EP1224478A4 - Circuit d'interface de transducteur servant a evaluer une capacite et presentant de nombreuses possibilites de configuration - Google Patents

Circuit d'interface de transducteur servant a evaluer une capacite et presentant de nombreuses possibilites de configuration

Info

Publication number
EP1224478A4
EP1224478A4 EP00982671A EP00982671A EP1224478A4 EP 1224478 A4 EP1224478 A4 EP 1224478A4 EP 00982671 A EP00982671 A EP 00982671A EP 00982671 A EP00982671 A EP 00982671A EP 1224478 A4 EP1224478 A4 EP 1224478A4
Authority
EP
European Patent Office
Prior art keywords
interface circuit
capacitive transducer
highly configurable
transducer interface
configurable capacitive
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP00982671A
Other languages
German (de)
English (en)
Other versions
EP1224478A1 (fr
Inventor
Ying Hsu
Christ Saunders
Kirk Su
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Microsensors Inc
Original Assignee
Microsensors Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Microsensors Inc filed Critical Microsensors Inc
Publication of EP1224478A1 publication Critical patent/EP1224478A1/fr
Publication of EP1224478A4 publication Critical patent/EP1224478A4/fr
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605—Measuring capacitance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G01R19/2506—Arrangements for conditioning or analysing measured signals, e.g. for indicating peak values ; Details concerning sampling, digitizing or waveform capturing

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Fluid Pressure (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)
  • Amplifiers (AREA)
EP00982671A 1999-10-15 2000-10-16 Circuit d'interface de transducteur servant a evaluer une capacite et presentant de nombreuses possibilites de configuration Withdrawn EP1224478A4 (fr)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US15983299P 1999-10-15 1999-10-15
US159832P 1999-10-15
PCT/US2000/041207 WO2001031351A1 (fr) 1999-10-15 2000-10-16 Circuit d'interface de transducteur servant a evaluer une capacite et presentant de nombreuses possibilites de configuration

Publications (2)

Publication Number Publication Date
EP1224478A1 EP1224478A1 (fr) 2002-07-24
EP1224478A4 true EP1224478A4 (fr) 2004-05-19

Family

ID=22574257

Family Applications (1)

Application Number Title Priority Date Filing Date
EP00982671A Withdrawn EP1224478A4 (fr) 1999-10-15 2000-10-16 Circuit d'interface de transducteur servant a evaluer une capacite et presentant de nombreuses possibilites de configuration

Country Status (3)

Country Link
EP (1) EP1224478A4 (fr)
JP (1) JP4870889B2 (fr)
WO (1) WO2001031351A1 (fr)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005140657A (ja) * 2003-11-07 2005-06-02 Denso Corp 静電容量型センサの容量変化検出回路
EP1548409A1 (fr) * 2003-12-23 2005-06-29 Dialog Semiconductor GmbH Mesure de capacité différentielle
US7368923B2 (en) * 2005-12-22 2008-05-06 Honeywell International Inc. Time interval trimmed differential capacitance sensor
GB0605717D0 (en) 2006-03-21 2006-05-03 Univ Sussex Electric potential sensor
EP2177880A1 (fr) * 2008-10-16 2010-04-21 Dialog Imaging Systems GmbH Mesure de la distance à l'aide d'un capteur capacitif
DE102009026496B4 (de) 2009-05-27 2022-04-28 Robert Bosch Gmbh Kompensationskapazität für einen kapazitiven Sensor
EP2653846A1 (fr) * 2012-04-18 2013-10-23 Nxp B.V. Circuit de capteur et procédé d'étalonnage
EP2653845B1 (fr) 2012-04-18 2015-07-15 Nxp B.V. Circuit de capteur et procédé d'étalonnage
US9228979B2 (en) * 2012-06-01 2016-01-05 Smiths Detection-Watford Limited Capacitive transimpedance amplifier with offset

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0972757A (ja) * 1995-09-01 1997-03-18 Murata Mfg Co Ltd 微少容量検出回路
EP0816818A2 (fr) * 1996-06-26 1998-01-07 Siemens Aktiengesellschaft Capteur de mesure capacitive et circuit de sélection

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3682598D1 (de) * 1985-02-13 1992-01-09 Philips Nv Elektrischer filter.
US5557267A (en) * 1993-04-23 1996-09-17 Ade Corporation Apparatus and methods for measurement system calibration
US5537109A (en) * 1993-05-28 1996-07-16 General Scanning, Inc. Capacitive transducing with feedback
JP3216955B2 (ja) * 1994-05-31 2001-10-09 株式会社日立製作所 容量式センサ装置
JPH08327392A (ja) * 1995-05-30 1996-12-13 Seikosha Co Ltd 静電容量型センサ
US5670887A (en) * 1996-04-17 1997-09-23 Mitutoyo Corporation Method and apparatus for fast sampling in capacitive position transducers

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0972757A (ja) * 1995-09-01 1997-03-18 Murata Mfg Co Ltd 微少容量検出回路
EP0816818A2 (fr) * 1996-06-26 1998-01-07 Siemens Aktiengesellschaft Capteur de mesure capacitive et circuit de sélection

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
PATENT ABSTRACTS OF JAPAN vol. 1997, no. 07 31 July 1997 (1997-07-31) *
See also references of WO0131351A1 *

Also Published As

Publication number Publication date
EP1224478A1 (fr) 2002-07-24
JP4870889B2 (ja) 2012-02-08
JP2004500557A (ja) 2004-01-08
WO2001031351A1 (fr) 2001-05-03

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