EP1218915A4 - Systems and methods for high performance scanning - Google Patents
Systems and methods for high performance scanningInfo
- Publication number
- EP1218915A4 EP1218915A4 EP99964213A EP99964213A EP1218915A4 EP 1218915 A4 EP1218915 A4 EP 1218915A4 EP 99964213 A EP99964213 A EP 99964213A EP 99964213 A EP99964213 A EP 99964213A EP 1218915 A4 EP1218915 A4 EP 1218915A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- systems
- methods
- high performance
- performance scanning
- scanning
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/008—Details of detection or image processing, including general computer control
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0036—Scanning details, e.g. scanning stages
- G02B21/0048—Scanning details, e.g. scanning stages scanning mirrors, e.g. rotating or galvanomirrors, MEMS mirrors
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/008—Details of detection or image processing, including general computer control
- G02B21/0084—Details of detection or image processing, including general computer control time-scale detection, e.g. strobed, ultra-fast, heterodyne detection
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/24—Base structure
- G02B21/26—Stages; Adjusting means therefor
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- General Engineering & Computer Science (AREA)
- Microscoopes, Condenser (AREA)
- Mechanical Optical Scanning Systems (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US383986 | 1999-08-26 | ||
US09/383,986 US6545264B1 (en) | 1998-10-30 | 1999-08-26 | Systems and methods for high performance scanning |
PCT/US1999/029351 WO2001015193A1 (en) | 1999-08-26 | 1999-12-10 | Systems and methods for high performance scanning |
Publications (2)
Publication Number | Publication Date |
---|---|
EP1218915A1 EP1218915A1 (en) | 2002-07-03 |
EP1218915A4 true EP1218915A4 (en) | 2002-10-09 |
Family
ID=23515571
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP99964213A Withdrawn EP1218915A4 (en) | 1999-08-26 | 1999-12-10 | Systems and methods for high performance scanning |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP1218915A4 (en) |
JP (1) | JP2003507777A (en) |
WO (1) | WO2001015193A1 (en) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CH697814B1 (en) * | 2001-01-26 | 2009-02-27 | Tecan Trading Ag | Optical system and method for exciting and measuring fluorescence on or in samples treated with fluorescent dyes. |
DE10148188A1 (en) * | 2001-09-28 | 2003-04-17 | Leica Mikroskopie & Syst | Microscope with contrast-enhancing image recording device |
DE10152609A1 (en) * | 2001-10-25 | 2003-05-08 | Max Planck Gesellschaft | Optical microscope has an adjustable objective so a sample can be viewed from different incidence angles by use of an adjustment device that varies the objective and beam guidance optics positions |
DE102004058565B4 (en) * | 2004-10-18 | 2022-04-21 | Leica Microsystems Cms Gmbh | scanning microscope |
JP4905139B2 (en) * | 2007-01-11 | 2012-03-28 | 株式会社ニコン | Scanning laser microscope |
US7863831B2 (en) | 2008-06-12 | 2011-01-04 | 3M Innovative Properties Company | AC illumination apparatus with amplitude partitioning |
DE102010007729A1 (en) | 2010-02-12 | 2011-08-18 | Leica Microsystems CMS GmbH, 35578 | Device for scanning an object, method for operating the device and scanning microscope |
CN104597590B (en) * | 2014-12-30 | 2018-02-02 | 深圳先进技术研究院 | A kind of super-resolution fluorescence light spectrum image-forming microscope |
CN113074917A (en) * | 2021-04-01 | 2021-07-06 | 南京信息工程大学 | Micro-nano structure characteristic parameter measuring method and device based on Bessel beam defocusing scanning |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3013467A (en) * | 1957-11-07 | 1961-12-19 | Minsky Marvin | Microscopy apparatus |
US5260569A (en) * | 1991-07-25 | 1993-11-09 | Fuji Photo Film Co., Ltd. | Scanning microscope and scanning mechanism |
US5459325A (en) * | 1994-07-19 | 1995-10-17 | Molecular Dynamics, Inc. | High-speed fluorescence scanner |
WO2000026935A2 (en) * | 1998-10-30 | 2000-05-11 | Affymetrix, Inc. | Systems and methods for high performance scanning |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5631734A (en) * | 1994-02-10 | 1997-05-20 | Affymetrix, Inc. | Method and apparatus for detection of fluorescently labeled materials |
EP0902885A4 (en) * | 1996-05-16 | 2006-09-27 | Affymetrix Inc | Systems and methods for detection of labeled materials |
US5880465A (en) * | 1996-05-31 | 1999-03-09 | Kovex Corporation | Scanning confocal microscope with oscillating objective lens |
-
1999
- 1999-12-10 JP JP2001519460A patent/JP2003507777A/en active Pending
- 1999-12-10 WO PCT/US1999/029351 patent/WO2001015193A1/en not_active Application Discontinuation
- 1999-12-10 EP EP99964213A patent/EP1218915A4/en not_active Withdrawn
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3013467A (en) * | 1957-11-07 | 1961-12-19 | Minsky Marvin | Microscopy apparatus |
US5260569A (en) * | 1991-07-25 | 1993-11-09 | Fuji Photo Film Co., Ltd. | Scanning microscope and scanning mechanism |
US5459325A (en) * | 1994-07-19 | 1995-10-17 | Molecular Dynamics, Inc. | High-speed fluorescence scanner |
WO2000026935A2 (en) * | 1998-10-30 | 2000-05-11 | Affymetrix, Inc. | Systems and methods for high performance scanning |
Non-Patent Citations (1)
Title |
---|
See also references of WO0115193A1 * |
Also Published As
Publication number | Publication date |
---|---|
JP2003507777A (en) | 2003-02-25 |
WO2001015193A1 (en) | 2001-03-01 |
EP1218915A1 (en) | 2002-07-03 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
17P | Request for examination filed |
Effective date: 20020304 |
|
AK | Designated contracting states |
Kind code of ref document: A1 Designated state(s): AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE |
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AX | Request for extension of the european patent |
Free format text: AL;LT;LV;MK;RO;SI |
|
A4 | Supplementary search report drawn up and despatched |
Effective date: 20020827 |
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AK | Designated contracting states |
Kind code of ref document: A4 Designated state(s): AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE |
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RIC1 | Information provided on ipc code assigned before grant |
Free format text: 7H 01J 3/14 A, 7G 02B 21/26 B, 7G 02B 21/00 B |
|
17Q | First examination report despatched |
Effective date: 20041026 |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWN |
|
18D | Application deemed to be withdrawn |
Effective date: 20050308 |