FR1415782A - Improvements to spectrometers - Google Patents

Improvements to spectrometers

Info

Publication number
FR1415782A
FR1415782A FR988529A FR988529A FR1415782A FR 1415782 A FR1415782 A FR 1415782A FR 988529 A FR988529 A FR 988529A FR 988529 A FR988529 A FR 988529A FR 1415782 A FR1415782 A FR 1415782A
Authority
FR
France
Prior art keywords
spectrometers
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR988529A
Other languages
French (fr)
Inventor
Jean Bens
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Compagnie Generale de Radiologie SA
Original Assignee
Compagnie Generale de Radiologie SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Compagnie Generale de Radiologie SA filed Critical Compagnie Generale de Radiologie SA
Priority to FR988529A priority Critical patent/FR1415782A/en
Priority to BE667219D priority patent/BE667219A/xx
Priority to GB37359/65A priority patent/GB1109276A/en
Application granted granted Critical
Publication of FR1415782A publication Critical patent/FR1415782A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Dispersion Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FR988529A 1964-09-18 1964-09-18 Improvements to spectrometers Expired FR1415782A (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
FR988529A FR1415782A (en) 1964-09-18 1964-09-18 Improvements to spectrometers
BE667219D BE667219A (en) 1964-09-18 1965-07-22
GB37359/65A GB1109276A (en) 1964-09-18 1965-09-01 Improvements in x-ray spectrometers

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR988529A FR1415782A (en) 1964-09-18 1964-09-18 Improvements to spectrometers

Publications (1)

Publication Number Publication Date
FR1415782A true FR1415782A (en) 1965-10-29

Family

ID=8838587

Family Applications (1)

Application Number Title Priority Date Filing Date
FR988529A Expired FR1415782A (en) 1964-09-18 1964-09-18 Improvements to spectrometers

Country Status (3)

Country Link
BE (1) BE667219A (en)
FR (1) FR1415782A (en)
GB (1) GB1109276A (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI80802C (en) * 1988-08-12 1990-07-10 Outokumpu Oy Sensors
DE19806168A1 (en) * 1998-02-14 1999-08-26 Studiengesellschaft Kohle Mbh X-ray measuring cell capable of direct flow
FI122507B (en) 2009-05-26 2012-02-29 Outotec Oyj Array of analyzer measurement window

Also Published As

Publication number Publication date
GB1109276A (en) 1968-04-10
BE667219A (en) 1965-11-16

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