Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
South African Inventions Development Corp
Original Assignee
South African Inventions Development Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by South African Inventions Development CorpfiledCriticalSouth African Inventions Development Corp
Publication of FR2083469A3publicationCriticalpatent/FR2083469A3/fr
Application grantedgrantedCritical
Publication of FR2083469B3publicationCriticalpatent/FR2083469B3/fr
G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
G01R17/00—Measuring arrangements involving comparison with a reference value, e.g. bridge
G—PHYSICS
G01—MEASURING; TESTING
G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
G01R13/00—Arrangements for displaying electric variables or waveforms
G01R13/20—Cathode-ray oscilloscopes
G01R13/22—Circuits therefor
G01R13/34—Circuits for representing a single waveform by sampling, e.g. for very high frequencies
G01R13/345—Circuits for representing a single waveform by sampling, e.g. for very high frequencies for displaying sampled signals by using digital processors by intermediate A.D. and D.A. convertors (control circuits for CRT indicators)