FI20045426A - Karakterisering av en elektronisk anordnings elektroniska krets - Google Patents
Karakterisering av en elektronisk anordnings elektroniska krets Download PDFInfo
- Publication number
- FI20045426A FI20045426A FI20045426A FI20045426A FI20045426A FI 20045426 A FI20045426 A FI 20045426A FI 20045426 A FI20045426 A FI 20045426A FI 20045426 A FI20045426 A FI 20045426A FI 20045426 A FI20045426 A FI 20045426A
- Authority
- FI
- Finland
- Prior art keywords
- characterization
- electronic
- electronic device
- electronic circuit
- circuit
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2837—Characterising or performance testing, e.g. of frequency response
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/0082—Monitoring; Testing using service channels; using auxiliary channels
- H04B17/0085—Monitoring; Testing using service channels; using auxiliary channels using test signal generators
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI20045426A FI119079B (sv) | 2004-11-08 | 2004-11-08 | Karakterisering av en elektronisk anordnings elektroniska krets |
EP05100512A EP1533624A1 (en) | 2004-11-08 | 2005-01-27 | Characterization of electric circuit of electric device |
US11/667,092 US20070290691A1 (en) | 2004-11-08 | 2005-11-07 | Characterization of Electric Circuit of Electric Device |
PCT/FI2005/050399 WO2006048512A1 (en) | 2004-11-08 | 2005-11-07 | Characterization of electric circuit of electric device |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI20045426 | 2004-11-08 | ||
FI20045426A FI119079B (sv) | 2004-11-08 | 2004-11-08 | Karakterisering av en elektronisk anordnings elektroniska krets |
Publications (3)
Publication Number | Publication Date |
---|---|
FI20045426A0 FI20045426A0 (sv) | 2004-11-08 |
FI20045426A true FI20045426A (sv) | 2006-05-09 |
FI119079B FI119079B (sv) | 2008-07-15 |
Family
ID=33515309
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FI20045426A FI119079B (sv) | 2004-11-08 | 2004-11-08 | Karakterisering av en elektronisk anordnings elektroniska krets |
Country Status (4)
Country | Link |
---|---|
US (1) | US20070290691A1 (sv) |
EP (1) | EP1533624A1 (sv) |
FI (1) | FI119079B (sv) |
WO (1) | WO2006048512A1 (sv) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB201116299D0 (en) | 2011-09-21 | 2011-11-02 | Aker Subsea Ltd | Condition monitoring employing cross-correlation |
RU2496115C1 (ru) * | 2012-03-11 | 2013-10-20 | Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Самарский государственный технический университет" | Способ диагностирования электрических цепей, содержащих активное сопротивление и индуктивность |
EP2736178A1 (en) * | 2012-11-27 | 2014-05-28 | ST-Ericsson SA | NFC reader transmission signal pre-distortion |
EP2735994B1 (en) * | 2012-11-27 | 2015-02-18 | ST-Ericsson SA | Near field communication method of detection of a tag presence by a tag reader |
FI126901B (sv) * | 2014-09-12 | 2017-07-31 | Enics Ag | Förfarande och system för att testa en elektronisk enhet |
EP3422029B1 (de) * | 2017-06-28 | 2022-08-31 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Vorrichtung und verfahren zur frequenzcharakterisierung eines elektronischen systems |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19846870C1 (de) * | 1998-10-12 | 2001-01-25 | Peter Peyerl | Verfahren zur Bestimmung der Impulsantwort eines breitbandigen linearen Systems und Meßanordnung zur Durchführung des Verfahrens |
US6236371B1 (en) * | 1999-07-26 | 2001-05-22 | Harris Corporation | System and method for testing antenna frequency response |
EP1273098B1 (de) * | 2000-03-16 | 2004-05-06 | Rohde & Schwarz GmbH & Co. KG | Verfahren zur bestimmung von parametern eines n-tors |
US6622103B1 (en) * | 2000-06-20 | 2003-09-16 | Formfactor, Inc. | System for calibrating timing of an integrated circuit wafer tester |
US20020094785A1 (en) * | 2000-07-18 | 2002-07-18 | Deats Bradley W. | Portable device used to measure passive intermodulation in radio frequency communication systems |
US6587019B2 (en) * | 2001-04-11 | 2003-07-01 | Eni Technology, Inc. | Dual directional harmonics dissipation system |
US7031687B2 (en) * | 2001-04-18 | 2006-04-18 | Nokia Corporation | Balanced circuit arrangement and method for linearizing such an arrangement |
EP1296149B1 (en) * | 2001-09-24 | 2006-08-02 | Agilent Technologies, Inc. (a Delaware corporation) | Characterizing non-linear behavior |
US6813589B2 (en) * | 2001-11-29 | 2004-11-02 | Wavecrest Corporation | Method and apparatus for determining system response characteristics |
US6982558B2 (en) * | 2003-01-09 | 2006-01-03 | Pass & Seymour, Inc. | Electric circuit test device |
-
2004
- 2004-11-08 FI FI20045426A patent/FI119079B/sv active
-
2005
- 2005-01-27 EP EP05100512A patent/EP1533624A1/en not_active Withdrawn
- 2005-11-07 US US11/667,092 patent/US20070290691A1/en not_active Abandoned
- 2005-11-07 WO PCT/FI2005/050399 patent/WO2006048512A1/en active Application Filing
Also Published As
Publication number | Publication date |
---|---|
EP1533624A1 (en) | 2005-05-25 |
WO2006048512A1 (en) | 2006-05-11 |
FI20045426A0 (sv) | 2004-11-08 |
FI119079B (sv) | 2008-07-15 |
US20070290691A1 (en) | 2007-12-20 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PC | Transfer of assignment of patent |
Owner name: ELEKTROBIT TESTING OY Free format text: ELEKTROBIT TESTING OY |
|
PC | Transfer of assignment of patent |
Owner name: ELEKTROBIT SYSTEM TEST OY Free format text: ELEKTROBIT SYSTEM TEST OY |