EP2926378A1 - Optical component and photovoltaic device - Google Patents
Optical component and photovoltaic deviceInfo
- Publication number
- EP2926378A1 EP2926378A1 EP13857890.1A EP13857890A EP2926378A1 EP 2926378 A1 EP2926378 A1 EP 2926378A1 EP 13857890 A EP13857890 A EP 13857890A EP 2926378 A1 EP2926378 A1 EP 2926378A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- optical component
- antireflection layer
- particles
- suspension liquid
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 230000003287 optical effect Effects 0.000 title claims abstract description 70
- 239000002245 particle Substances 0.000 claims abstract description 75
- 239000000758 substrate Substances 0.000 claims abstract description 48
- 238000012856 packing Methods 0.000 claims abstract description 23
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 43
- 239000007788 liquid Substances 0.000 claims description 37
- 239000000725 suspension Substances 0.000 claims description 37
- 239000002105 nanoparticle Substances 0.000 claims description 23
- 239000004005 microsphere Substances 0.000 claims description 13
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 claims description 6
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 claims description 6
- RVTZCBVAJQQJTK-UHFFFAOYSA-N oxygen(2-);zirconium(4+) Chemical compound [O-2].[O-2].[Zr+4] RVTZCBVAJQQJTK-UHFFFAOYSA-N 0.000 claims description 6
- 229910021426 porous silicon Inorganic materials 0.000 claims description 6
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 claims description 6
- 229910001928 zirconium oxide Inorganic materials 0.000 claims description 6
- 238000000137 annealing Methods 0.000 claims description 3
- 238000001035 drying Methods 0.000 claims 4
- 239000010410 layer Substances 0.000 description 86
- 238000000034 method Methods 0.000 description 33
- 238000011109 contamination Methods 0.000 description 17
- 230000000694 effects Effects 0.000 description 10
- 238000000411 transmission spectrum Methods 0.000 description 10
- 239000011521 glass Substances 0.000 description 9
- 239000000463 material Substances 0.000 description 9
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 8
- 239000011248 coating agent Substances 0.000 description 6
- 238000000576 coating method Methods 0.000 description 6
- 230000015556 catabolic process Effects 0.000 description 4
- 238000005229 chemical vapour deposition Methods 0.000 description 4
- 238000006731 degradation reaction Methods 0.000 description 4
- 239000002356 single layer Substances 0.000 description 4
- 238000002834 transmittance Methods 0.000 description 4
- ORUIBWPALBXDOA-UHFFFAOYSA-L magnesium fluoride Chemical compound [F-].[F-].[Mg+2] ORUIBWPALBXDOA-UHFFFAOYSA-L 0.000 description 3
- 229910001635 magnesium fluoride Inorganic materials 0.000 description 3
- 229910052814 silicon oxide Inorganic materials 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- BOTDANWDWHJENH-UHFFFAOYSA-N Tetraethyl orthosilicate Chemical compound CCO[Si](OCC)(OCC)OCC BOTDANWDWHJENH-UHFFFAOYSA-N 0.000 description 2
- 238000003618 dip coating Methods 0.000 description 2
- 238000007598 dipping method Methods 0.000 description 2
- 230000001788 irregular Effects 0.000 description 2
- 238000005240 physical vapour deposition Methods 0.000 description 2
- 238000005245 sintering Methods 0.000 description 2
- 238000009987 spinning Methods 0.000 description 2
- 238000005507 spraying Methods 0.000 description 2
- 230000002411 adverse Effects 0.000 description 1
- 229910001413 alkali metal ion Inorganic materials 0.000 description 1
- 229910052784 alkaline earth metal Inorganic materials 0.000 description 1
- 230000003667 anti-reflective effect Effects 0.000 description 1
- -1 but not limited to Substances 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/30—Coatings
- H10F77/306—Coatings for devices having potential barriers
- H10F77/311—Coatings for devices having potential barriers for photovoltaic cells
- H10F77/315—Coatings for devices having potential barriers for photovoltaic cells the coatings being antireflective or having enhancing optical properties
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
- G02B1/10—Optical coatings produced by application to, or surface treatment of, optical elements
- G02B1/11—Anti-reflection coatings
- G02B1/113—Anti-reflection coatings using inorganic layer materials only
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/70—Surface textures, e.g. pyramid structures
- H10F77/707—Surface textures, e.g. pyramid structures of the substrates or of layers on substrates, e.g. textured ITO layer on a glass substrate
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Definitions
- the present disclosure generally relates to optical material field, and more particularly, to an optical component and a photovoltaic device.
- an antireflection layer may be formed on the substrate to reduce light reflection.
- the refractive index of the antireflection layer equals to the square root of a product of refractive indexes of the air and the substrate (a refractive indexes matching condition)
- the thickness of the antireflection layer equals to one fourth of the light wavelength (a thickness matching condition)
- the antireflection layer may reduce reflection of lights having the wavelength effectively.
- the antireflection layer may be an antireflection layer with moth-eye structure, a porous silicon oxide layer, or a multi-layer antireflection coating including high refractive index material and low refractive index material alternatively stacked, etc.
- the conventional antireflection layers mentioned above are usually not provided with the property of contamination resistance.
- the antireflection layer needs to be coated with an additional layer, such as a low surface energy layer, which may adversely influence the antireflection effect.
- embodiments of this disclosure provide an antireflection film having property of contamination resistance.
- a contamination-resistant layer may be formed on an antireflection film, which may not cause substantial degradation of antireflection effect.
- an optical component which may include: a substrate; and a first antireflection layer which comprises a packing medium and a particle array comprising a plurality of particles, wherein the packing medium fills at least in part voids formed between the plurality of particles.
- the first antireflection layer having the above-mentioned structure may have properties of both antireflection and contamination resistance.
- the optical component further comprises a second antireflection layer between the substrate and first antireflection layer.
- the second antireflection layer may include a plurality of silica microspheres and voids formed between the plurality of silica microspheres.
- the plurality of silica microspheres may have a diameter ranging from lOnm to 20nm.
- the plurality of particles may be microspheres which have a diameter ranging from 80nm to 250nm.
- the packing medium may include a plurality of nanoparticles.
- the plurality of particles and the plurality of nanoparticles may be one or more selected from silica microspheres, titanium oxide microspheres, aluminum oxide microspheres and zirconium oxide microspheres.
- the plurality of nanoparticles may include silica microspheres having a diameter ranging from 7nm to 12nm, and the plurality of particles may include silica microspheres having a diameter ranging from 80nm to 250nm.
- the packing medium may fill at least 90% of the voids formed between the plurality of particles.
- the plurality of particles and the packing medium may be integrated as a whole.
- a photovoltaic device which may include an optical component provided in embodiments of the disclosure, wherein the optical component comprises a transparent substrate; and a solar cell, located on a side of the substrate on which the first antireflection layer is not located.
- FIG. 1 schematically illustrates a cross-sectional view of an optical component 100 according to one embodiment of the present disclosure
- FIG. 2 schematically illustrates a cross-sectional view of an optical component 200 according to one embodiment of the present disclosure
- FIG. 3 schematically illustrates a cross-sectional view of an optical component 300 according to one embodiment of the present disclosure
- FIG. 4 schematically illustrates a cross-sectional view of an optical component 400 according to one embodiment of the present disclosure
- FIG. 5 schematically illustrates a cross-sectional view of an optical component 500 according to one embodiment of the present disclosure
- FIG. 6 schematically illustrates a flow chart of a method for forming an optical component according to one embodiment of the present disclosure
- FIG. 7 schematically illustrates a flow chart of a method for forming an optical component according to another embodiment of the present disclosure
- FIG. 8 schematically illustrates a flow chart of a process S300 shown in FIG. 7 according to one embodiment of the present disclosure
- FIG. 9 schematically illustrates a flow chart of a process S200 shown in FIG. 6 or FIG. 7 according to one embodiment of the present disclosure
- FIG. 10 schematically illustrates a flow chart of a process S200 shown in FIG. 6 or FIG. 7 according to another embodiment of the present disclosure
- FIG. 11 schematically illustrates a transmission spectrum of an exemplary optical component 100 according to one embodiment of the present disclosure.
- FIG. 12 schematically illustrates a transmission spectrum of an exemplary optical component 200 according to one embodiment of the present disclosure.
- a device provided in embodiments of the present disclosure is described with reference to a method for forming the same device. It should be noted that the device is independent from the method. In other words, the device provided in embodiments of the present disclosure may be formed with other methods, and the method provided in embodiments of the present disclosure is not limited to obtain the device disclosed in the embodiments.
- FIG. 6 schematically illustrates a flow chart of a method for forming an optical component according to one embodiment of the present disclosure.
- a substrate is provided.
- the substrate may be made of any suitable material, including but not limited to, glass, metal, polymer or semiconductor.
- the substrate may have any suitable shape, such as a flat surface, a curved surface, etc.
- a first antireflection layer is formed.
- the first antireflection layer includes a packing medium and a particle array including a plurality of particles.
- the packing medium fills at least in part voids formed between the plurality of particles.
- An optical component 100 shown in FIG. 1 may be formed by using the method shown in FIG. 6.
- the optical component 100 includes a substrate 120 and a first antireflection layer 140 formed thereon.
- the first antireflection layer 140 includes a particle array including a plurality of particles 142, and a packing medium 144 which fills voids formed between the plurality of particles 142 in part.
- the packing medium 144 includes a plurality of nanoparticles, each of which has a diameter significantly less than that of the particles 142. That is, the first antireflection layer 140 has a heterogeneous particle structure.
- the first antireflection layer 140 having a heterogeneous particle structure has properties of both antireflection and contamination resistance. That is, there is no need to coat a contamination-resistant layer on the antireflection layer, which may avoid potential degradation of antireflection effect caused by the contamination-resistant layer.
- the phenomenon mentioned above may be interpreted as follows.
- the particle array formed by large-size particles 142 has a suitable roughness, which makes the heterogeneous particle structure have the capability of resisting contamination.
- the small-size nanoparticles 144 can avoid a sudden change of the refractive index at the interface between the heterogeneous particle structure and the substrate, which makes the heterogeneous particle structure have the antireflective property.
- the refractive index of the first antireflection layer 140 changes gradually from the top surface of the nanoparticles 144 to the interface between the heterogeneous particle structure and the substrate 120. Otherwise, if there are no nanoparticles 144, the refractive index may change sharply at the interface between the particles 142 and the substrate 120.
- particle array is intended to refer to a single-layer array including the plurality of particles 142.
- an array having a local multi-layer structure such as a double layer which may appear due to limited experiment condition, also belongs to the scope of the term “particle array” disclosed herein.
- the arrangement of the plurality of particles 142 may be ordered or disordered.
- the plurality of particles 142 may include, but not limited to, silicon oxide, titanium oxide, aluminum oxide or zirconium oxide.
- the plurality of particles 142 may have a shape of sphere, regular dodecahedron, triacontahedron or irregular polyhedron, or have any other suitable shape.
- the size of the particles 142 may be selected according to the thickness of the conventional single-layer antireflection layer, such as a magnesium fluoride layer, a porous silicon oxide layer.
- the particles 142 When the plurality of particles 142 are microspheres which are configured closely and voids formed between the plurality of particles is filled with the plurality of nanoparticles 144, the particles 142 may have a diameter substantially equal to the thickness of the single-layer antireflection layer. When the plurality of particles 142 are microspheres which are configured closely and the degree of filling for the voids formed between the plurality of particles exceeds 90%, the particles 142 may have a radius substantially equal to the thickness of the single-layer antireflection layer.
- the antireflection layer having a heterogeneous particle structure provided in embodiments of this disclosure may have properties of both antireflection and contamination resistance. In some embodiments, the particles 142 may have a diameter ranging from about 80nm to about 250nm.
- the first antireflection layer 140 described in the embodiments of this disclosure has a heterogeneous particle structure, which is provided with properties of both antireflection and contamination resistance.
- the term "voids formed between the plurality of particles”, as used herein, is intended to refer to spaces between the plurality of particles which may have a height no greater than that of the particles, such as 80%, 70%, 60%, 50% height of the particles.
- the plurality of nanoparticles 144 exceed the voids formed between the plurality of particles, it may cause degradation of antireflection effect of the antireflection layer.
- the nanoparticles 144 fill the voids to a height of about 50% of the height of the particles 142, which may achieve a satisfactory effect of antireflection and contamination resistance.
- a first suspension liquid which includes silica microspheres having a diameter ranging from 80nm to 250nm.
- silica microspheres having a diameter of lOOnm may be dispersed in ethanol, so as to obtain a suspension liquid wherein a mass ratio of the silica microspheres to the suspension liquid is about 1%.
- the first suspension liquid is coated on the substrate 120 and the substrate 120 coated with the first suspension liquid is dried.
- Spinning coating, dip coating, spraying coating, or other suitable methods may be used to coat the substrate 120 with the first suspension liquid.
- a second suspension liquid which includes silica microspheres having a diameter ranging from 7nm to 12nm.
- silica microspheres having a diameter ranging from lOnm to 12nm may be dispersed in ethanol, so as to obtain a suspension liquid wherein a mass ratio of the silica microspheres to the suspension liquid is about 0.5%.
- the second suspension liquid is coated on the substrate 120 and the substrate 120 coated with the second suspension liquid is dried.
- Spinning coating, dip coating, spraying coating, or other suitable methods may be used to coat the substrate 120 with the second suspension liquid.
- the process S200 may further include, such as, annealing the substrate for two hours at a temperature of about 480°C after coating the substrate with the second suspension liquid, so as to enhance mechanical strength of the first antireflection layer 140.
- the packing medium may be formed by Chemical Vapor Deposition (CVD), or formed through dipping and sintering.
- the optical component 100 may be formed according to the method shown in FIG. 9: providing a glass substrate, using silica microspheres having a diameter of about lOOnm as the particles 142, and using silica microspheres having a diameter ranging from about lOnm to about 12nm as the nanoparticles 144 which fill the voids formed between the plurality of particles 142 to a height about 50% of the height of the particles 142.
- Transmission spectra of the optical component 100 are shown in FIG. 11, which are illustrated by a full line labeled C910 and a dotted line labeled C920, respectively.
- the full line C910 denotes a transmission spectrum of the optical component 100 obtained after the optical component 100 has just been formed.
- the dotted line C920 denotes a transmission spectrum of the optical component 100 which has been placed on a housetop at an angle of 45° for two days.
- transmission spectra of a bare glass before and after being placed on a housetop at an angle of 45° for two days are also provided, which are marked with a full line labeled C930 and a dotted line labeled C940, respectively.
- the Y axis represents light transmittance (as a percent)
- the X axis represents wavelength (in nanometers).
- the light transmittance of the optical component 100 having the first antireflection layer 140 is substantially increased compared with that of the bare glass and changes very little after the optical component 100 having the first antireflection layer 140 is placed on the housetop for two days. While the maximum value of the light transmittance of the bare glass changes from 91.8% to 91.3%, after it is placed on the housetop for two days. That is, the first antireflection layer 140 have properties of both antireflection and contamination resistance.
- FIG. 7 schematically illustrates a method for forming an optical component according to another embodiment of the present disclosure. Compared with the embodiments shown in FIG. 6, a process S300 is added between the processes SI 00 and S200 in the embodiment shown in FIG. 7.
- a second antireflection layer is formed, which may be a conventional antireflection layer, or may be developed after the present application is filed.
- the second antireflection layer may include, but not limited to, a porous silicon oxide layer, a magnesium fluoride layer, a mesoporous silicon oxide particles layer, or a film with moth-eye structure.
- An optical component 200 shown in FIG. 2 may be formed with the method shown in FIG. 7.
- the optical component 200 may further include a second antireflection layer 160 formed between the substrate 120 and the first antireflection layer 140.
- the first antireflection layer 140 having a heterogeneous particle structure on the second antireflection layer 160 not only the contamination-resistant property can be achieved, but also the antireflection effect of the second antireflection layer 160 may not be affected substantially, which thereby may overcome or alleviate the problem of degradation of antireflection effect which may be caused by other contamination-resistant layers.
- a suspension liquid including silica microspheres is provided.
- silica microspheres having a diameter ranging from lOnm to 20nm may be dispersed in water to obtain a suspension liquid wherein a mass ratio of the silica microspheres to the suspension liquid is about 25%.
- the suspension liquid is then diluted with ethanol to have a mass ratio of about 0.5%.
- the substrate is drawn out of the suspension liquid.
- the substrate may be drawn out of the suspension liquid at a speed of 3mm/s.
- the process S300 may be performed to form the suitable second antireflection layer 160 with any suitable method.
- a magnesium fluoride layer may be formed with Magnetron Sputter Plating.
- optical component 200 provided in embodiments of the present disclosure will be described hereinafter.
- the second antireflection layer 160 is formed according to the method shown in FIG. 8. Specifically, a glass substrate is provided. Silica microspheres having a diameter ranging from lOnm to 20nm are dispersed in water to obtain a suspension liquid having a mass ratio of about 25%. The suspension liquid is then diluted with ethanol to have a mass ratio of about 0.5%. The glass substrate is dipped into the diluted suspension liquid. Then the glass substrate is drawn out of the suspension liquid and is dried in air. Then, the first antireflection layer 140 is formed according to the method shown in FIG. 9.
- silica microspheres having a diameter of about lOOnm are used as the particles 142
- silica microspheres having a diameter ranging from lOnm to 12nm are used as the nanoparticles 144 which fill the voids formed between the plurality of particles 142 to a height of about 50% of the height of the particles 142.
- the optical component 200 obtained in this way may have a transmission spectrum illustrated by a curved line labeled C110 shown in FIG. 12.
- a curved line C120 denotes a transmission spectrum of a bare glass (which is illustrated by a thumbnail image on the upper right);
- a curved line labeled C130 denotes a transmission spectrum of an optical component having a second antireflection layer 160, but without a first antireflection layer 140 (which is illustrated by a thumbnail image on the lower left);
- a curved line labeled CI 40 denotes a transmission spectrum of an optical component having a second antireflection layer 160, and a first antireflection layer 140 which has a plurality of large-size particles 142, but has no nanoparticles 144 (which is illustrated by a thumbnail image on the lower right).
- the Y axis represents light transmittance (as a percent)
- the X axis represents wavelength (in nanometers).
- the antireflection effect of the optical component 200 (corresponding to the curved line labeled CI 10) is not substantially degraded. Instead, the antireflection effect is improved in the wavelength range of 400nm to 2000nm, which makes the optical component 200 advantageous in applications on a photoelectric device which works in the wavelength range of 400nm to 2000nm.
- the optical component 200 (corresponding to the curved line labeled CI 10) has better antireflection effect over the whole wavelength range.
- FIG. 10 schematically illustrates the process S200 shown in FIG. 6 or FIG. 7 according to another embodiment of the present disclosure.
- the process S200 may further include S250: annealing the substrate to make the silica microspheres in a molten state.
- An optical component 300 shown in FIG. 3 may be obtained according to the method illustrated in FIG. 10.
- a packing medium 344 of a first antireflection layer 340 of the optical component 300 fills at least 90% of the voids formed between the plurality of particles 142, and the plurality of particles 142 together with the packing medium 344 are integrated as a whole.
- the first antireflection layer 340 has properties of both antireflection and contamination resistance.
- the first antireflection layer 340 may further prevent water or impurities from entering thereinto.
- the packing medium 344 may be formed with, but not limited to, the method shown in FIG. 10.
- the packing medium 344 may be formed by Chemical Vapor Deposition (CVD), Physical Vapor Deposition (PVD), dipping and sintering, or any other suitable method.
- FIG. 4 schematically illustrates a cross-sectional view of an optical component 400 according to one embodiment of the present disclosure.
- a packing medium 444 may include one or more selected from porous silicon oxide, porous titanium oxide, porous aluminum oxide and porous zirconium oxide. Similar to the first antireflection layer 140, a first antireflection layer 440 of the optical component 400 has the properties of both antireflection and contamination resistance as well.
- the first antireflection layer 440 may be formed with any appropriate method.
- tetraethoxysilane (TEOS) collosol and silica particles 142 may be mixed, and the substrate 120 may be coated with the mixture by spin coating. Then a heat treatment may be performed on the substrate to obtain the first antireflection layer 440, where the packing medium 444 includes porous silicon oxide.
- TEOS tetraethoxysilane
- FIG. 5 schematically illustrates a cross-sectional view of an optical component 500 according to one embodiment of the present disclosure.
- the optical component 500 includes a transparent compact layer 580, which is disposed between the first antireflection layer 440 and the substrate 120.
- the transparent compact layer 580 may include one or more materials selected from a group consisting of silicon oxide, titanium oxide, aluminum oxide and zirconium oxide.
- the transparent compact layer 580 may prevent outward diffusion of alkali metal ions or alkali earth metal ions from the substrate 120.
- the transparent compact layer 580 can be combined with other embodiments of the disclosure.
- the transparent compact layer 580 may be provided between the first antireflection layer 140 and the substrate 120 of the optical component 100, or provided between the second antireflection layer 160 and the substrate 120 of the optical component 200, or provided between the first antireflection layer 340 and the substrate 120 of the optical component 300.
- silica microspheres are taken as an example to illustrate the particles 142 and the nanoparticles 144. It should be noted that the particles 142 and the nanoparticles 144 may include titanium oxide microspheres, aluminum oxide microspheres or zirconium oxide microspheres.
- the particles 142 may include a material same as or different from that of the nanoparticles 144.
- the particles 142 may include one or more kinds of materials, and the nanoparticles 144 may also include one or more kinds of materials.
- the particles 142 and the nanoparticles 144 may have a shape of sphere, but not limited thereto. In some embodiments, the particles 142 and the nanoparticles 144 may have a shape of regular dodecahedron or triacontahedron, or irregular polyhedron, or any other suitable shape.
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- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Surface Treatment Of Optical Elements (AREA)
- Optical Elements Other Than Lenses (AREA)
Abstract
Description
Claims
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2012206537967U CN202948938U (en) | 2012-11-30 | 2012-11-30 | Optical component and photovoltaic device |
| PCT/CN2013/087746 WO2014082550A1 (en) | 2012-11-30 | 2013-11-25 | Optical component and photovoltaic device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| EP2926378A1 true EP2926378A1 (en) | 2015-10-07 |
| EP2926378A4 EP2926378A4 (en) | 2016-07-27 |
Family
ID=48424626
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP13857890.1A Withdrawn EP2926378A4 (en) | 2012-11-30 | 2013-11-25 | OPTICAL COMPONENT AND PHOTOVOLTAIC DEVICE |
Country Status (3)
| Country | Link |
|---|---|
| EP (1) | EP2926378A4 (en) |
| CN (1) | CN202948938U (en) |
| WO (1) | WO2014082550A1 (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103048706B (en) * | 2012-11-30 | 2016-09-14 | 法国圣戈班玻璃公司 | Optical module and manufacture method, photovoltaic device |
| CN202948938U (en) * | 2012-11-30 | 2013-05-22 | 法国圣戈班玻璃公司 | Optical component and photovoltaic device |
| CN113113497B (en) * | 2021-04-13 | 2023-01-24 | 河南大学 | Solar cell using organic synergist and preparation method thereof |
| WO2025153429A1 (en) * | 2024-01-19 | 2025-07-24 | Swiss Pv Ag | Composition and method for manufacturing a glazing unit using the same |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4267741B2 (en) * | 1999-03-09 | 2009-05-27 | 富士フイルム株式会社 | Anti-glare antireflection film and image display device |
| JP2001177130A (en) * | 1999-12-16 | 2001-06-29 | Kanegafuchi Chem Ind Co Ltd | Solar cell module |
| JP2002182006A (en) * | 2000-12-19 | 2002-06-26 | Nippon Sheet Glass Co Ltd | Antireflection film, base material and photoelectric conversion device including the same |
| EP1759428B1 (en) * | 2004-06-14 | 2016-05-18 | Philips Intellectual Property & Standards GmbH | Led with improved light emission profile |
| JP5063926B2 (en) * | 2006-04-20 | 2012-10-31 | 株式会社カネカ | Method for producing antireflection substrate |
| JP5536977B2 (en) * | 2007-03-30 | 2014-07-02 | パナソニック株式会社 | Surface emitter |
| TW200913287A (en) * | 2007-09-13 | 2009-03-16 | Delta Electronics Inc | Solar cell and manufacturing method thereof |
| CN101431111A (en) * | 2007-11-08 | 2009-05-13 | 和椿科技股份有限公司 | dye-sensitized solar cell |
| DE112010002848B4 (en) * | 2009-07-08 | 2016-02-04 | Mitsubishi Electric Corp. | Coating agent for a solar cell module and method for producing the solar cell module |
| GB201014024D0 (en) * | 2010-08-20 | 2010-10-06 | Oxford Energy Technologies Ltd | Optical coating |
| CN202948938U (en) * | 2012-11-30 | 2013-05-22 | 法国圣戈班玻璃公司 | Optical component and photovoltaic device |
-
2012
- 2012-11-30 CN CN2012206537967U patent/CN202948938U/en not_active Expired - Fee Related
-
2013
- 2013-11-25 EP EP13857890.1A patent/EP2926378A4/en not_active Withdrawn
- 2013-11-25 WO PCT/CN2013/087746 patent/WO2014082550A1/en not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| CN202948938U (en) | 2013-05-22 |
| EP2926378A4 (en) | 2016-07-27 |
| WO2014082550A1 (en) | 2014-06-05 |
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