DK2972873T3 - Selektiv selvreferencelæsning - Google Patents
Selektiv selvreferencelæsning Download PDFInfo
- Publication number
- DK2972873T3 DK2972873T3 DK14775795.9T DK14775795T DK2972873T3 DK 2972873 T3 DK2972873 T3 DK 2972873T3 DK 14775795 T DK14775795 T DK 14775795T DK 2972873 T3 DK2972873 T3 DK 2972873T3
- Authority
- DK
- Denmark
- Prior art keywords
- reference reading
- selective self
- selective
- self
- reading
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
- G06F11/0751—Error or fault detection not based on redundancy
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1673—Reading or sensing circuits or methods
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
- G06F11/0706—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment
- G06F11/0727—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment in a storage system, e.g. in a DASD or network based storage system
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1677—Verifying circuits or methods
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
- G11C29/021—Detection or location of defective auxiliary circuits, e.g. defective refresh counters in voltage or current generators
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C2029/0411—Online error correction
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Mram Or Spin Memory Techniques (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US13/804,598 US9025364B2 (en) | 2013-03-14 | 2013-03-14 | Selective self-reference read |
PCT/US2014/019148 WO2014158657A1 (en) | 2013-03-14 | 2014-02-27 | Selective self-reference read |
Publications (1)
Publication Number | Publication Date |
---|---|
DK2972873T3 true DK2972873T3 (da) | 2022-04-04 |
Family
ID=51526456
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DK14775795.9T DK2972873T3 (da) | 2013-03-14 | 2014-02-27 | Selektiv selvreferencelæsning |
Country Status (8)
Country | Link |
---|---|
US (5) | US9025364B2 (da) |
EP (2) | EP3996094A1 (da) |
JP (1) | JP2016516255A (da) |
KR (1) | KR101810307B1 (da) |
CN (2) | CN108717858B (da) |
DK (1) | DK2972873T3 (da) |
TW (3) | TWI604443B (da) |
WO (1) | WO2014158657A1 (da) |
Families Citing this family (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9111622B2 (en) * | 2012-05-09 | 2015-08-18 | Everspin Technologies, Inc. | Self referencing sense amplifier for spin torque MRAM |
US10146601B2 (en) * | 2013-06-12 | 2018-12-04 | Everspin Technologies, Inc. | Methods and devices for healing reset errors in a magnetic memory |
US9281041B1 (en) | 2014-12-16 | 2016-03-08 | Honeywell International Inc. | Delay-based read system for a magnetoresistive random access memory (MRAM) bit |
US9666259B1 (en) * | 2016-04-12 | 2017-05-30 | Qualcomm Incorporated | Dual mode sensing scheme |
US10067827B2 (en) * | 2016-06-29 | 2018-09-04 | Micron Technology, Inc. | Error correction code event detection |
US10553277B2 (en) * | 2016-11-21 | 2020-02-04 | SK Hynix Inc. | Cross point array type phase change memory device and method of driving the same |
JP2018156556A (ja) * | 2017-03-21 | 2018-10-04 | 東芝メモリ株式会社 | 計算機システム及びメモリデバイス |
US10304514B2 (en) | 2017-07-05 | 2019-05-28 | Micron Technology, Inc. | Self-reference sensing for memory cells |
US10395715B2 (en) | 2017-08-25 | 2019-08-27 | Micron Technology, Inc. | Self-referencing memory device |
JP2019053794A (ja) | 2017-09-13 | 2019-04-04 | 東芝メモリ株式会社 | 半導体記憶装置 |
US10403336B2 (en) | 2017-12-28 | 2019-09-03 | Micron Technology, Inc. | Techniques for precharging a memory cell |
CN110033801B (zh) * | 2018-01-11 | 2021-01-12 | 上海磁宇信息科技有限公司 | 一种用于磁性随机存储器的冗余参照布局电路 |
US10403378B1 (en) * | 2018-02-09 | 2019-09-03 | Micron Technology, Inc. | Performing an operation on a memory cell of a memory system at a frequency based on temperature |
US10854289B2 (en) | 2018-05-14 | 2020-12-01 | Samsung Electronics Co., Ltd. | Resistive memory device providing reference calibration, and operating method thereof |
US10460782B1 (en) | 2018-08-06 | 2019-10-29 | Globalfoundaries Inc. | Integrated circuits having single state memory reference cells and methods for operating the same |
DE102018132503B4 (de) * | 2018-12-17 | 2020-09-17 | Infineon Technologies Ag | Detektion von Codewörtern |
JP2020161201A (ja) | 2019-03-27 | 2020-10-01 | キオクシア株式会社 | 半導体記憶装置 |
KR20220148866A (ko) * | 2020-03-03 | 2022-11-07 | 마이크론 테크놀로지, 인크 | 메모리 셀을 위한 카운터 기반 감지 증폭기 방법 |
FR3111439B1 (fr) * | 2020-06-12 | 2023-06-30 | St Microelectronics Rousset | Procédé de gestion des requêtes d’accès à une mémoire vive et système correspondant |
US11978491B2 (en) * | 2021-09-24 | 2024-05-07 | Sandisk Technologies Llc | Mixed current-forced read scheme for MRAM array with selector |
US11972822B2 (en) * | 2021-09-24 | 2024-04-30 | Sandisk Technologies Llc | Programmable ECC for MRAM mixed-read scheme |
Family Cites Families (31)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6445624B1 (en) * | 2001-02-23 | 2002-09-03 | Micron Technology, Inc. | Method of synchronizing read timing in a high speed memory system |
JP2003050738A (ja) * | 2001-08-03 | 2003-02-21 | Elpida Memory Inc | キャリブレーション方法及びメモリシステム |
US6654278B1 (en) * | 2002-07-31 | 2003-11-25 | Motorola, Inc. | Magnetoresistance random access memory |
US6920060B2 (en) * | 2002-08-14 | 2005-07-19 | Intel Corporation | Memory device, circuits and methods for operating a memory device |
KR100521363B1 (ko) * | 2002-10-07 | 2005-10-13 | 삼성전자주식회사 | 마그네틱 랜덤 액세스 메모리의 데이터 센싱 회로 및 그방법 |
US6914808B2 (en) * | 2002-12-27 | 2005-07-05 | Kabushiki Kaisha Toshiba | Magnetoresistive random access memory device |
US7370260B2 (en) | 2003-12-16 | 2008-05-06 | Freescale Semiconductor, Inc. | MRAM having error correction code circuitry and method therefor |
US7154798B2 (en) * | 2004-04-27 | 2006-12-26 | Taiwan Semiconductor Manufacturing Company, Ltd. | MRAM arrays and methods for writing and reading magnetic memory devices |
US7327868B2 (en) * | 2004-06-04 | 2008-02-05 | Hewlett-Packard Development Company, L.P. | Magnetic stripline scanner |
US7624209B1 (en) * | 2004-09-15 | 2009-11-24 | Xilinx, Inc. | Method of and circuit for enabling variable latency data transfers |
TWI261912B (en) * | 2004-12-01 | 2006-09-11 | Ind Tech Res Inst | Magnetic random access memory with reference magnetic resistance and reading method thereof |
US7536304B2 (en) * | 2005-05-27 | 2009-05-19 | Porticus, Inc. | Method and system for bio-metric voice print authentication |
US7272035B1 (en) * | 2005-08-31 | 2007-09-18 | Grandis, Inc. | Current driven switching of magnetic storage cells utilizing spin transfer and magnetic memories using such cells |
JP2007242118A (ja) * | 2006-03-07 | 2007-09-20 | Tdk Corp | 磁気メモリの読み出し回路 |
US7577018B2 (en) | 2006-03-07 | 2009-08-18 | Tdk Corporation | Readout circuit of magnetic memory |
US7865797B2 (en) * | 2006-11-16 | 2011-01-04 | Freescale Semiconductor, Inc. | Memory device with adjustable read reference based on ECC and method thereof |
US7765426B2 (en) | 2007-06-07 | 2010-07-27 | Micron Technology, Inc. | Emerging bad block detection |
US7660152B2 (en) * | 2008-04-30 | 2010-02-09 | International Business Machines Corporation | Method and apparatus for implementing self-referencing read operation for PCRAM devices |
US8116123B2 (en) | 2008-06-27 | 2012-02-14 | Seagate Technology Llc | Spin-transfer torque memory non-destructive self-reference read method |
US8310866B2 (en) * | 2008-07-07 | 2012-11-13 | Qimonda Ag | MRAM device structure employing thermally-assisted write operations and thermally-unassisted self-referencing operations |
US7826255B2 (en) | 2008-09-15 | 2010-11-02 | Seagate Technology Llc | Variable write and read methods for resistive random access memory |
US7898838B2 (en) | 2008-10-31 | 2011-03-01 | Seagate Technology Llc | Resistive sense memory calibration for self-reference read method |
US7830693B2 (en) * | 2008-11-12 | 2010-11-09 | Seagate Technology Llc | NAND based resistive sense memory cell architecture |
US7940592B2 (en) * | 2008-12-02 | 2011-05-10 | Seagate Technology Llc | Spin-torque bit cell with unpinned reference layer and unidirectional write current |
US7936625B2 (en) * | 2009-03-24 | 2011-05-03 | Seagate Technology Llc | Pipeline sensing using voltage storage elements to read non-volatile memory cells |
JP4901899B2 (ja) * | 2009-03-30 | 2012-03-21 | 株式会社東芝 | 磁気抵抗効果メモリ |
EP2309514B1 (en) * | 2009-10-05 | 2016-01-06 | Crocus Technology | Circuit for generating adjustable timing signals for sensing a self-referenced MRAM cell |
US8312349B2 (en) | 2009-10-27 | 2012-11-13 | Micron Technology, Inc. | Error detection/correction based memory management |
CN102200926B (zh) * | 2010-03-24 | 2014-05-07 | 北京兆易创新科技股份有限公司 | 一种存储器读操作功能的仿真验证方法 |
US9183911B2 (en) * | 2011-11-17 | 2015-11-10 | Everspin Technologies, Inc. | Hybrid read scheme for spin torque MRAM |
US9619318B2 (en) * | 2013-02-22 | 2017-04-11 | Intel Deutschland Gmbh | Memory circuits, method for accessing a memory and method for repairing a memory |
-
2013
- 2013-03-14 US US13/804,598 patent/US9025364B2/en active Active
-
2014
- 2014-02-27 KR KR1020157024097A patent/KR101810307B1/ko active IP Right Grant
- 2014-02-27 DK DK14775795.9T patent/DK2972873T3/da active
- 2014-02-27 CN CN201810528567.4A patent/CN108717858B/zh active Active
- 2014-02-27 EP EP21217726.5A patent/EP3996094A1/en not_active Withdrawn
- 2014-02-27 JP JP2015561427A patent/JP2016516255A/ja active Pending
- 2014-02-27 CN CN201480013302.0A patent/CN105027085B/zh active Active
- 2014-02-27 WO PCT/US2014/019148 patent/WO2014158657A1/en active Application Filing
- 2014-02-27 EP EP14775795.9A patent/EP2972873B1/en active Active
- 2014-03-10 TW TW105124198A patent/TWI604443B/zh not_active IP Right Cessation
- 2014-03-10 TW TW106132590A patent/TWI620175B/zh not_active IP Right Cessation
- 2014-03-10 TW TW103108220A patent/TWI555019B/zh not_active IP Right Cessation
-
2015
- 2015-04-08 US US14/681,471 patent/US9715419B2/en active Active
-
2017
- 2017-07-24 US US15/658,066 patent/US10585735B2/en not_active Expired - Fee Related
-
2020
- 2020-02-14 US US16/791,674 patent/US11379286B2/en active Active
-
2022
- 2022-06-17 US US17/843,237 patent/US11789796B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
TW201447880A (zh) | 2014-12-16 |
CN108717858A (zh) | 2018-10-30 |
KR101810307B1 (ko) | 2017-12-18 |
US9025364B2 (en) | 2015-05-05 |
EP3996094A1 (en) | 2022-05-11 |
TWI604443B (zh) | 2017-11-01 |
CN105027085B (zh) | 2018-06-22 |
KR20150115901A (ko) | 2015-10-14 |
CN108717858B (zh) | 2023-04-18 |
US10585735B2 (en) | 2020-03-10 |
US20170322840A1 (en) | 2017-11-09 |
US20140269029A1 (en) | 2014-09-18 |
US20150212871A1 (en) | 2015-07-30 |
EP2972873A1 (en) | 2016-01-20 |
EP2972873A4 (en) | 2016-11-23 |
TWI555019B (zh) | 2016-10-21 |
US11379286B2 (en) | 2022-07-05 |
EP2972873B1 (en) | 2022-01-26 |
CN105027085A (zh) | 2015-11-04 |
US11789796B2 (en) | 2023-10-17 |
TW201802804A (zh) | 2018-01-16 |
TW201640500A (zh) | 2016-11-16 |
TWI620175B (zh) | 2018-04-01 |
US20220318084A1 (en) | 2022-10-06 |
US9715419B2 (en) | 2017-07-25 |
US20200257584A1 (en) | 2020-08-13 |
WO2014158657A1 (en) | 2014-10-02 |
JP2016516255A (ja) | 2016-06-02 |
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