FR2015395A1 - - Google Patents
Info
- Publication number
- FR2015395A1 FR2015395A1 FR6927469A FR6927469A FR2015395A1 FR 2015395 A1 FR2015395 A1 FR 2015395A1 FR 6927469 A FR6927469 A FR 6927469A FR 6927469 A FR6927469 A FR 6927469A FR 2015395 A1 FR2015395 A1 FR 2015395A1
- Authority
- FR
- France
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P15/12—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by alteration of electrical resistance
- G01P15/123—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by alteration of electrical resistance by piezo-resistive elements, e.g. semiconductor strain gauges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/18—Measuring force or stress, in general using properties of piezo-resistive materials, i.e. materials of which the ohmic resistance varies according to changes in magnitude or direction of force applied to the material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
- G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
- G01L1/225—Measuring circuits therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
- G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
- G01L1/225—Measuring circuits therefor
- G01L1/2262—Measuring circuits therefor involving simple electrical bridges
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US75142668A | 1968-08-09 | 1968-08-09 |
Publications (1)
Publication Number | Publication Date |
---|---|
FR2015395A1 true FR2015395A1 (fr) | 1970-04-24 |
Family
ID=25021924
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR6927469A Withdrawn FR2015395A1 (fr) | 1968-08-09 | 1969-08-08 |
Country Status (4)
Country | Link |
---|---|
US (1) | US3572109A (fr) |
DE (1) | DE1939931A1 (fr) |
FR (1) | FR2015395A1 (fr) |
GB (1) | GB1223810A (fr) |
Families Citing this family (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2209770C3 (de) * | 1972-03-01 | 1980-07-24 | Philips Patentverwaltung Gmbh, 2000 Hamburg | Schaltungsanordnung zur Umwandlung des exponentiell mit einer Meßgröße verknüpften Widerstandswerts eines Widerstandsgebers in eine der Meßgröße proportionale Frequenz einer elektrischen Schwingung |
US3848144A (en) * | 1973-04-11 | 1974-11-12 | Sperry Rand Corp | Acoustic delay surface wave motion transducer systems |
US3826929A (en) * | 1973-06-11 | 1974-07-30 | Avco Corp | Gain stabilized signal processing circuitry for ground resistance sensor |
US3841150A (en) * | 1973-11-02 | 1974-10-15 | Honeywell Inc | Strain gauge transducer signal conditioning circuitry |
US4096740A (en) * | 1974-06-17 | 1978-06-27 | Rockwell International Corporation | Surface acoustic wave strain detector and gage |
US3956927A (en) * | 1975-09-29 | 1976-05-18 | Honeywell Inc. | Strain gauge transducer apparatus |
US4079804A (en) * | 1975-12-29 | 1978-03-21 | Claude Andre Paillard | Electronic device for controlling the brakes of a vehicle |
DE2655604C2 (de) * | 1976-12-08 | 1984-11-29 | Robert Bosch Gmbh, 7000 Stuttgart | Verzögerungsaufnehmer zur Auslösung von Insassenschutzvorrichtungen im Kraftfahrzeug |
US4143357A (en) * | 1978-03-24 | 1979-03-06 | Ncr Corporation | Transducing device for signature verification system |
US4205556A (en) * | 1979-02-12 | 1980-06-03 | Rockwell International Corporation | Circuitry for strain sensitive apparatus |
US4342227A (en) * | 1980-12-24 | 1982-08-03 | International Business Machines Corporation | Planar semiconductor three direction acceleration detecting device and method of fabrication |
US4498342A (en) * | 1983-04-18 | 1985-02-12 | Honeywell Inc. | Integrated silicon accelerometer with stress-free rebalancing |
JPS6341080A (ja) * | 1986-08-06 | 1988-02-22 | Nissan Motor Co Ltd | 半導体加速度センサ |
US4809552A (en) * | 1987-11-23 | 1989-03-07 | Allied-Signal, Inc. | Multidirectional force-sensing transducer |
JPH0830716B2 (ja) * | 1990-11-30 | 1996-03-27 | 三菱電機株式会社 | 半導体加速度検出装置 |
US5201224A (en) * | 1991-05-03 | 1993-04-13 | Fmc Corporation | Apparatus and method for sensing unbalance force and location through frequency modulation |
US5440935A (en) * | 1993-03-18 | 1995-08-15 | Mts Systems Corporation | Apparatus for combining transducer output signals |
DE19825761C2 (de) * | 1998-06-09 | 2001-02-08 | Fraunhofer Ges Forschung | Vorrichtung zum Erfassen einer Dehnung und/oder einer Stauchung eines Körpers |
US6807875B2 (en) | 2000-12-01 | 2004-10-26 | Honeywell International Inc. | Self-compensating position sensor |
WO2003025533A1 (fr) * | 2001-09-20 | 2003-03-27 | Honeywell International, Inc. | Capteur piézo-résistif à contrainte uniforme |
US9835515B2 (en) | 2014-10-10 | 2017-12-05 | Stmicroeletronics S.R.L. | Pressure sensor with testing device and related methods |
US9887165B2 (en) | 2014-12-10 | 2018-02-06 | Stmicroelectronics S.R.L. | IC with insulating trench and related methods |
US9726587B2 (en) | 2015-01-30 | 2017-08-08 | Stmicroelectronics S.R.L. | Tensile stress measurement device with attachment plates and related methods |
CN116679125B (zh) * | 2023-06-07 | 2024-04-09 | 海安市综合检验检测中心 | 利用多谐振荡器产生被测信号的应变电阻测量电路装置 |
-
1968
- 1968-08-09 US US751426A patent/US3572109A/en not_active Expired - Lifetime
-
1969
- 1969-07-29 GB GB38039/69A patent/GB1223810A/en not_active Expired
- 1969-08-06 DE DE19691939931 patent/DE1939931A1/de active Pending
- 1969-08-08 FR FR6927469A patent/FR2015395A1/fr not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
GB1223810A (en) | 1971-03-03 |
US3572109A (en) | 1971-03-23 |
DE1939931A1 (de) | 1970-02-12 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |