EP1305990A1 - Systeme de pipette a vide - Google Patents
Systeme de pipette a videInfo
- Publication number
- EP1305990A1 EP1305990A1 EP01913588A EP01913588A EP1305990A1 EP 1305990 A1 EP1305990 A1 EP 1305990A1 EP 01913588 A EP01913588 A EP 01913588A EP 01913588 A EP01913588 A EP 01913588A EP 1305990 A1 EP1305990 A1 EP 1305990A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- channel
- vacuum pipette
- suction
- vacuum
- filter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/04—Mounting of components, e.g. of leadless components
- H05K13/0404—Pick-and-place heads or apparatus, e.g. with jaws
- H05K13/0408—Incorporating a pick-up tool
- H05K13/0409—Sucking devices
Definitions
- the invention relates to a vacuum pipette system with a vacuum pipette for sucking electrical components, which can be arranged on a shank on.
- a vacuum pipette is known from W098 / 333698, which has a central vacuum channel which opens into a suction opening on the front.
- the vacuum pipette has a filter grille at the suction opening.
- Such a filter grid can prevent small and smallest components from being sucked into the suction channel, but solder particles and dust are sucked into the suction channel unhindered.
- Vacuum pipette systems are used, for example, in automatic placement machines for electrical components. Such placement machines often work in a continuous operating mode with short downtimes, as a result of which dust and deposits can form inside the placement machine. However, dust, solder tin particles and other impurities cannot be retained with a filter grid arranged in the vacuum pipette. When using conventional filters in the suction path, the vacuum interrogation required in vacuum pipette systems can be disturbed by a reduction in the passage cross section.
- Contaminants sucked into the vacuum pipette system such as solder particles or dust, lead to a reduction in the passage cross section in the suction path. In this way, evaluation errors can be caused when carrying out a vacuum query.
- the object of the invention is to provide a vacuum pipette system with improved functional reliability.
- a vacuum pipette system is created with a vacuum pipette that can be connected to a suction channel for the suction of electrical components, a particle filter being arranged in the suction channel and the particle filter having a larger cross section than the suction channel.
- the particle filter preferably has a first channel facing the vacuum pipette and a second channel facing away from the vacuum pipette, the first channel and the second channel being connected to one another, and the first channel and the second channel being arranged in such a way that the air flow in the transition region experiences at least one deflection between the first channel and the second channel.
- Particle traps spaced tangentially from the air flow can be arranged in the deflection area.
- the first channel can be arranged concentrically to the second channel, the first channel having a smaller diameter than the second channel, and an inner body with a filter grid being arranged in the transition region.
- the second channel can also be arranged concentrically with the first channel, the first channel having a larger diameter than the second channel, and an inner body with a filter grid being arranged in the transition region.
- the first channel and the second channel can also be arranged axially offset, it being possible for a filter grid to be arranged in the transition region.
- the first channel has a suction opening which faces the vacuum pipette and which is larger in cross section than the suction channel, the first channel extending in the axial direction of the suction channel and being delimited by a wall in the transition region, and that Filter grille is formed from a plurality of wing-like lamellae which are distributed in the first channel around the suction channel and which extend from the wall to the suction opening and are closed by a bottom at the end facing the vacuum pipette, the openings being formed by between the lamellae Columns are formed, and the particle traps are formed in the wall of the first channel facing away from the vacuum pipette in the axial direction.
- the first channel can extend in the axial direction of the suction channel and can be delimited by a wall in the transition region.
- the inner body can be cylindrical and protrude from the wall and the filter grid can be formed by openings formed in the lateral surface of the inner body.
- the inner body can be closed by a bottom at the end facing the vacuum pipette.
- the openings can be rectangular and extend in the axial direction of the suction channel.
- the particle filter can have an external thread on the second channel and can be screwed into an internal thread of a receiving shaft by means of the external thread, through which the suction channel runs. Furthermore, the external thread can have a slight oversize, as a result of which the threaded connection of the particle filter is sealed and clamped with the receiving shaft.
- a vacuum pipette system which has a particle filter, by means of which the filtering of the smallest components, solder particles, dust and other contaminants from the sucked-in suction air is possible without reducing the passage cross section of the suction channel, so that disturbances in the vacuum interrogation are avoided.
- a particle filter has depressions which are spaced tangentially from the flow of air through the particle filter, so that contaminants such as the smallest components, dust and solder particles can be deposited therein, so that they are used with the vacuum pipette system Vacuum generating devices are protected from damage and contamination.
- FIG. 1 shows a longitudinal section in the axial direction through a vacuum pipette system according to a first preferred embodiment of the invention
- FIG. 2 shows a schematic view of a particle filter according to a second preferred embodiment according to the invention
- 3 shows a schematic view of a particle filter according to a third preferred embodiment according to the invention
- Figure 4 is a schematic view of a particle filter according to a fourth preferred embodiment of the invention.
- FIG. 1 shows the schematic structure of a vacuum pipette system according to a first preferred embodiment of the invention.
- a vacuum pipette 150 is attached to the end of a cylindrical shaft of a placement head of an automatic placement machine, which is not shown in more detail.
- the vacuum pipette 150 has a suction opening 151, from which electrical components can be sucked.
- the vacuum pipette system according to the first preferred embodiment according to the invention further has a receiving shaft 152 in which a suction channel 153 is formed.
- An internal thread 157 is formed in the suction channel 153 at the end of the receiving shaft 152 facing the vacuum pipette.
- a particle filter 100 has a first channel 110 and a second channel 120 and can be screwed into the internal thread 157 of the receiving shaft 152 with an external thread 107 formed on its housing 101.
- the first channel 110 has a suction opening 102 which faces the vacuum pipette.
- the filter grid is formed from a plurality of wing-like lamellae distributed in the first channel 110 around the suction channel 153. It extends from the boundary wall into the first channel 110 to the suction opening 102 and is closed by a bottom 104 at the end facing the vacuum pipette 150.
- the suction air generated by the vacuum can flow through the openings 103, which are formed by gaps provided between the lamellae with a small gap width.
- the openings 103 are designed to extend in the axial direction of the filter 100. The width of the openings 103 is less than the smallest thickness of the smallest components to be assembled.
- Particle traps 140 are formed on the bottom of the suction opening 102 of the filter 100 facing away from the vacuum pipette 150. In these particle traps 140, contaminants such as dust, solder particles and other particles are stored during the operation of the vacuum pipette system. The particle traps 140 in the bottom of the suction opening 102 are spaced radially from the suction channel 153.
- the receiving shaft 152 of the vacuum pipette system is connected to a vacuum generation system.
- the suction duct 153 can be acted upon by vacuum by means of the vacuum generation system.
- the suction air sucked in through the suction opening 151 of the vacuum pipette 150 flows into the filter 100 through the suction opening 102 if the suction channel 153 is subjected to vacuum.
- the direction of flow is essentially along the axial direction of the filter 100.
- the direction of flow of the sucked-in suction air goes from an essentially axial direction to an essentially radial direction of filter 100 through openings 103.
- the direction of flow of the suction air changes from the substantially radial direction to a substantially axial direction and the suction air flows in this axial direction to the outlet opening 105 of the second channel 120 and into the suction channel 153.
- particles entrained in the suction air are deflected at an angle relative to their original axial direction of movement. With increasing density of the entrained particles, they are therefore deflected less and less, so that they tangle tial move away from the flow and collect in the particle traps 140, which are formed radially spaced from the suction channel 153.
- the outlet opening 105 corresponds at least to that of the suction channel 153 in its passage cross section.
- the suction opening 102 has a larger diameter than the outlet opening 105.
- the passage cross section of the openings 103 is larger than that of the suction channel 153. Therefore, the filter 100 does not influence a vacuum interrogation to be carried out in the case of vacuum pipette systems, which improves the functional reliability of the vacuum pipette system.
- the particle filter can also be designed in a different way in order to achieve the desired filter effect. Particle filters of this type are explained below with reference to FIGS. 2 to 4.
- a particle filter 200 has a first channel 210 and a second channel 220.
- the first channel 210 is arranged facing the vacuum pipette 150.
- the second channel 220 is connected to the suction channel 153, via which vacuum can be applied to the particle filter.
- the air flow S is also shown schematically.
- the air flowing into the particle filter 200 from the vacuum pipette enters the first channel 210. Due to the axial offset between the first channel 210 and the second channel 220, which is connected to the first channel, the air flowing through the particle filter 200 is deflected in the transition region from the first duct 210 into the second duct 220. A particle trap 240 is formed near the deflection point, from which those particles are picked up which, owing to their density, cannot follow the deflection of the air flow into the second channel.
- the particle trap 240 can be tangentially spaced from the central flow course through the first channel 210 and the second channel 220.
- other locations for the arrangement or formation of the particle trap 240 are also possible, for example offset axially to the flow profile or spaced in the axial direction of the flow direction of the air flow entering the first duct 210 and laterally offset to the flow direction of the air flow in the second duct 220.
- the particle filter 300 according to the third preferred embodiment has a first channel 310 and a second channel 320, which is connected to the first channel 310.
- the first channel 310 is arranged in the vacuum pipette system facing the vacuum pipette 150.
- the second channel 320 is arranged facing the suction channel 153 and can be subjected to a vacuum.
- the transition region between the first channel and the second channel is formed by an inner body with passage openings 330, which is closed by a bottom at its end facing the vacuum pipette 150.
- the inner body is cylindrical and projects from the second channel 320 into the first channel 310.
- the air flows from the first duct 310 through the through openings 330 in the outer surface of the inner body into the second duct 320, which is arranged concentrically to the first duct and has a smaller diameter than the first duct 310.
- the particle filter 300 flowing air flow S a deflection, similar to that indicated in Figure 3 by the dashed lines.
- At least one particle trap 340 can be arranged in the particle filter 300.
- the particle trap 340 can be arranged or formed at different locations in the particle filter 300. For example, as can be seen from FIG. 3, in the transition region between the first channel 310 and the second channel 320, it is formed radially offset from the inner body in a wall delimiting the first channel 310. All particles, which due to their density cannot follow the deflection of the air flow in the transition area between the first duct 310 and the second duct 320, are picked up by the particle trap 340.
- the particle filter 400 shown in FIG. 4 according to the fourth preferred embodiment of the invention is configured similarly to that according to the third preferred embodiment except for the following deviations.
- the first channel 410 is arranged concentrically to the second channel 420 and has a smaller diameter than the second channel 420.
- the inner body with passage openings 430 is arranged in the second channel and is cylindrical, for example.
- the particle trap 440 is formed in the inner body near the passage openings 430.
- the inner body is closed with a bottom at its end facing away from the vacuum pipette 150.
- the passage cross section of the particle filters 200, 300 and 400 is larger from the cross section of the suction channel 153. Therefore, the vacuum interrogation is not disturbed, so that reliable operation of the vacuum pipette system according to the invention is possible.
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Sampling And Sample Adjustment (AREA)
Abstract
L'invention concerne un système de pipette à vide comprenant une pipette à vide (150) conçue pour aspirer des composants électriques, laquelle pipette peut être agencée sur une tige de réception (152). Selon ladite invention, cette tige de réception (152) renferme un canal d'aspiration (153), dans lequel un filtre à particules (100) est équipé d'une grille de filtration dont la section de passage est supérieure au canal d'aspiration (153).
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10037725A DE10037725A1 (de) | 2000-08-02 | 2000-08-02 | Vakuum-Pipettensystem |
DE10037725 | 2000-08-02 | ||
PCT/DE2001/000473 WO2002011508A1 (fr) | 2000-08-02 | 2001-02-07 | Systeme de pipette a vide |
Publications (1)
Publication Number | Publication Date |
---|---|
EP1305990A1 true EP1305990A1 (fr) | 2003-05-02 |
Family
ID=7651111
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP01913588A Withdrawn EP1305990A1 (fr) | 2000-08-02 | 2001-02-07 | Systeme de pipette a vide |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP1305990A1 (fr) |
DE (1) | DE10037725A1 (fr) |
WO (1) | WO2002011508A1 (fr) |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02170600A (ja) * | 1988-12-23 | 1990-07-02 | Toshiba Corp | 電子部品吸着ノズル |
WO1998033369A1 (fr) * | 1997-01-28 | 1998-07-30 | Siemens Aktiengesellschaft | Pipette a depression pour saisir par aspiration des composants electriques |
JP3660459B2 (ja) * | 1997-02-28 | 2005-06-15 | 株式会社日立ハイテクインスツルメンツ | 電子部品の装着ヘッドおよびこれを備えた電子部品装着装置 |
DE50013094D1 (de) * | 1999-11-09 | 2006-08-10 | Siemens Ag | Vakuumpipette zum ansaugen von elektrischen bauelementen |
-
2000
- 2000-08-02 DE DE10037725A patent/DE10037725A1/de not_active Withdrawn
-
2001
- 2001-02-07 EP EP01913588A patent/EP1305990A1/fr not_active Withdrawn
- 2001-02-07 WO PCT/DE2001/000473 patent/WO2002011508A1/fr not_active Application Discontinuation
Non-Patent Citations (1)
Title |
---|
See references of WO0211508A1 * |
Also Published As
Publication number | Publication date |
---|---|
WO2002011508A1 (fr) | 2002-02-07 |
DE10037725A1 (de) | 2002-02-21 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
17P | Request for examination filed |
Effective date: 20021104 |
|
AK | Designated contracting states |
Designated state(s): AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR |
|
RBV | Designated contracting states (corrected) |
Designated state(s): CH DE FR GB IT LI NL |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWN |
|
18D | Application deemed to be withdrawn |
Effective date: 20060901 |