EP4157093A4 - Systems and methods for controlling image contrast in an x-ray system - Google Patents

Systems and methods for controlling image contrast in an x-ray system

Info

Publication number
EP4157093A4
EP4157093A4 EP20938600.2A EP20938600A EP4157093A4 EP 4157093 A4 EP4157093 A4 EP 4157093A4 EP 20938600 A EP20938600 A EP 20938600A EP 4157093 A4 EP4157093 A4 EP 4157093A4
Authority
EP
European Patent Office
Prior art keywords
systems
methods
image contrast
ray system
controlling image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
EP20938600.2A
Other languages
German (de)
French (fr)
Other versions
EP4157093A1 (en
Inventor
Jeffrey R Schubert
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
American Science and Engineering Inc
Original Assignee
American Science and Engineering Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by American Science and Engineering Inc filed Critical American Science and Engineering Inc
Publication of EP4157093A1 publication Critical patent/EP4157093A1/en
Publication of EP4157093A4 publication Critical patent/EP4157093A4/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/10—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being confined in a container, e.g. in a luggage X-ray scanners
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/313—Accessories, mechanical or electrical features filters, rotating filter disc

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
EP20938600.2A 2020-06-01 2020-06-01 Systems and methods for controlling image contrast in an x-ray system Pending EP4157093A4 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US2020/035508 WO2021246998A1 (en) 2020-06-01 2020-06-01 Systems and methods for controlling image contrast in an x-ray system

Publications (2)

Publication Number Publication Date
EP4157093A1 EP4157093A1 (en) 2023-04-05
EP4157093A4 true EP4157093A4 (en) 2024-01-24

Family

ID=78831358

Family Applications (1)

Application Number Title Priority Date Filing Date
EP20938600.2A Pending EP4157093A4 (en) 2020-06-01 2020-06-01 Systems and methods for controlling image contrast in an x-ray system

Country Status (4)

Country Link
EP (1) EP4157093A4 (en)
CN (1) CN115697202A (en)
GB (1) GB2609588A (en)
WO (1) WO2021246998A1 (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20190187324A1 (en) * 2015-10-21 2019-06-20 Smith Heimann SAS Vehicle cabin inspection system and method

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3417243A (en) * 1965-10-28 1968-12-17 Minnesota Mining & Mfg Method and apparatus for x-ray fluorescence gauging of a higher atomic number selected element in a coating on a base
DE4215343A1 (en) * 1992-05-09 1993-11-11 Philips Patentverwaltung Filter method for an X-ray system and arrangement for carrying out such a filter method
US6574307B1 (en) * 2001-11-21 2003-06-03 Ge Medical Systems Global Technology Company Llc Method and apparatus for enhancing the contrast of a medical diagnostic image that includes foreign objects
CN104970817B (en) * 2010-09-07 2017-10-31 株式会社日立制作所 X ray CT device and tube current determining method
DE102015217421B4 (en) * 2015-09-11 2023-05-17 Siemens Healthcare Gmbh Spectral filtering of X-rays for energy-selective X-ray imaging
US20180333109A1 (en) * 2017-05-18 2018-11-22 Robert Zamenhof Contrast enhanced energy subtraction mammography

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20190187324A1 (en) * 2015-10-21 2019-06-20 Smith Heimann SAS Vehicle cabin inspection system and method

Also Published As

Publication number Publication date
GB202216885D0 (en) 2022-12-28
GB2609588A (en) 2023-02-08
CN115697202A (en) 2023-02-03
EP4157093A1 (en) 2023-04-05
WO2021246998A1 (en) 2021-12-09

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DAX Request for extension of the european patent (deleted)
A4 Supplementary search report drawn up and despatched

Effective date: 20240103

RIC1 Information provided on ipc code assigned before grant

Ipc: G01N 23/04 20180101ALI20231220BHEP

Ipc: G01N 23/02 20060101ALI20231220BHEP

Ipc: G01N 23/00 20060101ALI20231220BHEP

Ipc: A61B 6/00 20060101AFI20231220BHEP