DE69832077D1 - Leiterplattenanordnung - Google Patents

Leiterplattenanordnung

Info

Publication number
DE69832077D1
DE69832077D1 DE69832077T DE69832077T DE69832077D1 DE 69832077 D1 DE69832077 D1 DE 69832077D1 DE 69832077 T DE69832077 T DE 69832077T DE 69832077 T DE69832077 T DE 69832077T DE 69832077 D1 DE69832077 D1 DE 69832077D1
Authority
DE
Germany
Prior art keywords
circuit board
circuit
test
data acquisition
power supply
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69832077T
Other languages
English (en)
Other versions
DE69832077T2 (de
Inventor
Nathan Chao
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
MISSION TECHNOLOGY TEANECK
Original Assignee
MISSION TECHNOLOGY TEANECK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by MISSION TECHNOLOGY TEANECK filed Critical MISSION TECHNOLOGY TEANECK
Publication of DE69832077D1 publication Critical patent/DE69832077D1/de
Application granted granted Critical
Publication of DE69832077T2 publication Critical patent/DE69832077T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2889—Interfaces, e.g. between probe and tester

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Oscillators With Electromechanical Resonators (AREA)
  • Diaphragms For Electromechanical Transducers (AREA)
  • Production Of Multi-Layered Print Wiring Board (AREA)
DE69832077T 1997-08-19 1998-08-17 Leiterplattenanordnung Expired - Fee Related DE69832077T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US914413 1997-08-19
US08/914,413 US6094624A (en) 1997-08-19 1997-08-19 Electronic test facility
PCT/US1998/017020 WO1999009623A1 (en) 1997-08-19 1998-08-17 Circuit board arrangement

Publications (2)

Publication Number Publication Date
DE69832077D1 true DE69832077D1 (de) 2005-12-01
DE69832077T2 DE69832077T2 (de) 2006-07-13

Family

ID=25434329

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69832077T Expired - Fee Related DE69832077T2 (de) 1997-08-19 1998-08-17 Leiterplattenanordnung

Country Status (9)

Country Link
US (1) US6094624A (de)
EP (1) EP1005708B1 (de)
JP (1) JP2001516037A (de)
CN (1) CN1161692C (de)
AT (1) ATE308136T1 (de)
AU (1) AU734069B2 (de)
CA (1) CA2300162A1 (de)
DE (1) DE69832077T2 (de)
WO (1) WO1999009623A1 (de)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6745146B1 (en) * 1998-10-30 2004-06-01 Avaya Technology Corp. Automated test system and method for device having circuit and ground connections
US6385739B1 (en) 1999-07-19 2002-05-07 Tivo Inc. Self-test electronic assembly and test system
WO2003010612A2 (en) * 2001-07-24 2003-02-06 University Of Delhi Multifunction interface device for use, inter alia, in laboratory procedures
CN1327350C (zh) * 2003-10-30 2007-07-18 英业达股份有限公司 数字信号的采集系统及方法
CN100517257C (zh) * 2005-10-28 2009-07-22 鸿富锦精密工业（深圳）有限公司 高速外围部件互连总线接口测试装置
CN101686414B (zh) * 2008-09-26 2013-06-05 深圳富泰宏精密工业有限公司 移动电话测试装置
US8161335B2 (en) * 2009-05-05 2012-04-17 Bae Systems Information And Electronic Systems Integration Inc. System and method for testing a circuit
CN102645627B (zh) * 2012-03-09 2014-06-25 中国南方电网有限责任公司超高压输电公司检修试验中心 实时数字仿真系统中的模拟量板卡io通道信号闭环测试系统
EP3382408A1 (de) 2017-03-30 2018-10-03 Rohde & Schwarz GmbH & Co. KG Messvorrichtung und verfahren zum messen für eine zu testende vorrichtung
US10620091B2 (en) 2017-11-17 2020-04-14 Hamilton Sundstrand Corporation Electronic control system tester
US11307061B2 (en) * 2018-03-08 2022-04-19 Rohde & Schwarz Gmbh & Co. Kg Electrical measurement device
CN111077431A (zh) * 2019-12-30 2020-04-28 浙江力创自动化科技有限公司 一种控制电路板的电性能检测设备

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4238784A (en) * 1975-01-23 1980-12-09 Colt Industries Operating Corp. Electronic measuring system with pulsed power supply and stability sensing
US4072851A (en) * 1976-03-26 1978-02-07 Norland Corporation Waveform measuring instrument with resident programmed processor for controlled waveform display and waveform data reduction and calculation
US4380764A (en) * 1981-03-12 1983-04-19 Data Translation, Inc. Data acquisition apparatus
US4571689A (en) * 1982-10-20 1986-02-18 The United States Of America As Represented By The Secretary Of The Air Force Multiple thermocouple testing device
US4747060A (en) * 1986-03-31 1988-05-24 Halliburton Company Data acquisition module and method
US4758779A (en) * 1986-04-07 1988-07-19 Tektronix, Inc. Probe body for an electrical measurement system
US4862067A (en) * 1987-06-24 1989-08-29 Schlumberger Technologies, Inc. Method and apparatus for in-circuit testing of electronic devices
JPH01180645A (ja) * 1988-01-13 1989-07-18 Hitachi Ltd 保守診断機構の自動検証方式
EP0347632A1 (de) * 1988-06-20 1989-12-27 Regeltron Computer Gmbh Gerät zur bedienungsfreien Erfassung und Speicherung von Messwerten
US5014226A (en) * 1988-09-29 1991-05-07 Lsi Logic Corporation Method and apparatus for predicting the metastable behavior of logic circuits
US5307290A (en) * 1988-10-18 1994-04-26 Fiat Auto S.P.A. System for the automatic testing, preferably on a bench, of electronic control systems which are intended to be fitted in vehicles
US5003486A (en) * 1989-02-24 1991-03-26 Nero Technologies Ltd. Programmable safety electrical socket controller
IE80813B1 (en) * 1989-05-16 1999-03-10 Formia Limited Electronic test systems
US5058112A (en) * 1989-07-31 1991-10-15 Ag Communication Systems Corporation Programmable fault insertion circuit
US5345392A (en) * 1991-01-25 1994-09-06 International Business Machines Corporation Battery charge monitor for a personal computer
US5254992A (en) * 1991-10-31 1993-10-19 Fairbanks Inc. Low power electronic measuring system
US5396168A (en) * 1992-03-27 1995-03-07 Tandy Corporation Digital multimeter with microprocessor control
US5406495A (en) * 1993-02-01 1995-04-11 Systems Analysis And Integration, Inc. Substation load distribution monitor system
US5459671A (en) * 1993-02-19 1995-10-17 Advanced Micro Devices, Inc. Programmable battery controller
US5526287A (en) * 1994-07-01 1996-06-11 Ada Technologies, Inc. Portable data collection device
US5544107A (en) * 1994-08-22 1996-08-06 Adaptec, Inc. Diagnostic data port for a LSI or VLSI integrated circuit
US5852737A (en) * 1995-04-24 1998-12-22 National Semiconductor Corporation Method and apparatus for operating digital static CMOS components in a very low voltage mode during power-down
DE19603942A1 (de) * 1996-02-05 1997-08-07 Eps Electronic Production Schl Datenerfassungsvorrichtung
US5790839A (en) * 1996-12-20 1998-08-04 International Business Machines Corporation System integration of DRAM macros and logic cores in a single chip architecture

Also Published As

Publication number Publication date
CN1276925A (zh) 2000-12-13
US6094624A (en) 2000-07-25
CN1161692C (zh) 2004-08-11
EP1005708A1 (de) 2000-06-07
AU734069B2 (en) 2001-05-31
WO1999009623A1 (en) 1999-02-25
ATE308136T1 (de) 2005-11-15
JP2001516037A (ja) 2001-09-25
EP1005708A4 (de) 2000-11-08
CA2300162A1 (en) 1999-02-25
AU8830798A (en) 1999-03-08
EP1005708B1 (de) 2005-10-26
DE69832077T2 (de) 2006-07-13

Similar Documents

Publication Publication Date Title
ATE363080T1 (de) Schaltschrank zum konfigurieren eines unterbrechungsfreien versorgungssystems und darin verwendete rückwandverdrahtung
EP0213037A3 (de) Halbleiterspeichergerät mit Prüfmustergeberschaltung
DE68922832D1 (de) Stromversorgung für tragbare elektrische Geräte.
DE69832077D1 (de) Leiterplattenanordnung
DE69429741D1 (de) Analoge, selbstständige Prüfbusstruktur zum Testen integrierter Schaltungen auf einer gedruckten Leiterplatte
DE68915186D1 (de) Tragbarer elektronischer Apparat.
DE69822930D1 (de) Versorgungsschaltung für einen Elektizitätszähler
ATE394684T1 (de) Spannungsversorgung für prüflinge, mit hoher geschwindigkeit und hoher genauigkeit und mit aktiver boostschaltung
TW222725B (en) Testing sequential logic circuit upon changing into combinatorial logic circuit
DE69923288D1 (de) Testeinrichtung zum testen eines moduls für einen zum kontaktlosen kommunizieren vorgesehenen datenträger
DE69113347D1 (de) Leistungsversorgungsschaltung für elektronische Geräte.
ATE407510T1 (de) Schnittstelleneinrichtung
TW335486B (en) IC card internal securing device
DE69019316D1 (de) Fassung für einen elektronischen Baustein.
MY122556A (en) Device for testing connections provided with pulling resistors
TW287237B (en) The circuit inspector
DE60010873D1 (de) Schnittstelle
TW328182B (en) Integrated circuit device
MY128470A (en) Boundary-scan testing opto-electronic devices.
DE19981507D2 (de) Integrierte Schaltung mit eingebautem Baugruppentest
KR940021410U (ko) 번인(Burn-In) 테스트모드 발생회로
ES2124667A1 (es) Circuito integrado multiplicador de frecuencia.
KR19980058349U (ko) 이동전화 교환기의 특성 시험기 클럭 공급장치
KR930020457U (ko) 격리기능을 가진 번인보드용 ic소켓
KR970016608A (ko) 프로브 테스트(Probe Test)장치

Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee