EP3248207A4 - Dynamically adjustable focal spot - Google Patents

Dynamically adjustable focal spot Download PDF

Info

Publication number
EP3248207A4
EP3248207A4 EP15879249.9A EP15879249A EP3248207A4 EP 3248207 A4 EP3248207 A4 EP 3248207A4 EP 15879249 A EP15879249 A EP 15879249A EP 3248207 A4 EP3248207 A4 EP 3248207A4
Authority
EP
European Patent Office
Prior art keywords
focal spot
dynamically adjustable
adjustable focal
dynamically
spot
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP15879249.9A
Other languages
German (de)
French (fr)
Other versions
EP3248207A1 (en
Inventor
Martin Rommel
Louis P. Wainwright
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
American Science and Engineering Inc
Original Assignee
American Science and Engineering Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by American Science and Engineering Inc filed Critical American Science and Engineering Inc
Publication of EP3248207A1 publication Critical patent/EP3248207A1/en
Publication of EP3248207A4 publication Critical patent/EP3248207A4/en
Withdrawn legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/24—Tubes wherein the point of impact of the cathode ray on the anode or anticathode is movable relative to the surface thereof
    • H01J35/30—Tubes wherein the point of impact of the cathode ray on the anode or anticathode is movable relative to the surface thereof by deflection of the cathode ray
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/14—Arrangements for concentrating, focusing, or directing the cathode ray
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/14—Arrangements for concentrating, focusing, or directing the cathode ray
    • H01J35/147—Spot size control
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/14—Arrangements for concentrating, focusing, or directing the cathode ray
    • H01J35/153—Spot position control
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
EP15879249.9A 2015-01-20 2015-12-18 Dynamically adjustable focal spot Withdrawn EP3248207A4 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201562105474P 2015-01-20 2015-01-20
PCT/US2015/066603 WO2016118271A1 (en) 2015-01-20 2015-12-18 Dynamically adjustable focal spot

Publications (2)

Publication Number Publication Date
EP3248207A1 EP3248207A1 (en) 2017-11-29
EP3248207A4 true EP3248207A4 (en) 2018-09-26

Family

ID=56417569

Family Applications (1)

Application Number Title Priority Date Filing Date
EP15879249.9A Withdrawn EP3248207A4 (en) 2015-01-20 2015-12-18 Dynamically adjustable focal spot

Country Status (6)

Country Link
US (1) US10535491B2 (en)
EP (1) EP3248207A4 (en)
GB (1) GB2549891B (en)
HK (1) HK1245499A1 (en)
MX (1) MX2017009342A (en)
WO (1) WO2016118271A1 (en)

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US11257653B2 (en) 2020-03-27 2022-02-22 The Boeing Company Integrated aperture shield for x-ray tubes
US11169098B2 (en) * 2020-04-02 2021-11-09 The Boeing Company System, method, and apparatus for x-ray backscatter inspection of parts
US11145481B1 (en) * 2020-04-13 2021-10-12 Hamamatsu Photonics K.K. X-ray generation using electron beam
CN113063808A (en) * 2021-03-29 2021-07-02 卡尔蔡司工业测量技术有限公司 Inspection system and method for inspecting at least one test object
DE102021203119A1 (en) * 2021-03-29 2022-09-29 Carl Zeiss Industrielle Messtechnik Gmbh Inspection system and method for inspecting at least one test object

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US20140161233A1 (en) * 2012-12-06 2014-06-12 Bruker Axs Gmbh X-ray apparatus with deflectable electron beam

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Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4045672A (en) * 1975-09-11 1977-08-30 Nihon Denshi Kabushiki Kaisha Apparatus for tomography comprising a pin hole for forming a microbeam of x-rays
US5822395A (en) * 1996-09-27 1998-10-13 Siemens Aktiengesellschaft X-ray apparatus having an x-ray tube with vario-focus
US6339635B1 (en) * 1998-03-10 2002-01-15 Siemens Aktiengesellschaft X-ray tube
WO2008155695A1 (en) * 2007-06-21 2008-12-24 Koninklijke Philips Electronics N.V. Magnetic lens system for spot control in an x-ray tube
US20140161233A1 (en) * 2012-12-06 2014-06-12 Bruker Axs Gmbh X-ray apparatus with deflectable electron beam

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO2016118271A1 *

Also Published As

Publication number Publication date
WO2016118271A1 (en) 2016-07-28
GB2549891A (en) 2017-11-01
MX2017009342A (en) 2017-11-17
US20180012724A1 (en) 2018-01-11
GB201711374D0 (en) 2017-08-30
GB2549891B (en) 2021-09-08
HK1245499A1 (en) 2018-08-24
US10535491B2 (en) 2020-01-14
EP3248207A1 (en) 2017-11-29

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