137A2 (en) Apparatus for providing X-rays
Haas et al. Infrared multiple photon dissociation of molecular ions formed by the laser multiphoton ionization of triethylamine
Pershin Transformation of the optical spectrum of a laser plasma when a surface is irradiated with a double pulse
Schultz et al. Simultaneous SIMS and direct recoil analysis of trace H, C, and O on a magnesium surface
Tasaka et al. Optical observation of plumes formed at laser ablation of carbon materials
Shibagaki et al. Synthesis of heavy carbon clusters by laser ablation in vacuum

Legal Events

Date Code Title Description
TP Transmission of property
TP Transmission of property
ST Notification of lapse