EP1842095A4 - Adaptive scanning optical microscope - Google Patents

Adaptive scanning optical microscope

Info

Publication number
EP1842095A4
EP1842095A4 EP05855789A EP05855789A EP1842095A4 EP 1842095 A4 EP1842095 A4 EP 1842095A4 EP 05855789 A EP05855789 A EP 05855789A EP 05855789 A EP05855789 A EP 05855789A EP 1842095 A4 EP1842095 A4 EP 1842095A4
Authority
EP
European Patent Office
Prior art keywords
optical microscope
scanning optical
adaptive scanning
adaptive
microscope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP05855789A
Other languages
German (de)
French (fr)
Other versions
EP1842095A2 (en
Inventor
Benjamin Michael Potsaid
Yves Bellouard
John T Wen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rensselaer Polytechnic Institute
Original Assignee
Rensselaer Polytechnic Institute
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rensselaer Polytechnic Institute filed Critical Rensselaer Polytechnic Institute
Publication of EP1842095A2 publication Critical patent/EP1842095A2/en
Publication of EP1842095A4 publication Critical patent/EP1842095A4/en
Withdrawn legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/36Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365Control or image processing arrangements for digital or video microscopes
    • G02B21/367Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/06Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the phase of light
EP05855789A 2005-01-27 2005-12-29 Adaptive scanning optical microscope Withdrawn EP1842095A4 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US64757205P 2005-01-27 2005-01-27
PCT/US2005/047287 WO2006081031A2 (en) 2005-01-27 2005-12-29 Adaptive scanning optical microscope

Publications (2)

Publication Number Publication Date
EP1842095A2 EP1842095A2 (en) 2007-10-10
EP1842095A4 true EP1842095A4 (en) 2010-08-04

Family

ID=36740940

Family Applications (1)

Application Number Title Priority Date Filing Date
EP05855789A Withdrawn EP1842095A4 (en) 2005-01-27 2005-12-29 Adaptive scanning optical microscope

Country Status (5)

Country Link
EP (1) EP1842095A4 (en)
JP (1) JP2008529082A (en)
CN (1) CN100585449C (en)
IL (1) IL183131A0 (en)
WO (1) WO2006081031A2 (en)

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US7556378B1 (en) 2003-04-10 2009-07-07 Tsontcho Ianchulev Intraoperative estimation of intraocular lens power
EP2444021B8 (en) 2004-04-20 2018-04-18 Alcon Research, Ltd. Integrated surgical microscope and wavefront sensor
DE102006010767B4 (en) 2006-03-08 2008-04-17 Carl Zeiss Surgical Gmbh microscopy system
US8333474B2 (en) 2007-10-19 2012-12-18 Wavetec Vision Systems, Inc. Optical instrument alignment system
US7594729B2 (en) 2007-10-31 2009-09-29 Wf Systems, Llc Wavefront sensor
US8550624B2 (en) 2008-11-06 2013-10-08 Wavetec Vision Systems, Inc. Optical angular measurement system for ophthalmic applications and method for positioning of a toric intraocular lens with increased accuracy
US8876290B2 (en) 2009-07-06 2014-11-04 Wavetec Vision Systems, Inc. Objective quality metric for ocular wavefront measurements
ES2653970T3 (en) 2009-07-14 2018-02-09 Wavetec Vision Systems, Inc. Determination of the effective position of the lens of an intraocular lens using aphakic refractive power
WO2011008609A1 (en) 2009-07-14 2011-01-20 Wavetec Vision Systems, Inc. Ophthalmic surgery measurement system
CN102686972B (en) 2009-09-18 2015-04-08 卡尔蔡司Smt有限责任公司 Method of measuring a shape of an optical surface and interferometric measuring device
JP2011095685A (en) * 2009-11-02 2011-05-12 Sony Corp Microscope system and method for controlling the microscope system
JP5744450B2 (en) * 2009-11-17 2015-07-08 キヤノン株式会社 Imaging apparatus and control method thereof
DE102012101778A1 (en) * 2012-03-02 2013-09-05 Leica Microsystems Cms Gmbh Scanning microscopic method and scanning microscope
JP5814855B2 (en) * 2012-04-27 2015-11-17 株式会社日立ハイテクノロジーズ Charged particle beam adjustment support apparatus and method
US9072462B2 (en) 2012-09-27 2015-07-07 Wavetec Vision Systems, Inc. Geometric optical power measurement device
TWI490542B (en) * 2013-05-07 2015-07-01 Univ Nat Taiwan A scanning lens and an interference measuring device using the scanning lens
DE102014005880A1 (en) 2014-04-17 2015-11-05 Carl Zeiss Ag Scanning microscope with simplified optics, in particular with variable pupil position
DE102014112199A1 (en) * 2014-08-26 2016-03-03 Carl Zeiss Microscopy Gmbh Microscopic imaging system
DE102014113908A1 (en) * 2014-09-25 2016-03-31 Carl Zeiss Ag Laser scanning system
DE102014017001A1 (en) * 2014-11-12 2016-05-12 Carl Zeiss Ag Microscope with low distortion error
CN104460007B (en) * 2014-12-30 2017-02-01 哈尔滨工业大学 Laser tripled-frequency space intensity shaping method
CN108351301B (en) 2015-09-02 2021-03-09 英思克斯公司 System and method for color imaging
CN105242397B (en) * 2015-09-30 2017-10-27 深圳大学 A kind of relevant adaptive optics aberration correction system
CN108474736B (en) * 2015-11-05 2022-01-25 英思克斯公司 System and method for optogenetic imaging
CN106092518B (en) * 2016-06-06 2017-09-05 北京理工大学 Unlimited and finite conjugate differential detection seeks burnt photoelectricity as analyzer and its method
CN105910799B (en) * 2016-06-06 2017-06-06 北京理工大学 Unlimited and finite conjugate seeks burnt light electric image analyzer and its method
CN106199751B (en) * 2016-07-08 2019-03-01 中国科学院电子学研究所 The automatically controlled beam scanning optical link of Terahertz
CN106680984B (en) * 2016-12-16 2019-06-11 大连光耀辉科技有限公司 A kind of laser binary channels output equipment and microscope simultaneously
CN106773024A (en) * 2017-03-30 2017-05-31 中国检验认证集团检验有限公司 A kind of change enlargement ratio optical image technology based on distorting lens
CN107063092B (en) * 2017-06-05 2019-02-05 北京理工大学 A kind of coaxial calibration system of double light sources that big visual field quickly scans and method of adjustment
CN112782844B (en) * 2021-01-12 2023-03-31 中国科学院光电技术研究所 Stable closed-loop control method for adaptive optical system

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10038622A1 (en) * 2000-08-03 2002-02-21 Leica Microsystems Scanning microscope, optical arrangement and method for image acquisition in scanning microscopy
US20020044332A1 (en) * 2000-10-04 2002-04-18 Johann Engelhardt Optical arrangement, and method for the deflection of light beams
WO2004025331A2 (en) * 2002-09-16 2004-03-25 Rensselaer Polytechnic Institute Microscope with extended field of vision
US20040184163A1 (en) * 2003-02-13 2004-09-23 Olympus Corporation Optical apparatus

Family Cites Families (7)

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TW538256B (en) * 2000-01-14 2003-06-21 Zeiss Stiftung Microlithographic reduction projection catadioptric objective
JP2004514943A (en) * 2000-11-28 2004-05-20 カール・ツアイス・エスエムテイ・アーゲー Catadioptric projection system for 157nm lithography
JP2003057553A (en) * 2001-08-09 2003-02-26 Olympus Optical Co Ltd Confocal scanning type microscope
AU2003245458A1 (en) * 2002-06-12 2003-12-31 Advanced Research And Technology Institute, Inc. Method and apparatus for improving both lateral and axial resolution in ophthalmoscopy
US7339148B2 (en) * 2002-12-16 2008-03-04 Olympus America Inc. Confocal microscope
JP2004198492A (en) * 2002-12-16 2004-07-15 Olympus Corp Fluorescence microscope
US7057806B2 (en) * 2003-05-09 2006-06-06 3M Innovative Properties Company Scanning laser microscope with wavefront sensor

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10038622A1 (en) * 2000-08-03 2002-02-21 Leica Microsystems Scanning microscope, optical arrangement and method for image acquisition in scanning microscopy
US20020044332A1 (en) * 2000-10-04 2002-04-18 Johann Engelhardt Optical arrangement, and method for the deflection of light beams
WO2004025331A2 (en) * 2002-09-16 2004-03-25 Rensselaer Polytechnic Institute Microscope with extended field of vision
US20040184163A1 (en) * 2003-02-13 2004-09-23 Olympus Corporation Optical apparatus

Also Published As

Publication number Publication date
EP1842095A2 (en) 2007-10-10
WO2006081031A3 (en) 2007-03-01
CN100585449C (en) 2010-01-27
JP2008529082A (en) 2008-07-31
CN101116023A (en) 2008-01-30
WO2006081031A2 (en) 2006-08-03
IL183131A0 (en) 2007-09-20

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Legal Events

Date Code Title Description
PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

Free format text: ORIGINAL CODE: 0009012

17P Request for examination filed

Effective date: 20070515

AK Designated contracting states

Kind code of ref document: A2

Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU LV MC NL PL PT RO SE SI SK TR

RIN1 Information on inventor provided before grant (corrected)

Inventor name: BELLOUARD, YVES

Inventor name: POTSAID, BENJAMIN, MICHAEL

Inventor name: WEN, JOHN, T.

DAX Request for extension of the european patent (deleted)
A4 Supplementary search report drawn up and despatched

Effective date: 20100702

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWN

18D Application deemed to be withdrawn

Effective date: 20110201