DK1342094T3 - Indretning elektromagnetisk karakteringsering af en teststruktur - Google Patents

Indretning elektromagnetisk karakteringsering af en teststruktur

Info

Publication number
DK1342094T3
DK1342094T3 DK01999827T DK01999827T DK1342094T3 DK 1342094 T3 DK1342094 T3 DK 1342094T3 DK 01999827 T DK01999827 T DK 01999827T DK 01999827 T DK01999827 T DK 01999827T DK 1342094 T3 DK1342094 T3 DK 1342094T3
Authority
DK
Denmark
Prior art keywords
signals
signal generator
test structure
electromagnetic characterization
frequency band
Prior art date
Application number
DK01999827T
Other languages
Danish (da)
English (en)
Inventor
Bernard Jean Yves Jecko
Edson Antoine Andre Martinod
Michele Marie Lalande-Guionie
Alain Jean Louis Reineix
Original Assignee
Centre Nat Rech Scient
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre Nat Rech Scient filed Critical Centre Nat Rech Scient
Application granted granted Critical
Publication of DK1342094T3 publication Critical patent/DK1342094T3/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
    • G01R29/0871—Complete apparatus or systems; circuits, e.g. receivers or amplifiers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
    • G01R27/32—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
    • G01R31/68—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board
    • G01R31/69—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board of terminals at the end of a cable or a wire harness; of plugs; of sockets, e.g. wall sockets or power sockets in appliances

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Control Of High-Frequency Heating Circuits (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Relating To Insulation (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
  • Magnetic Resonance Imaging Apparatus (AREA)
DK01999827T 2000-12-04 2001-11-28 Indretning elektromagnetisk karakteringsering af en teststruktur DK1342094T3 (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR0015700A FR2817620B1 (fr) 2000-12-04 2000-12-04 Dispositif de caracterisation electromagnetique d'une structure sous test
PCT/FR2001/003767 WO2002046780A1 (fr) 2000-12-04 2001-11-28 Dispositif de caracterisation electromagentique d'une structure sous test

Publications (1)

Publication Number Publication Date
DK1342094T3 true DK1342094T3 (da) 2004-10-18

Family

ID=8857218

Family Applications (1)

Application Number Title Priority Date Filing Date
DK01999827T DK1342094T3 (da) 2000-12-04 2001-11-28 Indretning elektromagnetisk karakteringsering af en teststruktur

Country Status (9)

Country Link
US (1) US6995569B2 (es)
EP (1) EP1342094B1 (es)
AT (1) ATE268912T1 (es)
AU (1) AU2002216147A1 (es)
DE (1) DE60103779T2 (es)
DK (1) DK1342094T3 (es)
ES (1) ES2223016T3 (es)
FR (1) FR2817620B1 (es)
WO (1) WO2002046780A1 (es)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4941304B2 (ja) * 2005-09-01 2012-05-30 株式会社村田製作所 被検体の散乱係数の測定方法および測定装置
DE102007034851B4 (de) * 2007-07-24 2015-02-26 Gunter Langer Vorrichtung und Verfahren zur Ermittlung der elektromagnetischen Störaussendung und Störfestigkeit
US20150084656A1 (en) * 2013-09-25 2015-03-26 Tektronix, Inc. Two port vector network analyzer using de-embed probes
DE102017216771A1 (de) * 2017-09-21 2019-03-21 Bender Gmbh & Co. Kg Verfahren und Schaltungsanordnungen zur Lokalisierung eines Fehlerortes auf einer elektrischen Leitung auf Basis der Zeitbereichsreflektometrie
CN115808573A (zh) * 2021-09-13 2023-03-17 英业达科技有限公司 测试辐射敏感度的方法及系统

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2652653B1 (fr) * 1989-09-29 1991-12-13 Centre Nat Rech Scient Analyseur vectoriel de reseau millimetrique et/ou submillimetrique.
US5059915A (en) * 1989-12-01 1991-10-22 Wiltron Company Vector network analyzer RF pulse profiling method and apparatus
DE69637960D1 (de) * 1995-04-05 2009-08-06 Nippon Telegraph & Telephone Verfahren und Vorrichtung zum Suchen nach der Quelle einer elektromagnetischen Störung und kontaktlose Sonde dafür
DE19621401C2 (de) * 1996-05-28 2001-03-01 Siemens Ag Verfahren zur Bestimmung der Schirmwirkung einer abgeschirmten Verkabelungsstrecke
FR2751415B1 (fr) * 1996-07-19 1998-10-23 Aerospatiale Banc de mesure d'impedance de transfert notamment pour connecteurs de diametre important et/ou de profil non uniforme
US5821760A (en) * 1996-07-31 1998-10-13 Fluke Corporation Method and apparatus for measuring near-end cross-talk in patch cords

Also Published As

Publication number Publication date
DE60103779T2 (de) 2005-07-14
WO2002046780A1 (fr) 2002-06-13
FR2817620A1 (fr) 2002-06-07
FR2817620B1 (fr) 2003-02-07
EP1342094B1 (fr) 2004-06-09
US6995569B2 (en) 2006-02-07
US20040075441A1 (en) 2004-04-22
ATE268912T1 (de) 2004-06-15
AU2002216147A1 (en) 2002-06-18
EP1342094A1 (fr) 2003-09-10
ES2223016T3 (es) 2005-02-16
DE60103779D1 (de) 2004-07-15

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