EP3948632A1 - Application and product realization of darpa lads capabilities to legacy avionics - Google Patents
Application and product realization of darpa lads capabilities to legacy avionicsInfo
- Publication number
- EP3948632A1 EP3948632A1 EP20750133.9A EP20750133A EP3948632A1 EP 3948632 A1 EP3948632 A1 EP 3948632A1 EP 20750133 A EP20750133 A EP 20750133A EP 3948632 A1 EP3948632 A1 EP 3948632A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- magnitudes
- emissions
- circuit
- analysis device
- constituent frequencies
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/005—Testing of electric installations on transport means
- G01R31/008—Testing of electric installations on transport means on air- or spacecraft, railway rolling stock or sea-going vessels
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/005—Circuits for comparing several input signals and for indicating the result of this comparison, e.g. equal, different, greater, smaller (comparing phase or frequency of 2 mutually independent oscillations in demodulators)
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/16—Spectrum analysis; Fourier analysis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
- G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
- G01R29/0892—Details related to signal analysis or treatment; presenting results, e.g. displays; measuring specific signal features other than field strength, e.g. polarisation, field modes, phase, envelope, maximum value
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
- G01R31/002—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing where the device under test is an electronic circuit
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
- G06F21/70—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer
- G06F21/86—Secure or tamper-resistant housings
- G06F21/87—Secure or tamper-resistant housings by means of encapsulation, e.g. for integrated circuits
Definitions
- This disclosure relates generally to a system and method for determining whether an electrical circuit has been compromised and, more particularly, to a system and method for determining whether an electrical circuit has been compromised, where the method includes obtaining baseband electromagnetic emissions from an equivalent test circuit that is operating properly and comparing those emissions to electromagnetic emissions emitted by the circuit when it is operational in the field.
- Modern aircraft both manned and unmanned, typically employ a vehicle management system that includes the necessary controllers and other hardware for flight operation of the aircraft.
- the various sub-systems in the vehicle management system often include safety critical systems that if they were to fail, could cause a catastrophic failure of the aircraft. Therefore, these systems must be designed to have a high degree of reliability against failure.
- a component generally having a high degree of reliability may still lack redundancy.
- these type of circuits, devices and systems are sometimes victims of malware, tampering and cyber-attacks. Therefore, safety critical systems on an aircraft typically require some type of fault tolerant system.
- the present disclosure describes a system and related method for determining whether an electrical circuit has been compromised.
- the system includes a circuit probe positioned relative to the electrical circuit that detects electromagnetic circuit emissions therefrom and an analysis device electrically coupled to the circuit probe and receiving electromagnetic emissions detection signals therefrom, where the analysis device identifies constituent frequencies and their magnitudes in the detection signals.
- the system also includes a comparison processor responsive to the constituent frequencies and magnitudes from the analysis device, where the comparison processor compares the constituent frequencies and magnitudes to previously stored constituent frequencies and magnitudes obtained from an equivalent test circuit to the electrical circuit to determine whether the electrical circuit has been compromised.
- a background probe can be provided to obtain background emissions that can be subtracted from the circuit emissions.
- Figure 1 is a schematic block diagram of a testing detection system illustrating a process for determining baseline electromagnetic emissions from an electrical test circuit, processing the electronic emissions and storing the baseline emissions;
- Figure 2 is a graph with frequency on the horizontal axis and magnitude on the vertical axis showing an example of detected emissions from the test electrical circuit at one given instant in time;
- Figure 3 is a schematic block diagram of a generalized software defined radio used to capture electromagnetic emissions from a test electrical circuit
- Figure 4 is a spectrogram with frequency on the horizontal axis and a moving time window on the vertical axis showing intensity representations of the detected emissions from the electrical test circuit in inverse gray scale with dark for highest intensity and light for lowest intensity, where frequencies F1-F4 are signals radiated from a single board computer (SBC) being monitopred and are typical of a properly functioning circuit during a given functional mode such as normal boot behavior;
- SBC single board computer
- Figure 5 is a graph with time on the horizontal axis and magnitude on the vertical axis showing the magnitude of clock power electromagnetic emissions from the test electrical circuit;
- Figure 6 is a graph with time on the horizontal axis and magnitude on the vertical axis showing the magnitude of modulated power electromagnetic emissions from the electrical test circuit;
- Figure 7 is an exploded isometric view of a component chassis including microprocessor boards having microprocessors and a detection system for detecting electromagnetic emissions from the boards, microprocessors and chassis enclosure;
- Figure 8 is a schematic block diagram of a detection system for detecting electromagnetic emissions from a plurality of computer boards
- Figure 9 is a schematic block diagram of a testing detection system illustrating a process for determining baseline electromagnetic emissions from an electrical test circuit and storing the baseline emissions;
- Figure 10 is a schematic block diagram of a detection system illustrating a process for comparing the stored baseline electromagnetic emissions to electromagnetic emissions detected in the field from an equivalent circuit is operational;
- Figure 1 1 is the spectrogram as shown in figure 4 with anomalies of circuit behavior found in the frequencies F1 , F3 and F4 from the SBC being monitored and are atypical of a properly functioning circuit during the same functional mode.
- the present disclosure proposes a system and method for detecting cyber or malware events using close-in RF measurements of electromagnetic emissions from processing systems with high reliability.
- the method includes the detection of changes in software being executed relative to a baseline, and the detection of anomalous events during execution of known software.
- Machine learning techniques can be employed to identify unique events for the system, which can be modeled.
- the models can be used as a baseline to compare with emissions from a system being used in the field to differentiate a normal boot-up sequence from an abnormal and possibly malicious activated boot-up sequence.
- the system and method have particular application for working in conjunction with the known processes for leveraging the analog domain for security (LADS).
- LADS analog domain for security
- FIG. 1 is a schematic block diagram of a test system 10 for obtaining and storing normal operation electromagnetic RF emissions from a test component box 12 that may include a vehicle management computer (VMC), for example, an aircraft or avionics computer board, that may be one of several component boxes 14, where the component box 12 may include several removable microprocessor boards (not shown), each having one or more circuit modules.
- VMC vehicle management computer
- the box 12 is not in the field, but is part of a testing configuration where the box 12 is operated by a simulator 18 and is controlled by an operator through a computer 20.
- the box 12 is intended to represent any component box having circuits that may be subjected to a malicious attack by a virus or firmware, such as aircraft circuits, and that gives off electromagnetic radiation when it is operating at any frequency that can be detected.
- a near-field RF probe 22 is placed using any suitable technique on or adjacent to a particular microprocessor board in the box 12 so that it is able to detect electromagnetic radiation emitted from the circuits on the board when it is in operation, where the probe 22 would have to be moved, or a separate probe would have to be provided to detect the emissions from other microprocessor boards.
- the probe 22 can be any probe having any type of antenna, such as a loop antenna, a patch antenna, etc., that detects electromagnetic emissions at any desirably frequency suitable for the purposes discussed herein.
- the measured electromagnetic RF emissions by the probe 22 are amplified by a low noise amplifier 24 and then sent to an analog spectrum analyzer 26, which may operate, for example, over a frequency band of 9 kHz - 26 GHz.
- the analyzer 26 identifies the constituent frequencies and their magnitudes of the measured electromagnetic emissions that changes over time as the microprocessor board operates.
- Figure 2 is a graph with frequency on the horizontal axis and magnitude on the vertical axis showing an example of the identified frequencies in the detected emissions provided by the analyzer 26 for the particular microprocessor board in the box 12 at a particular point in time.
- the constituent frequencies and their magnitudes can then be further processed by the spectrum analyzer 26 to give a representation of the emissions for a certain operation, such as a boot-up sequence, and provided to a back-end computer 28.
- FIG 3 is a block diagram of a software defined radio (SDR) 120 that is an alternative to the analog spectrum analyzer 26 in that it includes digitally programmable elements that can perform the same functions as the analog spectrum analyzer 26 as well as perform a myriad of digital processing functions.
- An RF signal 122 enters the SDR 120 and is amplified by a low noise RF amplifier 124, which performs the same function as that of the amplifier 24.
- the amplified input signal is then sent to a high order low pass“brick wall” filter 126, also known as an anti-alias filter.
- the filter 126 allows signals up to the sample rate of a following analog-to-digital convertor (A/D) 128, but then greatly attenuates (hence“brick wall”) signals higher than the sample rate of the A/D 128. Such filtering is required and fundamental to any analog-to-digital conversion to remove false frequency components due to the phenomenon of aliasing.
- the digital samples from A/D 128 are then processed by a field programmable gate array (FPGA) 130, a digital signal processor (DSP) 132 and a general purpose processor (GPP) 134, which form the core of the SDR processing.
- the processed digital signal can be presented to a back end computer interface port, such as that of a universal serial bus (USB) 136.
- USB universal serial bus
- a typical data stream from the SDR 120 to the back end computer is that of I and Q samples (in-phase) and (quadrature phase).
- the particular FPGA bit stream configuration, the DSP code and the GPP code, which enable specific SDR functions, such as two dimensional spectrum analysis, and three dimensional waterfall spectrum analysis can be downloaded to the SDR 120 from the back end computer 28.
- the following discussion refers the SDR 120 being employed to characterize the emissions instead of the spectrum analyzer 26.
- Figure 4 is a spectrogram with frequency on the horizontal axis and time on the vertical axis of a certain microprocessor boot-up sequence, where the intensity of the detected emissions is represented by reverse grey scale shading.
- the center line in the spectrogram is caused by emissions from the microprocessor clock signal and the other shorter lines are other emissions caused by various circuits during the normal boot-up sequence of the box 12.
- the spectrogram can be further analyzed by the SDR 120 to show the power of the emissions overtime during the boot-up sequence.
- figures 5 and 6 are graphs with time on the horizontal axis and magnitude on the vertical axis, where figure 5 shows the clock power and figure 6 shows the modulated power.
- the various emissions representations provided by the SDR 120 can then be sent to the computer 28 that performs machine learning and feature extraction to identify unique features of the emissions that are stored to later be used in the field for a similar microprocessor board consistent with the discussion herein.
- FIG. 7 is an exploded isometric view of a component chassis 40, such as an avionics chassis, having an outer box 42 defining an enclosure 44 and having a lid 46, where a number of electrical connectors 48 provide an electrical connection to the box 42 and the electrical circuits therein.
- the enclosure 44 is able to accept a number of microprocessor boards 50, such as single board computers (SBC), that are slid into slots in the box 42 so that the boards 50 make the desired electrical connection.
- SBC single board computers
- Each of the boards 50 includes a number of daughter cards 52 each having a number of circuits for performing a certain operation and a number of microprocessors 54.
- One of the boards 50 has an empty slot 56 in which is provided a multi-channel RF processor software defined radio 58 that is specially configured to process emissions measurements from the cards 52 and the microprocessors 54 to obtain the various spectrograms and frequency plots discussed above identifying features in the RF emissions.
- a separate antenna probe 60 such as a near-field loop antenna, is attached to some of the cards 52 and some of the microprocessors 54, where the probes 60 detect electromagnetic emissions that are processed by the radio 58.
- an antenna probe 64 is attached to an underside of the lid 44 so that it is in the enclosure 44 to detect background emissions in the enclosure 44 as a baseband that are also processed by the radio 58.
- the detected background emissions by the probe 64 can be subtracted from the emissions detected by the other probes 60 that would not be from the emissions from the particular card 52 or the microprocessor 54 to improve the signal-to-noise ratio.
- the radio 58 processes detected emissions from three of the cards 52 and the microprocessors 54 in this embodiment, the radio 58 can process emissions from any reasonable number of circuits in the chassis 40.
- FIG 8 is a schematic block diagram of a detection system 60 of the type just described, but separated from the chassis 40.
- the system 60 includes a chassis lid 62 having an antenna 64 coupled thereto, three SBCs 66 each having a probe 68 coupled thereto and a multi-channel RF processor software defined radio 70 that receives the detected electromagnetic emissions from the probes 68 and the antenna 64.
- the radio 70 processes the detected signals and converts them to the frequency domain, and provides the signals to a central SBC health monitor processor 72 that compares the signals in real time to signals stored from the test of equivalent circuits and microprocessors that were operating properly having the proper operating emissions.
- the processor 72 may be provided in the slot 56 or may be provided in an empty back-plane slot of the boards 50 in the chassis 40.
- FIG. 9 is a schematic block diagram of a testing detection system 80 illustrating a process for determining baseline electromagnetic emissions from a properly operating test electrical circuit, such as an SBC 82, and storing the baseline emissions for later use.
- the system 80 includes an electromagnetic (EM) probe 84 that captures the electromagnetic emissions from the SBC 82 in the manner discussed above that are converted to representative voltages.
- the voltages are converted to the digital domain by an SDR 90 and the digital signals are analyzed by the SDR 90 configures as a suitable spectrum analyzer to obtain characteristic voltage/time and frequency/time ratios in the emissions.
- the characteristic voltage/time and frequency/time ratio signals are provided to a feature extraction processor 92 that provides post processing, such as feature extraction, machine learning, tolerance additions, and other such parametric analysis of the signals to identify unique characteristics and create reference data files of the emissions, referred to herein as golden data characterization signature files (Asigs), that are stored in a storage device 94 for later use in the field.
- Asigs golden data characterization signature files
- FIG. 10 is a schematic block diagram of a field detection system 100 illustrating a process for comparing the stored Asigs processed from electromagnetic emissions from the test SBC 82 to processed electromagnetic emissions from an equivalent SBC 106 in real-time as the SBC 106 is operational in the field to identify whether the SBC 106 has been compromised, either maliciously or otherwise.
- the Asigs previously stored in the storage device 94 are transferred to a storage device 102 that is provided in the field as part of the system 100, where the Asigs are available to a comparison processor 104, similar to the processor 72.
- the system 100 includes a probe 108 that measures the electromagnetic emissions from the SBC 106 in the manner discussed above that are converted to representative voltages.
- the voltages are converted to the digital domain by an SDR 1 10 and the digital signals are analyzed by the SDR 1 10 configured as a suitable spectrum analyzer to obtain characteristic voltage/time and frequency/time ratios in the emissions.
- the characteristic voltage/time and frequency/time ratio signals referred to herein as monitored board real time data characterization signatures (Bsigs), are provided to the processor 104.
- the system 100 includes an EM probe 120 that captures the electromagnetic emissions from a chassis lid 118 that houses the SBC 106 in the manner discussed above that are converted to representative voltages.
- the voltages are converted to the digital domain by an SDR 1 14 and the digital signals are analyzed by the SDR 114 configured as a suitable spectrum analyzer to obtain characteristic voltage/time and frequency/time ratios in the emissions.
- the characteristic voltage/time and frequency/time ratio signals referred to herein as chassis background real time data characterization signatures (Csigs)
- Csigs chassis background real time data characterization signatures
- the processor 104 that subtracts the subtracted real time emission files from the Asigs reference files (Asigs - (Bsigs-Csigs)) to obtain a mismatch value outputted from the processor 104. If the mismatch value exceeds some threshold, then the SBC 106 is determined to be compromised and further steps are performed to address that problem.
- Figure 1 1 is the spectrogram shown in figure 4 of a certain microprocessor boot-up sequence, and showing notional anomalies of a circuit plagued with malware or other nefarious agents. Such anomalies are detected and reported by the circuitry and processes described in these collective paragraphs.
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Electromagnetism (AREA)
- Theoretical Computer Science (AREA)
- Mathematical Physics (AREA)
- Computer Security & Cryptography (AREA)
- General Engineering & Computer Science (AREA)
- Software Systems (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Monitoring And Testing Of Transmission In General (AREA)
- Testing Relating To Insulation (AREA)
Abstract
Description
Claims
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US16/518,051 US10935587B2 (en) | 2019-07-22 | 2019-07-22 | Application and product realization of darpa lads capabilities to legacy avionics |
| PCT/US2020/042236 WO2021016025A1 (en) | 2019-07-22 | 2020-07-16 | Application and product realization of darpa lads capabilities to legacy avionics |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| EP3948632A1 true EP3948632A1 (en) | 2022-02-09 |
| EP3948632B1 EP3948632B1 (en) | 2023-12-20 |
Family
ID=71895302
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP20750133.9A Active EP3948632B1 (en) | 2019-07-22 | 2020-07-16 | Application and product realization of darpa lads capabilities to legacy avionics |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US10935587B2 (en) |
| EP (1) | EP3948632B1 (en) |
| KR (1) | KR20220035329A (en) |
| WO (1) | WO2021016025A1 (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2631704A (en) | 2023-07-10 | 2025-01-15 | Ibm | Detecting information breach in a computer system |
| KR102873506B1 (en) * | 2024-03-19 | 2025-10-22 | 한국전자통신연구원 | Apparatus and Method for Extracting Noise Source Impedance Extraction of Electronic Device |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3587300B2 (en) * | 2001-01-16 | 2004-11-10 | 株式会社デンソー | Integrated circuit device |
| US7436196B2 (en) * | 2006-02-15 | 2008-10-14 | Apple Inc. | Method and apparatus for measuring die-level integrated circuit power variations |
| WO2012048264A2 (en) * | 2010-10-07 | 2012-04-12 | Andrew Llc | Systems and methods of testing active digital radio antennas |
| US9059189B2 (en) | 2011-03-02 | 2015-06-16 | Nokomis, Inc | Integrated circuit with electromagnetic energy anomaly detection and processing |
| US8935117B2 (en) * | 2012-03-09 | 2015-01-13 | Freescale Semiconductor, Inc. | Circuit and method for measuring voltage |
| US9098757B2 (en) * | 2012-11-29 | 2015-08-04 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method and apparatus of RFID tag contactless testing |
| US10395032B2 (en) | 2014-10-03 | 2019-08-27 | Nokomis, Inc. | Detection of malicious software, firmware, IP cores and circuitry via unintended emissions |
| US9268938B1 (en) | 2015-05-22 | 2016-02-23 | Power Fingerprinting Inc. | Systems, methods, and apparatuses for intrusion detection and analytics using power characteristics such as side-channel information collection |
| US20190093829A1 (en) * | 2017-09-22 | 2019-03-28 | KPL South Texas, LLC | System and method for detecting and remediating selective seam weld corrosion in a conduit |
-
2019
- 2019-07-22 US US16/518,051 patent/US10935587B2/en active Active
-
2020
- 2020-07-16 KR KR1020217040122A patent/KR20220035329A/en active Pending
- 2020-07-16 WO PCT/US2020/042236 patent/WO2021016025A1/en not_active Ceased
- 2020-07-16 EP EP20750133.9A patent/EP3948632B1/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| US20210025931A1 (en) | 2021-01-28 |
| WO2021016025A1 (en) | 2021-01-28 |
| US10935587B2 (en) | 2021-03-02 |
| KR20220035329A (en) | 2022-03-22 |
| EP3948632B1 (en) | 2023-12-20 |
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