EP1573769A1 - Microelectromechanical rf switch - Google Patents
Microelectromechanical rf switchInfo
- Publication number
- EP1573769A1 EP1573769A1 EP03814029A EP03814029A EP1573769A1 EP 1573769 A1 EP1573769 A1 EP 1573769A1 EP 03814029 A EP03814029 A EP 03814029A EP 03814029 A EP03814029 A EP 03814029A EP 1573769 A1 EP1573769 A1 EP 1573769A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- arms
- arm
- mems switch
- conductor
- bridge
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004020 conductor Substances 0.000 claims abstract description 40
- 239000000758 substrate Substances 0.000 claims abstract description 17
- 238000004519 manufacturing process Methods 0.000 claims description 7
- 239000003351 stiffener Substances 0.000 claims description 5
- 239000010409 thin film Substances 0.000 claims description 2
- 238000000034 method Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 239000012212 insulator Substances 0.000 description 2
- 239000002904 solvent Substances 0.000 description 2
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000012811 non-conductive material Substances 0.000 description 1
- 230000001902 propagating effect Effects 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H59/00—Electrostatic relays; Electro-adhesion relays
- H01H59/0009—Electrostatic relays; Electro-adhesion relays making use of micromechanics
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H1/00—Contacts
- H01H1/0036—Switches making use of microelectromechanical systems [MEMS]
- H01H2001/0089—Providing protection of elements to be released by etching of sacrificial element; Avoiding stiction problems, e.g. of movable element to substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H59/00—Electrostatic relays; Electro-adhesion relays
- H01H59/0009—Electrostatic relays; Electro-adhesion relays making use of micromechanics
- H01H2059/0018—Special provisions for avoiding charge trapping, e.g. insulation layer between actuating electrodes being permanently polarised by charge trapping so that actuating or release voltage is altered
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H59/00—Electrostatic relays; Electro-adhesion relays
- H01H59/0009—Electrostatic relays; Electro-adhesion relays making use of micromechanics
- H01H2059/0036—Movable armature with higher resonant frequency for faster switching
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01H—ELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
- H01H59/00—Electrostatic relays; Electro-adhesion relays
- H01H59/0009—Electrostatic relays; Electro-adhesion relays making use of micromechanics
- H01H2059/0072—Electrostatic relays; Electro-adhesion relays making use of micromechanics with stoppers or protrusions for maintaining a gap, reducing the contact area or for preventing stiction between the movable and the fixed electrode in the attracted position
Definitions
- the invention in general relates to miniature switches, and more particularly, to a MEMS switch useful in radar and other microwave applications.
- MEMS microelectromechanical systems
- These MEMS switches are popular insofar as they can have a relatively high off impedance, with a low off capacitance, and a relatively low on impedance, with a high on capacitance, leading to desirable high cutoff frequencies and wide bandwidth operation. Additionally, the MEMS switches have a small footprint, can operate at high RF voltages and are compatible with conventional integrated circuit fabrication techniques.
- Electrostatic elements such as opposed electrodes, which are attracted to one another upon application of a DC pull down control voltage.
- At least one of these DC pull down electrodes is on a substrate and an opposing electrode is defined on the underside of a moveable bridge above the substrate.
- the bridge Upon application of the DC pull down control voltage, the bridge is deflected down and the electrical impedance is severely reduced (either by capacitive coupling or by direct ohmic contact), between first and second spaced apart RF conductors on the substrate.
- the particular bridge design creates asymmetric transverse and longitudinal vibration modes during operation. Switching between on and off states moves the bridge and excites vibration modes, which can lead to undesirable electrical impedance modulation. This impedance modulation is further increased with bridge designs that are laterally asymmetric, causing twisting modes to occur.
- the bridge may be fabricated from different layers. Internal stresses in the bridge's arms can cause the bridge arms to curl and thereby stiffen. This stiffening due to stress- induced curling can increase the pull down voltage requirement by more than 100%. This is undesirable from an integrated circuit operating point of view.
- MEMS switch which reduces or eliminates the undesired asymmetric transverse and longitudinal vibration modes in the bridge structure. It is a further object to eliminate the sticking problem in a capacitive type MEMS switch produced by charge built up in the dielectric.
- a MEMS switch which includes a substrate member with first and second spaced-apart RF conductors deposited on the substrate.
- a bridge member having at least three radially disposed arms of equal length is connected to a support arrangement on the substrate, with each arm having one end connected to the support arrangement and a second end integral with a common central bridge portion having an undersurface. At least one of the arms is electrically connected to the second conductor.
- the first conductor has an end portion facing the undersurface of the central bridge portion, with the end portion of the first conductor being constructed and arranged to define an open area.
- a pull down electrode is disposed within the open area of the first conductor and is electrically isolated from the conductor. The height of the pull down electrode is less than that of the end portion.
- the central bridge portion is drawn toward the first conductor upon application of a control voltage to the pull down electrode, to vary the electrical impedance between the first and second conductors.
- the impedance is varied from a high value (off state) to a low value (on state) relative to the impedance of the conductors, thus allowing a signal to propagate between the first and second conductors.
- Fig. 1 is a plan view of a MEMS switch in accordance with one embodiment of the present invention.
- Fig. 2 is a view along line 2-2 of Fig. 1.
- Fig. 3 is an isometric exploded view of the switch of
- Fig. 4 is a partial view of an arm of a prior art
- Fig. 5 is a partial view of one of the arms of the bridge of the switch of Fig. 1.
- the improved MEMS switch 10 includes first and second spaced apart RF conductors 12 and 13, typically 50 ohm microstrips for carrying and propagating microwave signals, and deposited on a substrate 14 (generally over an oxide or other insulator).
- Typical substrates include gallium arsenide, silicon, alumina or sapphire, by way of example.
- Switch 10 includes a bridge member 16 having at least three radially symmetrically disposed arms 18a, 18b, and 18c of equal length. For a three arm embodiment as illustrated, the arms would be 120° apart. Each arm includes a respective first, or distal end, 20a, 20b, and 20c, as well as a respective second, or proximate end, 21a, 21b and 21c, with these second ends being integral with a common central bridge portion 22.
- This bridge design reduces twisting and radially asymmetrical vibration modes.
- each of the first ends 20a is identical to each of the first ends 20a.
- Support arrangement 26 extends, by way of example, in a generally "C" shaped orientation, from end 20c to end 20b so as to support the bridge 16 over substrate 14, with common central bridge portion 22 being positioned over an end 30 of first conductor 12.
- the support arrangement 26 includes an opening 32, for a purpose to be described hereinafter.
- Conductive bridge segments may be added, electrically connecting arm 18c with arm 18a via segment 34, and electrically connecting arm 18b with arm 18a via segment 35. If the support arrangement 26 is of a non-conductive material, a conductive segment 36 is added to complete the electrical connection with second conductor 13. It is to be noted that the added current path length through segment 34 or 35 is small relative to the wavelength of the microwave signal being switched.
- a generally C-shaped support arrangement is illustrated by way of example, other arrangements are possible.
- support segments could extend linearly between the distal ends of the arms, instead of curving.
- the support arrangement could be comprised of individual support posts, one under each of the distal ends of the bridge arms. In the latter case, segments 34 and 35 would be eliminated.
- Fig. 4 illustrates a segment of a typical prior art bridge arm 40.
- Bridge fabrication and/ or a multilayer structure produces stresses in the metal arm 40 and may cause the arm to curl, as indicated by the curl radius R, and thus stiffen to an objectionable degree. Controlling the internal stresses is difficult and the stiffening due to stress-induced curling can significantly increase the pull down voltage required for on/ off switch operation. It may be shown that the degree of arm stiffening is directly related to the moment of inertia of the arm, and that curling increases this moment of inertia.
- the present invention substantially reduces the effects of arm (and therefore, bridge) stiffening due to stress, and to this end reference is additionally made to Fig. 5 which illustrates a sectional view of a portion of arm 18a, exemplary of all three arms.
- the arm 18a includes a longitudinal slot 42a which lies along an axis A and extends generally from the support 26 to the common central bridge portion 22. If curling of the arm occurs, the provision of slot 42a significantly reduces the effect of curling-induced stiffening, thus allowing for reduced pull down voltage requirements.
- end portion 30 of first conductor 12 is constructed and arranged to define an open area 56. Disposed within the open area 56 is a pull down electrode 58 of a height less than that of the end portion 30 and is electrically insulated from conductor 12.
- a pad 60 to which the pull down voltage is applied, is connected to the pull down electrode 58 via a thin film resistor 62 which passes through the opening 32 in support 26 and through an opening 64 in end portion 30.
- the resistor 62 is intended to essentially eliminate loading on the microwave signals and should be of a relatively high impedance value with respect to the 50 ohm conductor impedance. If desired, the switch may be fabricated such that resistor 62 tunnels under support 26 and end portion 30, thus eliminating openings 32 and 64.
- the switch 10 is a capacitive type MEMS switch, then a dielectric layer 66 is deposited over the end portion 30, but not over the open area 56.
- a pull down voltage is applied to pull down electrode 58 there is an electrostatic attraction with the undersurface 70 of the common central bridge portion 22 drawing it down to make contact with the dielectric layer 66, acting as a mechanical stop.
- a capacitive electrical connection is made between the first and second conductors 12 and 13.
- the switch is of the ohmic type, then no dielectric layer is present and the common central bridge portion 22 makes direct ohmic contact with the end 30 to complete an ohmic electrical connection between the first and second conductors 12 and 13.
- Typical MEMS switches are generally made utilizing conventional well-known integrated circuit fabrication techniques. During the switch fabrication process, certain solvents are used to remove unwanted material. Surface tension effects, as a result of the solvents, can force the arms 18a, 18b and 18c toward the substrate 14 to a degree where the elastic limit of the arms may be exceeded, thereby causing permanent deformation. To obviate this possibility, switch 10 is fabricated to include bumpers 74 positioned below respective arms 18a, 18b and 18c to limit downward travel of the arms during the fabrication process.
Landscapes
- Micromachines (AREA)
- Electron Tubes For Measurement (AREA)
- Push-Button Switches (AREA)
Abstract
Description
Claims
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US321562 | 2002-12-18 | ||
| US10/321,562 US6639494B1 (en) | 2002-12-18 | 2002-12-18 | Microelectromechanical RF switch |
| PCT/US2003/040013 WO2004059679A1 (en) | 2002-12-18 | 2003-12-17 | Microelectromechanical rf switch |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| EP1573769A1 true EP1573769A1 (en) | 2005-09-14 |
| EP1573769B1 EP1573769B1 (en) | 2007-02-14 |
Family
ID=29250422
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP03814029A Expired - Lifetime EP1573769B1 (en) | 2002-12-18 | 2003-12-17 | Microelectromechanical rf switch |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US6639494B1 (en) |
| EP (1) | EP1573769B1 (en) |
| JP (1) | JP2006511060A (en) |
| AT (1) | ATE354171T1 (en) |
| AU (1) | AU2003300964A1 (en) |
| DE (1) | DE60311873T2 (en) |
| WO (1) | WO2004059679A1 (en) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7042308B2 (en) * | 2004-06-29 | 2006-05-09 | Intel Corporation | Mechanism to prevent self-actuation in a microelectromechanical switch |
| US20060055281A1 (en) * | 2004-09-16 | 2006-03-16 | Com Dev Ltd. | Microelectromechanical electrostatic actuator assembly |
| KR100661349B1 (en) | 2004-12-17 | 2006-12-27 | 삼성전자주식회사 | MEMS switch and its manufacturing method |
| CN101213631B (en) | 2005-05-02 | 2012-03-28 | 爱普科斯公司 | Capacitive rf-mems device and its manufacture method |
| US8354901B1 (en) * | 2009-02-20 | 2013-01-15 | Rf Micro Devices, Inc. | Thermally tolerant anchor configuration for a circular cantilever |
| US8570122B1 (en) | 2009-05-13 | 2013-10-29 | Rf Micro Devices, Inc. | Thermally compensating dieletric anchors for microstructure devices |
| FR3027448B1 (en) * | 2014-10-21 | 2016-10-28 | Airmems | ROBUST MICROELECTROMECHANICAL SWITCH |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE4205340C1 (en) * | 1992-02-21 | 1993-08-05 | Siemens Ag, 8000 Muenchen, De | Micro-mechanical electrostatic relay with parallel electrodes - has frame shaped armature substrate with armature contacts above base electrode contacts on base substrate |
| US6100477A (en) * | 1998-07-17 | 2000-08-08 | Texas Instruments Incorporated | Recessed etch RF micro-electro-mechanical switch |
| US6384353B1 (en) * | 2000-02-01 | 2002-05-07 | Motorola, Inc. | Micro-electromechanical system device |
| US6657525B1 (en) * | 2002-05-31 | 2003-12-02 | Northrop Grumman Corporation | Microelectromechanical RF switch |
-
2002
- 2002-12-18 US US10/321,562 patent/US6639494B1/en not_active Expired - Lifetime
-
2003
- 2003-12-17 WO PCT/US2003/040013 patent/WO2004059679A1/en not_active Ceased
- 2003-12-17 AU AU2003300964A patent/AU2003300964A1/en not_active Abandoned
- 2003-12-17 DE DE60311873T patent/DE60311873T2/en not_active Expired - Lifetime
- 2003-12-17 AT AT03814029T patent/ATE354171T1/en not_active IP Right Cessation
- 2003-12-17 JP JP2004563601A patent/JP2006511060A/en active Pending
- 2003-12-17 EP EP03814029A patent/EP1573769B1/en not_active Expired - Lifetime
Non-Patent Citations (1)
| Title |
|---|
| See references of WO2004059679A1 * |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2004059679A1 (en) | 2004-07-15 |
| EP1573769B1 (en) | 2007-02-14 |
| DE60311873D1 (en) | 2007-03-29 |
| DE60311873T2 (en) | 2008-01-17 |
| JP2006511060A (en) | 2006-03-30 |
| AU2003300964A1 (en) | 2004-07-22 |
| US6639494B1 (en) | 2003-10-28 |
| ATE354171T1 (en) | 2007-03-15 |
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