EP0830683A1 - Clocked sense amplifier with positive source feedback - Google Patents
Clocked sense amplifier with positive source feedbackInfo
- Publication number
- EP0830683A1 EP0830683A1 EP97906538A EP97906538A EP0830683A1 EP 0830683 A1 EP0830683 A1 EP 0830683A1 EP 97906538 A EP97906538 A EP 97906538A EP 97906538 A EP97906538 A EP 97906538A EP 0830683 A1 EP0830683 A1 EP 0830683A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- pair
- gain elements
- input
- input gain
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
- G11C7/065—Differential amplifiers of latching type
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
- G11C7/062—Differential amplifiers of non-latching type, e.g. comparators, long-tailed pairs
Definitions
- This invention relates to differential amplifiers, and more particularly to differential amplifiers with high common-mode rejection and rapid signal response.
- Computer memory circuits commonly include long interconnects with many loads distributed along the length of the interconnect.
- high density circuit arrangements on integrated circuit chips contribute significant noise signals that must be discriminated from desirable data signals. Accordingly, it is desirable to provide a sense amplifier for data signals that is capable of operating in high noise environment to drive large distributed loads.
- the illustrated embodiment of the present invention includes a clock- latched differential amplifier circuit including field-effect transistors or other gain elements connected to provide positive feedback at the source electrodes of the differential amplifier stage.
- the illustrated embodiment provides rapid signal response to applied differential signals and high common-mode noise rejection, and also controls latching of data in an output stage in response to the levels of signals on the source electrodes of the differential amplifier circuit.
- Figure 1 is a schematic diagram of the clocked sense amplifier with positive source feedback and a latched load
- Figures 2a)-2j) are graphs showing signal waveforms present on circuit nodes during operation of the sense amplifier of Figure 1.
- NMOS transistors 9 and 11 that have gate electrodes, or gates, connected to receive BIT and BIT input signals from long-length conductors 7, 8, and each with source and drain electrodes, or source and drain, forming the circuit nodes 12-15.
- Complementary pairs of PMOS transistors 17, 19 and NMOS transistors 21, 23 having opposite conduction characteristics per pair have their gates commonly connected to receive signals from cross-connected sources of the differential pair of transistors 9, 11, and also have the common connection of each of the serial pairs 17, 19 and 21, 23 connected to the circuit nodes 13, 15.
- This cross-coupling forms positive feedback between the transistors 9 and 11 when selectively enabled via activation to conduction of NMOS transistor 25.
- the amplifier circuit of NMOS transistors 9, 11 thus operates in one mode as a differential sense amplifier, and in another mode as a latch.
- the sense amplifier 9, 11 functions as a conventional current- mode differential amplifier when the enable input 27 is active and NMOS transistor 25 thus acts as a current source for approximately half of the current flowing in each of the transistors 9, 11 that form the differential input pair, with excellent capability to respond to small differential input voltages on the bit lines 7, 8.
- the nodes 12, 14 are initially equalized and charged to the voltage Vcc applied through PMOS transistors 29, 31, and 33 when enabled on input 27.
- nodes 13 and 15 are equalized (but not charged to Vcc) via transistor 35 when enabled on input 27, and are also charged to a voltage substantially equal to Vcc less the threshold voltage drop of approximately 1 volt across either or both transistors 9, 11.
- the differential pair of transistors 9, 11 are connected and biased operate as a conventional differential amplifier while input 27 is enabled.
- the BIT and BIT conductors 7, 8 may be precharged and equalized by a pre-charge circuit 10, for example, connected similarly to transistors 29, 31 and 33 operating on a clock input 20. If the BIT input discharges (and BIT remains energized), then the voltage level of node 12 drops more quickly than the voltage level at node 14 while enable input 27 is disabled. Thus, the voltage of node 14 charges up through the cross-coupled, positive-feedback via transistors 17, 19, 21 and 23, and this effectively turns off transistor 9. Therefore, all of the current flows through transistor 11 of the differential pair of transistors 9, 11 causing the voltage level on node 12 to drop more rapidly and further accelerating the switching of the differential input pair of transistors 9 and 11. Such cross-coupled positive feedback also improves noise rejection during operation in this mode as a differential sense amplifier.
- the differential pair of input transistors 9, 11 also operates in the latch mode to control data latching in response to the voltage differences at nodes 12 and 14 while input 27 is disabled.
- the data latch is formed by the complementary pairs of NMOS and PMOS transistors 41, 43 and 45, 47 that have source and drain paths serially connected (in opposite orientations) between the Vcc voltage supply and each of the nodes 12 and 14.
- the gates of each complementary pair of the transistors 41, 43 and 45, 47 are connected together and to the common serial junction of the other pair of transistors as the DATA and DATA signal channels.
- This data latch 41, 43 45, 47 thus functions in conventional manner in response to the voltage differences appearing on nodes 12 and 14 in response to differential BIT and BIT signals applied to the gates of the differential input transistors 9 and 11.
- the transistors 29, 31, 33 and 35 are connected as described above to equalize and precharge the nodes 12-15 in response to an ENable signal at input 27, and transistor 25 serves as a current source for the input transistors operating as a differential sense amplifier in response to the ENable signal at input 27.
- FIG. 2a)-2j there is shown a chart of waveforms present over time during operation of the circuit of Figure 1. Specifically, the operating time intervals are shown designated as previous sensing cycle and precharge 50, followed in time by BIT and BIT discharge cycle 52, followed in time in recurring manner by another sensing cycle 54.
- Figure 2a represents a clock waveform 10
- Figure 2d represents the ENable signal 27 delayed slightly from the clock signal 10 attributable, for example, to the clock waveform 10 passing through a latch with associated delay to produce the ENable signal 27.
- the BIT and BIT conductors 7, 8 charge up to a common voltage substantially at Vcc during precharge 50, and then during the discharge cycle 52 begin to discharge at different rates to produce a potential difference at the beginning of the sense cycle 54.
- ENable signal 27 of Figure 2d goes high after the BIT and BIT discharge cycle 52, the sense amplifier 9, 11 is enabled to sense the differential voltage 51 on the BIT and BIT conductors 7, 8.
- the voltages on the circuit nodes 12 and 14 are at substantially the same voltage level during the discharge cycle 52, while the voltages on the circuit nodes 13 and 15 (in Figures 2f and 2h) during the discharge cycle 52 are substantially equal at about the voltage Vcc less the drop of about 1 volt across one or both of the input transistors 9, 11.
- These input transistors are thus enabled to sense the differential voltage on BIT and BIT conductors 7, 8 (in Figures 2b, 2c) when the ENable signal 27 (in Figure 2d) is again activated.
- the input transistors 9, 11 sense the differential input voltages on BIT and BIT conductors 7, 8, amplify the differential voltage during operation initially as a differential sense amplifier at the beginning of cycle 54, and then respond through the positive feedback provided by transistors 17, 19, 21, 23 to latch at least one transistor (e.g., transistor 11, as shown (in Figures 2e and 2f) with substantially common voltages on nodes 12 and 13. Voltage levels on Data and DATA conductors (in Figures 2i and 2j) thus split and are latched rapidly in the sense cycle 54 (and in the successive sensing and precharge cycle, a sample of which is shown in interval 50).
- the amplifier circuit is reset and precharged thereafter in response to the cyclic enable and disable logic levels of the ENable signal 27, in the manner as previously described. Therefore, the sense amplifier of the present invention operates as a conventional differential amplifier and includes positive feedback to rapidly initiate latching operation with associated excellent noise rejection.
Abstract
A differential sense amplifier includes positive feedback cross coupling to control operation in one mode as a differential sense amplifier and in another mode as a latch to control a data-latching load. Circuit nodes are precharged and equalized in response to applied enable signal.
Description
CLOCKED SENSE AMPLIFIER WITH POSITIVE SOURCE FEEDBACK
Cross-References to Related Applications The subject matter of this application is related to the subject matter of the following applications: application serial number , attorney docket number 2268, entitled
"ASYNCHRONOUS PACKET SWITCHING" filed on February 22, 1996, by Thomas M. Wicki, Patrick J. Helland, Takeshi Shimizu, Wolf-Dietrich Weber, and Winfried W. Wilcke; application serial number , attorney docket number 2269, entitled
"SYSTEM AND METHOD FOR DYNAMIC NETWORK TOPOLOGY EXPLORATION" filed on February 22, 1996, by Thomas M. Wicki, Patrick }. Helland, Wolf-Dietrich Weber, and Winfried W. Wilcke; application serial number , attorney docket number 2270, entitled
"LOW LATENCY, HIGH CLOCK FREQUENCY PLESIO ASYNCHRONOUS PACKET- BASED CROSSBAR SWITCHING CHIP SYSTEM AND METHOD" filed on February 22, 1996, by Thomas M. Wicki, Jeffrey D. Larson, Albert Mu, and Raghu Sastry; application serial number , attorney docket number 2271, entitled "METHOD AND APPARATUS FOR COORDINAΗNG ACCESS TO AN OUTPUT OF A ROUTING DEVICE IN A PACKET SWITCHING NETWORK" filed on February 22, 1996, by Jeffrey D. Larson, Albert Mu, and Thomas M. Wicki; application serial number , attorney docket number 2272, entitled
"CROSSBAR SWITCH AND METHOD WITH REDUCED VOLTAGE SWING AND NO INTERNAL BLOCKING DATA PATH" filed on February 22, 1996, by Albert Mu and Jeffrey D. Larson; application serial number , attorney docket number 2274, entitled
"A FLOW CONTROL PROTOCOL SYSTEM AND METHOD" filed on February 22, 1996, by Thomas M. Wicki, Patrick J. Helland, Jeffrey D. Larson, Albert Mu, and Raghu Sastry; and Richard L. Schober, Jr.; application serial number , attorney docket number 2275, entitled
"INTERCONNECT FAULT DETECTION AND LOCALIZATION METHOD AND APPARATUS" filed on February 22, 1996, by Raghu Sastry, Jeffrey D. Larson, Albert Mu, John R. Slice, Richard L. Schober, Jr. and Thomas M. Wicki; application serial number , attorney docket number 2277, entitled,
"METHOD AND APPARATUS FOR DETECTION OF ERRORS IN MULTIPLE-WORD COMMUNICATIONS" filed on February 22, 1996, by Thomas M. Wicki, Patrick J. Helland and Takeshi Shimizu;
all of the above applications are incorporated herein by reference in their entirety.
Field of the Invention
This invention relates to differential amplifiers, and more particularly to differential amplifiers with high common-mode rejection and rapid signal response.
Background of the Invention
Computer memory circuits commonly include long interconnects with many loads distributed along the length of the interconnect. In addition, high density circuit arrangements on integrated circuit chips contribute significant noise signals that must be discriminated from desirable data signals. Accordingly, it is desirable to provide a sense amplifier for data signals that is capable of operating in high noise environment to drive large distributed loads.
Summary of the Invention
The illustrated embodiment of the present invention includes a clock- latched differential amplifier circuit including field-effect transistors or other gain elements connected to provide positive feedback at the source electrodes of the differential amplifier stage. The illustrated embodiment provides rapid signal response to applied differential signals and high common-mode noise rejection, and also controls latching of data in an output stage in response to the levels of signals on the source electrodes of the differential amplifier circuit.
Description of the Drawing
Figure 1 is a schematic diagram of the clocked sense amplifier with positive source feedback and a latched load; and
Figures 2a)-2j) are graphs showing signal waveforms present on circuit nodes during operation of the sense amplifier of Figure 1.
Detailed Description of the Preferred Embodiment
Referring now to Figure 1, there is shown a pair of NMOS transistors 9 and 11 that have gate electrodes, or gates, connected to receive BIT and BIT input signals from long-length conductors 7, 8, and each with source and drain electrodes, or source and drain, forming the circuit nodes 12-15. Complementary pairs of PMOS transistors 17, 19 and NMOS transistors 21, 23 having opposite conduction characteristics per pair have their gates commonly connected to receive signals from
cross-connected sources of the differential pair of transistors 9, 11, and also have the common connection of each of the serial pairs 17, 19 and 21, 23 connected to the circuit nodes 13, 15. This cross-coupling forms positive feedback between the transistors 9 and 11 when selectively enabled via activation to conduction of NMOS transistor 25. The amplifier circuit of NMOS transistors 9, 11 thus operates in one mode as a differential sense amplifier, and in another mode as a latch.
Initially, the sense amplifier 9, 11 functions as a conventional current- mode differential amplifier when the enable input 27 is active and NMOS transistor 25 thus acts as a current source for approximately half of the current flowing in each of the transistors 9, 11 that form the differential input pair, with excellent capability to respond to small differential input voltages on the bit lines 7, 8. In this mode, the nodes 12, 14 are initially equalized and charged to the voltage Vcc applied through PMOS transistors 29, 31, and 33 when enabled on input 27. Also, nodes 13 and 15 are equalized (but not charged to Vcc) via transistor 35 when enabled on input 27, and are also charged to a voltage substantially equal to Vcc less the threshold voltage drop of approximately 1 volt across either or both transistors 9, 11. Thus, the differential pair of transistors 9, 11 are connected and biased operate as a conventional differential amplifier while input 27 is enabled.
The BIT and BIT conductors 7, 8 may be precharged and equalized by a pre-charge circuit 10, for example, connected similarly to transistors 29, 31 and 33 operating on a clock input 20. If the BIT input discharges (and BIT remains energized), then the voltage level of node 12 drops more quickly than the voltage level at node 14 while enable input 27 is disabled. Thus, the voltage of node 14 charges up through the cross-coupled, positive-feedback via transistors 17, 19, 21 and 23, and this effectively turns off transistor 9. Therefore, all of the current flows through transistor 11 of the differential pair of transistors 9, 11 causing the voltage level on node 12 to drop more rapidly and further accelerating the switching of the differential input pair of transistors 9 and 11. Such cross-coupled positive feedback also improves noise rejection during operation in this mode as a differential sense amplifier.
With the sense amplifier thus latched by operation of the cross-coupled positive feedback provided by transistors 17, 19, 21, 23, the differential pair of input transistors 9, 11 also operates in the latch mode to control data latching in response to the voltage differences at nodes 12 and 14 while input 27 is disabled. Specifically, the data latch is formed by the complementary pairs of NMOS and PMOS transistors 41, 43 and 45, 47 that have source and drain paths serially connected (in opposite orientations) between the Vcc voltage supply and each of the nodes 12 and 14. The gates of each complementary pair of the transistors 41, 43 and 45, 47 are connected
together and to the common serial junction of the other pair of transistors as the DATA and DATA signal channels. This data latch 41, 43 45, 47 thus functions in conventional manner in response to the voltage differences appearing on nodes 12 and 14 in response to differential BIT and BIT signals applied to the gates of the differential input transistors 9 and 11. The transistors 29, 31, 33 and 35 are connected as described above to equalize and precharge the nodes 12-15 in response to an ENable signal at input 27, and transistor 25 serves as a current source for the input transistors operating as a differential sense amplifier in response to the ENable signal at input 27.
Referring to Figures 2a)-2j), there is shown a chart of waveforms present over time during operation of the circuit of Figure 1. Specifically, the operating time intervals are shown designated as previous sensing cycle and precharge 50, followed in time by BIT and BIT discharge cycle 52, followed in time in recurring manner by another sensing cycle 54. Figure 2a represents a clock waveform 10, and Figure 2d represents the ENable signal 27 delayed slightly from the clock signal 10 attributable, for example, to the clock waveform 10 passing through a latch with associated delay to produce the ENable signal 27. As illustrated in Figures 2b and 2c, the BIT and BIT conductors 7, 8 charge up to a common voltage substantially at Vcc during precharge 50, and then during the discharge cycle 52 begin to discharge at different rates to produce a potential difference at the beginning of the sense cycle 54. As ENable signal 27 of Figure 2d goes high after the BIT and BIT discharge cycle 52, the sense amplifier 9, 11 is enabled to sense the differential voltage 51 on the BIT and BIT conductors 7, 8. It should be noted that the voltages on the circuit nodes 12 and 14 (in Figures 2e and 2g) are at substantially the same voltage level during the discharge cycle 52, while the voltages on the circuit nodes 13 and 15 (in Figures 2f and 2h) during the discharge cycle 52 are substantially equal at about the voltage Vcc less the drop of about 1 volt across one or both of the input transistors 9, 11. These input transistors are thus enabled to sense the differential voltage on BIT and BIT conductors 7, 8 (in Figures 2b, 2c) when the ENable signal 27 (in Figure 2d) is again activated. Thus, the input transistors 9, 11 sense the differential input voltages on BIT and BIT conductors 7, 8, amplify the differential voltage during operation initially as a differential sense amplifier at the beginning of cycle 54, and then respond through the positive feedback provided by transistors 17, 19, 21, 23 to latch at least one transistor (e.g., transistor 11, as shown (in Figures 2e and 2f) with substantially common voltages on nodes 12 and 13. Voltage levels on Data and DATA conductors (in Figures 2i and 2j) thus split and are latched rapidly in the sense cycle 54 (and in the successive sensing and precharge cycle, a sample of which is shown in interval 50). The amplifier circuit is reset and precharged thereafter in response to the cyclic enable and disable logic levels of the ENable signal 27, in the manner as previously described.
Therefore, the sense amplifier of the present invention operates as a conventional differential amplifier and includes positive feedback to rapidly initiate latching operation with associated excellent noise rejection.
Claims
1. A memory data sensing circuit for operation on clocked signals with a memory cell that includes a pair of complementary bit channels, the sensing circuit comprising:
a precharging circuit connected to the pair of complementary bit channels and connected to receive a clock signal for selectively charging the pair of complementary bit channels to a logical signal level;
a pair of input gain elements each including a pair of electrodes forming an output circuit and having an input electrode connected to an associated one of the complementary bit channels;
a coupling circuit connecting the pair of input gain elements and disposed to receive an enable signal in one logic state for operation in one mode as a differential amplifier, and cross coupling the pair of input gain elements for operation in another mode on received enable signal in another logic state to provide positive feedback between the input gain elements for operation thereof as a latch;
a conditioning circuit connected to receive the enable signal and coupled to the output circuits of the input gain elements for charging the output circuits substantially to the same logic signal levels in response to said another logic state of the enable signal; and
a data latch coupled to respond to the logic signal levels on the output circuits of the input gain elements to provide data signals representative of signals on the complementary bit channels.
2. The sensing circuit according to claim 1 wherein the logic states of the enable signal are indicative of different logic states of the clock signal.
3. The sensing circuit according to claim 1 wherein the input gain elements are of one conductivity type, and the coupling circuit includes for each input gain element a pair of gain elements of opposite conductivity types, each including an input electrode and a pair of electrodes forming serially-connected output circuits, with input electrodes of the pair of gain elements for one of the input gain elements commonly connected to the output circuit of the other of the pair of input gain elements, and with the serial connection of the output circuits of the gain elements for each input gain elements connected to the output circuit of the associated input gain element for providing differential signal conduction through the gain elements of the one conductivity type during operation in said one mode.
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US603882 | 1996-02-22 | ||
| US08/603,882 US5615161A (en) | 1996-02-22 | 1996-02-22 | Clocked sense amplifier with positive source feedback |
| PCT/US1997/002082 WO1997031375A1 (en) | 1996-02-22 | 1997-02-12 | Clocked sense amplifier with positive source feedback |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| EP0830683A1 true EP0830683A1 (en) | 1998-03-25 |
Family
ID=24417314
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP97906538A Withdrawn EP0830683A1 (en) | 1996-02-22 | 1997-02-12 | Clocked sense amplifier with positive source feedback |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US5615161A (en) |
| EP (1) | EP0830683A1 (en) |
| JP (1) | JP4138878B2 (en) |
| WO (1) | WO1997031375A1 (en) |
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| JP2830800B2 (en) * | 1995-09-29 | 1998-12-02 | 日本電気株式会社 | Current differential amplifier circuit |
| KR100189750B1 (en) * | 1996-07-29 | 1999-06-01 | 구본준 | Latch-type sensing amplification part having negative feedback means |
| US5872736A (en) * | 1996-10-28 | 1999-02-16 | Micron Technology, Inc. | High speed input buffer |
| US5917758A (en) | 1996-11-04 | 1999-06-29 | Micron Technology, Inc. | Adjustable output driver circuit |
| US6060907A (en) * | 1997-06-25 | 2000-05-09 | Sun Microsystems, Inc. | Impedance control circuit |
| US6281714B1 (en) | 1997-06-25 | 2001-08-28 | Sun Microsystems, Inc. | Differential receiver |
| US5990701A (en) * | 1997-06-25 | 1999-11-23 | Sun Microsystems, Inc. | Method of broadly distributing termination for buses using switched terminators |
| US6411131B1 (en) | 1997-06-25 | 2002-06-25 | Sun Microsystems, Inc. | Method for differentiating a differential voltage signal using current based differentiation |
| US5982191A (en) * | 1997-06-25 | 1999-11-09 | Sun Microsystems, Inc. | Broadly distributed termination for buses using switched terminator logic |
| US5955894A (en) * | 1997-06-25 | 1999-09-21 | Sun Microsystems, Inc. | Method for controlling the impedance of a driver circuit |
| US5942918A (en) * | 1997-06-25 | 1999-08-24 | Sun Microsystems, Inc. | Method for resolving differential signals |
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| US6085033A (en) * | 1997-06-25 | 2000-07-04 | Sun Microsystems, Inc. | Method for determining bit element values for driver impedance control |
| KR100355222B1 (en) * | 1998-12-28 | 2003-02-19 | 삼성전자 주식회사 | Current sense amplifier having high sending speed and high-VCC margin |
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| US6316957B1 (en) | 1999-09-20 | 2001-11-13 | Sun Microsystems, Inc. | Method for a dynamic termination logic driver with improved impedance control |
| US6297677B1 (en) | 1999-09-20 | 2001-10-02 | Sun Microsystems, Inc. | Method for a dynamic termination logic driver with improved slew rate control |
| US6294924B1 (en) | 1999-09-20 | 2001-09-25 | Sun Microsystems, Inc. | Dynamic termination logic driver with improved slew rate control |
| DE19961518B4 (en) | 1999-12-20 | 2007-03-29 | Infineon Technologies Ag | Method for operating a current sense amplifier |
| TW499794B (en) * | 2000-05-05 | 2002-08-21 | Ind Tech Res Inst | Receiver and transmitter for signal transmission |
| DE10022263A1 (en) * | 2000-05-08 | 2001-11-22 | Infineon Technologies Ag | Memory sense amplifier circuit, has precharging circuit and two amplifier stages that can be initialized to voltage supply and earth potentials respectively |
| US6304505B1 (en) * | 2000-05-22 | 2001-10-16 | Micron Technology Inc. | Differential correlated double sampling DRAM sense amplifier |
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| KR100360405B1 (en) | 2000-08-09 | 2002-11-13 | 삼성전자 주식회사 | Output data amplifier of semiconductor device for improving output stability and semiconductor device having the same |
| US6507222B1 (en) * | 2001-07-23 | 2003-01-14 | Cirrus Logic, Inc. | High speed single ended sense amplifier |
| US7237016B1 (en) | 2001-09-07 | 2007-06-26 | Palau Acquisition Corporation (Delaware) | Method and system to manage resource requests utilizing link-list queues within an arbiter associated with an interconnect device |
| US6920106B1 (en) | 2001-09-07 | 2005-07-19 | Agilent Technologies, Inc. | Speculative loading of buffers within a port of a network device |
| US6763418B1 (en) | 2001-09-07 | 2004-07-13 | Agilent Technologies, Inc. | Request bus arbitration |
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| US7016996B1 (en) | 2002-04-15 | 2006-03-21 | Schober Richard L | Method and apparatus to detect a timeout condition for a data item within a process |
| US6894541B2 (en) * | 2002-10-16 | 2005-05-17 | Stmicroelectronics Pvt. Ltd. | Sense amplifier with feedback-controlled bitline access |
| US7263016B1 (en) * | 2004-06-07 | 2007-08-28 | Virage Logic Corporation | Method and system for pre-charging and biasing a latch-type sense amplifier |
| KR100864626B1 (en) * | 2007-04-02 | 2008-10-22 | 주식회사 하이닉스반도체 | Semiconductor memory device and operation method thereof |
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| US5226014A (en) * | 1990-12-24 | 1993-07-06 | Ncr Corporation | Low power pseudo-static ROM |
| US5257236A (en) * | 1991-08-01 | 1993-10-26 | Silicon Engineering, Inc. | Static RAM |
| US5508644A (en) * | 1994-09-28 | 1996-04-16 | Motorola, Inc. | Sense amplifier for differential voltage detection with low input capacitance |
| US5502680A (en) * | 1995-02-16 | 1996-03-26 | Cirrus Logic Inc | Sense amplifier with pull-up circuit for accelerated latching of logic level output data |
-
1996
- 1996-02-22 US US08/603,882 patent/US5615161A/en not_active Expired - Lifetime
-
1997
- 1997-02-12 JP JP53020297A patent/JP4138878B2/en not_active Expired - Fee Related
- 1997-02-12 WO PCT/US1997/002082 patent/WO1997031375A1/en not_active Application Discontinuation
- 1997-02-12 EP EP97906538A patent/EP0830683A1/en not_active Withdrawn
Non-Patent Citations (1)
| Title |
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| See references of WO9731375A1 * |
Also Published As
| Publication number | Publication date |
|---|---|
| JP4138878B2 (en) | 2008-08-27 |
| JP2000503449A (en) | 2000-03-21 |
| US5615161A (en) | 1997-03-25 |
| WO1997031375A1 (en) | 1997-08-28 |
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